JP2003515124A5 - - Google Patents

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Publication number
JP2003515124A5
JP2003515124A5 JP2001538779A JP2001538779A JP2003515124A5 JP 2003515124 A5 JP2003515124 A5 JP 2003515124A5 JP 2001538779 A JP2001538779 A JP 2001538779A JP 2001538779 A JP2001538779 A JP 2001538779A JP 2003515124 A5 JP2003515124 A5 JP 2003515124A5
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JP
Japan
Prior art keywords
light
light source
optical fiber
sample
detection means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001538779A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003515124A (ja
Filing date
Publication date
Priority claimed from US09/444,061 external-priority patent/US6307630B1/en
Application filed filed Critical
Publication of JP2003515124A publication Critical patent/JP2003515124A/ja
Publication of JP2003515124A5 publication Critical patent/JP2003515124A5/ja
Pending legal-status Critical Current

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JP2001538779A 1999-11-19 2000-11-13 濁度計 Pending JP2003515124A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/444,061 1999-11-19
US09/444,061 US6307630B1 (en) 1999-11-19 1999-11-19 Turbidimeter array system
PCT/US2000/031153 WO2001036940A2 (en) 1999-11-19 2000-11-13 Turbidimeter array system

Publications (2)

Publication Number Publication Date
JP2003515124A JP2003515124A (ja) 2003-04-22
JP2003515124A5 true JP2003515124A5 (https=) 2008-01-10

Family

ID=23763327

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001538779A Pending JP2003515124A (ja) 1999-11-19 2000-11-13 濁度計

Country Status (7)

Country Link
US (2) US6307630B1 (https=)
EP (1) EP1230534A2 (https=)
JP (1) JP2003515124A (https=)
KR (1) KR20020063576A (https=)
AU (1) AU772363B2 (https=)
CA (1) CA2391979C (https=)
WO (1) WO2001036940A2 (https=)

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US7530877B1 (en) * 1999-06-03 2009-05-12 Micron Technology, Inc. Semiconductor processor systems, a system configured to provide a semiconductor workpiece process fluid
US6290576B1 (en) 1999-06-03 2001-09-18 Micron Technology, Inc. Semiconductor processors, sensors, and semiconductor processing systems
US7180591B1 (en) * 1999-06-03 2007-02-20 Micron Technology, Inc Semiconductor processors, sensors, semiconductor processing systems, semiconductor workpiece processing methods, and turbidity monitoring methods
US6894778B2 (en) * 2002-04-23 2005-05-17 Hach Company Low detection limit turbidimeter
DE10225842A1 (de) * 2002-06-04 2003-12-24 Zeiss Carl Smt Ag Verfahren und Vorrichtung zur Bestimmung der Strahlungsbeständigkeit eines optischen Materials
CA2391641A1 (fr) * 2002-06-28 2003-12-28 Robert Longin Plateforme robotisee de cultures cellulaires en batteries de reacteurs miniaturises, equipee d'un systeme de mesure en temps reel de la turbidite cellulaire ou toutes autres proprietes optiques
WO2004036214A2 (en) * 2002-10-18 2004-04-29 Pfizer Products Inc. Automated kinetci solubility assay apparatus and method
US20040083798A1 (en) * 2002-11-05 2004-05-06 Sadar Michael J. Detection of filter breakthrough
US7099012B1 (en) * 2003-03-13 2006-08-29 Turner Designs, Inc. In-line spectrometer
US20060055927A1 (en) * 2004-09-16 2006-03-16 Rosemount Analytical Inc. Turbidity sensor
US20060061765A1 (en) * 2004-09-16 2006-03-23 Behzad Rezvani Turbidity sensor with improved noise rejection
US7301158B1 (en) 2004-12-15 2007-11-27 Turner Designs, Inc. Method and apparatus for measuring active fluorescence
US7470917B1 (en) 2004-12-15 2008-12-30 Turner Designs, Inc. Submersible apparatus for measuring active fluorescence
US8877507B2 (en) 2007-04-06 2014-11-04 Qiagen Gaithersburg, Inc. Ensuring sample adequacy using turbidity light scattering techniques
US8703492B2 (en) 2007-04-06 2014-04-22 Qiagen Gaithersburg, Inc. Open platform hybrid manual-automated sample processing system
US8355132B2 (en) * 2007-04-06 2013-01-15 Qiagen Gaithersburg, Inc. Sample adequacy measurement system having a plurality of sample tubes and using turbidity light scattering techniques
CN101809430A (zh) 2007-09-12 2010-08-18 哈赫公司 标准介质悬浮体、光学颗粒测量仪器、以及用于光学颗粒测量仪器的检定方法
KR100903133B1 (ko) * 2007-12-17 2009-06-16 한국전자통신연구원 광공동을 이용한 고감도 혼탁도 센서 및 센싱 방법
JP5152803B2 (ja) * 2008-09-24 2013-02-27 倉敷紡績株式会社 液体濃度計
US7659980B1 (en) 2008-11-24 2010-02-09 Herbert Leckie Mitchell Nephelometric turbidity sensor device
US20100220315A1 (en) * 2009-02-27 2010-09-02 Beckman Coulter, Inc. Stabilized Optical System for Flow Cytometry
KR20120012468A (ko) * 2009-04-15 2012-02-10 비오까르띠 에스아 ｒｔＰＣＲ 반응을 모니터링하기 위한 광학 검출 시스템
RU2442973C2 (ru) * 2009-10-02 2012-02-20 Закрытое акционерное общество "ИММУНОСКРИН" (ЗАО "ИММУНОСКРИН") Иммунотурбидиметрический планшетный анализатор
JP4948624B2 (ja) * 2010-05-06 2012-06-06 シャープ株式会社 濁度検知器
WO2015043675A1 (en) * 2013-09-30 2015-04-02 Hach Lange Gmbh Nephelometric turbidimeter and method for detection of the contamination of a sample cuvette of a nephelometric turbidimeter
WO2016205744A1 (en) * 2015-06-17 2016-12-22 Flodesign Sonics, Inc. Turbidity sensor with improved flow path

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