JP2001159736A - 観察物体の物理量を検出するための方法およびこれを用いた検出装置 - Google Patents

観察物体の物理量を検出するための方法およびこれを用いた検出装置

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Publication number
JP2001159736A
JP2001159736A JP2000285256A JP2000285256A JP2001159736A JP 2001159736 A JP2001159736 A JP 2001159736A JP 2000285256 A JP2000285256 A JP 2000285256A JP 2000285256 A JP2000285256 A JP 2000285256A JP 2001159736 A JP2001159736 A JP 2001159736A
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Japan
Prior art keywords
image information
phase
observation object
image
optical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2000285256A
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English (en)
Japanese (ja)
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JP2001159736A5 (enExample
Inventor
Toyohiko Yatagai
豊彦 谷田貝
Masahide Ito
雅英 伊藤
Yutaka Ishiwatari
裕 石渡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP2000285256A priority Critical patent/JP2001159736A/ja
Publication of JP2001159736A publication Critical patent/JP2001159736A/ja
Publication of JP2001159736A5 publication Critical patent/JP2001159736A5/ja
Abandoned legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
JP2000285256A 1999-09-20 2000-09-14 観察物体の物理量を検出するための方法およびこれを用いた検出装置 Abandoned JP2001159736A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000285256A JP2001159736A (ja) 1999-09-20 2000-09-14 観察物体の物理量を検出するための方法およびこれを用いた検出装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP30446799 1999-09-20
JP11-304467 1999-09-20
JP2000285256A JP2001159736A (ja) 1999-09-20 2000-09-14 観察物体の物理量を検出するための方法およびこれを用いた検出装置

Publications (2)

Publication Number Publication Date
JP2001159736A true JP2001159736A (ja) 2001-06-12
JP2001159736A5 JP2001159736A5 (enExample) 2007-11-01

Family

ID=26563921

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000285256A Abandoned JP2001159736A (ja) 1999-09-20 2000-09-14 観察物体の物理量を検出するための方法およびこれを用いた検出装置

Country Status (1)

Country Link
JP (1) JP2001159736A (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005218379A (ja) * 2004-02-06 2005-08-18 Olympus Corp 培養細胞の状態計測方法及び計測装置
JP2006170996A (ja) * 2004-12-14 2006-06-29 Asml Netherlands Bv 検査装置、サンプル、及び検査方法
JP2006300714A (ja) * 2005-04-20 2006-11-02 Olympus Corp 形状計測装置、及びプログラム
JP2008102294A (ja) * 2006-10-18 2008-05-01 Olympus Corp 位相物体の可視化方法とその顕微鏡システム
JP2008292939A (ja) * 2007-05-28 2008-12-04 Graduate School For The Creation Of New Photonics Industries 定量位相顕微鏡

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005218379A (ja) * 2004-02-06 2005-08-18 Olympus Corp 培養細胞の状態計測方法及び計測装置
JP2006170996A (ja) * 2004-12-14 2006-06-29 Asml Netherlands Bv 検査装置、サンプル、及び検査方法
JP2006300714A (ja) * 2005-04-20 2006-11-02 Olympus Corp 形状計測装置、及びプログラム
JP2008102294A (ja) * 2006-10-18 2008-05-01 Olympus Corp 位相物体の可視化方法とその顕微鏡システム
JP2008292939A (ja) * 2007-05-28 2008-12-04 Graduate School For The Creation Of New Photonics Industries 定量位相顕微鏡

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