JP2002107392A - ジッタ測定装置、ジッタ測定方法、試験装置 - Google Patents

ジッタ測定装置、ジッタ測定方法、試験装置

Info

Publication number
JP2002107392A
JP2002107392A JP2001257052A JP2001257052A JP2002107392A JP 2002107392 A JP2002107392 A JP 2002107392A JP 2001257052 A JP2001257052 A JP 2001257052A JP 2001257052 A JP2001257052 A JP 2001257052A JP 2002107392 A JP2002107392 A JP 2002107392A
Authority
JP
Japan
Prior art keywords
signal
jitter
period
value
band
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001257052A
Other languages
English (en)
Japanese (ja)
Inventor
Masahiro Ishida
雅裕 石田
Takahiro Yamaguchi
隆弘 山口
Mani Soma
マニ ソーマ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of JP2002107392A publication Critical patent/JP2002107392A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Dc Digital Transmission (AREA)
JP2001257052A 2000-08-28 2001-08-27 ジッタ測定装置、ジッタ測定方法、試験装置 Pending JP2002107392A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/650,000 US6598004B1 (en) 2000-08-28 2000-08-28 Jitter measurement apparatus and its method
US09/650000 2000-08-28

Publications (1)

Publication Number Publication Date
JP2002107392A true JP2002107392A (ja) 2002-04-10

Family

ID=24607079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001257052A Pending JP2002107392A (ja) 2000-08-28 2001-08-27 ジッタ測定装置、ジッタ測定方法、試験装置

Country Status (3)

Country Link
US (1) US6598004B1 (US06598004-20030722-M00004.png)
JP (1) JP2002107392A (US06598004-20030722-M00004.png)
DE (1) DE10142855A1 (US06598004-20030722-M00004.png)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005233946A (ja) * 2004-02-18 2005-09-02 Advantest Corp ジッタ測定装置、ジッタ測定方法およびプログラム
WO2008114700A1 (ja) * 2007-03-13 2008-09-25 Advantest Corporation 測定装置、測定方法、試験装置、電子デバイス、および、プログラム
WO2011033589A1 (ja) * 2009-09-18 2011-03-24 株式会社アドバンテスト 試験装置および試験方法
WO2011033588A1 (ja) * 2009-09-18 2011-03-24 株式会社アドバンテスト 試験装置および試験方法
JP2015512173A (ja) * 2012-12-13 2015-04-23 インテル・コーポレーション Ｐａｍ送信機におけるジッタ抑制のための歪み測定

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6721724B1 (en) 2000-03-31 2004-04-13 Microsoft Corporation Validating multiple execution plans for database queries
US7035325B2 (en) * 2001-05-25 2006-04-25 Tektronix, Inc. Jitter measurement using mixed down topology
GB0115015D0 (en) * 2001-06-20 2001-08-08 Koninkl Philips Electronics Nv Method of, and receiver for, minimising carrier phase rotation due to signal adjustments and enhancements
US6832179B2 (en) 2001-06-26 2004-12-14 Invensys Systems, Inc. Evaluating a vortex flow-meter signal
KR100398879B1 (ko) * 2001-07-09 2003-09-19 삼성전자주식회사 입력신호의 영점교차 특성을 이용한 위상오차 검출장치
JP2004093345A (ja) * 2002-08-30 2004-03-25 Renesas Technology Corp ジッタ測定回路
US20040062301A1 (en) * 2002-09-30 2004-04-01 Takahiro Yamaguchi Jitter measurement apparatus and jitter measurement method
KR100512965B1 (ko) * 2003-03-14 2005-09-07 삼성전자주식회사 입력신호의 히스토그램 정보에 기초한 주파수 오차검출장치 및 검출방법
US7236555B2 (en) * 2004-01-23 2007-06-26 Sunrise Telecom Incorporated Method and apparatus for measuring jitter
US7284141B2 (en) * 2004-02-05 2007-10-16 Anritsu Company Method of and apparatus for measuring jitter and generating an eye diagram of a high speed data signal
CN100357935C (zh) * 2004-08-27 2007-12-26 鸿富锦精密工业（深圳）有限公司 泛用型抖动分析系统及方法
DE102004058255A1 (de) * 2004-12-03 2006-05-04 Red-Ant Measurement Technologies And Services E.K. Verfahren zur Bestimmung der Periodendauer eines Messsignals
DE102005035473A1 (de) * 2005-07-28 2007-02-01 Rohde & Schwarz Gmbh & Co. Kg Verfahren und System zur digitalen Triggerung für Oszilloskope
DE102005035394A1 (de) * 2005-07-28 2007-02-15 Rohde & Schwarz Gmbh & Co Kg Verfahren und System zur digitalen Triggerung von Signalen auf der Basis von zwei zeitlich beabstandeten Triggerereignissen
US20070118361A1 (en) * 2005-10-07 2007-05-24 Deepen Sinha Window apparatus and method
US7778319B2 (en) * 2005-11-04 2010-08-17 Advantest Corporation Jitter measuring apparatus, jitter measuring method and test apparatus
US8068538B2 (en) * 2005-11-04 2011-11-29 Advantest Corporation Jitter measuring apparatus, jitter measuring method and test apparatus
US20070271049A1 (en) * 2006-05-16 2007-11-22 Carole James A Method and system for measuring band pass filtered phase noise of a repetitive signal
US7945009B1 (en) 2006-08-22 2011-05-17 Marvell International Ltd. Jitter measurement
US7734434B2 (en) * 2007-03-30 2010-06-08 Intel Corporation High speed digital waveform identification using higher order statistical signal processing
US7620861B2 (en) * 2007-05-31 2009-11-17 Kingtiger Technology (Canada) Inc. Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels
US7953579B2 (en) * 2007-08-30 2011-05-31 Micron Technology, Inc. Jittery signal generation with discrete-time filtering
JP5256094B2 (ja) * 2009-03-30 2013-08-07 アンリツ株式会社 ジッタ測定装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05107287A (ja) * 1991-10-18 1993-04-27 Advantest Corp ジツタ解析装置
US6263290B1 (en) * 1995-02-22 2001-07-17 Michael K. Williams Process and machine for signal waveform analysis
CN1209631C (zh) * 1998-01-30 2005-07-06 波峰有限公司 用于抖动分析的方法
US20010037189A1 (en) * 2000-01-20 2001-11-01 Dan Onu Method of estimating phase noise spectral density and jitter in a periodic signal

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005233946A (ja) * 2004-02-18 2005-09-02 Advantest Corp ジッタ測定装置、ジッタ測定方法およびプログラム
WO2008114700A1 (ja) * 2007-03-13 2008-09-25 Advantest Corporation 測定装置、測定方法、試験装置、電子デバイス、および、プログラム
JPWO2008114700A1 (ja) * 2007-03-13 2010-07-01 株式会社アドバンテスト 測定装置、測定方法、試験装置、電子デバイス、および、プログラム
WO2011033589A1 (ja) * 2009-09-18 2011-03-24 株式会社アドバンテスト 試験装置および試験方法
WO2011033588A1 (ja) * 2009-09-18 2011-03-24 株式会社アドバンテスト 試験装置および試験方法
JPWO2011033588A1 (ja) * 2009-09-18 2013-02-07 株式会社アドバンテスト 試験装置および試験方法
JPWO2011033589A1 (ja) * 2009-09-18 2013-02-07 株式会社アドバンテスト 試験装置および試験方法
US8473248B2 (en) 2009-09-18 2013-06-25 Advantest Corporation Test apparatus and test method
US8554514B2 (en) 2009-09-18 2013-10-08 Advantest Corporation Test apparatus and test method
JP2015512173A (ja) * 2012-12-13 2015-04-23 インテル・コーポレーション Ｐａｍ送信機におけるジッタ抑制のための歪み測定
US9344203B2 (en) 2012-12-13 2016-05-17 Intel Corporation Distortion measurement for limiting jitter in PAM transmitters

Also Published As

Publication number Publication date
US6598004B1 (en) 2003-07-22
DE10142855A1 (de) 2002-04-04

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