JP2001504626A5 - - Google Patents
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- Publication number
- JP2001504626A5 JP2001504626A5 JP1998523794A JP52379498A JP2001504626A5 JP 2001504626 A5 JP2001504626 A5 JP 2001504626A5 JP 1998523794 A JP1998523794 A JP 1998523794A JP 52379498 A JP52379498 A JP 52379498A JP 2001504626 A5 JP2001504626 A5 JP 2001504626A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/752,414 | 1996-11-19 | ||
| US08/752,414 US6360340B1 (en) | 1996-11-19 | 1996-11-19 | Memory tester with data compression |
| PCT/US1997/020997 WO1998022951A1 (en) | 1996-11-19 | 1997-11-18 | Memory tester with data compression |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001504626A JP2001504626A (ja) | 2001-04-03 |
| JP2001504626A5 true JP2001504626A5 (enExample) | 2005-07-14 |
Family
ID=25026221
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP52379498A Ceased JP2001504626A (ja) | 1996-11-19 | 1997-11-18 | データ圧縮を備えたメモリ・テスタ |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6360340B1 (enExample) |
| EP (1) | EP1016089B1 (enExample) |
| JP (1) | JP2001504626A (enExample) |
| KR (1) | KR100516428B1 (enExample) |
| DE (1) | DE69712113T2 (enExample) |
| WO (1) | WO1998022951A1 (enExample) |
Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW473728B (en) * | 1999-07-22 | 2002-01-21 | Koninkl Philips Electronics Nv | A method for testing a memory array and a memory-based device so testable with a fault response signalizing mode for when finding predetermined correspondence between fault patterns signalizing one such fault pattern only in the form of a compressed resp |
| US6629282B1 (en) * | 1999-11-05 | 2003-09-30 | Advantest Corp. | Module based flexible semiconductor test system |
| US6718487B1 (en) * | 2000-06-27 | 2004-04-06 | Infineon Technologies North America Corp. | Method for high speed testing with low speed semiconductor test equipment |
| KR100723464B1 (ko) * | 2000-11-29 | 2007-06-04 | 삼성전자주식회사 | 프레임비트를 이용하여 테스트모드의 경우의 수를확장하는 테스트모드 설정회로 |
| US6577156B2 (en) * | 2000-12-05 | 2003-06-10 | International Business Machines Corporation | Method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox |
| US6834364B2 (en) * | 2001-04-19 | 2004-12-21 | Agilent Technologies, Inc. | Algorithmically programmable memory tester with breakpoint trigger, error jamming and 'scope mode that memorizes target sequences |
| CA2348799A1 (fr) * | 2001-05-22 | 2002-11-22 | Marcel Blais | Appareil d'essai de composants electroniques |
| KR100459698B1 (ko) * | 2002-02-08 | 2004-12-04 | 삼성전자주식회사 | 병렬검사되는 개수를 증가시키는 반도체 소자의 전기적검사방법 |
| US7139943B2 (en) * | 2002-03-29 | 2006-11-21 | Infineon Technologies Ag | Method and apparatus for providing adjustable latency for test mode compression |
| GB2411482B (en) * | 2002-10-21 | 2006-03-01 | Zeroplus Technology Co Ltd | Method of processing test data |
| US7392434B2 (en) * | 2002-10-21 | 2008-06-24 | Zeroplus Technology Co., Ltd. | Logic analyzer data processing method |
| EP1416641A1 (en) * | 2002-10-30 | 2004-05-06 | STMicroelectronics S.r.l. | Method for compressing high repetitivity data, in particular data used in memory device testing |
| US7493534B2 (en) * | 2003-08-29 | 2009-02-17 | Hewlett-Packard Development Company, L.P. | Memory error ranking |
| US7472330B2 (en) * | 2003-11-26 | 2008-12-30 | Samsung Electronics Co., Ltd. | Magnetic memory which compares compressed fault maps |
| US7484065B2 (en) | 2004-04-20 | 2009-01-27 | Hewlett-Packard Development Company, L.P. | Selective memory allocation |
| US20060236185A1 (en) * | 2005-04-04 | 2006-10-19 | Ronald Baker | Multiple function results using single pattern and method |
| KR100747370B1 (ko) | 2005-04-21 | 2007-08-07 | 제로플러스 테크날러지 코포레이션 엘티디 | 논리분석기 데이터 처리 방법 |
| US20070266283A1 (en) * | 2006-05-01 | 2007-11-15 | Nec Laboratories America, Inc. | Method and Apparatus for Testing an Integrated Circuit |
| US7596729B2 (en) * | 2006-06-30 | 2009-09-29 | Micron Technology, Inc. | Memory device testing system and method using compressed fail data |
| US8059547B2 (en) * | 2008-12-08 | 2011-11-15 | Advantest Corporation | Test apparatus and test method |
| US8743702B2 (en) * | 2008-12-08 | 2014-06-03 | Advantest Corporation | Test apparatus and test method |
| KR20150008707A (ko) | 2013-07-15 | 2015-01-23 | 삼성전자주식회사 | 독출 데이터를 마스킹하는 메모리 장치 및 이의 테스트 방법 |
| JP6715198B2 (ja) | 2017-02-20 | 2020-07-01 | キオクシア株式会社 | メモリ検査装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59180898A (ja) * | 1983-03-31 | 1984-10-15 | Hitachi Ltd | 不良ビット救済方法 |
| EP0125633B1 (en) * | 1983-05-11 | 1990-08-08 | Hitachi, Ltd. | Testing apparatus for redundant memory |
| US4876685A (en) * | 1987-06-08 | 1989-10-24 | Teradyne, Inc. | Failure information processing in automatic memory tester |
| EP0424612A3 (en) * | 1989-08-30 | 1992-03-11 | International Business Machines Corporation | Apparatus and method for real time data error capture and compression for redundancy analysis of a memory |
| US5173906A (en) | 1990-08-31 | 1992-12-22 | Dreibelbis Jeffrey H | Built-in self test for integrated circuits |
| US5617531A (en) * | 1993-11-02 | 1997-04-01 | Motorola, Inc. | Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor |
| JPH09507730A (ja) * | 1994-01-14 | 1997-08-05 | ヒューストン・アドバンスト・リサーチ・センター | ビデオ・イメージに対する境界スプライン・ウエーブレット圧縮 |
| JP3552175B2 (ja) * | 1995-05-17 | 2004-08-11 | 株式会社アドバンテスト | フェイルメモリ装置 |
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1996
- 1996-11-19 US US08/752,414 patent/US6360340B1/en not_active Expired - Lifetime
-
1997
- 1997-11-18 DE DE69712113T patent/DE69712113T2/de not_active Expired - Lifetime
- 1997-11-18 WO PCT/US1997/020997 patent/WO1998022951A1/en not_active Ceased
- 1997-11-18 EP EP97949467A patent/EP1016089B1/en not_active Expired - Lifetime
- 1997-11-18 JP JP52379498A patent/JP2001504626A/ja not_active Ceased
- 1997-11-18 KR KR10-1999-7004393A patent/KR100516428B1/ko not_active Expired - Fee Related