JP2001264398A - 電子部品検査装置及び検査方法 - Google Patents

電子部品検査装置及び検査方法

Info

Publication number
JP2001264398A
JP2001264398A JP2000356572A JP2000356572A JP2001264398A JP 2001264398 A JP2001264398 A JP 2001264398A JP 2000356572 A JP2000356572 A JP 2000356572A JP 2000356572 A JP2000356572 A JP 2000356572A JP 2001264398 A JP2001264398 A JP 2001264398A
Authority
JP
Japan
Prior art keywords
signal
electronic component
component inspection
under test
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000356572A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001264398A5 (enExample
Inventor
Tomohisa Kobayashi
智久 小林
Takafumi Shinohara
貴文 篠原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Ten Ltd
Original Assignee
Denso Ten Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denso Ten Ltd filed Critical Denso Ten Ltd
Priority to JP2000356572A priority Critical patent/JP2001264398A/ja
Publication of JP2001264398A publication Critical patent/JP2001264398A/ja
Publication of JP2001264398A5 publication Critical patent/JP2001264398A5/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Supply And Installment Of Electrical Components (AREA)
JP2000356572A 1999-11-22 2000-11-22 電子部品検査装置及び検査方法 Pending JP2001264398A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000356572A JP2001264398A (ja) 1999-11-22 2000-11-22 電子部品検査装置及び検査方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP11-331856 1999-11-22
JP33185699 1999-11-22
JP2000356572A JP2001264398A (ja) 1999-11-22 2000-11-22 電子部品検査装置及び検査方法

Publications (2)

Publication Number Publication Date
JP2001264398A true JP2001264398A (ja) 2001-09-26
JP2001264398A5 JP2001264398A5 (enExample) 2008-01-10

Family

ID=26573989

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000356572A Pending JP2001264398A (ja) 1999-11-22 2000-11-22 電子部品検査装置及び検査方法

Country Status (1)

Country Link
JP (1) JP2001264398A (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7185245B2 (en) 2003-06-17 2007-02-27 Infineon Technologies Ag Test reading apparatus for memories
JP2007156526A (ja) * 2005-11-30 2007-06-21 Kyosan Electric Mfg Co Ltd 接点入力装置
JP2007178154A (ja) * 2005-12-27 2007-07-12 Hioki Ee Corp 回路基板検査装置および回路基板検査方法
CN100535672C (zh) * 2006-02-08 2009-09-02 财团法人工业技术研究院 内藏电容组件的测试方法及其测试系统
JP2011043440A (ja) * 2009-08-21 2011-03-03 Toyota Motor Corp 電子回路の検査方法
JP2016038239A (ja) * 2014-08-06 2016-03-22 日置電機株式会社 データ生成装置およびデータ生成方法
JP2017040629A (ja) * 2015-08-21 2017-02-23 学校法人 芝浦工業大学 電子部品試験装置、電子部品試験方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6323669U (enExample) * 1986-07-30 1988-02-16
JPS63139567U (enExample) * 1987-03-05 1988-09-14
JPH01227079A (ja) * 1988-03-07 1989-09-11 Hioki Ee Corp 回路基板検査方法
JPH0466878A (ja) * 1990-07-06 1992-03-03 Yokogawa Hewlett Packard Ltd 静電容量、抵抗及びインダクタンスの測定装置並びに測定方法
JPH06347517A (ja) * 1993-06-02 1994-12-22 Ford Motor Co 信号混在下での集積回路のテスト方法およびその装置
JPH11108997A (ja) * 1997-09-30 1999-04-23 Mitsubishi Electric Corp 電子回路検査装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6323669U (enExample) * 1986-07-30 1988-02-16
JPS63139567U (enExample) * 1987-03-05 1988-09-14
JPH01227079A (ja) * 1988-03-07 1989-09-11 Hioki Ee Corp 回路基板検査方法
JPH0466878A (ja) * 1990-07-06 1992-03-03 Yokogawa Hewlett Packard Ltd 静電容量、抵抗及びインダクタンスの測定装置並びに測定方法
JPH06347517A (ja) * 1993-06-02 1994-12-22 Ford Motor Co 信号混在下での集積回路のテスト方法およびその装置
JPH11108997A (ja) * 1997-09-30 1999-04-23 Mitsubishi Electric Corp 電子回路検査装置

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7185245B2 (en) 2003-06-17 2007-02-27 Infineon Technologies Ag Test reading apparatus for memories
JP2007156526A (ja) * 2005-11-30 2007-06-21 Kyosan Electric Mfg Co Ltd 接点入力装置
JP2007178154A (ja) * 2005-12-27 2007-07-12 Hioki Ee Corp 回路基板検査装置および回路基板検査方法
CN100535672C (zh) * 2006-02-08 2009-09-02 财团法人工业技术研究院 内藏电容组件的测试方法及其测试系统
JP2011043440A (ja) * 2009-08-21 2011-03-03 Toyota Motor Corp 電子回路の検査方法
JP2016038239A (ja) * 2014-08-06 2016-03-22 日置電機株式会社 データ生成装置およびデータ生成方法
JP2017040629A (ja) * 2015-08-21 2017-02-23 学校法人 芝浦工業大学 電子部品試験装置、電子部品試験方法

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