JP2002318169A5 - - Google Patents

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Publication number
JP2002318169A5
JP2002318169A5 JP2002002689A JP2002002689A JP2002318169A5 JP 2002318169 A5 JP2002318169 A5 JP 2002318169A5 JP 2002002689 A JP2002002689 A JP 2002002689A JP 2002002689 A JP2002002689 A JP 2002002689A JP 2002318169 A5 JP2002318169 A5 JP 2002318169A5
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JP
Japan
Prior art keywords
polarization
probe beam
retarding element
axis
components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2002002689A
Other languages
English (en)
Japanese (ja)
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JP2002318169A (ja
Filing date
Publication date
Priority claimed from GBGB0100819.2A external-priority patent/GB0100819D0/en
Application filed filed Critical
Publication of JP2002318169A publication Critical patent/JP2002318169A/ja
Publication of JP2002318169A5 publication Critical patent/JP2002318169A5/ja
Ceased legal-status Critical Current

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JP2002002689A 2001-01-12 2002-01-09 リターディング素子の光学特性の測定方法 Ceased JP2002318169A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0100819.2A GB0100819D0 (en) 2001-01-12 2001-01-12 Optical characterization of retarding devices
GB0100819.2 2001-01-12

Publications (2)

Publication Number Publication Date
JP2002318169A JP2002318169A (ja) 2002-10-31
JP2002318169A5 true JP2002318169A5 (enExample) 2005-08-04

Family

ID=9906711

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002002689A Ceased JP2002318169A (ja) 2001-01-12 2002-01-09 リターディング素子の光学特性の測定方法

Country Status (3)

Country Link
US (1) US6697161B2 (enExample)
JP (1) JP2002318169A (enExample)
GB (2) GB0100819D0 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100453710B1 (ko) * 2002-02-09 2004-10-20 국방과학연구소 표면 측정장치 및 그 측정방법
US7212289B1 (en) * 2002-11-18 2007-05-01 Carl Zeiss Smt Ag Interferometric measurement device for determining the birefringence in a transparent object
JP4556463B2 (ja) * 2004-03-25 2010-10-06 有限会社グローバルファイバオプティックス 複屈折率測定装置
DE102004051247B3 (de) * 2004-10-20 2006-04-06 Thüringisches Institut für Textil- und Kunststoff-Forschung e.V. Schnelle Messung hoher Gangunterschiede von doppelbrechenden Medien ohne und mit Falschfarben durch simultane Kombination des Mehrfarben-Senarmont-Verfahrens mit der diskreten Fourier-Analyse
JP4538344B2 (ja) * 2005-03-01 2010-09-08 日本分光株式会社 軸方位測定装置および方法
JPWO2008010482A1 (ja) * 2006-07-19 2009-12-17 学校法人慶應義塾 光弾性測定方法およびその装置
CN102620907B (zh) * 2012-03-19 2014-02-26 中国科学院上海技术物理研究所 一种测量光学器件相位延迟角度的方法
DE102014204941A1 (de) * 2014-03-17 2015-09-17 Menlo Systems Gmbh Verfahren zum Betreiben einer Lasereinrichtung, Resonatoranordnung und Verwendung eines Phasenschiebers
CN108760249B (zh) * 2018-05-30 2019-09-24 西北大学 一种波片面相位延迟量的检测方法与装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3692385A (en) * 1970-06-01 1972-09-19 John George Gievers Rotation sensitive retarder system
JPS5532094A (en) * 1978-08-29 1980-03-06 Matsushita Electric Ind Co Ltd Corona discharge device
JPS55121456A (en) * 1979-03-12 1980-09-18 Toshiba Electric Equip Corp Power source device
JPS6026374A (ja) * 1983-07-22 1985-02-09 Canon Inc 帯電器の給電装置
US4801798A (en) * 1987-12-14 1989-01-31 Eastman Kodak Company Method and apparatus for measuring optical retardation in transparent materials
US5257092A (en) * 1990-06-27 1993-10-26 Asahi Kogaku Kogyo Kabushiki Kaisha Apparatus for measuring polarization and birefringence
US5235404A (en) * 1991-06-27 1993-08-10 Board Of Trustees, Leland Stanford Junior University, Stanford University Interferometric technique for measurement of nonreciprocal optical effects in a sample
JPH06147986A (ja) * 1992-11-12 1994-05-27 Sadao Nakai 複屈折分布測定方法
US5619325A (en) * 1995-04-04 1997-04-08 Advantest Corporation Optical system for ellipsometry utilizing a circularly polarized probe beam
JPH11297455A (ja) * 1998-04-14 1999-10-29 Kasuga Electric Works Ltd 放電電極針
JP2000340393A (ja) * 1999-05-28 2000-12-08 Ishiyama Seisakusho:Kk 高圧印加式除電器の除電電極である放電電極のスパッタリング現象防止、オゾン発生防止、並びに発光作用防止又真空層内の帯電除去等装置及びその製造方法。
JP3083939U (ja) * 2001-08-07 2002-02-22 道雄 津郷 足元灯
JP3083938U (ja) * 2001-08-07 2002-02-22 道雄 津郷 電気スタンド

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