JP2002074960A - 半導体記憶装置 - Google Patents
半導体記憶装置Info
- Publication number
- JP2002074960A JP2002074960A JP2000253888A JP2000253888A JP2002074960A JP 2002074960 A JP2002074960 A JP 2002074960A JP 2000253888 A JP2000253888 A JP 2000253888A JP 2000253888 A JP2000253888 A JP 2000253888A JP 2002074960 A JP2002074960 A JP 2002074960A
- Authority
- JP
- Japan
- Prior art keywords
- bit line
- potential
- switch
- power supply
- overdrive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4094—Bit-line management or control circuits
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000253888A JP2002074960A (ja) | 2000-08-24 | 2000-08-24 | 半導体記憶装置 |
| US09/935,010 US6519198B2 (en) | 2000-08-24 | 2001-08-21 | Semiconductor memory device |
| US10/322,405 US6762968B2 (en) | 2000-08-24 | 2002-12-17 | Semiconductor memory device having a small-sized memory chip and a decreased power-supply noise |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000253888A JP2002074960A (ja) | 2000-08-24 | 2000-08-24 | 半導体記憶装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002074960A true JP2002074960A (ja) | 2002-03-15 |
| JP2002074960A5 JP2002074960A5 (enExample) | 2005-07-07 |
Family
ID=18742917
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000253888A Pending JP2002074960A (ja) | 2000-08-24 | 2000-08-24 | 半導体記憶装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US6519198B2 (enExample) |
| JP (1) | JP2002074960A (enExample) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009020952A (ja) * | 2007-07-11 | 2009-01-29 | Elpida Memory Inc | 半導体記憶装置 |
| US7567469B2 (en) | 2006-06-29 | 2009-07-28 | Hynix Semiconductor Inc. | Over driving pulse generator |
| US7800424B2 (en) | 2007-02-09 | 2010-09-21 | Hynix Semiconductor Inc. | Apparatus for supplying overdriving signal |
| US8687447B2 (en) | 2009-09-30 | 2014-04-01 | SK Hynix Inc. | Semiconductor memory apparatus and test method using the same |
| JP2018073449A (ja) * | 2016-11-04 | 2018-05-10 | 力晶科技股▲ふん▼有限公司 | 半導体記憶装置 |
| US10204692B1 (en) | 2017-09-14 | 2019-02-12 | Toshiba Memory Corporation | Semiconductor memory device |
| US10892020B2 (en) | 2018-06-26 | 2021-01-12 | Toshiba Memory Corporation | Semiconductor memory device |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3874655B2 (ja) * | 2001-12-06 | 2007-01-31 | 富士通株式会社 | 半導体記憶装置、及び半導体記憶装置のデータアクセス方法 |
| US7221605B2 (en) * | 2004-08-31 | 2007-05-22 | Micron Technology, Inc. | Switched capacitor DRAM sense amplifier with immunity to mismatch and offsets |
| US7176719B2 (en) * | 2004-08-31 | 2007-02-13 | Micron Technology, Inc. | Capacitively-coupled level restore circuits for low voltage swing logic circuits |
| KR100613449B1 (ko) | 2004-10-07 | 2006-08-21 | 주식회사 하이닉스반도체 | 내부전압 공급회로 |
| US20060234727A1 (en) * | 2005-04-13 | 2006-10-19 | Wirelesswerx International, Inc. | Method and System for Initiating and Handling an Emergency Call |
| US7580287B2 (en) | 2005-09-01 | 2009-08-25 | Micron Technology, Inc. | Program and read trim setting |
| US7564728B2 (en) * | 2005-09-29 | 2009-07-21 | Hynix Semiconductor, Inc. | Semiconductor memory device and its driving method |
| JP4824500B2 (ja) * | 2005-10-28 | 2011-11-30 | エルピーダメモリ株式会社 | 半導体記憶装置 |
| JP2020102293A (ja) | 2018-12-25 | 2020-07-02 | キオクシア株式会社 | 半導体記憶装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR0122108B1 (ko) * | 1994-06-10 | 1997-12-05 | 윤종용 | 반도체 메모리 장치의 비트라인 센싱회로 및 그 방법 |
| JPH09330591A (ja) * | 1996-06-11 | 1997-12-22 | Fujitsu Ltd | センスアンプ駆動回路 |
| US5862089A (en) * | 1997-08-14 | 1999-01-19 | Micron Technology, Inc. | Method and memory device for dynamic cell plate sensing with ac equilibrate |
| JPH1186553A (ja) | 1997-09-08 | 1999-03-30 | Hitachi Ltd | 半導体集積回路装置 |
| DE19929095B4 (de) * | 1998-06-29 | 2005-12-08 | Fujitsu Ltd., Kawasaki | Halbleiterspeichervorrichtung mit übersteuertem Leseverstärker und Halbleitervorrichtung |
| JP4043142B2 (ja) * | 1999-05-18 | 2008-02-06 | 富士通株式会社 | メモリデバイス |
| JP4034476B2 (ja) * | 1999-06-29 | 2008-01-16 | 株式会社東芝 | 半導体記憶装置 |
| KR100300079B1 (ko) * | 1999-07-28 | 2001-11-01 | 김영환 | 센스앰프 구동회로 |
| US6347058B1 (en) * | 2000-05-19 | 2002-02-12 | International Business Machines Corporation | Sense amplifier with overdrive and regulated bitline voltage |
-
2000
- 2000-08-24 JP JP2000253888A patent/JP2002074960A/ja active Pending
-
2001
- 2001-08-21 US US09/935,010 patent/US6519198B2/en not_active Expired - Fee Related
-
2002
- 2002-12-17 US US10/322,405 patent/US6762968B2/en not_active Expired - Fee Related
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7567469B2 (en) | 2006-06-29 | 2009-07-28 | Hynix Semiconductor Inc. | Over driving pulse generator |
| US7800424B2 (en) | 2007-02-09 | 2010-09-21 | Hynix Semiconductor Inc. | Apparatus for supplying overdriving signal |
| JP2009020952A (ja) * | 2007-07-11 | 2009-01-29 | Elpida Memory Inc | 半導体記憶装置 |
| US8687447B2 (en) | 2009-09-30 | 2014-04-01 | SK Hynix Inc. | Semiconductor memory apparatus and test method using the same |
| JP2018073449A (ja) * | 2016-11-04 | 2018-05-10 | 力晶科技股▲ふん▼有限公司 | 半導体記憶装置 |
| US11393545B2 (en) | 2017-09-14 | 2022-07-19 | Kioxia Corporation | Semiconductor memory device |
| US11011241B2 (en) | 2017-09-14 | 2021-05-18 | Toshiba Memory Corporation | Semiconductor memory device |
| US10204692B1 (en) | 2017-09-14 | 2019-02-12 | Toshiba Memory Corporation | Semiconductor memory device |
| US11837295B2 (en) | 2017-09-14 | 2023-12-05 | Kioxia Corporation | Semiconductor memory device |
| US12387799B2 (en) | 2017-09-14 | 2025-08-12 | Kioxia Corporation | Semiconductor memory device |
| US10892020B2 (en) | 2018-06-26 | 2021-01-12 | Toshiba Memory Corporation | Semiconductor memory device |
| US11158388B2 (en) | 2018-06-26 | 2021-10-26 | Toshiba Memory Corporation | Semiconductor memory device |
| US11594285B2 (en) | 2018-06-26 | 2023-02-28 | Kioxia Corporation | Semiconductor memory device |
| US11894070B2 (en) | 2018-06-26 | 2024-02-06 | Kioxia Corporation | Semiconductor memory device |
Also Published As
| Publication number | Publication date |
|---|---|
| US20020031027A1 (en) | 2002-03-14 |
| US6762968B2 (en) | 2004-07-13 |
| US6519198B2 (en) | 2003-02-11 |
| US20030086317A1 (en) | 2003-05-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20041105 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20041105 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20071029 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20071106 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20080408 |