JP2003098437A5 - - Google Patents

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Publication number
JP2003098437A5
JP2003098437A5 JP2002212454A JP2002212454A JP2003098437A5 JP 2003098437 A5 JP2003098437 A5 JP 2003098437A5 JP 2002212454 A JP2002212454 A JP 2002212454A JP 2002212454 A JP2002212454 A JP 2002212454A JP 2003098437 A5 JP2003098437 A5 JP 2003098437A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002212454A
Other languages
Japanese (ja)
Other versions
JP2003098437A (ja
Filing date
Publication date
Priority claimed from DE10139920A external-priority patent/DE10139920B4/de
Application filed filed Critical
Publication of JP2003098437A publication Critical patent/JP2003098437A/ja
Publication of JP2003098437A5 publication Critical patent/JP2003098437A5/ja
Pending legal-status Critical Current

Links

JP2002212454A 2001-08-14 2002-07-22 走査顕微鏡及び目標物を走査するための方法 Pending JP2003098437A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10139920.0 2001-08-14
DE10139920A DE10139920B4 (de) 2001-08-14 2001-08-14 Scanmikroskop und Verfahren zum Scannen eines Objekts

Publications (2)

Publication Number Publication Date
JP2003098437A JP2003098437A (ja) 2003-04-03
JP2003098437A5 true JP2003098437A5 (enExample) 2005-10-13

Family

ID=7695420

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002212454A Pending JP2003098437A (ja) 2001-08-14 2002-07-22 走査顕微鏡及び目標物を走査するための方法

Country Status (3)

Country Link
US (1) US6754003B2 (enExample)
JP (1) JP2003098437A (enExample)
DE (1) DE10139920B4 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10148188A1 (de) * 2001-09-28 2003-04-17 Leica Mikroskopie & Syst Mikroskop mit kontrasterhöhender Bildaufnahmevorrichtung
DE10235914B4 (de) * 2002-08-06 2020-12-31 Leica Microsystems Cms Gmbh Lichtquelle zur Beleuchtung mikroskopischer Objekte und Scanmikroskopsystem
JP2005043624A (ja) * 2003-07-28 2005-02-17 Nikon Corp 顕微鏡制御装置、顕微鏡装置、及び顕微鏡対物レンズ
JP4642397B2 (ja) * 2004-07-12 2011-03-02 オリンパス株式会社 光走査型顕微鏡装置
DE102004034989A1 (de) * 2004-07-16 2006-02-09 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop mit punktförmiger Lichtquellenverteilung und Verwendung
DE102004034991A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop
DE102004034990A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
TW200624509A (en) * 2004-09-09 2006-07-16 Shinetsu Chemical Co Polyphenylene ether oligomer sulfonic acid salt, making method, flame retardant resin composition, and molded article
DE102006013410B4 (de) * 2005-03-18 2007-08-16 Logic-Logistic Consult Ingenieurgesellschaft Mbh Vorrichtung zur Verlegung von Rohrleitungen in Gräben
JP4915071B2 (ja) 2005-09-22 2012-04-11 株式会社ニコン 顕微鏡、およびバーチャルスライド作成システム
JP4996304B2 (ja) * 2007-03-28 2012-08-08 オリンパス株式会社 走査型顕微鏡とその調節方法
US20090174935A1 (en) * 2008-01-09 2009-07-09 Szulczewski Michael J Scanning microscope having complementary, serial scanners
US9134521B2 (en) * 2008-07-30 2015-09-15 The Regents Of The University Of California Multidirectional selective plane illumination microscopy
EP2360505B1 (en) * 2010-01-21 2017-03-01 Olympus Corporation Microscope apparatus
US9645374B2 (en) 2011-01-20 2017-05-09 Ge Healthcare Bio-Sciences Ab Light-scanning systems
DE102012101778A1 (de) * 2012-03-02 2013-09-05 Leica Microsystems Cms Gmbh Scanmikroskopisches Verfahren und Scanmikroskop
CN107361725B (zh) * 2017-07-20 2024-02-27 无锡海斯凯尔医学技术有限公司 快速组织分子成像装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3202461C1 (de) * 1982-01-27 1983-06-09 Fa. Carl Zeiss, 7920 Heidenheim Befestigung von Mikroskopobjektiven
JPH07111504B2 (ja) * 1987-05-11 1995-11-29 浜松ホトニクス株式会社 レ−ザ光走査型顕微鏡
US5184012A (en) * 1991-12-26 1993-02-02 Olympus Optical Co., Ltd. Optical scanning apparatus with axis deviation correction
US5612818A (en) * 1993-09-08 1997-03-18 Nikon Corporation Confocal microscope
DE19654210C2 (de) 1996-12-24 1999-12-09 Leica Microsystems Optische Anordnung zum Scannen eines Strahls in zwei im wesentlichen senkrecht zueinander liegenden Achsen
EP1046073B1 (de) * 1998-01-14 2015-04-08 Leica Microsystems CMS GmbH Verfahren zur abstimmung des beleuchtungsstrahlengangs eines konfokalen mikroskops auf die eintrittspupille eines objektivs
JP2001091848A (ja) * 1999-09-27 2001-04-06 Nikon Corp 走査型光学顕微鏡
TW498152B (en) * 2000-09-11 2002-08-11 Olympus Optical Co Confocal microscope

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