GB0100819D0 - Optical characterization of retarding devices - Google Patents

Optical characterization of retarding devices

Info

Publication number
GB0100819D0
GB0100819D0 GBGB0100819.2A GB0100819A GB0100819D0 GB 0100819 D0 GB0100819 D0 GB 0100819D0 GB 0100819 A GB0100819 A GB 0100819A GB 0100819 D0 GB0100819 D0 GB 0100819D0
Authority
GB
United Kingdom
Prior art keywords
optical characterization
retarding devices
retarding
devices
characterization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0100819.2A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Priority to GBGB0100819.2A priority Critical patent/GB0100819D0/en
Publication of GB0100819D0 publication Critical patent/GB0100819D0/en
Priority to GB0129770A priority patent/GB2374141B/en
Priority to JP2002002689A priority patent/JP2002318169A/ja
Priority to US10/040,425 priority patent/US6697161B2/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)
GBGB0100819.2A 2001-01-12 2001-01-12 Optical characterization of retarding devices Ceased GB0100819D0 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
GBGB0100819.2A GB0100819D0 (en) 2001-01-12 2001-01-12 Optical characterization of retarding devices
GB0129770A GB2374141B (en) 2001-01-12 2001-12-12 Optical characterization of retarding devices
JP2002002689A JP2002318169A (ja) 2001-01-12 2002-01-09 リターディング素子の光学特性の測定方法
US10/040,425 US6697161B2 (en) 2001-01-12 2002-01-10 Optical characterization of retarding devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0100819.2A GB0100819D0 (en) 2001-01-12 2001-01-12 Optical characterization of retarding devices

Publications (1)

Publication Number Publication Date
GB0100819D0 true GB0100819D0 (en) 2001-02-21

Family

ID=9906711

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB0100819.2A Ceased GB0100819D0 (en) 2001-01-12 2001-01-12 Optical characterization of retarding devices
GB0129770A Expired - Fee Related GB2374141B (en) 2001-01-12 2001-12-12 Optical characterization of retarding devices

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB0129770A Expired - Fee Related GB2374141B (en) 2001-01-12 2001-12-12 Optical characterization of retarding devices

Country Status (3)

Country Link
US (1) US6697161B2 (enExample)
JP (1) JP2002318169A (enExample)
GB (2) GB0100819D0 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100453710B1 (ko) * 2002-02-09 2004-10-20 국방과학연구소 표면 측정장치 및 그 측정방법
US7212289B1 (en) * 2002-11-18 2007-05-01 Carl Zeiss Smt Ag Interferometric measurement device for determining the birefringence in a transparent object
JP4556463B2 (ja) * 2004-03-25 2010-10-06 有限会社グローバルファイバオプティックス 複屈折率測定装置
DE102004051247B3 (de) * 2004-10-20 2006-04-06 Thüringisches Institut für Textil- und Kunststoff-Forschung e.V. Schnelle Messung hoher Gangunterschiede von doppelbrechenden Medien ohne und mit Falschfarben durch simultane Kombination des Mehrfarben-Senarmont-Verfahrens mit der diskreten Fourier-Analyse
JP4538344B2 (ja) * 2005-03-01 2010-09-08 日本分光株式会社 軸方位測定装置および方法
JPWO2008010482A1 (ja) * 2006-07-19 2009-12-17 学校法人慶應義塾 光弾性測定方法およびその装置
CN102620907B (zh) * 2012-03-19 2014-02-26 中国科学院上海技术物理研究所 一种测量光学器件相位延迟角度的方法
DE102014204941A1 (de) * 2014-03-17 2015-09-17 Menlo Systems Gmbh Verfahren zum Betreiben einer Lasereinrichtung, Resonatoranordnung und Verwendung eines Phasenschiebers
CN108760249B (zh) * 2018-05-30 2019-09-24 西北大学 一种波片面相位延迟量的检测方法与装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3692385A (en) * 1970-06-01 1972-09-19 John George Gievers Rotation sensitive retarder system
JPS5532094A (en) * 1978-08-29 1980-03-06 Matsushita Electric Ind Co Ltd Corona discharge device
JPS55121456A (en) * 1979-03-12 1980-09-18 Toshiba Electric Equip Corp Power source device
JPS6026374A (ja) * 1983-07-22 1985-02-09 Canon Inc 帯電器の給電装置
US4801798A (en) * 1987-12-14 1989-01-31 Eastman Kodak Company Method and apparatus for measuring optical retardation in transparent materials
US5257092A (en) * 1990-06-27 1993-10-26 Asahi Kogaku Kogyo Kabushiki Kaisha Apparatus for measuring polarization and birefringence
US5235404A (en) * 1991-06-27 1993-08-10 Board Of Trustees, Leland Stanford Junior University, Stanford University Interferometric technique for measurement of nonreciprocal optical effects in a sample
JPH06147986A (ja) * 1992-11-12 1994-05-27 Sadao Nakai 複屈折分布測定方法
US5619325A (en) * 1995-04-04 1997-04-08 Advantest Corporation Optical system for ellipsometry utilizing a circularly polarized probe beam
JPH11297455A (ja) * 1998-04-14 1999-10-29 Kasuga Electric Works Ltd 放電電極針
JP2000340393A (ja) * 1999-05-28 2000-12-08 Ishiyama Seisakusho:Kk 高圧印加式除電器の除電電極である放電電極のスパッタリング現象防止、オゾン発生防止、並びに発光作用防止又真空層内の帯電除去等装置及びその製造方法。
JP3083939U (ja) * 2001-08-07 2002-02-22 道雄 津郷 足元灯
JP3083938U (ja) * 2001-08-07 2002-02-22 道雄 津郷 電気スタンド

Also Published As

Publication number Publication date
GB2374141A (en) 2002-10-09
GB2374141B (en) 2004-09-22
US20020159069A1 (en) 2002-10-31
US6697161B2 (en) 2004-02-24
GB0129770D0 (en) 2002-01-30
JP2002318169A (ja) 2002-10-31

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)