JP2003289036A - Substrate treatment device - Google Patents

Substrate treatment device

Info

Publication number
JP2003289036A
JP2003289036A JP2002092462A JP2002092462A JP2003289036A JP 2003289036 A JP2003289036 A JP 2003289036A JP 2002092462 A JP2002092462 A JP 2002092462A JP 2002092462 A JP2002092462 A JP 2002092462A JP 2003289036 A JP2003289036 A JP 2003289036A
Authority
JP
Japan
Prior art keywords
substrate
liquid
roller
processing apparatus
transport roller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002092462A
Other languages
Japanese (ja)
Other versions
JP3987362B2 (en
Inventor
Mitsuaki Yoshitani
光明 芳谷
Nobuo Yanagisawa
暢生 柳沢
Koji Toyoda
浩司 豊田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP2002092462A priority Critical patent/JP3987362B2/en
Priority to KR10-2003-0017990A priority patent/KR100527307B1/en
Priority to TW092106948A priority patent/TWI225676B/en
Priority to CN031079911A priority patent/CN1448994B/en
Publication of JP2003289036A publication Critical patent/JP2003289036A/en
Application granted granted Critical
Publication of JP3987362B2 publication Critical patent/JP3987362B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67063Apparatus for fluid treatment for etching
    • H01L21/67075Apparatus for fluid treatment for etching for wet etching
    • H01L21/6708Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67706Mechanical details, e.g. roller, belt

Abstract

<P>PROBLEM TO BE SOLVED: To provide a device capable of preventing a carriage roller or the internal wall face of a treatment tank from being contaminated by a treatment solution containing solidification components at the time of treating a substrate by carrying the substrate in the treatment tank, and supplying the treatment solution to the substrate. <P>SOLUTION: A solution storage bat 12 is disposed immediately under a carriage roller 10 brought into contact with the lower face side of a substrate 1 for supporting and carrying the substrate, a developing solution is supplied to the solution storage bat, the solution storage bat is constantly filled with the developing solution 14, and a part of the peripheral face of the carriage roller is immersed in the developing solution filled in the solution storage bat. <P>COPYRIGHT: (C)2004,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は、フラットパネル
ディスプレイ用ガラス基板、半導体ウエハ、プリント基
板等の基板を1枚ずつ、並列して設置された複数の搬送
ローラによって支持し搬送しながら、基板に対し洗浄、
現像、エッチング、剥膜などの処理を施す基板処理装置
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a flat panel display glass substrate, a semiconductor wafer, a printed circuit board, and other substrates, each of which is supported and conveyed by a plurality of conveying rollers arranged in parallel. Wash against
The present invention relates to a substrate processing apparatus that performs processing such as development, etching, and film peeling.

【0002】[0002]

【従来の技術】例えば基板上に配線パターンを形成する
プロセスにおいて、基板の表面に形成されたフォトレジ
スト膜を現像する場合、基板を1枚ずつ横置きで搬送ロ
ーラによって搬送しつつ基板上に現像液を盛り、液盛り
してから所定時間が経過した後に現像反応を停止させる
方式のローラ搬送式現像処理装置が使用される。この現
像処理装置の概略構成の1例を図8に模式的に示す。
2. Description of the Related Art For example, in the process of forming a wiring pattern on a substrate, when developing a photoresist film formed on the surface of the substrate, the substrates are horizontally placed one by one and are developed on the substrate while being conveyed by a conveying roller. A roller-conveying type development processing apparatus is used in which the liquid is filled and the development reaction is stopped after a predetermined time has passed since the liquid was filled. FIG. 8 schematically shows an example of a schematic configuration of this developing processing apparatus.

【0003】図8に示した現像処理装置は、入口側開口
3aおよび出口側開口3bを有する処理槽2を備え、処
理槽2の内部には、複数の搬送ローラ4a、4b、4c
が並列して配設されている。そして、基板1は、入口側
開口3aを通って処理槽2内へ搬入され、搬送ローラ4
a〜4cにより支持されて水平方向へ搬送され、処理槽
2内から出口側開口3bを通って搬出されて、次の水洗
処理槽(図示せず)へ送られるようになっている。処理
槽2の内部の入口側開口3a付近には、現像液吐出ノズ
ル5が配設されている。また、処理槽2の内部の出口側
開口3bの付近には、搬送ローラ4cの直上に搬送ロー
ラ4cと対向するように、搬送ローラ4cに支持されて
搬送される基板1の上面側に接触する液切りローラ6が
配設されている。
The development processing apparatus shown in FIG. 8 includes a processing tank 2 having an inlet side opening 3a and an outlet side opening 3b, and inside the processing tank 2, a plurality of conveying rollers 4a, 4b, 4c.
Are arranged in parallel. Then, the substrate 1 is carried into the processing tank 2 through the entrance side opening 3a, and the carrying roller 4
It is supported by a to 4c and conveyed in the horizontal direction, carried out from the inside of the treatment tank 2 through the outlet side opening 3b, and sent to the next washing treatment tank (not shown). A developing solution discharge nozzle 5 is arranged near the inlet side opening 3 a inside the processing tank 2. Further, in the vicinity of the outlet side opening 3b inside the processing tank 2, the upper surface side of the substrate 1 supported and transported by the transport roller 4c is contacted so as to face the transport roller 4c immediately above the transport roller 4c. A liquid draining roller 6 is provided.

【0004】このような構成の現像処理装置において、
表面に露光済みのフォトレジスト膜が形成された基板1
は、処理槽2の入口側開口3a付近に配設された現像液
吐出ノズル5の直下位置を通過する際に、現像液吐出ノ
ズル5下端面のスリット状吐出口から吐出される現像液
7が表面上に盛られる。液盛りされた基板1は、搬送ロ
ーラ4a、4bによって搬送されている間にフォトレジ
スト膜の現像反応が進行する。基板1が処理槽2の出口
側開口3bの付近まで搬送されてくると、液切りローラ
6によって基板1上から現像液7が除去され、その後
に、処理槽2内から搬出される。そして、基板1は、次
の水洗処理槽へ送られて、フォトレジスト膜の現像反応
が完全に停止させられる。
In the developing processing apparatus having such a structure,
Substrate 1 having an exposed photoresist film formed on its surface
Is the amount of the developer 7 discharged from the slit-shaped discharge port on the lower end surface of the developer discharge nozzle 5 when passing through the position directly below the developer discharge nozzle 5 arranged near the inlet side opening 3a of the processing tank 2. It is laid on the surface. The development reaction of the photoresist film proceeds while the liquid-filled substrate 1 is being conveyed by the conveying rollers 4a and 4b. When the substrate 1 is conveyed to the vicinity of the outlet-side opening 3b of the processing tank 2, the developer 7 is removed from the substrate 1 by the liquid draining roller 6, and then, is discharged from the processing tank 2. Then, the substrate 1 is sent to the next water washing treatment tank to completely stop the development reaction of the photoresist film.

【0005】[0005]

【発明が解決しようとする課題】上記したような現像処
理装置において、基板1の表面上から現像液7、特にレ
ジストを含んだ現像液7がこぼれ落ちると、その現像液
が搬送ローラ4a〜4cの周面や処理槽2の内壁面等に
付着することになる。また、液切りローラ6の周面は、
レジストを含んだ現像液7が常に付着した状態となって
いる。それらの部材に付着した現像液が乾くと、レジス
ト分が固化して部材が汚染される。このため、パーティ
クルが発生して基板1を汚染したり、センサー等の機器
の誤動作を招く原因となったりする、といった問題を生
じることになる。一方、それらの問題が起こらないよう
にするには、処理槽2内部の清掃作業を頻繁に行う必要
があるが、処理効率の低下や作業の煩雑さを招くことに
なる。
In the development processing apparatus as described above, when the developing solution 7, especially the developing solution 7 containing the resist, spills from the surface of the substrate 1, the developing solution is transported by the conveying rollers 4a-4c. Will adhere to the peripheral surface of the substrate, the inner wall surface of the processing tank 2, and the like. The peripheral surface of the liquid draining roller 6 is
The developer 7 containing the resist is always attached. When the developer adhering to these members dries, the resist component solidifies and the members are contaminated. For this reason, there arises a problem that particles are generated to contaminate the substrate 1 or cause malfunction of equipment such as a sensor. On the other hand, in order to prevent these problems from occurring, it is necessary to frequently clean the inside of the processing tank 2, but this leads to a decrease in processing efficiency and complexity of the work.

【0006】なお、上記方式とは異なる方式、すなわ
ち、処理槽内にスプレイノズルを設置し、スプレイノズ
ルから現像液等を、処理槽の内部全体に拡散するように
ミスト状に噴出させる現像方式をとる場合には、搬送ロ
ーラや処理槽の内壁面、センサーなどの表面が現像液等
で常時濡れた状態となるため、固化したレジストによる
汚染が起こりにくくなり、上記した問題は生じにくい。
しかしながら、現像液等のミストが行き届きにくい個所
に搬送ローラなどが設置されている場合には、やはりレ
ジストを含んだ現像液による搬送ローラ等の汚染を生じ
ることになる。また、この方式は、基本的に、ミスト発
生を抑制する必要のあるプロセスでは採用することがで
きない。
A method different from the above method, that is, a developing method in which a spray nozzle is installed in the processing tank and a developing solution or the like is sprayed from the spray nozzle in the form of a mist so as to diffuse into the entire inside of the processing tank. In this case, since the surfaces of the conveying roller, the inner wall surface of the processing tank, the sensor, and the like are always wet with the developing solution or the like, contamination by the solidified resist is less likely to occur, and the above problems are less likely to occur.
However, when the transport roller or the like is installed at a place where the mist of the developer or the like is difficult to reach, the transport roller or the like is also contaminated by the developer containing the resist. Further, this method cannot be basically adopted in a process that needs to suppress mist generation.

【0007】この発明は、以上のような事情に鑑みてな
されたものであり、処理槽内において基板を搬送しつつ
基板に対し処理液を供給して基板の処理を行う場合に、
固化成分を含んだ処理液によって搬送ローラや処理槽の
内壁面などが汚染されることを防止することができ、基
板の汚染や機器の誤動作などを防ぐことができる基板処
理装置を提供することを目的とする。
The present invention has been made in view of the above circumstances, and when a substrate is transported in a processing tank and a processing liquid is supplied to the substrate to process the substrate,
To provide a substrate processing apparatus capable of preventing the transfer roller, the inner wall surface of a processing tank, and the like from being contaminated by a processing liquid containing a solidified component, and preventing contamination of a substrate, malfunction of equipment, and the like. To aim.

【0008】[0008]

【課題を解決するための手段】請求項1に係る発明は、
処理槽内において基板を搬送しつつ基板を処理液で処理
する基板処理装置において、基板の下面側に接触し基板
を支持して搬送する搬送ローラの直下に液溜め容器を配
設し、その液溜め容器内へ湿潤用液を供給して液溜め容
器内を常に湿潤用液で満たす液供給手段を備え、前記液
溜め容器内に満たされた湿潤用液中に前記搬送ローラの
周面の一部を浸漬させておくことを特徴とする。
The invention according to claim 1 is
In a substrate processing apparatus for processing a substrate with a processing liquid while transporting the substrate in a processing tank, a liquid storage container is arranged immediately below a transport roller that contacts the lower surface of the substrate and supports and transports the substrate. A liquid supply means is provided for supplying a wetting liquid into the storage container to constantly fill the liquid storage container with the wetting liquid, and one of the peripheral surfaces of the conveying rollers is filled with the wetting liquid filled in the liquid storage container. It is characterized in that the part is immersed.

【0009】請求項2に係る発明は、処理槽内において
基板を搬送しつつ基板を処理液で処理する基板処理装置
において、基板の下面側に接触し基板を支持して搬送す
る搬送ローラに近接しかつ搬送ローラによって支持され
る基板の高さ位置より下方に、吐出口が搬送ローラと対
向するように液吐出手段を配設し、その液吐出手段へ湿
潤用液を供給する液供給手段を備えたことを特徴とす
る。
According to a second aspect of the present invention, in a substrate processing apparatus for processing a substrate with a processing liquid while transporting the substrate in a processing tank, the substrate is in contact with a lower surface side of the substrate and is close to a transportation roller for supporting and transporting the substrate. Liquid discharge means is disposed below the height position of the substrate supported by the transport roller so that the discharge port faces the transport roller, and liquid supply means for supplying the wetting liquid to the liquid discharge means is provided. It is characterized by having.

【0010】請求項3に係る発明は、処理槽内において
基板を搬送しつつ基板を処理液で処理する基板処理装置
において、基板の下面側に接触し基板を支持して搬送す
る搬送ローラの近傍であって搬送ローラによって支持さ
れる基板の高さ位置より下方に、前記搬送ローラの直上
に搬送ローラと対向するように配設され搬送ローラに支
持されて搬送される基板の上面側に接触する上部ローラ
と吐出口が対向するように液吐出手段を配設し、その液
吐出手段へ湿潤用液を供給する液供給手段を備えたこと
を特徴とする。
According to a third aspect of the present invention, in a substrate processing apparatus for processing a substrate with a processing liquid while transporting the substrate in a processing tank, the vicinity of a transportation roller that contacts the lower surface of the substrate and supports and transports the substrate. Is disposed below the height position of the substrate supported by the transport roller, directly above the transport roller so as to face the transport roller, and is in contact with the upper surface side of the substrate supported and transported by the transport roller. The liquid ejecting means is arranged so that the upper roller and the ejection opening face each other, and the liquid ejecting means is provided with a liquid supplying means for supplying the wetting liquid.

【0011】請求項4に係る発明は、請求項3記載の基
板処理装置において、前記搬送ローラおよび前記上部ロ
ーラを上方位置と下方位置との間で移動可能に支持し、
前記液吐出手段は、搬送ローラおよび上部ローラが上方
に位置したときに、搬送ローラによって支持される基板
の高さ位置より下方に位置するように配設され、搬送ロ
ーラおよび上部ローラが下方に位置したときには、前記
搬送ローラが、それより基板の搬送方向における上流側
に配設された別の搬送ローラと同じ高さに位置するとと
もに、搬送ローラおよび上部ローラに基板が接触しない
ように制御されることを特徴とする。
According to a fourth aspect of the present invention, in the substrate processing apparatus according to the third aspect, the carrying roller and the upper roller are movably supported between an upper position and a lower position,
The liquid discharging means is arranged so as to be located below the height position of the substrate supported by the carrying roller when the carrying roller and the upper roller are located above, and the carrying roller and the upper roller are located below. In this case, the carrying roller is positioned at the same height as another carrying roller arranged upstream of the carrying roller in the carrying direction, and is controlled so that the board does not come into contact with the carrying roller and the upper roller. It is characterized by

【0012】請求項5に係る発明は、請求項4記載の基
板処理装置において、前記搬送ローラおよび前記上部ロ
ーラを、搬送ローラの軸心線の延長線上の一点を中心と
して鉛直面内で揺動するように支持して、傾斜姿勢とな
る上方位置と水平姿勢となる下方位置との間で移動させ
ることを特徴とする。
According to a fifth aspect of the present invention, in the substrate processing apparatus according to the fourth aspect, the conveying roller and the upper roller are swung within a vertical plane about a point on an extension of the axis line of the conveying roller. It is supported so that it is moved between an upper position which is an inclined posture and a lower position which is a horizontal posture.

【0013】請求項6に係る発明は、請求項4または請
求項5記載の基板処理装置において、前記搬送ローラと
前記上部ローラとが液切りローラであり、その液切りロ
ーラと前記別の搬送ローラとの間に、液切りローラと一
体的に上方位置と下方位置との間を移動するように支持
され基板の下面側に接触し基板を支持して搬送する複数
の搬送ローラを配設したことを特徴とする。
According to a sixth aspect of the present invention, in the substrate processing apparatus according to the fourth or fifth aspect, the conveying roller and the upper roller are liquid draining rollers, and the liquid draining roller and the another transporting roller. And a plurality of transport rollers that are supported so as to move integrally between the liquid draining roller and an upper position and a lower position and contact the lower surface side of the substrate to support and transport the substrate. Is characterized by.

【0014】請求項7に係る発明は、請求項2ないし請
求項6のいずれかに記載の基板処理装置において、前記
液供給手段は、その吐出口から前記搬送ローラに向けて
吐出された湿潤用液が液撥ねによって飛散しない程度の
低圧で前記液吐出手段へ湿潤用液を供給することを特徴
とする。
According to a seventh aspect of the present invention, in the substrate processing apparatus according to any one of the second to sixth aspects, the liquid supply means is for wetting and is discharged from the discharge port toward the transport roller. It is characterized in that the wetting liquid is supplied to the liquid discharging means at a low pressure such that the liquid does not scatter due to splashing of the liquid.

【0015】請求項8に係る発明は、請求項2ないし請
求項7のいずれかに記載の基板処理装置において、基板
を搬送して基板を処理している期間中において、前記搬
送ローラが基板の下面側と接触していないときに前記液
吐出手段の吐出口から湿潤用液を吐出し搬送ローラが基
板の下面側と接触しているときには液吐出手段の吐出口
から湿潤用液を吐出しないように、前記液供給手段から
液吐出手段へ間欠的に湿潤用液を供給するようにするこ
とを特徴とする。
According to an eighth aspect of the present invention, in the substrate processing apparatus according to any one of the second to seventh aspects, during the period in which the substrate is being transported and the substrate is being processed, the transport roller is the substrate. Do not discharge the wetting liquid from the discharge port of the liquid discharge means when not in contact with the lower surface side, and do not discharge the wetting liquid from the discharge port of the liquid discharge means when the transport roller is in contact with the lower surface side of the substrate. In addition, the wetting liquid is intermittently supplied from the liquid supply unit to the liquid discharge unit.

【0016】請求項9に係る発明は、請求項2ないし請
求項8のいずれかに記載の基板処理装置において、基板
を搬送していない期間中において、前記液供給手段から
前記液吐出手段へ一定時間ごとに間欠的に湿潤用液を供
給するようにすることを特徴とする。
According to a ninth aspect of the present invention, in the substrate processing apparatus according to any one of the second to eighth aspects, during the period in which the substrate is not being transported, the liquid is constantly supplied from the liquid supply means to the liquid discharge means. It is characterized in that the wetting liquid is intermittently supplied every time.

【0017】請求項10に係る発明は、処理槽内におい
て基板を搬送しつつ基板を処理液で処理する基板処理装
置において、前記処理槽の傾斜した内底面上へ湿潤用液
を吐出する液吐出手段を、内底面の傾斜方向上部に配設
し、その液吐出手段へ湿潤用液を供給する液供給手段を
備えたことを特徴とする。
According to a tenth aspect of the present invention, in a substrate processing apparatus for processing a substrate with a processing liquid while transporting the substrate in the processing tank, a liquid discharge for discharging a wetting liquid onto an inclined inner bottom surface of the processing tank. The means is disposed above the inner bottom surface in the direction of inclination, and liquid supply means for supplying the wetting liquid to the liquid discharge means is provided.

【0018】請求項1に係る発明の基板処理装置におい
ては、液供給手段から液溜め容器内へ湿潤用液が供給さ
れて、液溜め容器内が常に湿潤用液で満たされ、その液
溜め容器内に満たされた湿潤用液中に搬送ローラの周面
の一部が浸漬させられる。これにより、搬送ローラの周
面は湿潤用液で常時濡れた状態となる。このため、基板
の表面上から処理液、例えばレジストを含んだ現像液が
こぼれ落ちて搬送ローラの周面に付着しても、現像液は
乾くことがないので、レジスト分が固化することはなく
なる。したがって、固化したレジストによって搬送ロー
ラが汚染される、といったことが避けられる。また、液
溜め容器内に満たされた湿潤用液中に搬送ローラが浸漬
させられるだけであるので、液撥ねの起こる心配が無
い。したがって、例えばレジストを含有した現像液を循
環させつつ湿潤用液として再利用するような場合であっ
ても、液撥ねにより、レジスト含有現像液が基板に付着
して基板を汚染したり、レジスト含有現像液がセンサー
等の機器に付着して誤動作を招いたりする、といったこ
とがない。
In the substrate processing apparatus according to the first aspect of the present invention, the wetting liquid is supplied from the liquid supply means into the liquid reservoir and the liquid reservoir is constantly filled with the wetting liquid. A part of the peripheral surface of the conveying roller is immersed in the wetting liquid filled therein. As a result, the peripheral surface of the transport roller is always wet with the wetting liquid. For this reason, even if a processing solution, for example, a developing solution containing a resist spills from the surface of the substrate and adheres to the peripheral surface of the conveying roller, the developing solution does not dry, so that the resist component does not solidify. Therefore, it is possible to prevent the transport roller from being contaminated by the solidified resist. Further, since the conveying roller is only immersed in the wetting liquid filled in the liquid reservoir, there is no fear of liquid splashing. Therefore, for example, even when the developer containing the resist is circulated and reused as the wetting liquid, the resist-containing developer adheres to the substrate due to liquid splashing to contaminate the substrate, There is no possibility that the developing solution adheres to devices such as sensors and causes malfunction.

【0019】請求項2に係る発明の基板処理装置におい
ては、液吐出手段の吐出口から搬送ローラに向かって湿
潤用液が吐出されることにより、搬送ローラは湿潤用液
で常時濡れた状態となる。このため、基板の表面上から
処理液、例えばレジストを含んだ現像液がこぼれ落ちて
搬送ローラに付着しても、現像液は乾くことがないの
で、レジスト分が固化することはなくなる。したがっ
て、固化したレジストによって搬送ローラが汚染され
る、といったことが避けられる。また、液吐出手段は搬
送ローラに近接して配設されているので、液撥ねが生じ
にくく、湿潤用液が広範囲に飛散することはない。した
がって、例えばレジストを含有した現像液を循環させつ
つ湿潤用液として再利用するような場合であっても、液
撥ねにより、レジスト含有現像液が基板に付着して基板
を汚染したり、レジスト含有現像液がセンサー等の機器
に付着して誤動作を招いたりする、といったことがな
い。また、液吐出手段が基板の高さ位置より下方に配設
されているので、液吐出手段の吐出口からレジスト含有
現像液がぼた落ちしたとしても、現像液が基板上に付着
することはない。
In the substrate processing apparatus according to the second aspect of the present invention, the wetting liquid is discharged from the discharge port of the liquid discharging means toward the conveying roller, so that the conveying roller is always wet with the wetting liquid. Become. Therefore, even if the processing liquid, for example, the developing liquid containing the resist spills from the surface of the substrate and adheres to the conveying roller, the developing liquid does not dry, and the resist component does not solidify. Therefore, it is possible to prevent the transport roller from being contaminated by the solidified resist. Further, since the liquid ejecting means is arranged in the vicinity of the conveying roller, liquid splashing is unlikely to occur, and the wetting liquid does not scatter in a wide range. Therefore, for example, even when the developer containing the resist is circulated and reused as the wetting liquid, the resist-containing developer adheres to the substrate due to liquid splashing to contaminate the substrate, There is no possibility that the developing solution adheres to devices such as sensors and causes malfunction. Further, since the liquid ejecting means is disposed below the height position of the substrate, even if the resist-containing developing solution spills from the ejection port of the liquid ejecting means, the developing solution does not adhere to the substrate. Absent.

【0020】請求項3に係る発明の基板処理装置におい
ては、液吐出手段の吐出口から搬送ローラの直上に配設
された上部ローラに向かって湿潤用液が吐出されること
により、上部ローラは湿潤用液で常時濡れた状態となる
とともに、上部ローラの周面を伝って湿潤用液が搬送ロ
ーラの周面へ流下することにより、搬送ローラも湿潤用
液で常時濡れた状態となる。このため、基板の上面側に
接触する上部ローラに処理液、例えばレジストを含んだ
現像液が付着しても、また、基板の表面上から現像液が
こぼれ落ちて搬送ローラに付着しても、現像液は乾くこ
とがないので、レジスト分が固化することはなくなる。
したがって、固化したレジストによって上部ローラおよ
び搬送ローラが汚染される、といったことが避けられ
る。また、液吐出手段は搬送ローラの近傍に配設されて
いるので、液撥ねが生じにくく、湿潤用液が広範囲に飛
散することはない。したがって、例えばレジストを含有
した現像液を循環させつつ湿潤用液として再利用するよ
うな場合であっても、液撥ねにより、レジスト含有現像
液が基板に付着して基板を汚染したり、レジスト含有現
像液がセンサー等の機器に付着して誤動作を招いたりす
る、といったことがない。また、液吐出手段が基板の高
さ位置より下方に配設されているので、液吐出手段の吐
出口からレジスト含有現像液がぼた落ちしたとしても、
現像液が基板上に付着することはない。
In the substrate processing apparatus according to the third aspect of the present invention, the wetting liquid is discharged from the discharge port of the liquid discharge means toward the upper roller arranged immediately above the carrying roller, whereby the upper roller is While being constantly wet with the wetting liquid, the wetting liquid flows down along the peripheral surface of the upper roller to the peripheral surface of the conveying roller, so that the conveying roller is also constantly wet with the wetting liquid. Therefore, even if the processing solution, for example, the developing solution containing the resist adheres to the upper roller contacting the upper surface side of the substrate, or the developing solution spills from the surface of the substrate and adheres to the transport roller, Since the liquid does not dry, the resist does not solidify.
Therefore, it is possible to prevent the upper roller and the transport roller from being contaminated by the solidified resist. Further, since the liquid ejecting means is arranged in the vicinity of the conveying roller, liquid splash does not easily occur and the wetting liquid does not scatter in a wide range. Therefore, for example, even when the developer containing the resist is circulated and reused as the wetting liquid, the resist-containing developer adheres to the substrate due to liquid splashing to contaminate the substrate, There is no possibility that the developing solution adheres to devices such as sensors and causes malfunction. Further, since the liquid ejecting means is arranged below the height position of the substrate, even if the resist-containing developing solution spills from the ejection port of the liquid ejecting means,
The developing solution does not adhere to the substrate.

【0021】請求項4に係る発明の基板処理装置では、
搬送ローラおよび上部ローラが上方に位置したときに、
液吐出手段が基板の高さ位置より下方に位置するので、
液吐出手段の吐出口から処理液、例えばレジストを含ん
だ現像液がぼた落ちしたとしても、現像液が基板上に付
着することはない。一方、搬送ローラおよび上部ローラ
が下方に位置したときには、搬送ローラおよび上部ロー
ラに基板が接触しないので、液吐出手段の吐出口からレ
ジスト含有現像液がぼた落ちしたとしても、現像液が基
板上に付着する心配が無い。
In the substrate processing apparatus of the invention according to claim 4,
When the transport roller and upper roller are located above,
Since the liquid discharge means is located below the height position of the substrate,
Even if the processing solution, for example, the developing solution containing the resist drops out from the ejection port of the liquid ejecting means, the developing solution does not adhere to the substrate. On the other hand, when the transport roller and the upper roller are located below, the substrate does not come into contact with the transport roller and the upper roller. Therefore, even if the resist-containing developer spills from the discharge port of the liquid discharge means, the developer remains on the substrate. No need to worry about sticking to.

【0022】請求項5に係る発明の基板処理装置では、
搬送ローラおよび上部ローラは、搬送ローラの軸心線の
延長線上の一点を中心として鉛直面内で揺動することに
より、上方位置と下方位置との間を移動する。そして、
上方位置においては搬送ローラおよび上部ローラが傾斜
姿勢となるので、搬送ローラによって支持される基板も
傾斜し、このため、基板の表面上から処理液が流れ落ち
る。
In the substrate processing apparatus of the invention according to claim 5,
The transport roller and the upper roller move between the upper position and the lower position by swinging in the vertical plane about a point on the extension line of the axis line of the transport roller. And
Since the transport roller and the upper roller are inclined at the upper position, the substrate supported by the transport roller is also inclined, so that the processing liquid flows down from the surface of the substrate.

【0023】請求項6に係る発明の基板処理装置では、
液切りローラにより、搬送ローラによって支持され搬送
されてきた基板から処理液、例えばレジストを含んだ現
像液が除去され、その際に液切りローラの周面にレジス
ト含有現像液が付着しても、液切りローラは湿潤用液で
常時濡れた状態とされるので、現像液は乾くことがな
く、このため、液切りローラの周面でレジスト分が固化
することはなくなる。
In the substrate processing apparatus of the invention according to claim 6,
The liquid removing roller removes the processing liquid, for example, the developing solution containing the resist from the substrate supported and conveyed by the conveying roller, and the resist-containing developing solution adheres to the peripheral surface of the liquid removing roller at that time, Since the liquid draining roller is kept wet with the wetting liquid at all times, the developing liquid does not dry, so that the resist component does not solidify on the peripheral surface of the liquid draining roller.

【0024】請求項7に係る発明の基板処理装置では、
液供給手段から液吐出手段へは、液吐出手段の吐出口か
ら搬送ローラに向けて吐出された湿潤用液が液撥ねによ
って飛散しない程度の低圧で湿潤用液が供給されるの
で、液撥ねがより生じにくく、湿潤用液が広範囲に飛散
することはない。
In the substrate processing apparatus of the invention according to claim 7,
Since the wetting liquid is supplied from the liquid supply means to the liquid discharge means at a low pressure such that the wetting liquid discharged from the discharge port of the liquid discharge means toward the transport roller is not scattered by the liquid splash, the liquid splash does not occur. It is less likely to occur and the wetting liquid does not scatter in a wide range.

【0025】請求項8に係る発明の基板処理装置では、
基板を搬送して基板を処理している期間中において、搬
送ローラが基板の下面側と接触していないときに液吐出
手段の吐出口から湿潤用液が吐出され、搬送ローラが基
板の下面側と接触しているときには液吐出手段の吐出口
から湿潤用液が吐出されないので、例えばレジストを含
有した現像液を循環させつつ湿潤用液として再利用する
ような場合に、液吐出手段の吐出口から吐出されたレジ
スト含有現像液が基板に付着して基板を汚染する、とい
った心配が無い。
In the substrate processing apparatus of the invention according to claim 8,
During the period in which the substrate is transported and the substrate is processed, the wetting liquid is discharged from the discharge port of the liquid discharging means when the transport roller is not in contact with the lower surface side of the substrate, and the transport roller is the lower surface side of the substrate. Since the wetting liquid is not discharged from the discharge port of the liquid discharge means when it is in contact with the liquid discharge device, the discharge port of the liquid discharge means is used, for example, when the developer containing the resist is circulated and reused as the wetting liquid. There is no concern that the resist-containing developing solution discharged from the substrate adheres to the substrate and contaminates the substrate.

【0026】請求項9に係る発明の基板処理装置では、
基板を搬送していない期間中において、液供給手段から
液吐出手段へ一定時間ごとに間欠的に湿潤用液が供給さ
れるので、搬送ローラまたは上部ローラおよび搬送ロー
ラは湿潤用液で濡れた状態に保たれるとともに、湿潤用
液の使用量が低減される。
In the substrate processing apparatus of the invention according to claim 9,
While the substrate is not being transported, the wetting liquid is intermittently supplied from the liquid supplying means to the liquid discharging means at regular intervals, so that the transport roller or the upper roller and the transport roller are wet with the wetting liquid. The amount of the wetting liquid used is reduced.

【0027】請求項10に係る発明の基板処理装置にお
いては、液吐出手段から処理槽の内底面の傾斜方向上部
へ湿潤用液が吐出され、その吐出された湿潤用液は内底
面の傾斜に沿って内底面上を流下するので、内底面の全
体が湿潤用液で常時濡れた状態となる。このため、基板
の表面上から処理液、例えばレジストを含んだ現像液が
内底面上にこぼれ落ちても、現像液は乾くことがないの
で、レジスト分が固化することはなくなる。したがっ
て、固化したレジストによって処理槽の内底面が汚染さ
れる、といったことが避けられる。
In the substrate processing apparatus of the tenth aspect of the present invention, the wetting liquid is discharged from the liquid discharging means to the upper portion of the inner bottom surface of the processing tank in the inclined direction, and the discharged wetting liquid is inclined to the inner bottom surface. Since it flows down along the inner bottom surface, the entire inner bottom surface is always wet with the wetting liquid. Therefore, even if a processing solution, for example, a developing solution containing a resist spills on the inner bottom surface from the surface of the substrate, the developing solution does not dry, so that the resist component does not solidify. Therefore, it can be avoided that the inner bottom surface of the processing tank is contaminated by the solidified resist.

【0028】[0028]

【発明の実施の形態】以下、この発明の好適な実施形態
について図1ないし図7を参照しながら説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT A preferred embodiment of the present invention will be described below with reference to FIGS.

【0029】図1は、第1の発明の実施形態の1例を示
し、基板処理装置、例えば現像処理装置の構成要素の1
つである搬送ローラの1つを一部断面で示す側面図であ
る。現像処理装置の全体の構成については、図8に基づ
いて上述したので、その説明を省略するが、図1に示す
搬送ローラ10は、図8に示した現像処理装置の複数の
搬送ローラ4a〜4cのうち、処理槽2の中間辺りに配
置された搬送ローラ4bに対応するものである。
FIG. 1 shows an example of an embodiment of the first invention, which is one of the components of a substrate processing apparatus, for example, a development processing apparatus.
It is a side view which shows one of the conveyance rollers which are two in a partial cross section. The overall configuration of the development processing apparatus has been described above with reference to FIG. 8, and thus description thereof will be omitted. However, the conveyance roller 10 illustrated in FIG. 1 includes the plurality of conveyance rollers 4a to 4a of the development processing apparatus illustrated in FIG. 4c, which corresponds to the transport roller 4b arranged near the middle of the processing tank 2.

【0030】搬送ローラ10は、その周面が基板1の下
面側の幅方向全体にわたって接触する円柱状をなしてい
る。この搬送ローラ10は、基板1を支持して搬送する
とともに、基板1の下面側の幅方向全体にわたって接触
しつつ回転することにより基板の下面側を洗浄する機能
を有している。搬送ローラ10の直下には、液溜めバッ
ト12が配設されている。液溜めバット12内には、液
供給源から供給される湿潤用液、例えば基板1の表面上
から処理槽底部に流下して回収タンク(図示せず)に回
収され回収タンクから送液される現像液14が収容され
ている。液溜めバット12内へは、連続して現像液が供
給されており、液溜めバット12内は常に現像液14で
満たされた状態であり、液溜めバット12の上部から溢
れ出た現像液は回収されて循環使用される。そして、液
溜めバット12内に満たされた現像液14中に搬送ロー
ラ10の周面の一部が浸漬させられている。
The conveying roller 10 has a cylindrical shape whose peripheral surface is in contact with the entire lower surface of the substrate 1 in the width direction. The transport roller 10 has a function of supporting and transporting the substrate 1, and rotating the substrate 1 while contacting the entire lower surface of the substrate 1 in the width direction to clean the lower surface of the substrate. A liquid reservoir vat 12 is disposed immediately below the transport roller 10. In the liquid reservoir vat 12, a wetting liquid supplied from a liquid supply source, for example, flows down from the surface of the substrate 1 to the bottom of the processing tank, is collected in a recovery tank (not shown), and is sent from the recovery tank. A developer 14 is contained. The developer is continuously supplied into the liquid reservoir vat 12, and the liquid reservoir vat 12 is always filled with the developer 14, and the developer overflowing from the upper part of the liquid reservoir vat 12 is It is collected and reused. Then, a part of the peripheral surface of the transport roller 10 is immersed in the developer 14 filled in the liquid reservoir vat 12.

【0031】図1に示した構成を備えた装置では、液溜
めバット12内に満たされた現像液14中に搬送ローラ
10の周面の一部が浸漬させられるので、搬送ローラ1
0の周面は現像液14で常時濡れた状態となる。このた
め、基板1の表面上からレジストを含んだ現像液がこぼ
れ落ちて搬送ローラ10の周面に付着しても、搬送ロー
ラ10の周面で現像液が乾いてレジスト分が固化する、
といったことはなくなる。したがって、固化したレジス
トによる搬送ローラ10の汚染の心配が無くなる。ま
た、液溜めバット12内に満たされた現像液14中に搬
送ローラ10が浸漬させられるだけであるので、液撥ね
を生じる恐れは無い。したがって、液撥ねにより、レジ
ストを含有した現像液が基板1に付着して基板1を汚染
したり、レジスト含有現像液がセンサー等の機器に付着
して誤動作を招いたりする、といったことは起こらな
い。
In the apparatus having the structure shown in FIG. 1, since a part of the peripheral surface of the carrying roller 10 is immersed in the developer 14 filled in the liquid reservoir vat 12, the carrying roller 1
The peripheral surface of 0 is always wet with the developer 14. Therefore, even if the developer containing the resist spills from the surface of the substrate 1 and adheres to the peripheral surface of the transport roller 10, the developer is dried on the peripheral surface of the transport roller 10 and the resist is solidified.
There is no such thing. Therefore, there is no fear of the transport roller 10 being contaminated by the solidified resist. Further, since the transport roller 10 is only immersed in the developer 14 filled in the liquid reservoir vat 12, there is no risk of liquid splashing. Therefore, the liquid splash does not cause the developer containing the resist to adhere to the substrate 1 to contaminate the substrate 1 or the developer containing the resist to adhere to devices such as sensors to cause malfunction. .

【0032】次に、図2は、第2の発明の実施形態の1
例を示し、現像処理装置の構成要素の1つである搬送ロ
ーラの1つを示す側面図である。この図2に示す搬送ロ
ーラ16は、図8に示した現像処理装置の複数の搬送ロ
ーラ4a〜4cのうち、処理槽2の中間辺りおよび出口
側開口3b付近にそれぞれ配置された搬送ローラ4b、
4cを除いた大部分の搬送ローラ4aに対応するもので
ある。
Next, FIG. 2 shows a first embodiment of the second invention.
FIG. 3 is a side view showing an example and one of the transport rollers that is one of the components of the development processing apparatus. The carrying roller 16 shown in FIG. 2 is, among the plurality of carrying rollers 4a to 4c of the developing processing apparatus shown in FIG. 8, a carrying roller 4b disposed near the middle of the processing tank 2 and near the outlet side opening 3b, respectively.
It corresponds to most of the transport rollers 4a except 4c.

【0033】搬送ローラ16は、円板形であって、回転
支軸18の両端部に一対固着され、あるいは回転支軸1
8に複数個、例えば回転支軸18の両端部および中央部
に3個固着されている。そして、この搬送ローラ16に
近接した位置であって搬送ローラ16で支持される基板
1の高さ位置より下方の位置に、吐出口22が搬送ロー
ラ16と対向するように液吐出ノズル20が配設されて
いる。液吐出ノズル20には、例えば基板1の表面上か
ら処理槽底部に流下して回収タンクに回収された現像液
が回収タンクから供給されている。このとき、液吐出ノ
ズル20へ現像液を供給する圧力は、吐出口22から搬
送ローラ16に向けて吐出された現像液14が液撥ねに
よって飛散しない程度の低圧に設定される。
The conveying rollers 16 are disc-shaped and are fixed to each end of the rotary support shaft 18 as a pair, or the rotary support shaft 1
A plurality of them, for example, three are fixed to both ends and the center of the rotary support shaft 18. The liquid discharge nozzle 20 is arranged at a position close to the transport roller 16 and below the height position of the substrate 1 supported by the transport roller 16 so that the discharge port 22 faces the transport roller 16. It is set up. To the liquid discharge nozzle 20, for example, the developer that has flowed down from the surface of the substrate 1 to the bottom of the processing tank and is collected in the collection tank is supplied from the collection tank. At this time, the pressure for supplying the developing solution to the solution discharge nozzle 20 is set to a low pressure such that the developing solution 14 discharged from the discharge port 22 toward the transport roller 16 does not scatter due to splashing of the liquid.

【0034】液吐出ノズル20の吐出口22から搬送ロ
ーラ16に向けての現像液14の吐出は、基板1を搬送
しつつ処理している期間中においては、搬送ローラ16
が基板1の下面側と接触しておらず、かつ、基板1がそ
の搬送ローラ16の近傍にも存在していないときに行
い、搬送ローラ16が基板1の下面側と接触していると
きや近傍に基板1が存在しているときには液吐出ノズル
20の吐出口22から現像液を吐出しないようにする。
このように現像液の吐出を間欠的に行うことにより、レ
ジストを含有した現像液を循環させつつ再利用するよう
な場合に、液吐出ノズル20の吐出口22から吐出され
たレジスト含有現像液やその飛沫が基板1に付着して基
板1を汚染する恐れを無くすことができる。一方、基板
1を搬送していない期間中においては、液吐出ノズル2
0の吐出口22から搬送ローラ16に向けての現像液1
4の吐出は、一定時間ごとに間欠的に行うようにする。
このように現像液の吐出を一定時間ごとに間欠的に行う
ことにより、基板1の処理を行っていない間も搬送ロー
ラ16を濡れた状態に保ってレジスト分の固化を防ぐこ
とができるとともに、現像液の使用量を低減することが
できる。
The discharge of the developing solution 14 from the discharge port 22 of the liquid discharge nozzle 20 toward the conveying roller 16 is performed while the substrate 1 is being conveyed and processed.
Is not in contact with the lower surface side of the substrate 1 and the substrate 1 is not present in the vicinity of the transport roller 16 either, and when the transport roller 16 is in contact with the lower surface side of the substrate 1. When the substrate 1 is present in the vicinity, the developing solution is not ejected from the ejection port 22 of the liquid ejection nozzle 20.
By intermittently discharging the developing solution in this manner, when the developing solution containing the resist is circulated and reused, the resist-containing developing solution discharged from the discharge port 22 of the solution discharge nozzle 20 or It is possible to eliminate the risk that the droplets adhere to the substrate 1 and contaminate the substrate 1. On the other hand, while the substrate 1 is not being transported, the liquid discharge nozzle 2
Developing solution 1 from the discharge port 22 of 0 toward the conveying roller 16
The discharge of No. 4 is intermittently performed at regular intervals.
By intermittently discharging the developing solution at regular intervals in this manner, it is possible to prevent the solidification of the resist by keeping the transport roller 16 in a wet state even when the substrate 1 is not processed. The amount of developer used can be reduced.

【0035】図2に示した構成を備えた装置では、液吐
出ノズル20の吐出口22から搬送ローラ16に向かっ
て現像液14が吐出されることにより、搬送ローラ16
は現像液14で常時濡れた状態となる。このため、基板
1の表面上から、例えばレジストを含んだ現像液がこぼ
れ落ちて搬送ローラ16に付着しても、現像液は乾くこ
とがないので、レジスト分は固化しなくなる。したがっ
て、固化したレジストによって搬送ローラ16が汚染さ
れる、といったことが防止される。また、液吐出ノズル
20の吐出口22からは現像液14が低圧で吐出され、
かつ、搬送ローラ16の近接位置から搬送ローラ16に
向かって現像液14が吐出されるので、液撥ねが生じに
くく、現像液14が広範囲に飛散することはない。した
がって、レジストを含有した現像液を循環させつつ再利
用するような場合であっても、レジスト含有現像液が液
撥ねによって基板1を汚染したりセンサー等の機器に付
着して誤動作を招いたりする、といったことがない。ま
た、液吐出ノズル20は、基板1の高さ位置より下方に
配設されているので、吐出口22からレジスト含有現像
液がぼた落ちしたとしても、その現像液が基板1上に付
着する心配は無い。
In the apparatus having the structure shown in FIG. 2, the developing solution 14 is discharged from the discharge port 22 of the liquid discharge nozzle 20 toward the conveying roller 16, whereby the conveying roller 16 is discharged.
Is always wet with the developer 14. For this reason, even if, for example, a developer containing a resist spills from the surface of the substrate 1 and adheres to the transport roller 16, the developer does not dry, and the resist does not solidify. Therefore, it is possible to prevent the transport roller 16 from being contaminated by the solidified resist. Further, the developing solution 14 is discharged from the discharge port 22 of the liquid discharge nozzle 20 at a low pressure,
Moreover, since the developing solution 14 is ejected from the position close to the carrying roller 16 toward the carrying roller 16, liquid splash hardly occurs and the developing solution 14 does not spread over a wide range. Therefore, even when the developer containing resist is circulated and reused, the developer containing resist may contaminate the substrate 1 due to splashing of liquid or adhere to devices such as sensors to cause malfunction. There is no such thing. Further, since the liquid discharge nozzle 20 is arranged below the height position of the substrate 1, even if the resist-containing developer is dropped from the discharge port 22, the developer adheres to the substrate 1. Don't worry.

【0036】また、図3は、第2の発明の別の実施形態
を示す搬送ローラの側面図である。この図3に示した実
施形態では、液吐出ノズル20の吐出口22が斜め下向
きに設置されている。図2に示した実施形態のように、
吐出口22が上向きとなるように液吐出ノズル20を配
置すると、吐出口22からの液吐出を停止させた時に吐
出口22から液がぼた落ちする心配が無くなるのに対
し、図3に示した実施形態では、吐出口22から液がぼ
た落ちする可能性がある。ただし、液吐出ノズル20
は、二点鎖線Lで示す基板1の高さ位置より下方に配設
されているので、吐出口22からぼた落ちしたレジスト
含有現像液が基板1上に付着する心配は無い。
FIG. 3 is a side view of the carrying roller showing another embodiment of the second invention. In the embodiment shown in FIG. 3, the ejection port 22 of the liquid ejection nozzle 20 is installed obliquely downward. As in the embodiment shown in FIG.
If the liquid discharge nozzle 20 is arranged so that the discharge port 22 faces upward, there is no fear of the liquid dripping from the discharge port 22 when the liquid discharge from the discharge port 22 is stopped. In another embodiment, the liquid may drop from the discharge port 22. However, the liquid discharge nozzle 20
Is disposed below the height position of the substrate 1 indicated by the chain double-dashed line L, there is no concern that the resist-containing developer spilled from the ejection port 22 will adhere to the substrate 1.

【0037】次に、図4は、第3の発明の実施形態の1
例を示し、現像処理装置の構成要素の1つである搬送ロ
ーラおよび液切りローラを示す側面図である。この図4
に示す搬送ローラ24は、図8に示した現像処理装置の
複数の搬送ローラ4a〜4cのうち、処理槽2の出口側
開口3b付近に配置された搬送ローラ4cに対応するも
のである。
Next, FIG. 4 shows a first embodiment of the third invention.
FIG. 3 is a side view showing an example and shows a transport roller and a liquid draining roller that are one of the components of the development processing apparatus. This Figure 4
8 corresponds to the transport roller 4c arranged near the outlet side opening 3b of the processing tank 2 among the plurality of transport rollers 4a to 4c of the developing processing apparatus shown in FIG.

【0038】搬送ローラ24の直上に搬送ローラ24と
対向するように配設された液切りローラ26は、その周
面が基板1の上面側の幅方向全体にわたって接触する円
柱状をなしており、搬送ローラ24によって支持され搬
送される基板1の上面側の幅方向全体にわたって接触し
つつ回転することにより、基板1上に盛られた使用済み
の現像液を基板1上から除去する機能を有している。そ
して、搬送ローラ24の近傍であって搬送ローラ24に
よって支持され搬送される基板1の高さ位置(図4中に
二点鎖線Lで示す)より下方に、液切りローラ26と吐
出口30が対向するように液吐出ノズル28が配設され
ている。この液吐出ノズル28には、図2に示した液吐
出ノズル20と同様に、例えば基板1の表面上から処理
槽底部に流下して回収タンクに回収された現像液が回収
タンクから供給されている。このとき、液吐出ノズル2
8へ現像液を供給する圧力は、吐出口30から液切りロ
ーラ26に向けて吐出された現像液14が液撥ねによっ
て飛散しない程度の低圧に設定される。
The draining roller 26, which is arranged immediately above the transport roller 24 so as to face the transport roller 24, has a cylindrical shape whose peripheral surface is in contact with the entire upper surface of the substrate 1 in the width direction. It has a function of removing the used developing solution accumulated on the substrate 1 from the substrate 1 by rotating while contacting over the entire width direction on the upper surface side of the substrate 1 which is supported and conveyed by the conveying roller 24. ing. The liquid draining roller 26 and the discharge port 30 are provided below the height position (indicated by a chain double-dashed line L in FIG. 4) of the substrate 1 which is supported and transported by the transport roller 24 in the vicinity of the transport roller 24. Liquid discharge nozzles 28 are arranged so as to face each other. As in the case of the liquid discharge nozzle 20 shown in FIG. 2, for example, the developer discharged from the surface of the substrate 1 to the bottom of the processing tank and collected in the recovery tank is supplied to the liquid discharge nozzle 28 from the recovery tank. There is. At this time, the liquid discharge nozzle 2
The pressure for supplying the developing solution to the developing solution 8 is set to such a low pressure that the developing solution 14 discharged from the discharge port 30 toward the draining roller 26 does not scatter due to splashing of the liquid.

【0039】液吐出ノズル28の吐出口30から搬送ロ
ーラ16に向けての現像液14の吐出は、図2に示した
液吐出ノズル20と同様に、基板1を搬送しつつ処理し
ている期間中においては、搬送ローラ24および液切り
ローラ26が基板1と接触しておらず、かつ、基板1が
その搬送ローラ16の近傍にも存在していないときに行
い、搬送ローラ24および液切りローラ26が基板1と
接触しているときや近傍に基板1が存在しているときに
は液吐出ノズル28の吐出口30から現像液が吐出され
ないようにする。また、基板1を搬送していない期間中
においては、液吐出ノズル28の吐出口30から液切り
ローラ26に向けての現像液14の吐出は、一定時間ご
とに間欠的に行うようにする。
The discharge of the developing solution 14 from the discharge port 30 of the liquid discharge nozzle 28 toward the conveying roller 16 is the same as the case of the liquid discharge nozzle 20 shown in FIG. The operation is performed when the transport roller 24 and the liquid draining roller 26 are not in contact with the substrate 1 and the substrate 1 is not present near the transport roller 16 as well. The developing solution is prevented from being ejected from the ejection port 30 of the liquid ejection nozzle 28 when 26 is in contact with the substrate 1 or when the substrate 1 is present in the vicinity thereof. Further, during the period in which the substrate 1 is not transported, the developing solution 14 is ejected from the ejection port 30 of the liquid ejection nozzle 28 toward the liquid draining roller 26 intermittently at regular intervals.

【0040】図4に示した構成を備えた装置では、液吐
出ノズル28の吐出口30から液切りローラ26に向か
って現像液14が吐出されることにより、液切りローラ
26は現像液で常時濡れた状態となる。また、液切りロ
ーラ26の周面上に吐出された現像液14は、液切りロ
ーラ26の周面を伝って下方の搬送ローラ24の周面へ
流下することにより、搬送ローラ24も現像液で常時濡
れた状態となる。このため、基板1の上面側に接触する
液切りローラ26に、例えばレジストを含んだ現像液が
付着し、また、基板1の表面上からこぼれ落ちたレジス
ト含有現像液が搬送ローラ24に付着しても、現像液は
乾くことがないので、レジスト分が固化することはなく
なる。したがって、固化したレジストによって液切りロ
ーラ26および搬送ローラ24が汚染されることが防止
される。また、液吐出ノズル28の吐出口30からは現
像液14が低圧で吐出され、かつ、搬送ローラ24の近
傍位置から液切りローラ26に向かって現像液14が吐
出されるので、液撥ねが生じにくく、現像液14が広範
囲に飛散することはない。したがって、レジストを含有
した現像液を循環させつつ再利用するような場合であっ
ても、レジスト含有現像液が液撥ねによって基板1を汚
染したりセンサー等の機器に付着して誤動作を招いたり
する、といったことがない。また、液吐出ノズル28
は、基板1の高さ位置より下方に配設されているので、
吐出口30からレジスト含有現像液がぼた落ちしたとし
ても、その現像液が基板1上に付着する心配は無い。
In the apparatus having the structure shown in FIG. 4, the developer 14 is discharged from the discharge port 30 of the liquid discharge nozzle 28 toward the drain roller 26, so that the drain roller 26 is always filled with the developer. Get wet. Further, the developer 14 discharged onto the peripheral surface of the liquid draining roller 26 flows along the peripheral surface of the liquid draining roller 26 and flows down to the peripheral surface of the conveying roller 24 below, so that the conveying roller 24 is also a developer. It will always be wet. Therefore, for example, the developing solution containing the resist adheres to the liquid draining roller 26 contacting the upper surface side of the substrate 1, and the resist-containing developing solution spilled from the surface of the substrate 1 adheres to the transport roller 24. However, since the developer does not dry, the resist does not solidify. Therefore, the draining roller 26 and the transport roller 24 are prevented from being contaminated by the solidified resist. Further, since the developing solution 14 is ejected from the ejection port 30 of the liquid ejecting nozzle 28 at a low pressure and the developing solution 14 is ejected from a position near the transport roller 24 toward the liquid draining roller 26, liquid splashing occurs. It is difficult and the developer 14 does not scatter in a wide range. Therefore, even when the developer containing the resist is circulated and reused, the developer containing the resist may contaminate the substrate 1 due to splashing of the liquid or attach to a device such as a sensor to cause a malfunction. There is no such thing. In addition, the liquid discharge nozzle 28
Is disposed below the height position of the substrate 1,
Even if the resist-containing developer spills from the ejection port 30, there is no concern that the developer will adhere to the substrate 1.

【0041】図5および図6は、第3の発明の変形例を
示し、図5は、現像処理装置の構成要素の1つである搬
送ローラおよび液切りローラを示す側面断面図であり、
図6は同じく正面図である。この図5および図6に示す
搬送ローラ60および液切りローラ52、54は、図8
に示した現像処理装置の処理槽2の出口側開口3b付近
に配置された搬送ローラ4cとその近傍のものを示す。
FIGS. 5 and 6 show a modified example of the third invention, and FIG. 5 is a side sectional view showing a conveying roller and a liquid draining roller which are one of the components of the developing processing apparatus.
FIG. 6 is a front view of the same. The conveyance roller 60 and the liquid draining rollers 52 and 54 shown in FIGS.
The conveyance roller 4c arranged near the outlet side opening 3b of the processing tank 2 of the developing treatment apparatus shown in FIG.

【0042】この変形例に係る現像処理装置は、処理槽
2内のほとんどの領域では基板1を水平姿勢で搬送し、
処理槽2の下流側付近で基板1を傾斜姿勢にして次工程
へ搬出するものである。そのため、処理槽2の下流側付
近(すなわち出口側開口3bに近い位置)を除いた領域
では、基板1は、処理槽2内に固定された搬送ローラ6
2によって水平姿勢で搬送される。また、それ以外の領
域、すなわち出口側開口3bに近い領域では、基板1
は、搬送ローラ60および液切りローラ52、54によ
って搬送される。液切りローラ52、54は、その間を
基板1が通過可能なように微小な隙間を形成するように
設けられている。搬送ローラ60および液切りローラ5
2、54は、ローラ取付部材64、66に取り付けられ
る。ローラ取付部材64、66は、図6に示すように、
液切りローラ52の回転軸68の延長線上の点Oを通り
かつ基板の搬送方向と平行な直線(図6中で点Oを通り
かつ紙面に垂直な直線)を中心として、図示しない駆動
源の駆動によって上下方向に所定角度(一点鎖線Aと
A’とのなす角度)だけ旋回可能に設けられている。
In the developing processing apparatus according to this modification, the substrate 1 is conveyed in a horizontal posture in most of the area within the processing tank 2.
The substrate 1 is inclined in the vicinity of the downstream side of the processing tank 2 and is carried out to the next step. Therefore, in the region excluding the vicinity of the downstream side of the processing tank 2 (that is, the position close to the outlet side opening 3b), the substrate 1 is transported by the transport roller 6 fixed in the processing tank 2.
2 is conveyed in a horizontal posture. Further, in the other region, that is, in the region near the outlet side opening 3b, the substrate 1
Is transported by the transport roller 60 and the draining rollers 52 and 54. The liquid draining rollers 52 and 54 are provided so as to form a minute gap so that the substrate 1 can pass between them. Transport roller 60 and draining roller 5
2, 54 are attached to roller attachment members 64, 66. The roller mounting members 64 and 66 are, as shown in FIG.
A drive source (not shown) is centered around a straight line passing through the point O on the extension line of the rotation shaft 68 of the liquid draining roller 52 and parallel to the substrate transport direction (a straight line passing through the point O in FIG. 6 and perpendicular to the paper surface). It is provided so that it can be swung up and down by a predetermined angle (the angle formed by the alternate long and short dash lines A and A ') by driving.

【0043】ローラ取付部材64、66が最も下の位置
にある状態では、図5の(a)および図6中の実線で示
すように、搬送ローラ60および液切りローラ52、5
4は水平位置となる。そして、この水平位置の液切りロ
ーラ52と隣接する搬送ローラ60との間には、基板1
が搬送ローラ60の上に搬送されてきたことを検出する
検出装置70の振り子72が設けられている。振り子7
2の下流側には、水平位置にある液切りローラ54に対
して現像液を吐出する液吐出ノズル74が設けられてい
る。液吐出ノズル74は、水平位置の液切りローラ54
と略平行になるように設けられたノズル管75に、図5
の紙面奥行き方向に複数列設されている。検出装置70
およびノズル管75は、処理槽2に固定して設けられ
る。また、ローラ取付部材64、66に取り付けられた
搬送ローラ60のうち最も上流側のものと搬送ローラ6
2との間にも、基板1を検出する検出装置76が設けら
れている。
When the roller mounting members 64 and 66 are at the lowermost position, as shown by the solid line in FIG. 5A and FIG. 6, the conveying roller 60 and the draining rollers 52 and 5 are shown.
4 is a horizontal position. The substrate 1 is placed between the liquid draining roller 52 in the horizontal position and the adjacent transport roller 60.
A pendulum 72 of the detection device 70 for detecting that the paper has been conveyed onto the conveyance roller 60 is provided. Pendulum 7
A liquid discharge nozzle 74 that discharges the developing liquid to the liquid draining roller 54 in the horizontal position is provided on the downstream side of 2. The liquid discharge nozzle 74 is provided at the horizontal position with the liquid draining roller 54
The nozzle tube 75 provided so as to be substantially parallel to
Multiple rows are provided in the depth direction of the paper. Detector 70
The nozzle tube 75 is fixedly provided in the processing tank 2. Further, the most upstream one of the conveyance rollers 60 attached to the roller attachment members 64 and 66 and the conveyance roller 6
A detection device 76 that detects the substrate 1 is also provided between the two.

【0044】ローラ取付部材64、66が最も上の位置
にある状態では、図5の(b)および図6中の二点鎖線
で示すように、搬送ローラ60および液切りローラ5
2、54は、点Oの側が低くなるように傾斜し、しかも
かつ、それら搬送ローラ60および液切りローラ52、
54は、その最も低い位置が、ノズル管75よりも高い
位置となる。なお、図5の(b)では、奥行き方向のロ
ーラの傾斜は考慮して描いていない。
When the roller mounting members 64 and 66 are at the uppermost position, as shown by the chain double-dashed line in FIG. 5B and FIG.
2, 54 are inclined so that the side of the point O is low, and the conveyance roller 60 and the draining roller 52,
The lowest position of 54 is higher than the nozzle tube 75. In addition, in FIG. 5B, the inclination of the roller in the depth direction is not taken into consideration.

【0045】この現像処理装置の動作は、次のとおりで
ある。現像処理装置において、基板1は、処理槽2の入
口側開口(図5には図示せず)から水平姿勢で搬入さ
れ、現像液吐出ノズル5から吐出された現像液が基板1
上に液盛りされ、その状態で現像処理を行いながら搬送
ローラ62によって水平姿勢のまま下流側に向かって搬
送される。このとき、ローラ取付部材64、66は最も
下の位置にあり、搬送ローラ60および液切りローラ5
2、54は水平位置となっている。そしてかつ、このと
き液吐出ノズル74から現像液が吐出されており、吐出
された現像液は液切りローラ54にかかり、液切りロー
ラ54は現像液で濡れた状態に保たれる。また、液切り
ローラ54の下側にある液切りローラ52も、液切りロ
ーラ54から流下した現像液で濡れた状態に保たれる。
このため、液切りローラ52、54が乾燥してレジスト
分が固化することはない。
The operation of this developing processing apparatus is as follows. In the development processing apparatus, the substrate 1 is loaded horizontally from the opening (not shown in FIG. 5) of the processing tank 2 and the developing solution discharged from the developing solution discharge nozzle 5 is transferred to the substrate 1.
The liquid is piled up, and while being developed in that state, it is conveyed toward the downstream side in a horizontal posture by the conveyance roller 62. At this time, the roller mounting members 64 and 66 are at the lowest position, and the transport roller 60 and the liquid draining roller 5 are
2, 54 are horizontal positions. Further, at this time, the developing solution is being ejected from the solution ejecting nozzle 74, the ejected developing solution is applied to the solution draining roller 54, and the solution draining roller 54 is kept wet with the developing solution. The liquid draining roller 52 below the liquid draining roller 54 is also kept wet with the developer flowing down from the liquid draining roller 54.
Therefore, the liquid removing rollers 52 and 54 are not dried and the resist portion is not solidified.

【0046】そして、基板1が搬送されてきて検出装置
76の振り子78を動かすと、液吐出ノズル74からの
現像液の吐出は停止させられる。これは、基板1が液吐
出ノズル74に近づいたため、液吐出ノズル74からの
現像液の吐出を続けると、吐出された現像液の飛沫が基
板1にかかって処理むら等の不都合を生じさせる可能性
があるためである。そして、さらに基板1が搬送されて
検出装置70の振り子72を動かすと、搬送ローラ60
の回転駆動が停止され、基板1が搬送ローラ60上に停
止する。そして、その後、前記駆動源が駆動されて、ロ
ーラ取付部材64、66が上昇して搬送ローラ60は点
O側が低くなるように傾斜し、その上に乗っている基板
1も傾斜姿勢となる。これにより、基板1の上に液盛り
されていた現像液の大半は下側に流れ落ちて大まかに液
切りされる。そして、液の大部分が流れ落ちると、再び
搬送ローラ60および液切りローラ52、54が回転駆
動され、基板1は傾斜姿勢のままで下流側に向けて搬送
され、この傾斜姿勢の位置にあわせて形成された出口側
開口3bから搬出されて次工程へ搬送される。このと
き、ローラ取付部材64、66が上昇していることか
ら、液吐出ノズル74や検出装置70の振り子72は、
搬送ローラ60よりも下方に位置することになり、基板
1の搬送の障害となることはなく、また、液吐出ノズル
74から液が不用意に漏れ出てきても、基板1に付着す
ることがない。基板1が出口側開口3bから搬出される
と、ローラ取付部材64、66が下降して次の基板を待
つ。
When the substrate 1 is conveyed and the pendulum 78 of the detection device 76 is moved, the discharge of the developing solution from the solution discharge nozzle 74 is stopped. This is because the substrate 1 has approached the liquid discharge nozzle 74, and therefore, when the discharge of the developing liquid from the liquid discharge nozzle 74 is continued, droplets of the discharged developing liquid may impinge on the substrate 1 and cause inconveniences such as uneven processing. Because there is a nature. Then, when the substrate 1 is further transported and the pendulum 72 of the detection device 70 is moved, the transport roller 60
The rotation driving of the substrate 1 is stopped, and the substrate 1 stops on the transport roller 60. Then, after that, the drive source is driven to raise the roller mounting members 64 and 66, and the conveying roller 60 is inclined so that the point O side is lowered, and the substrate 1 placed thereon is also in an inclined posture. As a result, most of the developing solution deposited on the substrate 1 flows down and is roughly drained. Then, when most of the liquid flows down, the transport roller 60 and the liquid draining rollers 52 and 54 are driven to rotate again, and the substrate 1 is transported toward the downstream side while maintaining the tilted posture, and the substrate 1 is adjusted to the position of this tilted posture. It is carried out from the formed outlet side opening 3b and carried to the next step. At this time, since the roller mounting members 64 and 66 are raised, the liquid discharge nozzle 74 and the pendulum 72 of the detection device 70 are
Since it is located below the transport roller 60, it does not hinder the transport of the substrate 1, and even if the liquid accidentally leaks from the liquid discharge nozzle 74, it may adhere to the substrate 1. Absent. When the substrate 1 is carried out from the outlet side opening 3b, the roller mounting members 64 and 66 descend and wait for the next substrate.

【0047】また、図7は、第4の発明の実施形態の1
例を示し、現像処理装置の構成要素である処理槽の底部
を示す断面図である。図7に示した装置では、処理槽3
2の傾斜した内底面34の傾斜方向上部に、吐出口38
が内底面34に向けられた液吐出ノズル36が配設され
ている。この液吐出ノズル36には、例えば基板1の表
面上から処理槽底部に流下して回収タンクに回収された
現像液が回収タンクから供給される。
FIG. 7 shows the first embodiment of the fourth invention.
FIG. 3 is a cross-sectional view showing an example and showing a bottom portion of a processing tank which is a component of the development processing apparatus. In the apparatus shown in FIG. 7, the processing tank 3
The discharge port 38 is provided above the inclined inner bottom surface 34 of FIG.
A liquid discharge nozzle 36 is disposed so as to face the inner bottom surface 34. To the liquid discharge nozzle 36, for example, the developer that has flowed down from the surface of the substrate 1 to the bottom of the processing tank and is collected in the collection tank is supplied from the collection tank.

【0048】図7に示した構成を備えた装置では、液吐
出ノズル36の吐出口38から処理槽32の内底面34
の傾斜方向上部へ現像液14が吐出され、その吐出され
た現像液14は内底面34の傾斜に沿って内底面34上
を流下する。このため、内底面34の全体が現像液14
で常時濡れた状態となる。したがって、基板1の表面上
からレジストを含んだ現像液が内底面34上にこぼれ落
ちても、その現像液は乾くことがないので、レジスト分
が固化することはなくなり、固化したレジストによって
処理槽32の内底面34が汚染されることが防止され
る。
In the apparatus having the structure shown in FIG. 7, the discharge port 38 of the liquid discharge nozzle 36 to the inner bottom surface 34 of the processing bath 32 is discharged.
The developing solution 14 is discharged to the upper part in the inclined direction, and the discharged developing solution 14 flows down on the inner bottom surface 34 along the inclination of the inner bottom surface 34. Therefore, the entire inner bottom surface 34 is entirely covered with the developer 14.
Will always be wet. Therefore, even if the developer containing the resist spills from the surface of the substrate 1 onto the inner bottom surface 34, the developer does not dry, so that the resist does not solidify, and the solidified resist prevents the processing tank 32 from being solidified. It is possible to prevent the inner bottom surface 34 from being contaminated.

【0049】なお、上述した記載においては、現像処理
装置について説明したが、この発明は、洗浄、エッチン
グ、剥膜などの処理を行う基板処理装置にも適用するこ
とが可能である。
Although the development processing apparatus has been described in the above description, the present invention can also be applied to a substrate processing apparatus that performs processing such as cleaning, etching, and film removal.

【0050】[0050]

【発明の効果】請求項1ないし請求項3に係る各発明の
基板処理装置を使用すると、処理槽内において基板を搬
送しつつ基板に対し処理液を供給して基板の処理を行う
場合に、レジストを含んだ現像液のように固化成分を含
んだ処理液によって搬送ローラまたは上部ローラおよび
搬送ローラが汚染されることを防止することができ、基
板の汚染や機器の誤動作などを防ぐことができる。そし
て、処理槽の内部の清掃作業を頻繁に行う必要も無いの
で、処理効率の低下や作業の煩雑さを招くことがない。
When the substrate processing apparatus according to each of the first to third aspects of the present invention is used, when the substrate is processed in the processing bath by supplying the processing liquid to the substrate while transporting the substrate, It is possible to prevent the carrying roller or the upper roller and the carrying roller from being contaminated by a processing solution containing a solidifying component such as a developing solution containing a resist, and it is possible to prevent substrate contamination and equipment malfunction. . Further, since it is not necessary to frequently clean the inside of the processing tank, the processing efficiency is not lowered and the work is not complicated.

【0051】請求項4に係る発明の基板処理装置では、
搬送ローラおよび上部ローラが上方および下方のいずれ
に位置したときでも、液吐出手段の吐出口から処理液、
例えばレジストを含有した現像液がぼた落ちしたとして
も現像液が基板上に付着する心配が無い。
In the substrate processing apparatus of the invention according to claim 4,
Regardless of whether the transport roller and the upper roller are located above or below, the treatment liquid is discharged from the discharge port of the liquid discharge means,
For example, even if the developer containing the resist drops out, there is no concern that the developer will adhere to the substrate.

【0052】請求項5に係る発明の基板処理装置では、
搬送ローラおよび上部ローラが鉛直面内で揺動すること
により上方位置と下方位置との間を移動し、上方位置に
おいては搬送ローラによって支持される基板が傾斜する
ことにより、基板の表面上から処理液の一部が流れ落ち
て除去される。
In the substrate processing apparatus of the invention according to claim 5,
The carrier roller and the upper roller move between the upper position and the lower position by swinging in the vertical plane, and at the upper position, the substrate supported by the carrier roller is inclined, so that the process is performed from the surface of the substrate. A part of the liquid flows down and is removed.

【0053】請求項6に係る発明の基板処理装置では、
液切りローラによって基板から処理液、例えばレジスト
を含んだ現像液が除去された際に液切りローラの周面に
レジスト含有現像液が付着しても、液切りローラの周面
でレジスト分が固化することを防止することができる。
In the substrate processing apparatus of the invention according to claim 6,
Even if the resist-containing developer adheres to the peripheral surface of the liquid draining roller when the processing liquid, for example, the developer containing resist, is removed from the substrate by the liquid draining roller, the resist component solidifies on the peripheral surface of the liquid draining roller. Can be prevented.

【0054】請求項7に係る発明の基板処理装置では、
液撥ねがより生じにくく、湿潤用液の飛散をより効果的
に抑えることができる。
In the substrate processing apparatus of the invention according to claim 7,
Liquid splashing is less likely to occur, and scattering of the wetting liquid can be suppressed more effectively.

【0055】請求項8に係る発明の基板処理装置では、
例えばレジストを含有した現像液を循環させつつ湿潤用
液として再利用するような場合に、液吐出手段の吐出口
から吐出されたレジスト含有現像液によって基板を汚染
する、といった心配を無くすことができる。
In the substrate processing apparatus of the invention according to claim 8,
For example, when a developer containing a resist is circulated and reused as a wetting liquid, it is possible to eliminate the concern that the substrate is contaminated by the resist-containing developer discharged from the discharge port of the liquid discharge means. .

【0056】請求項9に係る発明の基板処理装置では、
搬送ローラまたは上部ローラおよび搬送ローラが汚染さ
れることを防止しつつ、湿潤用液の使用量を低減するこ
とができる。
In the substrate processing apparatus of the invention according to claim 9,
It is possible to reduce the amount of the wetting liquid used while preventing the carrying roller or the upper roller and the carrying roller from being contaminated.

【0057】請求項10に係る発明の基板処理装置を使
用すると、処理槽内において基板を搬送しつつ基板に対
し処理液を供給して基板の処理を行う場合に、レジスト
を含んだ現像液のように固化成分を含んだ処理液によっ
て処理槽の内底面が汚染されることを防止することがで
き、基板の汚染や機器の誤動作などを防ぐことができ
る。そして、処理槽の内部の清掃作業を頻繁に行う必要
も無いので、処理効率の低下や作業の煩雑さを招くこと
がない。
According to the substrate processing apparatus of the tenth aspect of the present invention, when the substrate is processed by supplying the processing liquid to the substrate while transporting the substrate in the processing tank, the developing solution containing the resist is used. As described above, it is possible to prevent the inner bottom surface of the processing tank from being contaminated by the processing liquid containing the solidifying component, and it is possible to prevent the substrate from being contaminated and the malfunction of the device. Further, since it is not necessary to frequently clean the inside of the processing tank, the processing efficiency is not lowered and the work is not complicated.

【図面の簡単な説明】[Brief description of drawings]

【図1】第1の発明の実施形態の1例を示し、現像処理
装置の構成要素の1つである搬送ローラの1つを一部断
面で示す側面図である。
FIG. 1 is a side view showing an example of an embodiment of the first invention and showing in partial cross section one of the transport rollers that is one of the components of the development processing apparatus.

【図2】第2の発明の実施形態の1例を示し、現像処理
装置の構成要素の1つである搬送ローラの1つを示す側
面図である。
FIG. 2 is a side view showing an example of an embodiment of the second invention and showing one of the conveying rollers which is one of the constituent elements of the development processing apparatus.

【図3】第2の発明の別の実施形態を示す搬送ローラの
側面図である。
FIG. 3 is a side view of a transport roller showing another embodiment of the second invention.

【図4】第3の発明の実施形態の1例を示し、現像処理
装置の構成要素の1つである搬送ローラおよび液切りロ
ーラを示す側面図である。
FIG. 4 is a side view showing an example of an embodiment of the third invention and showing a transport roller and a liquid draining roller, which are one of the components of the development processing apparatus.

【図5】第3の発明の変形例を示し、現像処理装置の構
成要素の1つである搬送ローラおよび液切りローラを示
す側面断面図である。
FIG. 5 is a side sectional view showing a modified example of the third invention and showing a transport roller and a liquid draining roller, which are one of the components of the development processing apparatus.

【図6】図5に示した液切りローラの正面図である。FIG. 6 is a front view of the liquid draining roller shown in FIG.

【図7】第4の発明の実施形態の1例を示し、現像処理
装置の構成要素である処理槽の底部を示す断面図であ
る。
FIG. 7 is a cross-sectional view showing an example of an embodiment of the fourth invention and showing a bottom portion of a processing tank which is a constituent element of a development processing apparatus.

【図8】現像処理装置の概略構成の1例を示す模式図で
ある。
FIG. 8 is a schematic diagram showing an example of a schematic configuration of a development processing apparatus.

【符号の説明】 1 基板 2、32 処理槽 10、16、24、60、62 搬送ローラ 12 液溜めバット 14 現像液 20、28、36 液吐出ノズル 22、30、38 液吐出ノズルの吐出口 26 液切りローラ 34 処理槽の内底面 52、54 液切りローラ 64、66 ローラ取付部材 70、76 検出装置 74 液吐出ノズル 75 ノズル管[Explanation of symbols] 1 substrate 2, 32 treatment tanks 10, 16, 24, 60, 62 Conveyor rollers 12 Liquid Reservoir Vat 14 Developer 20, 28, 36 liquid discharge nozzle 22, 30, 38 Discharge port of liquid discharge nozzle 26 Draining roller 34 Inner bottom of processing tank 52, 54 Draining roller 64, 66 Roller mounting member 70,76 Detector 74 Liquid discharge nozzle 75 nozzle tube

───────────────────────────────────────────────────── フロントページの続き (72)発明者 柳沢 暢生 京都市上京区堀川通寺之内上る4丁目天神 北町1番地の1 大日本スクリーン製造株 式会社内 (72)発明者 豊田 浩司 京都市上京区堀川通寺之内上る4丁目天神 北町1番地の1 大日本スクリーン製造株 式会社内 Fターム(参考) 2H096 AA26 AA27 AA28 GA21 GA23 GA24 3B201 AA47 AB53 BB01 BB21 CD24 5F046 LA11 LA14    ─────────────────────────────────────────────────── ─── Continued front page    (72) Inventor Nobuo Yanagisawa             4-chome Tenjin, which runs up to Teranouchi, Horikawa-dori, Kamigyo-ku, Kyoto             1 Kitamachi No. 1 Dai Nippon Screen Manufacturing Co., Ltd.             Inside the company (72) Inventor Koji Toyota             4-chome Tenjin, which runs up to Teranouchi, Horikawa-dori, Kamigyo-ku, Kyoto             1 Kitamachi No. 1 Dai Nippon Screen Manufacturing Co., Ltd.             Inside the company F term (reference) 2H096 AA26 AA27 AA28 GA21 GA23                       GA24                 3B201 AA47 AB53 BB01 BB21 CD24                 5F046 LA11 LA14

Claims (10)

【特許請求の範囲】[Claims] 【請求項1】 処理槽内において基板を搬送しつつ基板
を処理液で処理する基板処理装置において、 基板の下面側に接触し基板を支持して搬送する搬送ロー
ラの直下に液溜め容器を配設し、その液溜め容器内へ湿
潤用液を供給して液溜め容器内を常に湿潤用液で満たす
液供給手段を備え、前記液溜め容器内に満たされた湿潤
用液中に前記搬送ローラの周面の一部を浸漬させておく
ことを特徴とする基板処理装置。
1. A substrate processing apparatus for processing a substrate with a processing liquid while transporting the substrate in a processing tank, and arranging a liquid storage container just below a transportation roller which is in contact with the lower surface side of the substrate and supports and transports the substrate. And a liquid supply means for supplying a wetting liquid into the liquid storage container to constantly fill the liquid storage container with the wetting liquid, and the conveying roller in the wetting liquid filled in the liquid storage container. A substrate processing apparatus, wherein a part of the peripheral surface of the substrate is immersed.
【請求項2】 処理槽内において基板を搬送しつつ基板
を処理液で処理する基板処理装置において、 基板の下面側に接触し基板を支持して搬送する搬送ロー
ラに近接しかつ搬送ローラによって支持される基板の高
さ位置より下方に、吐出口が搬送ローラと対向するよう
に液吐出手段を配設し、その液吐出手段へ湿潤用液を供
給する液供給手段を備えたことを特徴とする基板処理装
置。
2. In a substrate processing apparatus for processing a substrate with a processing liquid while transporting the substrate in a processing tank, the substrate processing apparatus is in contact with a lower surface side of the substrate and is adjacent to a transportation roller for supporting and transporting the substrate, and is supported by the transportation roller. Liquid ejection means is provided below the height position of the substrate to be ejected so that the ejection port faces the transport roller, and liquid supply means for supplying the wetting liquid to the liquid ejection means is provided. Substrate processing equipment.
【請求項3】 処理槽内において基板を搬送しつつ基板
を処理液で処理する基板処理装置において、 基板の下面側に接触し基板を支持して搬送する搬送ロー
ラの近傍であって搬送ローラによって支持される基板の
高さ位置より下方に、前記搬送ローラの直上に搬送ロー
ラと対向するように配設され搬送ローラに支持されて搬
送される基板の上面側に接触する上部ローラと吐出口が
対向するように液吐出手段を配設し、その液吐出手段へ
湿潤用液を供給する液供給手段を備えたことを特徴とす
る基板処理装置。
3. A substrate processing apparatus for processing a substrate with a processing liquid while transporting the substrate in a processing tank, in the vicinity of a transport roller which is in contact with a lower surface side of the substrate and supports and transports the substrate by a transport roller. Below the height position of the substrate to be supported, there are an upper roller and an ejection port which are disposed directly above the transport roller so as to face the transport roller and are in contact with the upper surface side of the substrate which is supported and transported by the transport roller. A substrate processing apparatus, comprising liquid discharge means arranged so as to face each other, and liquid supply means for supplying a wetting liquid to the liquid discharge means.
【請求項4】 前記搬送ローラおよび前記上部ローラが
上方位置と下方位置との間で移動可能に支持され、前記
液吐出手段は、搬送ローラおよび上部ローラが上方に位
置したときに、搬送ローラによって支持される基板の高
さ位置より下方に位置するように配設され、搬送ローラ
および上部ローラが下方に位置したときには、前記搬送
ローラが、それより基板の搬送方向における上流側に配
設された別の搬送ローラと同じ高さに位置するととも
に、搬送ローラおよび上部ローラに基板が接触しないよ
うに制御される請求項3記載の基板処理装置。
4. The transport roller and the upper roller are movably supported between an upper position and a lower position, and the liquid ejecting means is configured by the transport roller when the transport roller and the upper roller are positioned above. When the carrying roller and the upper roller are located below the height position of the substrate to be supported and the carrying roller and the upper roller are located below, the carrying roller is located upstream of the carrying roller in the carrying direction. The substrate processing apparatus according to claim 3, wherein the substrate processing apparatus is positioned at the same height as another transport roller and is controlled so that the substrate does not contact the transport roller and the upper roller.
【請求項5】 前記搬送ローラおよび前記上部ローラ
が、搬送ローラの軸心線の延長線上の一点を中心として
鉛直面内で揺動するように支持されて、傾斜姿勢となる
上方位置と水平姿勢となる下方位置との間を移動する請
求項4記載の基板処理装置。
5. An upper position and a horizontal position in which the carrying roller and the upper roller are supported so as to swing in a vertical plane about a point on an extension line of the axis of the carrying roller as a center, and are inclined. The substrate processing apparatus according to claim 4, wherein the substrate processing apparatus moves between a lower position and a lower position.
【請求項6】 前記搬送ローラと前記上部ローラとが液
切りローラであり、その液切りローラと前記別の搬送ロ
ーラとの間に、液切りローラと一体的に上方位置と下方
位置との間を移動するように支持され基板の下面側に接
触し基板を支持して搬送する複数の搬送ローラが配設さ
れた請求項4または請求項5記載の基板処理装置。
6. The conveying roller and the upper roller are liquid draining rollers, and between the liquid draining roller and the other transporting roller, between the liquid draining roller and an upper position and a lower position. 6. The substrate processing apparatus according to claim 4 or 5, further comprising a plurality of transport rollers that are supported so as to move and contact the lower surface side of the substrate to support and transport the substrate.
【請求項7】 前記液供給手段は、その吐出口から前記
搬送ローラに向けて吐出された湿潤用液が液撥ねによっ
て飛散しない程度の低圧で前記液吐出手段へ湿潤用液を
供給する請求項2ないし請求項6のいずれかに記載の基
板処理装置。
7. The liquid supply means supplies the wetting liquid to the liquid discharge means at a low pressure such that the wetting liquid discharged from the discharge port toward the transport roller does not scatter due to splashing of the liquid. The substrate processing apparatus according to claim 2.
【請求項8】 基板を搬送して基板を処理している期間
中において、前記搬送ローラが基板の下面側と接触して
いないときに前記液吐出手段の吐出口から湿潤用液を吐
出し搬送ローラが基板の下面側と接触しているときには
液吐出手段の吐出口から湿潤用液を吐出しないように、
前記液供給手段から液吐出手段へ間欠的に湿潤用液を供
給するようにする請求項2ないし請求項7のいずれかに
記載の基板処理装置。
8. The wetting liquid is discharged from the discharge port of the liquid discharge means and is transferred when the transfer roller is not in contact with the lower surface side of the substrate during the period in which the substrate is transferred and processed. When the roller is in contact with the lower surface side of the substrate, do not discharge the wetting liquid from the discharge port of the liquid discharge means,
8. The substrate processing apparatus according to claim 2, wherein the wetting liquid is intermittently supplied from the liquid supply unit to the liquid discharge unit.
【請求項9】 基板を搬送していない期間中において、
前記液供給手段から前記液吐出手段へ一定時間ごとに間
欠的に湿潤用液を供給するようにする請求項2ないし請
求項8のいずれかに記載の基板処理装置。
9. During the period when the substrate is not transported,
9. The substrate processing apparatus according to claim 2, wherein the wetting liquid is intermittently supplied from the liquid supply unit to the liquid discharge unit at regular intervals.
【請求項10】 処理槽内において基板を搬送しつつ基
板を処理液で処理する基板処理装置において、 前記処理槽の傾斜した内底面上へ湿潤用液を吐出する液
吐出手段を、内底面の傾斜方向上部に配設し、その液吐
出手段へ湿潤用液を供給する液供給手段を備えたことを
特徴とする基板処理装置。
10. A substrate processing apparatus for processing a substrate with a processing liquid while transporting the substrate in the processing tank, wherein a liquid discharging means for discharging a wetting liquid onto the inclined inner bottom surface of the processing tank is provided on the inner bottom surface. A substrate processing apparatus, characterized in that the substrate processing apparatus is provided at an upper part in an inclined direction and has a liquid supply means for supplying a wetting liquid to the liquid discharge means.
JP2002092462A 2002-03-28 2002-03-28 Substrate processing equipment Expired - Lifetime JP3987362B2 (en)

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JP2002092462A JP3987362B2 (en) 2002-03-28 2002-03-28 Substrate processing equipment
KR10-2003-0017990A KR100527307B1 (en) 2002-03-28 2003-03-22 Substrate processing apparatus
TW092106948A TWI225676B (en) 2002-03-28 2003-03-27 Substrate treatment device
CN031079911A CN1448994B (en) 2002-03-28 2003-03-28 Device for treating substrate

Applications Claiming Priority (1)

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Cited By (5)

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Publication number Priority date Publication date Assignee Title
KR100729700B1 (en) * 2003-08-12 2007-06-19 가부시키가이샤 히타치 디스프레이즈 Method for manufacturing the display device
JP2010060253A (en) * 2008-09-08 2010-03-18 Nippon Electric Glass Co Ltd Device for removing liquid attached to glass plate and method of removing liquid attached to glass plate
KR101279376B1 (en) * 2011-07-20 2013-07-24 주식회사 디엠에스 Apparatus for treating substrate
US9214366B2 (en) 2011-07-20 2015-12-15 Dms Co., Ltd. Apparatus for treating substrate by applying chemical solution on substrate using plural rollers
CN114779592A (en) * 2021-01-22 2022-07-22 株式会社斯库林集团 Substrate transfer apparatus, developing apparatus and developing method

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005057109A1 (en) * 2005-11-26 2007-05-31 Kunze-Concewitz, Horst, Dipl.-Phys. Continuous wet chemical processing, e.g. cleaning, etching, stripping, coating or drying of flat, thin, fragile substrates comprises transporting and processing substrates using absorbent rollers
TWI745566B (en) * 2017-03-29 2021-11-11 美商康寧公司 Substrate coating apparatus and methods
JP2021004149A (en) * 2019-06-26 2021-01-14 日本電気硝子株式会社 Glass plate cleaning apparatus and glass plate manufacturing process

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Publication number Priority date Publication date Assignee Title
US6153064A (en) * 1998-11-25 2000-11-28 Oliver Sales Company Apparatus for in line plating

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100729700B1 (en) * 2003-08-12 2007-06-19 가부시키가이샤 히타치 디스프레이즈 Method for manufacturing the display device
JP2010060253A (en) * 2008-09-08 2010-03-18 Nippon Electric Glass Co Ltd Device for removing liquid attached to glass plate and method of removing liquid attached to glass plate
KR101279376B1 (en) * 2011-07-20 2013-07-24 주식회사 디엠에스 Apparatus for treating substrate
US9214366B2 (en) 2011-07-20 2015-12-15 Dms Co., Ltd. Apparatus for treating substrate by applying chemical solution on substrate using plural rollers
CN114779592A (en) * 2021-01-22 2022-07-22 株式会社斯库林集团 Substrate transfer apparatus, developing apparatus and developing method
CN114779592B (en) * 2021-01-22 2023-10-03 株式会社斯库林集团 Substrate conveying device, developing device and developing method

Also Published As

Publication number Publication date
KR20030078662A (en) 2003-10-08
TW200403787A (en) 2004-03-01
TWI225676B (en) 2004-12-21
JP3987362B2 (en) 2007-10-10
CN1448994B (en) 2013-06-19
KR100527307B1 (en) 2005-11-09
CN1448994A (en) 2003-10-15

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