AU772363B2 - Turbidimeter array system - Google Patents

Turbidimeter array system Download PDF

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Publication number
AU772363B2
AU772363B2 AU16039/01A AU1603901A AU772363B2 AU 772363 B2 AU772363 B2 AU 772363B2 AU 16039/01 A AU16039/01 A AU 16039/01A AU 1603901 A AU1603901 A AU 1603901A AU 772363 B2 AU772363 B2 AU 772363B2
Authority
AU
Australia
Prior art keywords
light
light source
accordance
sample
optical fiber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
AU16039/01A
Other languages
English (en)
Other versions
AU1603901A (en
Inventor
Ashim K. Banerjee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hach Co
Original Assignee
Hach Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hach Co filed Critical Hach Co
Publication of AU1603901A publication Critical patent/AU1603901A/en
Application granted granted Critical
Publication of AU772363B2 publication Critical patent/AU772363B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
AU16039/01A 1999-11-19 2000-11-13 Turbidimeter array system Ceased AU772363B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/444061 1999-11-19
US09/444,061 US6307630B1 (en) 1999-11-19 1999-11-19 Turbidimeter array system
PCT/US2000/031153 WO2001036940A2 (en) 1999-11-19 2000-11-13 Turbidimeter array system

Publications (2)

Publication Number Publication Date
AU1603901A AU1603901A (en) 2001-05-30
AU772363B2 true AU772363B2 (en) 2004-04-22

Family

ID=23763327

Family Applications (1)

Application Number Title Priority Date Filing Date
AU16039/01A Ceased AU772363B2 (en) 1999-11-19 2000-11-13 Turbidimeter array system

Country Status (7)

Country Link
US (2) US6307630B1 (https=)
EP (1) EP1230534A2 (https=)
JP (1) JP2003515124A (https=)
KR (1) KR20020063576A (https=)
AU (1) AU772363B2 (https=)
CA (1) CA2391979C (https=)
WO (1) WO2001036940A2 (https=)

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US7530877B1 (en) * 1999-06-03 2009-05-12 Micron Technology, Inc. Semiconductor processor systems, a system configured to provide a semiconductor workpiece process fluid
US6290576B1 (en) 1999-06-03 2001-09-18 Micron Technology, Inc. Semiconductor processors, sensors, and semiconductor processing systems
US7180591B1 (en) * 1999-06-03 2007-02-20 Micron Technology, Inc Semiconductor processors, sensors, semiconductor processing systems, semiconductor workpiece processing methods, and turbidity monitoring methods
US6894778B2 (en) * 2002-04-23 2005-05-17 Hach Company Low detection limit turbidimeter
DE10225842A1 (de) * 2002-06-04 2003-12-24 Zeiss Carl Smt Ag Verfahren und Vorrichtung zur Bestimmung der Strahlungsbeständigkeit eines optischen Materials
CA2391641A1 (fr) * 2002-06-28 2003-12-28 Robert Longin Plateforme robotisee de cultures cellulaires en batteries de reacteurs miniaturises, equipee d'un systeme de mesure en temps reel de la turbidite cellulaire ou toutes autres proprietes optiques
WO2004036214A2 (en) * 2002-10-18 2004-04-29 Pfizer Products Inc. Automated kinetci solubility assay apparatus and method
US20040083798A1 (en) * 2002-11-05 2004-05-06 Sadar Michael J. Detection of filter breakthrough
US7099012B1 (en) * 2003-03-13 2006-08-29 Turner Designs, Inc. In-line spectrometer
US20060055927A1 (en) * 2004-09-16 2006-03-16 Rosemount Analytical Inc. Turbidity sensor
US20060061765A1 (en) * 2004-09-16 2006-03-23 Behzad Rezvani Turbidity sensor with improved noise rejection
US7301158B1 (en) 2004-12-15 2007-11-27 Turner Designs, Inc. Method and apparatus for measuring active fluorescence
US7470917B1 (en) 2004-12-15 2008-12-30 Turner Designs, Inc. Submersible apparatus for measuring active fluorescence
US8877507B2 (en) 2007-04-06 2014-11-04 Qiagen Gaithersburg, Inc. Ensuring sample adequacy using turbidity light scattering techniques
US8703492B2 (en) 2007-04-06 2014-04-22 Qiagen Gaithersburg, Inc. Open platform hybrid manual-automated sample processing system
US8355132B2 (en) * 2007-04-06 2013-01-15 Qiagen Gaithersburg, Inc. Sample adequacy measurement system having a plurality of sample tubes and using turbidity light scattering techniques
CN101809430A (zh) 2007-09-12 2010-08-18 哈赫公司 标准介质悬浮体、光学颗粒测量仪器、以及用于光学颗粒测量仪器的检定方法
KR100903133B1 (ko) * 2007-12-17 2009-06-16 한국전자통신연구원 광공동을 이용한 고감도 혼탁도 센서 및 센싱 방법
JP5152803B2 (ja) * 2008-09-24 2013-02-27 倉敷紡績株式会社 液体濃度計
US7659980B1 (en) 2008-11-24 2010-02-09 Herbert Leckie Mitchell Nephelometric turbidity sensor device
US20100220315A1 (en) * 2009-02-27 2010-09-02 Beckman Coulter, Inc. Stabilized Optical System for Flow Cytometry
KR20120012468A (ko) * 2009-04-15 2012-02-10 비오까르띠 에스아 ｒｔＰＣＲ 반응을 모니터링하기 위한 광학 검출 시스템
RU2442973C2 (ru) * 2009-10-02 2012-02-20 Закрытое акционерное общество "ИММУНОСКРИН" (ЗАО "ИММУНОСКРИН") Иммунотурбидиметрический планшетный анализатор
JP4948624B2 (ja) * 2010-05-06 2012-06-06 シャープ株式会社 濁度検知器
WO2015043675A1 (en) * 2013-09-30 2015-04-02 Hach Lange Gmbh Nephelometric turbidimeter and method for detection of the contamination of a sample cuvette of a nephelometric turbidimeter
WO2016205744A1 (en) * 2015-06-17 2016-12-22 Flodesign Sonics, Inc. Turbidity sensor with improved flow path

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5604590A (en) * 1994-09-08 1997-02-18 Hach Company Nephelometer instrument
EP0950892A2 (en) * 1998-04-17 1999-10-20 Labsystems Oy Device for measuring optical density

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Publication number Priority date Publication date Assignee Title
FR2323991A1 (fr) * 1975-09-11 1977-04-08 Inst Nat Sante Rech Med Perfectionnements aux appareils de mesure d'absorption du rayonnement notamment les photometres
JPS5389484A (en) * 1977-01-18 1978-08-07 Toshiba Electric Equip Photo detector
JPS5960323A (ja) * 1982-09-30 1984-04-06 Toshiba Corp 測光装置
JPS5970946A (ja) * 1982-10-15 1984-04-21 Toshiba Corp 吸光度測定装置
US4509856A (en) * 1982-11-16 1985-04-09 The United States Of America As Represented By The United States Department Of Energy Rotor for centrifugal fast analyzers
JPS59178337A (ja) * 1983-03-29 1984-10-09 Toshiba Corp 自動化学分析装置
FR2558610B1 (fr) * 1984-01-23 1986-05-09 Labo Electronique Physique Procede et appareillage pour determiner l'instant d'arret d'un processus de renouvellement de liquide
US4762413A (en) * 1984-09-07 1988-08-09 Olympus Optical Co., Ltd. Method and apparatus for measuring immunological reaction with the aid of fluctuation in intensity of scattered light
US4888484A (en) * 1986-02-20 1989-12-19 Automatik Machinery Corporation Apparatus and method for spectrophotometric analysis of a material in a moving process stream
JPH02259451A (ja) * 1989-03-30 1990-10-22 Shimadzu Corp 濁度計
JPH063266A (ja) * 1992-06-24 1994-01-11 Seki Electron Kk オゾン濃度測定方法および２光路セルを用いた光吸収式オゾン濃度計
JPH0915144A (ja) * 1995-07-03 1997-01-17 Toa Denpa Kogyo Kk 吸光光度計およびこの吸光光度計の温度補償方法
JPH10325797A (ja) * 1997-05-26 1998-12-08 Dainippon Screen Mfg Co Ltd 流体濃度測定装置
JPH11118715A (ja) * 1997-10-20 1999-04-30 Suido Kiko Kaisha Ltd 水質計および水質測定方法
ES2224347T3 (es) * 1998-05-01 2005-03-01 F. Hoffmann-La Roche Ag Aparato para controlar simultaneamente las reacciones que tienen lugaren una pluralidad de recipientes de reaccion.
US5912737A (en) * 1998-06-01 1999-06-15 Hach Company System for verifying the calibration of a turbidimeter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5604590A (en) * 1994-09-08 1997-02-18 Hach Company Nephelometer instrument
EP0950892A2 (en) * 1998-04-17 1999-10-20 Labsystems Oy Device for measuring optical density

Also Published As

Publication number Publication date
US20010046051A1 (en) 2001-11-29
KR20020063576A (ko) 2002-08-03
JP2003515124A (ja) 2003-04-22
CA2391979A1 (en) 2001-05-25
CA2391979C (en) 2006-12-19
EP1230534A2 (en) 2002-08-14
WO2001036940A3 (en) 2002-01-10
AU1603901A (en) 2001-05-30
WO2001036940A2 (en) 2001-05-25
US6307630B1 (en) 2001-10-23

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