JP2002318169A - リターディング素子の光学特性の測定方法 - Google Patents

リターディング素子の光学特性の測定方法

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Publication number
JP2002318169A
JP2002318169A JP2002002689A JP2002002689A JP2002318169A JP 2002318169 A JP2002318169 A JP 2002318169A JP 2002002689 A JP2002002689 A JP 2002002689A JP 2002002689 A JP2002002689 A JP 2002002689A JP 2002318169 A JP2002318169 A JP 2002318169A
Authority
JP
Japan
Prior art keywords
polarization
analyzer
phase
retarding element
components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2002002689A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002318169A5 (enExample
Inventor
Susanne Klein
スザンヌ・クレイン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JP2002318169A publication Critical patent/JP2002318169A/ja
Publication of JP2002318169A5 publication Critical patent/JP2002318169A5/ja
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)
JP2002002689A 2001-01-12 2002-01-09 リターディング素子の光学特性の測定方法 Ceased JP2002318169A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0100819.2 2001-01-12
GBGB0100819.2A GB0100819D0 (en) 2001-01-12 2001-01-12 Optical characterization of retarding devices

Publications (2)

Publication Number Publication Date
JP2002318169A true JP2002318169A (ja) 2002-10-31
JP2002318169A5 JP2002318169A5 (enExample) 2005-08-04

Family

ID=9906711

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002002689A Ceased JP2002318169A (ja) 2001-01-12 2002-01-09 リターディング素子の光学特性の測定方法

Country Status (3)

Country Link
US (1) US6697161B2 (enExample)
JP (1) JP2002318169A (enExample)
GB (2) GB0100819D0 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005274380A (ja) * 2004-03-25 2005-10-06 Optoquest Co Ltd 複屈折率測定装置
JP2006242617A (ja) * 2005-03-01 2006-09-14 Jasco Corp 軸方位測定装置および方法
WO2008010482A1 (fr) * 2006-07-19 2008-01-24 Keio University Procédé de mesure d'élasticité optique et son dispositif
JP2017508301A (ja) * 2014-03-17 2017-03-23 メンロ システムズ ゲーエムベーハー レーザー装置を操作する方法、共振装置及び移相器の使用

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100453710B1 (ko) * 2002-02-09 2004-10-20 국방과학연구소 표면 측정장치 및 그 측정방법
US7212289B1 (en) * 2002-11-18 2007-05-01 Carl Zeiss Smt Ag Interferometric measurement device for determining the birefringence in a transparent object
DE102004051247B3 (de) * 2004-10-20 2006-04-06 Thüringisches Institut für Textil- und Kunststoff-Forschung e.V. Schnelle Messung hoher Gangunterschiede von doppelbrechenden Medien ohne und mit Falschfarben durch simultane Kombination des Mehrfarben-Senarmont-Verfahrens mit der diskreten Fourier-Analyse
CN102620907B (zh) * 2012-03-19 2014-02-26 中国科学院上海技术物理研究所 一种测量光学器件相位延迟角度的方法
CN108760249B (zh) * 2018-05-30 2019-09-24 西北大学 一种波片面相位延迟量的检测方法与装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5720630B2 (enExample) * 1978-08-29 1982-04-30
JPS6147423B2 (enExample) * 1979-03-12 1986-10-18 Toshiba Electric Equip
JPH0527859B2 (enExample) * 1983-07-22 1993-04-22 Canon Kk
JPH11297455A (ja) * 1998-04-14 1999-10-29 Kasuga Electric Works Ltd 放電電極針
JP2000340393A (ja) * 1999-05-28 2000-12-08 Ishiyama Seisakusho:Kk 高圧印加式除電器の除電電極である放電電極のスパッタリング現象防止、オゾン発生防止、並びに発光作用防止又真空層内の帯電除去等装置及びその製造方法。
JP3083938U (ja) * 2001-08-07 2002-02-22 道雄 津郷 電気スタンド
JP3083939U (ja) * 2001-08-07 2002-02-22 道雄 津郷 足元灯

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3692385A (en) * 1970-06-01 1972-09-19 John George Gievers Rotation sensitive retarder system
US4801798A (en) * 1987-12-14 1989-01-31 Eastman Kodak Company Method and apparatus for measuring optical retardation in transparent materials
US5257092A (en) * 1990-06-27 1993-10-26 Asahi Kogaku Kogyo Kabushiki Kaisha Apparatus for measuring polarization and birefringence
US5235404A (en) * 1991-06-27 1993-08-10 Board Of Trustees, Leland Stanford Junior University, Stanford University Interferometric technique for measurement of nonreciprocal optical effects in a sample
JPH06147986A (ja) * 1992-11-12 1994-05-27 Sadao Nakai 複屈折分布測定方法
US5619325A (en) * 1995-04-04 1997-04-08 Advantest Corporation Optical system for ellipsometry utilizing a circularly polarized probe beam

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5720630B2 (enExample) * 1978-08-29 1982-04-30
JPS6147423B2 (enExample) * 1979-03-12 1986-10-18 Toshiba Electric Equip
JPH0527859B2 (enExample) * 1983-07-22 1993-04-22 Canon Kk
JPH11297455A (ja) * 1998-04-14 1999-10-29 Kasuga Electric Works Ltd 放電電極針
JP2000340393A (ja) * 1999-05-28 2000-12-08 Ishiyama Seisakusho:Kk 高圧印加式除電器の除電電極である放電電極のスパッタリング現象防止、オゾン発生防止、並びに発光作用防止又真空層内の帯電除去等装置及びその製造方法。
JP3083938U (ja) * 2001-08-07 2002-02-22 道雄 津郷 電気スタンド
JP3083939U (ja) * 2001-08-07 2002-02-22 道雄 津郷 足元灯

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005274380A (ja) * 2004-03-25 2005-10-06 Optoquest Co Ltd 複屈折率測定装置
JP2006242617A (ja) * 2005-03-01 2006-09-14 Jasco Corp 軸方位測定装置および方法
WO2008010482A1 (fr) * 2006-07-19 2008-01-24 Keio University Procédé de mesure d'élasticité optique et son dispositif
JPWO2008010482A1 (ja) * 2006-07-19 2009-12-17 学校法人慶應義塾 光弾性測定方法およびその装置
JP2017508301A (ja) * 2014-03-17 2017-03-23 メンロ システムズ ゲーエムベーハー レーザー装置を操作する方法、共振装置及び移相器の使用
US10720750B2 (en) 2014-03-17 2020-07-21 Menlo Systems Gmbh Method for operating a laser device, resonator arrangement and use of a phase shifter

Also Published As

Publication number Publication date
GB2374141B (en) 2004-09-22
US20020159069A1 (en) 2002-10-31
GB0100819D0 (en) 2001-02-21
US6697161B2 (en) 2004-02-24
GB0129770D0 (en) 2002-01-30
GB2374141A (en) 2002-10-09

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