JP2002082171A5 - - Google Patents

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Publication number
JP2002082171A5
JP2002082171A5 JP2000274787A JP2000274787A JP2002082171A5 JP 2002082171 A5 JP2002082171 A5 JP 2002082171A5 JP 2000274787 A JP2000274787 A JP 2000274787A JP 2000274787 A JP2000274787 A JP 2000274787A JP 2002082171 A5 JP2002082171 A5 JP 2002082171A5
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JP
Japan
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JP2000274787A
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JP2002082171A (ja
JP4678924B2 (ja
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Priority to JP2000274787A priority Critical patent/JP4678924B2/ja
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Publication of JP2002082171A5 publication Critical patent/JP2002082171A5/ja
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Publication of JP4678924B2 publication Critical patent/JP4678924B2/ja
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JP2000274787A 2000-09-11 2000-09-11 放射線検出器およびこれを用いたｘ線診断装置 Expired - Fee Related JP4678924B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000274787A JP4678924B2 (ja) 2000-09-11 2000-09-11 放射線検出器およびこれを用いたｘ線診断装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000274787A JP4678924B2 (ja) 2000-09-11 2000-09-11 放射線検出器およびこれを用いたｘ線診断装置

Publications (3)

Publication Number Publication Date
JP2002082171A JP2002082171A (ja) 2002-03-22
JP2002082171A5 true JP2002082171A5 (ja) 2007-10-25
JP4678924B2 JP4678924B2 (ja) 2011-04-27

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ID=18760494

Family Applications (1)

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JP2000274787A Expired - Fee Related JP4678924B2 (ja) 2000-09-11 2000-09-11 放射線検出器およびこれを用いたｘ線診断装置

Country Status (1)

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JP (1) JP4678924B2 (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004028815A (ja) * 2002-06-26 2004-01-29 Toshiba Corp シンチレータブロックとその製造方法ならびにｘ線検出器およびｘ線ｃｔ装置
DE10238398A1 (de) * 2002-08-22 2004-02-26 Philips Intellectual Property & Standards Gmbh Vorrichtung zur Erzeugung von Bildern und/oder Projektionen
US6992616B2 (en) * 2003-12-05 2006-01-31 Safeview, Inc. Millimeter-wave active imaging system
JP4669768B2 (ja) * 2005-09-30 2011-04-13 富士フイルム株式会社 解像度可変型ｘ線撮像装置及びｘ線ｃｔ装置
JP4724007B2 (ja) * 2006-01-31 2011-07-13 株式会社東芝 放射線検出器
JP2010169674A (ja) * 2008-12-26 2010-08-05 Tohoku Univ 放射線検出器
WO2012011505A1 (ja) * 2010-07-21 2012-01-26 国立大学法人広島大学 放射線検出器
FR2975108A1 (fr) * 2011-05-12 2012-11-16 Onectra Procede de depot de bore sur une tole metallique pour appareil de detection de neutrons ou chambre d'ionisation
JP5794501B2 (ja) * 2011-07-25 2015-10-14 国立研究開発法人理化学研究所 荷電粒子によるエネルギー付与用ノズルの製造方法、エネルギー付与用ノズル、エネルギー付与装置、および荷電粒子照射強度計測システム
JP6452425B2 (ja) * 2014-12-11 2019-01-16 株式会社日立製作所 放射線モニタ
JP6516596B2 (ja) * 2015-07-06 2019-05-22 株式会社日立製作所 放射線モニタ

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4230510A (en) * 1977-11-21 1980-10-28 General Electric Company Distributed phosphor scintillator structures
US4242221A (en) * 1977-11-21 1980-12-30 General Electric Company Ceramic-like scintillators
JPS55160078A (en) * 1979-05-25 1980-12-12 Fuji Photo Film Co Ltd Fluorescent substance and preparation of the same
JPS617489A (ja) * 1984-06-21 1986-01-14 Toshiba Corp 放射線検出器
JPH07104875B2 (ja) * 1987-07-29 1995-11-13 富士通株式会社 Ｐｅｒｔ図作成装置
JPH02187704A (ja) * 1989-01-17 1990-07-23 Fujitsu Ltd プラスチック螢光ファイバ
JP2738761B2 (ja) * 1990-01-23 1998-04-08 日本電信電話株式会社 Ｘ線計数管
JPH03243686A (ja) * 1990-02-21 1991-10-30 Toshiba Corp セラミックシンチレータ
JPH03257391A (ja) * 1990-03-08 1991-11-15 Mitsubishi Atom Power Ind Inc Ｘ線照射分布計測装置
FR2679042B1 (fr) * 1991-07-08 1996-10-18 Commissariat Energie Atomique Procede et appareil de detection simultanee et selective de neutrons et de photons x ou gamma.
JP3260541B2 (ja) * 1994-03-15 2002-02-25 株式会社東芝 蛍光体粉、セラミックスシンチレータ及びその製造方法
JPH09264963A (ja) * 1996-03-29 1997-10-07 Yazaki Corp α線シンチレーション検出器
JPH10232284A (ja) * 1997-02-19 1998-09-02 Toshiba Corp 波長シフト型放射線センサおよび放射線検出装置
DE69725179T2 (de) * 1997-08-11 2004-07-01 Bio-Scan S.A. Bildgebendes verfahren und system unter verwendung von gamma- und röntgenstrahlung
JP2000065936A (ja) * 1998-08-25 2000-03-03 Japan Atom Energy Res Inst 蛍光伝送方式によるホスウィッチ放射線同時計測法及びその検出器
JP2000147125A (ja) * 1998-11-05 2000-05-26 Toshiba Corp 放射線検出装置およびコンピュータ読み取り可能な記録媒体

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