JP2002091416A - 画像調整装置 - Google Patents

画像調整装置

Info

Publication number
JP2002091416A
JP2002091416A JP2000283511A JP2000283511A JP2002091416A JP 2002091416 A JP2002091416 A JP 2002091416A JP 2000283511 A JP2000283511 A JP 2000283511A JP 2000283511 A JP2000283511 A JP 2000283511A JP 2002091416 A JP2002091416 A JP 2002091416A
Authority
JP
Japan
Prior art keywords
adjustment
image
brightness
contrast
image adjustment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000283511A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002091416A5 (enExample
Inventor
Takao Marui
隆雄 丸井
Satoshi Yoshimi
聡 吉見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2000283511A priority Critical patent/JP2002091416A/ja
Publication of JP2002091416A publication Critical patent/JP2002091416A/ja
Publication of JP2002091416A5 publication Critical patent/JP2002091416A5/ja
Pending legal-status Critical Current

Links

Landscapes

  • Controls And Circuits For Display Device (AREA)
JP2000283511A 2000-09-19 2000-09-19 画像調整装置 Pending JP2002091416A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000283511A JP2002091416A (ja) 2000-09-19 2000-09-19 画像調整装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000283511A JP2002091416A (ja) 2000-09-19 2000-09-19 画像調整装置

Publications (2)

Publication Number Publication Date
JP2002091416A true JP2002091416A (ja) 2002-03-27
JP2002091416A5 JP2002091416A5 (enExample) 2007-02-08

Family

ID=18767865

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000283511A Pending JP2002091416A (ja) 2000-09-19 2000-09-19 画像調整装置

Country Status (1)

Country Link
JP (1) JP2002091416A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100705109B1 (ko) 2005-04-22 2007-04-06 엘지전자 주식회사 영상 표시 장치의 화질 조정 방법
JP2009529947A (ja) * 2006-03-17 2009-08-27 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 関心領域及び関心ボリュームをインタラクティブに規定するシステム及び方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04328234A (ja) * 1991-04-26 1992-11-17 Jeol Ltd 電子顕微鏡における自動輝度/コントラスト調整方式
JPH0546105A (ja) * 1991-08-13 1993-02-26 Sony Corp 画質制御装置
JPH08287860A (ja) * 1995-04-10 1996-11-01 Hitachi Ltd 走査電子顕微鏡
JPH1173275A (ja) * 1997-08-29 1999-03-16 Sharp Corp 情報処理装置
JP2000036276A (ja) * 1998-07-21 2000-02-02 Hitachi Ltd 荷電粒子線装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04328234A (ja) * 1991-04-26 1992-11-17 Jeol Ltd 電子顕微鏡における自動輝度/コントラスト調整方式
JPH0546105A (ja) * 1991-08-13 1993-02-26 Sony Corp 画質制御装置
JPH08287860A (ja) * 1995-04-10 1996-11-01 Hitachi Ltd 走査電子顕微鏡
JPH1173275A (ja) * 1997-08-29 1999-03-16 Sharp Corp 情報処理装置
JP2000036276A (ja) * 1998-07-21 2000-02-02 Hitachi Ltd 荷電粒子線装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100705109B1 (ko) 2005-04-22 2007-04-06 엘지전자 주식회사 영상 표시 장치의 화질 조정 방법
JP2009529947A (ja) * 2006-03-17 2009-08-27 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 関心領域及び関心ボリュームをインタラクティブに規定するシステム及び方法

Similar Documents

Publication Publication Date Title
US9129773B2 (en) Charged particle beam apparatus
US20080093551A1 (en) Electric charged particle beam microscopy and electric charged particle beam microscope
US8907303B2 (en) Stage device and control method for stage device
JP2010040381A (ja) 傾斜観察方法および観察装置
JP2006196236A (ja) 電子顕微鏡及び観察方法
JP2005209488A (ja) 荷電粒子線装置および倍率計測法
WO2010061516A1 (ja) 画像形成方法、及び画像形成装置
KR101455944B1 (ko) 주사 전자 현미경
JP4928987B2 (ja) 荷電粒子線調整方法及び荷電粒子線装置
JP2002091416A (ja) 画像調整装置
JPWO2006082714A1 (ja) 走査ビーム照射装置
US8927931B2 (en) Scanning electron microscope
US8067752B2 (en) Semiconductor testing method and semiconductor tester
US11837433B2 (en) Method of measuring relative rotational angle and scanning transmission electron microscope
JP7535193B2 (ja) 荷電粒子線装置
JPH11185688A (ja) 観察装置及びその倍率調整方法
JP4397730B2 (ja) 電子顕微鏡の絞り補正方法及び装置
JP2003331775A (ja) 集束イオンビーム装置
JP2010157370A (ja) Semの操作装置
JP5084528B2 (ja) 電子顕微鏡の制御装置及び制御方法
JP3195708B2 (ja) 透過電子顕微鏡用非点補正装置
JP2002098897A (ja) 顕微鏡
JP5202568B2 (ja) 半導体検査装置及びそのコンピュータプログラム
JP2019040747A (ja) 微細構造体の加工方法、および微細構造体の加工装置
JPH07254387A (ja) 走査型荷電粒子線顕微鏡

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20061208

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20061208

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100218

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20100712