JP2001311708A - 分析装置 - Google Patents

分析装置

Info

Publication number
JP2001311708A
JP2001311708A JP2000130828A JP2000130828A JP2001311708A JP 2001311708 A JP2001311708 A JP 2001311708A JP 2000130828 A JP2000130828 A JP 2000130828A JP 2000130828 A JP2000130828 A JP 2000130828A JP 2001311708 A JP2001311708 A JP 2001311708A
Authority
JP
Japan
Prior art keywords
analysis information
comment
information
analysis
operator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000130828A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001311708A5 (enExample
Inventor
Hironari Sone
裕也 曽根
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP2000130828A priority Critical patent/JP2001311708A/ja
Priority to EP01303710A priority patent/EP1150102B1/en
Priority to DE60123315T priority patent/DE60123315T2/de
Priority to US09/842,303 priority patent/US20020054055A1/en
Publication of JP2001311708A publication Critical patent/JP2001311708A/ja
Publication of JP2001311708A5 publication Critical patent/JP2001311708A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D9/00—Recording measured values
    • G01D9/005—Solid-state data loggers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP2000130828A 2000-04-28 2000-04-28 分析装置 Pending JP2001311708A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2000130828A JP2001311708A (ja) 2000-04-28 2000-04-28 分析装置
EP01303710A EP1150102B1 (en) 2000-04-28 2001-04-24 Analyzer
DE60123315T DE60123315T2 (de) 2000-04-28 2001-04-24 Analysegerät
US09/842,303 US20020054055A1 (en) 2000-04-28 2001-04-25 Analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000130828A JP2001311708A (ja) 2000-04-28 2000-04-28 分析装置

Publications (2)

Publication Number Publication Date
JP2001311708A true JP2001311708A (ja) 2001-11-09
JP2001311708A5 JP2001311708A5 (enExample) 2005-11-04

Family

ID=18639844

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000130828A Pending JP2001311708A (ja) 2000-04-28 2000-04-28 分析装置

Country Status (4)

Country Link
US (1) US20020054055A1 (enExample)
EP (1) EP1150102B1 (enExample)
JP (1) JP2001311708A (enExample)
DE (1) DE60123315T2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008145145A (ja) * 2006-12-07 2008-06-26 Yokogawa Electric Corp 測定装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7742833B1 (en) 2006-09-28 2010-06-22 Rockwell Automation Technologies, Inc. Auto discovery of embedded historians in network
US8181157B2 (en) * 2006-09-29 2012-05-15 Rockwell Automation Technologies, Inc. Custom language support for project documentation and editing
US7930261B2 (en) * 2007-09-26 2011-04-19 Rockwell Automation Technologies, Inc. Historians embedded in industrial units
US20090089671A1 (en) * 2007-09-28 2009-04-02 Rockwell Automation Technologies, Inc. Programmable controller programming with embedded macro capability
US9336060B2 (en) * 2011-06-17 2016-05-10 Microsoft Technology Licensing, Llc Middleware services framework for on-premises and cloud deployment

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5305081A (en) * 1992-08-27 1994-04-19 Constar Plastics Inc. Bottle stress analysis system
JP2549251B2 (ja) * 1992-10-23 1996-10-30 インターナショナル・ビジネス・マシーンズ・コーポレイション ライブ・データ用の注釈記録の作成方法
US6004276A (en) * 1997-03-03 1999-12-21 Quinton Instrument Company Open architecture cardiology information system
US5953009A (en) * 1997-05-27 1999-09-14 Hewlett-Packard Company Graphical system and method for invoking measurements in a signal measurement system
US6261103B1 (en) * 1999-04-15 2001-07-17 Cb Sciences, Inc. System for analyzing and/or effecting experimental data from a remote location
US6570592B1 (en) * 1999-10-29 2003-05-27 Agilent Technologies, Inc. System and method for specifying trigger conditions of a signal measurement system using graphical elements on a graphical user interface
US6707474B1 (en) * 1999-10-29 2004-03-16 Agilent Technologies, Inc. System and method for manipulating relationships among signals and buses of a signal measurement system on a graphical user interface
US6791545B2 (en) * 2001-12-11 2004-09-14 Lecroy Corporation Measurement icons for digital oscilloscopes

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008145145A (ja) * 2006-12-07 2008-06-26 Yokogawa Electric Corp 測定装置

Also Published As

Publication number Publication date
EP1150102A1 (en) 2001-10-31
DE60123315T2 (de) 2007-04-05
EP1150102B1 (en) 2006-09-27
DE60123315D1 (de) 2006-11-09
US20020054055A1 (en) 2002-05-09

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