JP2002367802A - Chip resistor network and its manufacturing method - Google Patents

Chip resistor network and its manufacturing method

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Publication number
JP2002367802A
JP2002367802A JP2001175698A JP2001175698A JP2002367802A JP 2002367802 A JP2002367802 A JP 2002367802A JP 2001175698 A JP2001175698 A JP 2001175698A JP 2001175698 A JP2001175698 A JP 2001175698A JP 2002367802 A JP2002367802 A JP 2002367802A
Authority
JP
Japan
Prior art keywords
electrode
electrodes
resistor
adjacent
trimming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001175698A
Other languages
Japanese (ja)
Other versions
JP4795568B2 (en
Inventor
Tatsuki Hirano
立樹 平野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kamaya Electric Co Ltd
Original Assignee
Kamaya Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kamaya Electric Co Ltd filed Critical Kamaya Electric Co Ltd
Priority to JP2001175698A priority Critical patent/JP4795568B2/en
Publication of JP2002367802A publication Critical patent/JP2002367802A/en
Application granted granted Critical
Publication of JP4795568B2 publication Critical patent/JP4795568B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To trim a resistor to be trimmed accurately through simple work without forming any closed circuit together with other adjacent resistors and electrodes. SOLUTION: A chip resistor network is provided with a plurality of first electrodes 3 which are formed on an insulating substrate 1 to face each other in a plurality of adjacent divided areas divided by dividing grooves 2 in a state where the electrodes 3 are separated from the grooves 2, a common electrode 4 which is arranged to face the first electrodes 3, and resistors which are provided on the electrodes 3 and 4 so that the resistors may partially overlap the electrodes 3 and 4 and the resistance values of which are adjusted by trimming. The network is also provided with second electrodes 8 which respectively connect the first electrodes 4 to the common electrode 4 over the dividing grooves 2.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、複数の抵抗体を配
置した絶縁基板を分割して形成されるチップ形抵抗ネッ
トワークおよびその製造方法に関する。
The present invention relates to a chip-type resistor network formed by dividing an insulating substrate on which a plurality of resistors are arranged, and a method of manufacturing the same.

【0002】[0002]

【従来の技術】チップ形抵抗ネットワークは、絶縁基板
上に分割溝により区画された互いに隣接する領域に複数
の電極が設けられ、これらの電極と共通電極との間に抵
抗体(膜)が接続された回路構成を持つ。従って、この
抵抗体の抵抗値調整のためにトリミングを行う際には、
これらの各抵抗体の両端に測定器のプローブを接触させ
て、抵抗値の測定を行うことになる。
2. Description of the Related Art In a chip-type resistor network, a plurality of electrodes are provided in regions adjacent to each other defined by a dividing groove on an insulating substrate, and a resistor (film) is connected between these electrodes and a common electrode. Circuit configuration. Therefore, when performing trimming to adjust the resistance value of this resistor,
A probe of a measuring instrument is brought into contact with both ends of each of these resistors to measure the resistance value.

【0003】ところが、絶縁基板上には複数の抵抗体が
電極間に設けられ、隣接する抵抗体や電極により閉回路
が形成されている場合には、一つの抵抗体の測定値がこ
の抵抗体とともに閉回路を構成する他の抵抗体や電極の
抵抗値を含んだ値となり、結果的に正確なトリミングを
実施できないという不都合があった。
However, when a plurality of resistors are provided between electrodes on an insulating substrate, and a closed circuit is formed by adjacent resistors and electrodes, the measured value of one resistor is determined by the resistance of the resistor. At the same time, the resistance value includes the resistance values of other resistors and electrodes constituting a closed circuit, and as a result, there is a disadvantage that accurate trimming cannot be performed.

【0004】これに対して、下記のようなチップ形抵抗
ネットワークの製造技術が、例えば特開平5−2347
25号公報に提案されている。これは図4(a)に示す
ように、絶縁基板1上に分割溝2によって区画されて互
いに隣接する複数領域Aに、互いに向い合うように、図
4(b)に示すような複数の個別電極3を形成し、さら
に各領域において、前記各個別電極3に共通電極4を対
向配置し、これらの各電極3、4間に図4(c)に示す
ような抵抗体5を形成するというものである。
On the other hand, the following technology for manufacturing a chip-type resistor network is disclosed in, for example, Japanese Patent Application Laid-Open No. H5-2347.
No. 25 has proposed this. As shown in FIG. 4A, a plurality of individual regions A shown in FIG. An electrode 3 is formed, and in each region, a common electrode 4 is arranged to face each of the individual electrodes 3, and a resistor 5 as shown in FIG. 4C is formed between each of the electrodes 3 and 4. Things.

【0005】また、この形成過程では、抵抗体単位で共
通電極4の一部をオープンにした状態にて、各抵抗体5
のトリミングを実施し、このトリミングの終了後に、共
通電極4における開放部6を、図4(d)に示すよう
に、導体7を用いて橋絡させるようにしたものが提案さ
れている。図5はこのような抵抗ネットワークを示す回
路図であり、図4に対応する部分には同一符号を付して
ある。
[0005] In this forming process, each of the resistors 5 is held in a state in which a part of the common electrode 4 is opened for each resistor.
The trimming is performed, and after the trimming is completed, the opening 6 in the common electrode 4 is bridged using a conductor 7 as shown in FIG. 4D. FIG. 5 is a circuit diagram showing such a resistance network, and the same reference numerals are given to portions corresponding to FIG.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、かかる
従来のチップ形抵抗ネットワークにおけるトリミングに
おいても、トリミングしようとする抵抗体5に隣接する
他の一部の抵抗体5を介して、図5に矢印ループ線で示
すような閉回路が形成されてしまい、従って、前記抵抗
体5のトリミングの高精度化を期すために、これまでは
前記他の一部の抵抗体5や電極の影響を打ち消すよう
に、これらに回り込み防止電圧を印加する必要があっ
た。このため、この回り込み防止電圧を印加する電源装
置やプローブなどが必要となり、トリミング作業が煩雑
で、作業能率が著しく悪いという問題があった。また、
共通電極を有するチップ形抵抗ネットワークにおいての
みしか対応できないという問題点もあった。
However, even in such a conventional chip-type resistor network trimming, an arrow loop is shown in FIG. 5 through another partial resistor 5 adjacent to the resistor 5 to be trimmed. A closed circuit as shown by a line is formed. Therefore, in order to improve the trimming accuracy of the resistor 5, the effects of the other partial resistors 5 and electrodes have been canceled so far. It is necessary to apply a wraparound prevention voltage to these. For this reason, a power supply device or a probe for applying the sneak-prevention voltage is required, so that the trimming work is complicated and the work efficiency is extremely poor. Also,
There is also a problem that only the chip type resistor network having the common electrode can cope with the problem.

【0007】本発明はこのような従来の問題を解決する
ものであり、トリミングの対象となる抵抗体が隣接する
他の抵抗体や電極とともに閉回路を形成することをなく
し、簡単な作業で正確なトリミングを能率的に実現でき
るチップ形抵抗ネットワークおよびこのチップ形抵抗ネ
ットワークの製造方法を提供することを目的とする。
The present invention solves such a conventional problem, and eliminates the need for a resistor to be trimmed to form a closed circuit together with other adjacent resistors and electrodes, thereby achieving accurate operation with a simple operation. It is an object of the present invention to provide a chip-type resistor network capable of efficiently realizing a proper trimming and a method of manufacturing the chip-type resistor network.

【0008】[0008]

【課題を解決するための手段】前記目的達成のため、請
求項1の発明にかかるチップ形抵抗ネットワークは、絶
縁基板上に分割溝により区画されて互いに隣接する複数
領域に、前記分割溝から離間して向い合うように形成さ
れた複数の第1電極と、前記各領域において、前記複数
の第1電極に対向配置された共通電極と、該共通電極と
前記各第1電極の各一部に重なるようにこれらの上に設
けられて、かつトリミングにより抵抗値が調整される抵
抗体と、前記隣接する領域にあって互いに向い合う位置
にある前記第1電極と共通電極をこれらの一部に重なる
ように、さらに前記分割溝を跨ぐように接続する第2電
極とを備えたことを特徴とする。これにより、トリミン
グ時は各抵抗体の抵抗値測定を、隣接する他の抵抗体や
電極の影響を受けずに、高精度に実施でき、従って、ト
リミング作業を高精度かつ迅速、容易に実現できる。
In order to achieve the above object, a chip-type resistor network according to the present invention is provided in a plurality of regions divided by a dividing groove on an insulating substrate and adjacent to each other and separated from the dividing groove. A plurality of first electrodes formed so as to face each other, a common electrode disposed opposite to the plurality of first electrodes in each of the regions, and a part of each of the common electrode and each of the first electrodes. A resistor provided on these so as to overlap and having a resistance value adjusted by trimming, and the first electrode and the common electrode which are located in the adjacent region and are opposed to each other are partially formed. And a second electrode connected so as to overlap the division groove so as to overlap. Thereby, at the time of trimming, the resistance value measurement of each resistor can be performed with high accuracy without being affected by other adjacent resistors or electrodes, and therefore, the trimming operation can be performed with high accuracy, quickly and easily. .

【0009】また、請求項2の発明にかかるチップ形抵
抗ネットワークは、絶縁基板上に分割溝により区画され
て互いに隣接する複数領域に、前記分割溝から離間して
向い合うように形成された複数の第1電極と、前記各領
域において、前記複数の第1電極に対向配置された第3
電極と、該第3電極と前記各第1電極の各一部とに重な
るように、および隣接する第3電極どうしの各一部に重
なるように、これらの上に設けられて、かつトリミング
により抵抗値が調整される抵抗体と、前記隣接する領域
にあって互いに向い合う位置にある前記第1電極と第3
電極をこれらの一部に重なるように、かつ前記分割溝を
跨ぐように接続する第2電極とを備えたことを特徴とす
る。これにより、第3電極間に抵抗体が接続された複雑
なチップ形抵抗ネットワークにおいても、トリミング時
には各抵抗体の抵抗値測定を、隣接する他の抵抗体や電
極の影響を受けずに、高精度に実施でき、従って、トリ
ミング作業を高精度かつ迅速、容易に実現できる。
A chip-type resistor network according to a second aspect of the present invention is provided with a plurality of chip-shaped resistor networks formed in a plurality of regions divided by a dividing groove on an insulating substrate and adjacent to each other so as to be spaced apart from the dividing groove. A first electrode, and a third electrode which is disposed in each of the regions so as to face the plurality of first electrodes.
An electrode is provided on these third electrodes so as to overlap with the third electrode and each part of each of the first electrodes and so as to overlap with each part of adjacent third electrodes, and is trimmed. A resistor whose resistance value is to be adjusted; and a first electrode and a third electrode which are located in the adjacent region and face each other.
A second electrode connected to the electrode so as to overlap a part thereof and to straddle the division groove. Accordingly, even in a complicated chip-type resistor network in which a resistor is connected between the third electrodes, the resistance value measurement of each resistor during trimming can be performed without being affected by other adjacent resistors or electrodes. Therefore, the trimming operation can be performed with high precision, quickly, and easily.

【0010】また、請求項3の発明にかかるチップ形抵
抗ネットワークは、第2電極を、導電性樹脂により形成
したことを特徴とする。これにより、トリミング工程以
降に形成される第2電極の硬化温度が前記抵抗体の焼成
温度より低く抑えることができるため、トリミング後の
抵抗値を高精度に維持することができる。
The chip-type resistor network according to the third aspect of the present invention is characterized in that the second electrode is formed of a conductive resin. Thereby, the curing temperature of the second electrode formed after the trimming step can be suppressed to be lower than the firing temperature of the resistor, so that the resistance value after the trimming can be maintained with high accuracy.

【0011】また、請求項4の発明にかかるチップ形抵
抗ネットワークの製造方法は、絶縁基板上に分割溝によ
り区画されて互いに隣接する複数領域に、分割溝から離
間して向い合うように複数の第1電極を形成するととも
に、前記各領域において、前記複数の第1電極に対向配
置するように共通電極を形成する電極形成工程と、該共
通電極と前記各第1電極の各一部に重なるようにこれら
の上にトリミングにより抵抗値が調整される抵抗体を設
ける抵抗体形成工程と、前記隣接する領域にあって互い
に向い合う位置にある前記第1電極と共通電極をこれら
の一部に重なるように、かつ前記分割溝を跨ぐように第
2電極を接続する第2電極形成工程とを有することを特
徴とする。これにより、トリミングしようとする抵抗体
に対し他の抵抗体により閉回路が形成されるのを回避し
ながら、簡単かつ正確にトリミング作業を実施すること
ができる。
According to a fourth aspect of the present invention, there is provided a method for manufacturing a chip-type resistor network, wherein a plurality of regions are defined on an insulating substrate and are adjacent to each other by a dividing groove so as to face away from the dividing groove. An electrode forming step of forming a first electrode and forming a common electrode in each of the regions so as to face the plurality of first electrodes; and overlapping the common electrode and each of the first electrodes. A resistor forming step of providing a resistor whose resistance value is adjusted by trimming on them, and the first electrode and the common electrode which are located in the adjacent region and are opposed to each other are partially formed. A second electrode forming step of connecting the second electrodes so as to overlap and straddle the division groove. This makes it possible to easily and accurately perform the trimming operation while avoiding the formation of a closed circuit by another resistor with respect to the resistor to be trimmed.

【0012】また、請求項5の発明にかかるチップ形抵
抗ネットワークの製造方法は、絶縁基板上に分割溝によ
り区画されて互いに隣接する複数領域に、前記分割溝か
ら離間して向い合うように複数の第1電極を形成すると
ともに、前記各領域において前記複数の第1電極に対向
配置するように第3電極を形成する電極形成工程と、該
第3電極と前記各第1電極の各一部とに重なるように、
および隣接する第3電極どうしの各一部に重なるよう
に、これらの上にトリミングにより抵抗値が調整される
抵抗体を設ける抵抗体形成工程と、前記隣接する領域に
あって互いに向い合う位置にある前記第1電極と第3電
極をこれらの一部に重なるように、かつ前記分割溝を跨
ぐように第2電極を接続する第2電極形成工程とを有す
ることを特徴とする。これにより、第3電極間にも抵抗
体が接続されている複雑な構成のチップ形抵抗ネットワ
ークにあっても、トリミングしようとする抵抗体に対し
他の抵抗体により閉回路が形成されるのを回避しなが
ら、簡単かつ正確にトリミング作業を実施することがで
きる。
According to a fifth aspect of the present invention, there is provided a method of manufacturing a chip-type resistor network, wherein a plurality of regions are defined on an insulating substrate by dividing grooves and adjacent to each other so as to face away from the dividing grooves. Forming a first electrode, and forming a third electrode so as to face the plurality of first electrodes in each of the regions, and a part of each of the third electrode and each of the first electrodes. To overlap with
And a resistor forming step of providing a resistor whose resistance value is adjusted by trimming thereon so as to overlap each part of the adjacent third electrodes, and at a position facing each other in the adjacent region. A second electrode forming step of connecting the second electrode so that the first electrode and the third electrode overlap a part of the first electrode and the third electrode, and straddle the division groove. As a result, even in a chip-type resistor network having a complicated configuration in which a resistor is connected between the third electrodes, a closed circuit is formed by another resistor with respect to the resistor to be trimmed. The trimming operation can be performed easily and accurately while avoiding the problem.

【0013】[0013]

【発明の実施の形態】以下に、本発明の実施の一形態を
図について説明する。図1は本発明のチップ形抵抗ネッ
トワークの製造工程図である。この製造工程では、初め
に、絶縁基板1を用意し、この絶縁基板1上に図1
(a)に示すような複数の分割溝2によって、隣接する
複数の領域を区画する。図1(b)はこのように分割溝
2によって区画された一つの領域を拡大して示す。な
お、分割溝2に沿って貫通孔2aが形成されており、こ
れにより外部電極を形成している。
DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a manufacturing process diagram of the chip-type resistor network of the present invention. In this manufacturing process, first, an insulating substrate 1 is prepared, and the insulating substrate 1 is placed on the insulating substrate 1 as shown in FIG.
A plurality of adjacent regions are defined by a plurality of division grooves 2 as shown in FIG. FIG. 1B is an enlarged view of one area partitioned by the dividing groove 2 in this manner. Note that a through hole 2a is formed along the dividing groove 2, thereby forming an external electrode.

【0014】次に、これらの区画されて互いに隣接する
複数領域に、その分割溝2から離間して向い合うよう
に、図1(c)に示すような複数の個別電極である第1
電極3を形成し、これらの各第1電極3に対向するよう
に、各領域について一本の共通電極4を配置する。ま
た、この共通電極4と各第1電極3とを、これらの一部
に重なるように、各一の抵抗体(膜)5により図1
(d)に示すように接続する。
Next, as shown in FIG. 1C, a plurality of individual electrodes, such as a plurality of individual electrodes as shown in FIG.
The electrodes 3 are formed, and one common electrode 4 is arranged in each region so as to face each of the first electrodes 3. Further, the common electrode 4 and each first electrode 3 are each overlapped with a part thereof by one resistor (film) 5 as shown in FIG.
Connect as shown in (d).

【0015】続いて、この抵抗体5の前記ガラスコート
処理を行った後、各抵抗体5のトリミングを行う。この
トリミングでは、各抵抗体5が各第1電極3および共通
電極4に接続されているものの、各第1電極3の一端と
共通電極の基板分割溝に接する端部は開放されて閉回路
を作ることがないため、各抵抗体5ごとの抵抗値測定を
高精度に行える。
Subsequently, after the resistors 5 are subjected to the glass coating process, each resistor 5 is trimmed. In this trimming, although each resistor 5 is connected to each first electrode 3 and common electrode 4, one end of each first electrode 3 and an end of the common electrode that contacts the substrate dividing groove are opened to form a closed circuit. Since no resistor is formed, the resistance value of each resistor 5 can be measured with high accuracy.

【0016】そこで、このトリミングを終了した後に、
隣接する前記領域の互いに対向する各第1電極3どうし
を、分割溝2を跨ぐように、第2電極8によって接続す
る。さらに、これらの各電極3、4、8上に所定のコー
ト処理を施し、さらに図示を省略した端面電極形成処
理、分割処理などを行うことで、各区画を一単位とする
多単位のチップ形抵抗ネットワークが同時に得られるこ
とになる。また、図2はこのような抵抗ネットワークを
示す回路図であり、図1に対応する部分には同一符号を
付してある。
Therefore, after finishing this trimming,
The first electrodes 3 facing each other in the adjacent regions are connected to each other by the second electrodes 8 so as to straddle the division grooves 2. Further, a predetermined coating process is performed on each of the electrodes 3, 4, and 8, and further, an end surface electrode forming process, a dividing process, and the like, which are not shown, are performed, so that a multi-unit chip type having each section as one unit. A resistor network will be obtained at the same time. FIG. 2 is a circuit diagram showing such a resistance network, and portions corresponding to FIG. 1 are denoted by the same reference numerals.

【0017】なお、トリミング後における抵抗値変動を
抑えるために、抵抗体5の焼成温度より低い温度での焼
成が必要となる。このため、第2電極8は、メタルグレ
ーズではなく、Ag含有フェノール系樹脂などの導電性
樹脂材料により形成する。
It is necessary to fire the resistor 5 at a temperature lower than the firing temperature of the resistor 5 in order to suppress the fluctuation of the resistance value after the trimming. For this reason, the second electrode 8 is formed of a conductive resin material such as an Ag-containing phenolic resin instead of a metal glaze.

【0018】本発明のチップ形抵抗ネットワークの主要
な製造工程は前記説明の通りで、第1電極3、第2電極
8および抵抗体5の配置パターンにより製造されるもの
であるが、次に、前記主要な製造工程を含む全工程につ
いて説明する。まず、分割溝2入りの絶縁基板1を用意
し、これの片面(裏面)には、後述の共通電極や第2電
極に対応する位置に、Ag系メタルグレーズペーストで
スクリーン印刷した裏面電極を形成する。
The main manufacturing steps of the chip-type resistor network of the present invention are as described above, and are manufactured by the arrangement pattern of the first electrode 3, the second electrode 8, and the resistor 5. Next, All steps including the main manufacturing steps will be described. First, an insulating substrate 1 containing a dividing groove 2 is prepared, and a back electrode screen-printed with an Ag-based metal glaze paste is formed on one surface (back surface) of the insulating substrate 1 at a position corresponding to a common electrode or a second electrode described later. I do.

【0019】次に、絶縁基板1の他面(表面)であっ
て、前記分割溝2によって区画された互いに隣接する複
数領域に、その分割溝2から離間して向い合うように、
第1の表電極としての複数の第1電極3と、第1電極3
のそれぞれに対応する一本の共通電極を、Ag・Pd系
メタルグレーズペーストのスクリーン印刷およびこれの
850℃の焼成により形成する。
Next, on the other surface (front surface) of the insulating substrate 1, a plurality of adjacent regions defined by the division grooves 2 are opposed to each other while being separated from the division grooves 2.
A plurality of first electrodes 3 as first front electrodes;
Are formed by screen printing of an Ag / Pd-based metal glaze paste and baking the same at 850 ° C.

【0020】続いて、これらの第1電極3と共通電極4
とをこれらの一部に重なるように、RuO2 メタルグレ
ーズペーストを印刷して850℃で焼成した抵抗体5に
より接続し、その上に硼硅酸鉛ガラスを印刷して600
℃で焼成したガラス膜を形成する。そして、このガラス
膜の上から抵抗体5にレーザトリミングを実施して、抵
抗体5の抵抗値の調整を行う。
Subsequently, the first electrode 3 and the common electrode 4
Are connected to each other by a resistor 5 printed with a RuO 2 metal glaze paste and baked at 850 ° C. so as to partially overlap with these, and then printed with lead borosilicate glass on the
A glass film baked at ℃ is formed. Then, laser trimming is performed on the resistor 5 from above the glass film to adjust the resistance value of the resistor 5.

【0021】次に、分割溝2から離間して向い合う位置
にある第1電極3と共通電極4をAg含有フェノール系
樹脂を印刷し、230℃で硬化させた第2電極8によ
り、前記分割溝2を跨ぐようにして接続する。さらに、
共通電極4、第2表電極としての第2電極8を覆うよう
に230℃で硬化させたフェノール系樹脂のアンダーコ
ート膜および230℃で硬化させたエポキシ系樹脂のオ
ーバーコート膜で覆い、前記分割溝2で分割(一次分
割)する。さらに、絶縁基板1の端面には、前記第2電
極8および裏面電極(図示しない)を接続するように、
端面電極を形成し、また二次分割を行った上で、端面電
極と第2電極8の一部を覆うように、ニッケルめっきお
よび半田めっきを施して、チップ形抵抗ネットワークを
得る。
Next, the first electrode 3 and the common electrode 4 located at positions facing away from the division groove 2 are printed by an Ag-containing phenolic resin and cured at 230 ° C. by the second electrode 8. The connection is made so as to straddle the groove 2. further,
The common electrode 4 is covered with an undercoat film of a phenolic resin cured at 230 ° C. so as to cover the second electrode 8 as the second front electrode, and an overcoat film of an epoxy resin cured at 230 ° C. Divide (primary division) by the groove 2. Further, the second electrode 8 and the back electrode (not shown) are connected to the end face of the insulating substrate 1 so that
After forming an end face electrode and performing secondary division, nickel plating and solder plating are performed so as to cover the end face electrode and a part of the second electrode 8, thereby obtaining a chip-type resistor network.

【0022】なお、前記レーザトリミング以降の工程で
は、第2電極8を、Ag系メタルグレーズペーストを印
刷して600℃で焼成し、アンダーコート膜およびオー
バーコート膜を硼硅酸鉛ガラスを600℃で焼成させて
形成し、さらに絶縁基板1の一次分割後に、Ag系メタ
ルグレーズペーストを600℃で焼成させたり、Ag含
有フェノール系樹脂を200℃で硬化させたりして端面
電極を形成する。またAg系メタルグレーズペーストを
600℃で焼成させた第2電極8の上に、硼硅酸鉛ガラ
スを600℃で焼成させたアンダーコート膜を形成した
後、エポキシ系樹脂を230℃で硬化させたオーバーコ
ート膜を形成し、さらに絶縁基板1を一次分割した後、
Ag含有フェノール系樹脂を200℃で硬化させた端面
電極を、絶縁基板1の端面に形成してもよい。
In the steps subsequent to the laser trimming, the second electrode 8 is printed with an Ag-based metal glaze paste and baked at 600 ° C., and the undercoat film and the overcoat film are made of lead borosilicate glass at 600 ° C. After the primary division of the insulating substrate 1, the Ag-based metal glaze paste is fired at 600 ° C., or the Ag-containing phenol-based resin is cured at 200 ° C. to form an end face electrode. Further, an undercoat film formed by firing lead borosilicate glass at 600 ° C. is formed on the second electrode 8 obtained by firing the Ag-based metal glaze paste at 600 ° C., and then the epoxy resin is cured at 230 ° C. After forming the overcoat film and further dividing the insulating substrate 1 into primary parts,
An end face electrode obtained by curing the Ag-containing phenolic resin at 200 ° C. may be formed on the end face of the insulating substrate 1.

【0023】さらに、Ag系メタルグレーズペーストを
600℃で焼成させた第2電極8の上に、フェノール系
樹脂を230℃で硬化させたアンダーコートを形成し、
このアンダーコート膜上にエポキシ系樹脂を230℃で
硬化させたオーバーコート膜を形成して、絶縁基板1を
一次分割した後に、Ag含有フェノール系樹脂を200
℃で硬化させた端面電極を絶縁基板1の端面に形成する
ようにしてもよい。
Further, an undercoat obtained by curing a phenolic resin at 230 ° C. is formed on the second electrode 8 obtained by firing the Ag-based metal glaze paste at 600 ° C.
An overcoat film formed by curing an epoxy resin at 230 ° C. is formed on the undercoat film, and the insulating substrate 1 is divided into primary parts.
An end face electrode cured at a temperature of ° C. may be formed on the end face of the insulating substrate 1.

【0024】なお、図2は共通電極4を有するチップ抵
抗形ネットワークの製造工程におけるトリミングについ
て述べたが、図3に示すような共通電極を有しないチッ
プ形ネットワークの製造工程においても、隣接する領域
にあって、互いに向い合う位置にある第1の電極3と第
3の電極9を、トリミング後にこれらの一部に重なるよ
うに、かつ分割溝2を跨ぐように第2電極8により接続
することで、閉回路の生じない正確なトリミングを実現
できる。なお、この図3では、第1電極3のそれぞれに
各一の第3電極9を対向配置し、その第3電極9と第1
電極3の各一部に重なるように、また隣接する第3電極
9、9のそれぞれに一部が重なるように、これらの上に
抵抗体5が形成されている。この場合にも、トリミング
後に第2電極8が設けられるまでは、閉回路が形成され
ないため、正確なトリミングを実現できる。
Although FIG. 2 has described the trimming in the manufacturing process of the chip resistor type network having the common electrode 4, even in the manufacturing process of the chip type network having no common electrode as shown in FIG. And connecting the first electrode 3 and the third electrode 9 located at positions facing each other by the second electrode 8 so as to overlap a part of them after trimming and to straddle the dividing groove 2. Thus, accurate trimming without generating a closed circuit can be realized. In FIG. 3, one third electrode 9 is disposed to face each of the first electrodes 3, and the third electrode 9 and the first
A resistor 5 is formed on each of the electrodes 3 so as to overlap each part of the electrodes 3 and so as to partially overlap each of the adjacent third electrodes 9 and 9. Also in this case, since the closed circuit is not formed until the second electrode 8 is provided after the trimming, accurate trimming can be realized.

【0025】[0025]

【発明の効果】以上のように、請求項1の発明によれ
ば、絶縁基板上に分割溝により区画されて互いに隣接す
る複数領域に、前記分割溝から離間して向い合うように
形成された複数の第1電極と、前記各領域において、前
記複数の第1電極に対向配置された共通電極と、該共通
電極と前記各第1電極の各一部に重なるようにこれらの
上に設けられて、かつトリミング溝が形成される抵抗体
と、前記隣接する領域にあって互いに向い合う位置にあ
る前記第1電極と共通電極をこれらの一部に重なるよう
に、かつ前記分割溝を跨ぐように接続する第2電極とを
設けたので、トリミング時は各抵抗体の抵抗値測定を、
隣接する他の抵抗体や電極の影響を受けずに、高精度に
実施でき、従って、トリミング作業を高精度かつ迅速、
容易に実現できるという効果が得られる。
As described above, according to the first aspect of the present invention, the insulating substrate is formed in a plurality of regions divided by the dividing groove and adjacent to each other so as to be separated from the dividing groove and face each other. A plurality of first electrodes, a common electrode in each of the regions facing the plurality of first electrodes, and a common electrode provided on the common electrode and each of the first electrodes so as to overlap each part thereof. And the resistor in which the trimming groove is formed, and the first electrode and the common electrode located in the adjacent region and facing each other so as to partially overlap with each other and to straddle the division groove. And the second electrode connected to the resistor, so that the resistance value of each resistor can be measured during trimming.
It can be performed with high accuracy without being affected by other adjacent resistors and electrodes.
The effect that it can be easily realized is obtained.

【0026】また、請求項2の発明によれば、絶縁基板
上に分割溝により区画されて互いに隣接する複数領域
に、前記分割溝から離間して向い合うように形成された
複数の第1電極と、前記各領域において、前記複数の第
1電極に対向配置された第3電極と、該第3電極と前記
各第1電極の各一部とに重なるように、および隣接する
第3電極どうしの各一部に重なるように、これらの上に
設けられて、かつトリミング溝が形成される抵抗体と、
前記隣接する領域にあって互いに向い合う位置にある前
記第1電極と第3電極をこれらの一部に重なるように、
かつ前記分割溝を跨ぐように接続する第2電極とを設け
たので、第3電極間に抵抗体が接続された複雑なチップ
形抵抗ネットワークにおいても、トリミング時は各抵抗
体の抵抗値測定を、隣接する他の抵抗体や電極の影響を
受けずに、高精度に実施でき、従って、トリミング作業
を高精度かつ迅速、容易に実現できるという効果が得ら
れる。
According to the second aspect of the present invention, the plurality of first electrodes formed on the insulating substrate in a plurality of regions divided by the dividing groove and adjacent to each other are formed so as to be spaced apart from the dividing groove and face each other. And, in each of the regions, a third electrode disposed to face the plurality of first electrodes, and a third electrode that overlaps the third electrode and a part of each of the first electrodes and that is adjacent to each other. A resistor provided on these so as to overlap each part of the above, and a trimming groove is formed;
The first electrode and the third electrode in the adjacent region and facing each other overlap with a part thereof.
In addition, since the second electrode is provided so as to straddle the dividing groove, even in a complicated chip-type resistor network in which a resistor is connected between the third electrodes, the resistance value of each resistor can be measured at the time of trimming. Therefore, it is possible to carry out the trimming operation with high accuracy without being affected by other adjacent resistors and electrodes, and thus to achieve an effect that the trimming operation can be performed with high accuracy, quickly and easily.

【0027】また、請求項3の発明によれば、前記第2
電極を、導電性樹脂により形成したので、トリミング工
程以降に形成される第2電極の硬化温度が前記抵抗体の
焼成温度より低く抑えることができ、トリミング後の抵
抗値を高精度に維持することができる。
According to the third aspect of the present invention, the second
Since the electrodes are formed of a conductive resin, the curing temperature of the second electrode formed after the trimming step can be kept lower than the firing temperature of the resistor, and the resistance value after the trimming can be maintained with high accuracy. Can be.

【0028】また、請求項4の発明によれば、絶縁基板
上に分割溝により区画されて互いに隣接する複数領域
に、前記分割溝から離間して向い合うように複数の第1
電極を形成する第1電極形成工程と、前記各領域におい
て、前記複数の第1電極に共通電極を対向配置する共通
電極形成工程と、該共通電極と前記各第1電極の各一部
に重なるようにこれらの上に抵抗体を設けて、かつトリ
ミング溝を形成する抵抗体形成工程と、前記隣接する領
域にあって互いに向い合う位置にある前記第1電極と共
通電極をこれらの一部に重なるように、かつ前記分割溝
を跨ぐように第2電極を接続する第2電極形成工程とを
有することとしたので、トリミングしようとする抵抗体
に対し他の抵抗体や電極による閉回路が形成されるのを
回避しながら、簡単かつ正確にトリミング作業を実施す
ることができる。
According to the fourth aspect of the present invention, a plurality of first regions are provided on a plurality of regions which are divided by the dividing groove on the insulating substrate and are adjacent to each other, so as to face away from the dividing groove.
A first electrode forming step of forming an electrode, a common electrode forming step of arranging a common electrode facing the plurality of first electrodes in each of the regions, and overlapping the common electrode and each of the first electrodes. A resistor forming step of providing a resistor thereon and forming a trimming groove as described above, and the first electrode and the common electrode located in the adjacent region and facing each other are partially formed. A second electrode forming step of connecting a second electrode so as to overlap and straddle the dividing groove, so that a closed circuit is formed by another resistor or electrode with respect to the resistor to be trimmed. It is possible to easily and accurately perform the trimming operation while avoiding the trimming operation.

【0029】また、請求項5の発明によれば、絶縁基板
上に分割溝により区画されて互いに隣接する複数領域
に、前記分割溝から離間して向い合うように複数の第1
電極を形成する第1電極形成工程と、前記各領域におい
て、前記複数の第1電極に第3電極を対向配置する第3
電極形成工程と、該第3電極と前記各第1電極の各一部
とに重なるように、および隣接する第3電極どうしの各
一部に重なるように、これらの上に抵抗体を設けて、か
つトリミング溝を形成する抵抗体形成工程と、前記隣接
する領域にあって互いに向い合う位置にある前記第1電
極と第3電極をこれらの一部に重なるように、かつ前記
分割溝を跨ぐように第2電極を接続する第2電極形成工
程とを有することとしたので、第3電極間にも抵抗体が
接続されている複雑な構成のチップ形抵抗ネットワーク
にあっても、トリミングしようとする抵抗体に対し他の
抵抗体や電極による閉回路が形成されるのを回避しなが
ら、簡単かつ正確にトリミング作業を実施することがで
きる。
According to the fifth aspect of the present invention, a plurality of first regions are provided on a plurality of regions defined by the dividing grooves on the insulating substrate and adjacent to each other so as to be spaced apart from the dividing grooves.
A first electrode forming step of forming an electrode, and a third step of arranging a third electrode opposite to the plurality of first electrodes in each of the regions.
An electrode forming step, and providing a resistor on these third electrodes so as to overlap each part of the first electrodes and so as to overlap each part of the adjacent third electrodes. And a resistor forming step of forming a trimming groove, and the first electrode and the third electrode, which are located in the adjacent region and face each other, are overlapped with a part of the first electrode and the third electrode, and straddle the division groove. And a second electrode forming step of connecting the second electrodes as described above. Therefore, even in the case of a chip-type resistor network having a complicated configuration in which a resistor is connected between the third electrodes, the trimming is attempted. It is possible to easily and accurately perform the trimming operation while avoiding the formation of a closed circuit by another resistor or an electrode with respect to the resistor to be formed.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の一形態によるチップ形抵抗ネッ
トワークの製造手順を示す製造工程図である。
FIG. 1 is a manufacturing process diagram showing a manufacturing procedure of a chip-type resistor network according to an embodiment of the present invention.

【図2】図1に示すチップ形抵抗ネットワークの回路図
である。
FIG. 2 is a circuit diagram of the chip-type resistor network shown in FIG.

【図3】本発明の実施の他の形態によるチップ形抵抗ネ
ットワークを具体的に示す回路図である。
FIG. 3 is a circuit diagram specifically illustrating a chip-type resistor network according to another embodiment of the present invention.

【図4】従来のチップ形抵抗ネットワークの製造手順を
示す製造工程図である。
FIG. 4 is a manufacturing process diagram showing a manufacturing procedure of a conventional chip-type resistor network.

【図5】図4に示すチップ形抵抗ネットワークの回路図
である。
FIG. 5 is a circuit diagram of the chip-type resistor network shown in FIG. 4;

【符号の説明】[Explanation of symbols]

1 絶縁基板 2 分割溝 3 個別電極(第1電極) 4 共通電極 5 抵抗体 6 開放部 7 導体 8 第2電極 9 第3電極 DESCRIPTION OF SYMBOLS 1 Insulating substrate 2 Dividing groove 3 Individual electrode (1st electrode) 4 Common electrode 5 Resistor 6 Opening part 7 Conductor 8 2nd electrode 9 3rd electrode

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 絶縁基板上に分割溝により区画されて互
いに隣接する複数領域に、前記分割溝から離間して向い
合うように形成された複数の第1電極と、前記各領域に
おいて、前記複数の第1電極に対向配置された共通電極
と、該共通電極と前記各第1電極の各一部に重なるよう
にこれらの上に設けられて、かつトリミングにより抵抗
値が調整される抵抗体と、前記隣接する領域にあって互
いに向い合う位置にある前記第1電極と共通電極を、こ
れらの一部に重なるように、かつ前記分割溝を跨ぐよう
に接続する第2電極とを備えたことを特徴とするチップ
形抵抗ネックワーク。
A plurality of first electrodes formed in a plurality of regions which are defined by a dividing groove on an insulating substrate and which are adjacent to each other, and which are formed so as to be spaced apart from the dividing groove and face each other; A common electrode disposed opposite to the first electrode, and a resistor provided on the common electrode and each of the first electrodes so as to overlap each part of the first electrode and having a resistance value adjusted by trimming. And a second electrode that connects the first electrode and the common electrode in the adjacent area and facing each other so as to overlap a part of the first electrode and the common electrode so as to straddle the division groove. A chip type resistor neck work characterized by the following.
【請求項2】 絶縁基板上に分割溝により区画されて互
いに隣接する複数領域に、前記分割溝から離間して向い
合うように形成された複数の第1電極と、前記各領域に
おいて、前記複数の第1電極に対向配置された第3電極
と、該第3電極と前記各第1電極の各一部と重なるよう
に、および隣接する第3電極どうしの各一部に重なるよ
うに、これらの上に設けられて、かつトリミングにより
抵抗値が調整される抵抗体と、前記隣接する領域にあっ
て互いに向い合う位置にある前記第1電極と第3電極
を、これらの一部に重なるように、かつ前記分割溝を跨
ぐように接続する第2電極とを備えたことを特徴とする
チップ形抵抗ネックワーク。
2. A plurality of first electrodes formed in a plurality of regions partitioned by a dividing groove on an insulating substrate and adjacent to each other and formed so as to be spaced apart from the dividing groove and face each other. A third electrode opposed to the first electrode, and a third electrode and a part of each of the first electrodes, and a part of the third electrodes adjacent to each other. And a first electrode and a third electrode which are provided on the first electrode and whose resistance value is adjusted by trimming, and the first electrode and the third electrode which are located in the adjacent area and face each other are overlapped with a part thereof. And a second electrode connected so as to straddle the dividing groove.
【請求項3】 前記第2電極が、導電性樹脂により形成
されていることを特徴とする請求項1または請求項2に
記載のチップ形抵抗ネックワーク。
3. The chip-type resistor neckwork according to claim 1, wherein the second electrode is formed of a conductive resin.
【請求項4】 絶縁基板上に分割溝により区画されて互
いに隣接する複数領域に、前記分割溝から離間して向い
合うように複数の第1電極を形成するとともに、前記各
領域において、前記複数の第1電極に対向配置するよう
に共通電極を形成する電極形成工程と、該共通電極と前
記各第1電極の各一部に重なるようにこれらの上にトリ
ミングにより抵抗値が調整される抵抗体を設ける抵抗体
形成工程と、前記隣接する領域にあって互いに向い合う
位置にある前記第1電極と共通電極を、これらの一部に
重なるように、かつ前記分割溝を跨ぐように第2電極を
接続する第2電極形成工程とを有することを特徴とする
チップ形抵抗ネックワークの製造方法。
4. A plurality of first electrodes are formed in a plurality of regions partitioned by a dividing groove and adjacent to each other on an insulating substrate so as to face away from the dividing groove and face each other. An electrode forming step of forming a common electrode so as to face the first electrode, and a resistor whose resistance value is adjusted by trimming the common electrode and each of the first electrodes so as to overlap each part of the first electrode. A resistor forming step of providing a body, and a second step in which the first electrode and the common electrode located in the adjacent region and facing each other are overlapped with a part of the first electrode and the common electrode so as to straddle the division groove. And a second electrode forming step of connecting the electrodes.
【請求項5】 絶縁基板上に分割溝により区画されて互
いに隣接する複数領域に、前記分割溝から離間して向い
合うように複数の第1電極を形成するとともに、前記各
領域において、前記複数の第1電極に対向配置するよう
に第3電極を形成する電極形成工程と、該第3電極と前
記各第1電極の各一部とに重なるように、および隣接す
る第3電極どうしの各一部に重なるように、これらの上
にトリミングにより抵抗値が調整される抵抗体を設ける
抵抗体形成工程と、前記隣接する領域にあって互いに向
い合う位置にある前記第1電極と第3電極を、これらの
一部に重なるように、かつ前記分割溝を跨ぐように第2
電極を接続する第2電極形成工程とを有することを特徴
とするチップ形抵抗ネックワークの製造方法。
5. A plurality of first electrodes are formed in a plurality of regions partitioned by a dividing groove and adjacent to each other on an insulating substrate so as to be spaced apart from the dividing groove and face each other. An electrode forming step of forming a third electrode so as to be opposed to the first electrode, and forming each of the third electrodes so as to overlap with the third electrode and each part of each of the first electrodes and between adjacent third electrodes. A resistor forming step of providing a resistor whose resistance value is adjusted by trimming thereon so as to partially overlap the first electrode and the third electrode which are located in the adjacent region and opposed to each other; In such a manner as to overlap a part thereof and to straddle the dividing groove.
And a second electrode forming step of connecting the electrodes.
JP2001175698A 2001-06-11 2001-06-11 Manufacturing method of chip-type resistor network Expired - Lifetime JP4795568B2 (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05234725A (en) * 1992-02-25 1993-09-10 Rohm Co Ltd Manufacture of chip type composite electronic component
JPH07335411A (en) * 1994-06-06 1995-12-22 Kamaya Denki Kk Chip resistor network
JP2000306711A (en) * 1999-04-19 2000-11-02 Matsushita Electric Ind Co Ltd Multiple chip resistor and production thereof
JP2001143902A (en) * 1999-11-16 2001-05-25 Matsushita Electric Ind Co Ltd Resistor and its manufacturing method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05234725A (en) * 1992-02-25 1993-09-10 Rohm Co Ltd Manufacture of chip type composite electronic component
JPH07335411A (en) * 1994-06-06 1995-12-22 Kamaya Denki Kk Chip resistor network
JP2000306711A (en) * 1999-04-19 2000-11-02 Matsushita Electric Ind Co Ltd Multiple chip resistor and production thereof
JP2001143902A (en) * 1999-11-16 2001-05-25 Matsushita Electric Ind Co Ltd Resistor and its manufacturing method

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