JP2002518840A - 近接効果を補正する方法および装置 - Google Patents

近接効果を補正する方法および装置

Info

Publication number
JP2002518840A
JP2002518840A JP2000555273A JP2000555273A JP2002518840A JP 2002518840 A JP2002518840 A JP 2002518840A JP 2000555273 A JP2000555273 A JP 2000555273A JP 2000555273 A JP2000555273 A JP 2000555273A JP 2002518840 A JP2002518840 A JP 2002518840A
Authority
JP
Japan
Prior art keywords
pattern
function
compensation
exposure
neural network
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000555273A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002518840A5 (enExample
Inventor
ディルク・エルンスト・マリア・ファン・ディック
ピオトル・トマス・イェドラシク
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JP2002518840A publication Critical patent/JP2002518840A/ja
Publication of JP2002518840A5 publication Critical patent/JP2002518840A5/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/302—Controlling tubes by external information, e.g. programme control
    • H01J37/3023—Programme control
    • H01J37/3026—Patterning strategy
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/3175—Lithography
    • H01J2237/31769—Proximity effect correction
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/143—Electron beam

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
JP2000555273A 1998-06-16 1999-06-14 近接効果を補正する方法および装置 Pending JP2002518840A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
NL1009422 1998-06-16
NL1009422 1998-06-16
NL1010311 1998-10-13
NL1010311A NL1010311C2 (nl) 1998-06-16 1998-10-13 Werkwijze en inrichting voor het corrigeren van nabijheidseffecten.
PCT/BE1999/000076 WO1999066530A1 (en) 1998-06-16 1999-06-14 Method and device for correcting proximity effects

Publications (2)

Publication Number Publication Date
JP2002518840A true JP2002518840A (ja) 2002-06-25
JP2002518840A5 JP2002518840A5 (enExample) 2006-05-25

Family

ID=26642826

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000555273A Pending JP2002518840A (ja) 1998-06-16 1999-06-14 近接効果を補正する方法および装置

Country Status (8)

Country Link
US (1) US6920368B1 (enExample)
EP (1) EP1088328B1 (enExample)
JP (1) JP2002518840A (enExample)
AU (1) AU4354199A (enExample)
DE (1) DE69907452T2 (enExample)
ES (1) ES2199576T3 (enExample)
NL (1) NL1010311C2 (enExample)
WO (1) WO1999066530A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7148496B2 (en) * 2004-04-13 2006-12-12 Massachusetts Institute Of Technology System and method for proximity effect correction in imaging systems
EP1612834A1 (en) * 2004-06-29 2006-01-04 Leica Microsystems Lithography GmbH A process for controlling the proximity effect correction
US20080077907A1 (en) * 2006-09-21 2008-03-27 Kulkami Anand P Neural network-based system and methods for performing optical proximity correction
JP2008122929A (ja) * 2006-10-20 2008-05-29 Toshiba Corp シミュレーションモデルの作成方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69030078T2 (de) * 1990-02-22 1997-08-07 At & T Corp Fertigungsjustierung während Produktherstellung
US5736281A (en) * 1996-06-07 1998-04-07 Lucent Technologies Inc. Dose modification proximity effect compensation (PEC) technique for electron beam lithography
US6035113A (en) * 1998-01-05 2000-03-07 International Business Machines Corporation Electron beam proximity correction method for hierarchical design data

Also Published As

Publication number Publication date
WO1999066530A1 (en) 1999-12-23
EP1088328A1 (en) 2001-04-04
NL1010311C2 (nl) 1999-12-20
EP1088328B1 (en) 2003-05-02
DE69907452D1 (de) 2003-06-05
DE69907452T2 (de) 2004-03-18
ES2199576T3 (es) 2004-02-16
AU4354199A (en) 2000-01-05
US6920368B1 (en) 2005-07-19

Similar Documents

Publication Publication Date Title
TW202518157A (zh) 用於光罩增強技術之方法
JP3466900B2 (ja) 電子ビーム描画装置及び電子ビーム描画方法
JPH10208993A (ja) 光強度計算のパラメトリック解析方法
TW200933700A (en) Exposure data preparation method and exposure method
JP2959858B2 (ja) 製品の製造方法
US20100237469A1 (en) Photomask, semiconductor device, and charged beam writing apparatus
US5736280A (en) Method of estimation of resist pattern and method of exposure based on same
JP2002518840A (ja) 近接効果を補正する方法および装置
JP4336476B2 (ja) 電子ビームリソグラフィ時に線幅変化を補正して露光する方法及びこれを記録した記録媒体
EP2250592A1 (en) Rendering a mask using coarse mask representation
US5717612A (en) Post-exposure bake simulator for chemically amplified photoresists
US20070085030A1 (en) Critical dimension effects correction in raster pattern generator
JP2000019708A5 (enExample)
TWI659443B (zh) 將電子束投射至靶材上的方法、電子束微影蝕刻裝置和電子顯微裝置
US9557711B2 (en) Method of static scaling of image in holographic lithography
JPH10229047A (ja) 荷電粒子線描画方法およびその装置
CN109377447A (zh) 一种基于杜鹃搜索算法的Contourlet变换图像融合方法
JP3272815B2 (ja) レジスト感度調整装置および方法
TW574631B (en) Electron beam exposure method
JPH10270332A (ja) 電子ビーム描画方法
CN113591290B (zh) Opc模型仿真方法
JP2862825B2 (ja) 荷電粒子線描画装置
EP4495975A1 (en) Determination of imaging transfer function of a charged-particle exposure apparatus using isofocal dose measurements
CN117055307A (zh) 一种应用于掩模成像的数据处理方法、装置及曝光设备
JPH10223509A (ja) ポストベークシミュレーション方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060328

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20060328

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090120

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20090630