GB2411482B - Method of processing test data - Google Patents

Method of processing test data

Info

Publication number
GB2411482B
GB2411482B GB0510267A GB0510267A GB2411482B GB 2411482 B GB2411482 B GB 2411482B GB 0510267 A GB0510267 A GB 0510267A GB 0510267 A GB0510267 A GB 0510267A GB 2411482 B GB2411482 B GB 2411482B
Authority
GB
United Kingdom
Prior art keywords
test data
processing test
processing
data
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0510267A
Other versions
GB2411482A (en
GB0510267D0 (en
Inventor
Chiu-Hao Cheng
Ming-Gwo Cheng
Tsung-Chih Huang
Chun-Feng Tzu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zeroplus Technology Co Ltd
Original Assignee
Zeroplus Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeroplus Technology Co Ltd filed Critical Zeroplus Technology Co Ltd
Publication of GB0510267D0 publication Critical patent/GB0510267D0/en
Publication of GB2411482A publication Critical patent/GB2411482A/en
Application granted granted Critical
Publication of GB2411482B publication Critical patent/GB2411482B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
GB0510267A 2002-10-21 2002-10-21 Method of processing test data Expired - Fee Related GB2411482B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2002/031587 WO2004038589A1 (en) 2002-10-21 2002-10-21 Logic analyzer data processing method

Publications (3)

Publication Number Publication Date
GB0510267D0 GB0510267D0 (en) 2005-06-29
GB2411482A GB2411482A (en) 2005-08-31
GB2411482B true GB2411482B (en) 2006-03-01

Family

ID=32173958

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0510267A Expired - Fee Related GB2411482B (en) 2002-10-21 2002-10-21 Method of processing test data

Country Status (7)

Country Link
JP (1) JP2006504183A (en)
CN (1) CN1723442A (en)
AU (1) AU2002347801A1 (en)
CA (1) CA2503342A1 (en)
DE (1) DE10297807T5 (en)
GB (1) GB2411482B (en)
WO (1) WO2004038589A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006090727A (en) * 2004-09-21 2006-04-06 Nec Engineering Ltd On-chip logic analyzer
US7528617B2 (en) * 2006-03-07 2009-05-05 Testmetrix, Inc. Apparatus having a member to receive a tray(s) that holds semiconductor devices for testing
US7734976B2 (en) * 2006-11-30 2010-06-08 Electro Scientific Industries, Inc. Synchronizing control of test instruments
CN103294602B (en) * 2012-02-28 2016-04-13 孕龙科技股份有限公司 The digital independent of logic analyser and write the method for its storer
TWI553323B (en) * 2014-07-15 2016-10-11 Zeroplus Technology Co Ltd Data Processing and Display Method of Logical Analysis System
CN106291335A (en) * 2015-05-14 2017-01-04 孕龙科技股份有限公司 Logic analyser and probe thereof

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5644578A (en) * 1995-05-17 1997-07-01 Advantest Corporation Failure memory device
WO1998020497A1 (en) * 1996-11-07 1998-05-14 Process Insight Limited Memory test system with defect compression
US6360340B1 (en) * 1996-11-19 2002-03-19 Teradyne, Inc. Memory tester with data compression
US6467053B1 (en) * 1999-06-28 2002-10-15 International Business Machines Corporation Captured synchronous DRAM fails in a working environment

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5644578A (en) * 1995-05-17 1997-07-01 Advantest Corporation Failure memory device
WO1998020497A1 (en) * 1996-11-07 1998-05-14 Process Insight Limited Memory test system with defect compression
US6360340B1 (en) * 1996-11-19 2002-03-19 Teradyne, Inc. Memory tester with data compression
US6467053B1 (en) * 1999-06-28 2002-10-15 International Business Machines Corporation Captured synchronous DRAM fails in a working environment

Also Published As

Publication number Publication date
DE10297807T5 (en) 2005-08-25
WO2004038589A1 (en) 2004-05-06
JP2006504183A (en) 2006-02-02
AU2002347801A1 (en) 2004-05-13
AU2002347801A8 (en) 2004-05-13
CN1723442A (en) 2006-01-18
GB2411482A (en) 2005-08-31
GB0510267D0 (en) 2005-06-29
CA2503342A1 (en) 2004-05-06

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20101021