JP2001063822A - Levitation conveying method - Google Patents

Levitation conveying method

Info

Publication number
JP2001063822A
JP2001063822A JP24344099A JP24344099A JP2001063822A JP 2001063822 A JP2001063822 A JP 2001063822A JP 24344099 A JP24344099 A JP 24344099A JP 24344099 A JP24344099 A JP 24344099A JP 2001063822 A JP2001063822 A JP 2001063822A
Authority
JP
Japan
Prior art keywords
wafer
plate
transport
transfer
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24344099A
Other languages
Japanese (ja)
Inventor
Michio Tanikai
道雄 谷貝
Masayuki Tsujimura
正之 辻村
Mitsuru Fukagawa
満 深川
Masashi Inamitsu
政司 稲光
Takahiro Hatanaka
貴裕 畠中
Masayuki Tsuda
昌之 都田
Masaki Kusuhara
昌樹 楠原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
WAKOMU DENSO KK
Watanabe Shoko KK
M Watanabe and Co Ltd
Original Assignee
WAKOMU DENSO KK
Watanabe Shoko KK
M Watanabe and Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by WAKOMU DENSO KK, Watanabe Shoko KK, M Watanabe and Co Ltd filed Critical WAKOMU DENSO KK
Priority to JP24344099A priority Critical patent/JP2001063822A/en
Publication of JP2001063822A publication Critical patent/JP2001063822A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To convey a plate-like body in no contact with a conveyance plane by arranging the plate-like body at least partially having a convexly curved surface on the conveyance plane with a convex surface faced to the conveyance plane, and floating and moving the plate-like body with the blowout of levitation air from the conveyance plane. SOLUTION: For conveying the plate-like body including curves and irregularities and at least partially having a convexly curved surface, e.g. a wafer 1, the wafer 1 is arranged on the conveyance plane 11 of a conveyance path 10 so that the convex surface 1A of the wafer 1 is faced to the conveyance plane 11. A jet quantity of the levitation air required for floating the wafer 1 from the conveyance plane 11 is spouted from the conveyance plane 11. The levitation air hits the convex surface 1A of the wafer 1 to float the wafer 1 then is lifted along the convex surface 1A, therefore the curved wafer 1 can be floated and conveyed along the conveyance plane 11 reliably in no contact with the conveyance plane 11.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、浮上搬送方法に
関し、特に、板状体を非接触状態で搬送する浮上搬送方
法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a levitation transport method, and more particularly to a levitation transport method for transporting a plate in a non-contact state.

【0002】[0002]

【従来の技術】浮上搬送方法は、半導体ウエハやディス
プレイ用のガラス板等の板状体を、搬送面から浮上させ
る。つまり、浮上搬送方法は、搬送面に対して非接触で
板状体を搬送する。板状体の浮上には各種の方法があ
る。その中の1つに、気体の噴出によって、板状体を浮
上させる方法がある。
2. Description of the Related Art In a floating transfer method, a plate-shaped body such as a semiconductor wafer or a glass plate for a display is floated from a transfer surface. That is, the levitation transport method transports the plate-like body without contacting the transport surface. There are various methods for floating the plate. One of them is a method in which a plate-like body is levitated by jetting gas.

【0003】気体噴出による浮上搬送方法は、たとえば
図11に示すように、板状体としてウエハ201の処理
のために、ウエハ201を処理装置101,102に非
接触で搬送する。処理装置101,102は、ウエハ2
01に対して加熱や成膜等の処理を行う。
In the floating transfer method using gas ejection, for example, as shown in FIG. 11, the wafer 201 is transferred to the processing apparatuses 101 and 102 in a non-contact manner for processing the wafer 201 as a plate. The processing apparatuses 101 and 102 are used for the wafer 2
01 is subjected to processing such as heating and film formation.

【0004】処理装置101,102は、搬送路111
〜113によって連結されている。搬送路111〜11
3は、それらの搬送面111A〜113Aから気体を噴
出する。搬送面111A〜113Aからは、浮上用の気
体と搬送用の気体とが噴出される。浮上用気体は、ウエ
ハ201を浮上させ、搬送用気体は、搬送面111A〜
113Aの長手方向つまり図11では搬送方向211
に、ウエハ201を搬送する。
[0004] The processing apparatuses 101 and 102 include a transport path 111.
Through 113. Transport paths 111 to 11
3 ejects gas from those transport surfaces 111A to 113A. From the transfer surfaces 111A to 113A, a floating gas and a transfer gas are ejected. The gas for floating raises the wafer 201, and the gas for transfer is the transfer surfaces 111A to 111A.
In the longitudinal direction of 113A, that is, in FIG.
Then, the wafer 201 is transferred.

【0005】このような気体噴出の様子を図12に示
す。浮上用気体は、図12(A)に示されるように、搬
送路111の搬送面111Aから噴出される。このと
き、浮上用気体は、搬送面111Aの上方に向かって、
かつ、搬送面111Aに対して直角方向に噴出される。
つまり、浮上用気体は、搬送面111Aから噴出方向2
12に噴出される。
FIG. 12 shows the state of such gas ejection. As shown in FIG. 12A, the floating gas is ejected from the transport surface 111A of the transport path 111. At this time, the levitation gas moves upward from the transport surface 111A.
And it is ejected in a direction perpendicular to the transport surface 111A.
That is, the floating gas is ejected from the transfer surface 111A in the ejection direction 2.
Squirted into 12.

【0006】搬送用気体は、図12(B)に示されるよ
うに、浮上用気体と同じように搬送路111の搬送面1
11Aから噴出される。このとき、搬送用気体は、搬送
方向211に向かって傾斜するように、搬送面111A
から上方に噴出される。つまり、搬送用気体は、搬送面
111Aから噴出方向213に噴出される。
[0006] As shown in FIG. 12B, the transfer gas is transferred to the transfer surface 1 of the transfer path 111 in the same manner as the floating gas.
It is ejected from 11A. At this time, the transport gas is inclined toward the transport direction 211 so that the transport surface 111A is inclined.
It is ejected upward from. That is, the carrier gas is ejected from the transport surface 111A in the ejection direction 213.

【0007】これらの搬送用気体と浮上用気体とによっ
て、ウエハ201が非接触で搬送される。そして、搬送
されたウエハ201が処理装置101,102で処理さ
れ、この後、ウエハ201からチップが切り出される。
切り出されたチップは、各種の装置に実装される。
The wafer 201 is transferred in a non-contact manner by the transfer gas and the floating gas. Then, the transferred wafer 201 is processed by the processing apparatuses 101 and 102, and thereafter, chips are cut out from the wafer 201.
The cut chips are mounted on various devices.

【0008】ところで、チップが実装される装置の制御
等が複雑になり、また、装置が薄型化するに伴なって、
ウエハの大型化や薄型化が必要になる。さらに、ディス
プレイの大型化に伴なって、ガラス板の大型化が必要に
なる。こうして、浮上搬送方法によって、大型化し、ま
た薄型化した板状体も搬送される。
By the way, as the control of the device on which the chip is mounted becomes complicated and the device becomes thinner,
The wafer needs to be large and thin. Further, as the size of the display increases, the size of the glass plate needs to be increased. In this way, the large and thin plate-like body is also transported by the floating transport method.

【0009】[0009]

【発明が解決しようとする課題】ウエハやガラス板等の
板状体の大きさが大きくなり、また、板状体の厚さが5
0〜100[μm]のような超薄型になると、浮上搬送方
法には次のような問題点が発生する。つまり、板状体の
形状が小さく、また厚さが厚い場合、板状体は曲がりに
くい。しかし、板状体の厚さが薄く、また形状が大きく
なると、板状体は曲がりやすくなる。
The size of a plate such as a wafer or a glass plate becomes large, and the thickness of the plate becomes 5 mm.
When the thickness becomes very thin, such as 0 to 100 [μm], the following problems occur in the floating conveyance method. That is, when the shape of the plate is small and the thickness is large, the plate is hard to bend. However, when the thickness of the plate-like body is small and the shape thereof is large, the plate-like body is easily bent.

【0010】板状体が曲がりやすくなった場合、この板
状体に対して、一方の面にパターンや膜等を設ける処理
や、加熱する処理などを行うと、板状体に反りが発生
し、板状体が湾曲する。別の処理をするために、湾曲し
た状態で板状体の浮上搬送を行うと、板状体が搬送面と
接触することがある。さらに、板状体と搬送面との接触
によって、ウエハが搬送面上で停止してしまうこともあ
る。
When the plate-like body is easily bent, if the plate-like body is subjected to a process of providing a pattern or a film on one surface or a heating process, the plate-like body is warped. The plate-like body is curved. If the plate-like body is levitated and transported in a curved state to perform another process, the plate-like body may come into contact with the transport surface. Further, the wafer may stop on the transfer surface due to the contact between the plate and the transfer surface.

【0011】この発明の目的は、このような問題点を解
決し、湾曲した板状体の浮上搬送をする際に、この板状
体が搬送面に接触することを防ぐ浮上搬送方法を提供す
ることにある。
An object of the present invention is to solve such a problem and to provide a levitation transport method for preventing a curved plate from coming into contact with a transport surface when the plate is floated and transported. It is in.

【0012】[0012]

【課題を解決するための手段】請求項1に記載された発
明は、少なくとも一部分が凸状に湾曲している面を持つ
板状体の前記凸面が搬送面と向かい合うように、前記板
状体を前記搬送面に対して配置し、前記板状体を前記搬
送面から浮上させて、前記搬送面に沿って移動させるこ
とを特徴とする。
According to a first aspect of the present invention, there is provided an image forming apparatus, wherein at least a portion of the plate-like body having a convexly curved surface faces the conveying surface. Is disposed with respect to the transport surface, and the plate-like body is floated from the transport surface, and is moved along the transport surface.

【0013】請求項2に記載された発明では、請求項1
の発明において、前記板状体の代わりに、起伏を持つ面
の中で前記起伏に比べて大きな凸面部分を含む板状体
を、この板状体の前記凸面部分が搬送面と向かい合うよ
うに、前記搬送面に対して配置することが好適である。
According to the second aspect of the present invention, the first aspect is provided.
In the invention, in place of the plate-like body, a plate-like body including a convex part larger than the undulation in a surface having undulations, such that the convex part of the plate-like body faces a transfer surface, It is preferable to dispose it on the transport surface.

【0014】請求項3に記載された発明では、請求項1
または2の発明において、前記搬送面から気体を噴出し
て、前記板状体の浮上と搬送とをすることが好適であ
る。
According to the invention described in claim 3, claim 1 is
Alternatively, in the invention according to the second aspect, it is preferable that a gas is ejected from the transport surface to float and transport the plate-like body.

【0015】[0015]

【発明の実施の形態】次に、この発明の実施の形態につ
いて説明する。
Next, an embodiment of the present invention will be described.

【0016】この実施の形態では、ウエハやガラス板等
である板状体の形状が大きく、また、板状体の厚さが5
0〜100[μm]のような超薄型になると、板状体が変
形しやすくなる。このような板状体に対して各種の処
理、たとえば、板状体の一方の面にパターンや膜等を設
ける処理や、板状体を加熱する処理などを行うと、板状
体が湾曲し、板状体の断面形状が弓形や半楕円形のよう
になる。また、板状体が変形して、起伏が板状体に発生
し、さらに、発生した起伏に比べて大きな形状の凸面部
分を持つこともある。
In this embodiment, the shape of a plate-like body such as a wafer or a glass plate is large, and the thickness of the plate-like body is 5 mm.
When the thickness becomes extremely thin, such as 0 to 100 [μm], the plate-like body is easily deformed. When various processes are performed on such a plate, for example, a process of providing a pattern or a film on one surface of the plate or a process of heating the plate, the plate is bent. Then, the cross-sectional shape of the plate-like body becomes like an arc or a semi-ellipse. Further, the plate-like body may be deformed, and undulation may be generated on the plate-like body, and may have a convex portion having a shape larger than that of the generated undulation.

【0017】この実施の形態では、次のような方法によ
って、湾曲や起伏が発生した板状体を搬送する。たとえ
ば、板状体がウエハである場合、図1に示すように、搬
送路1に対してウエハ1を次のように配置して搬送す
る。つまり、ウエハ1が湾曲した場合、ウエハ1の少な
くとも一部分が凸状に湾曲した凸面を持つ。図1では、
ウエハ1の一方の全面が凸面1Aとなり、他方の全面が
凹面1Bとなる。このとき、ウエハ1の凸面1Aが搬送
路10の搬送面11と向かい合うように、ウエハ1を搬
送面11に対して配置する。なお、図1では、図12
(A)と同様に、浮上用気体の噴出方向を矢印で示して
いる。また、図示を省略しているが、ウエハ1の送り
は、図12(B)と同様に搬送用気体によって行われ
る。
In this embodiment, a plate-like body having a curve or undulation is transported by the following method. For example, when the plate-like body is a wafer, as shown in FIG. That is, when the wafer 1 is curved, at least a part of the wafer 1 has a convex curved surface. In FIG.
One whole surface of the wafer 1 is a convex surface 1A, and the other whole surface is a concave surface 1B. At this time, the wafer 1 is arranged on the transfer surface 11 so that the convex surface 1A of the wafer 1 faces the transfer surface 11 of the transfer path 10. In FIG. 1, FIG.
As in (A), the ejection direction of the floating gas is indicated by an arrow. Although not shown, the wafer 1 is fed by a carrier gas, as in FIG. 12B.

【0018】こうして配置されたウエハ1は、凸面1A
が搬送面11と向かい合うように、かつ、凸面1Aの頂
部分が搬送面11に最も接近した状態になる。そして、
搬送面11からの浮上用気体は、凸面1Aが搬送面11
と向かい合わせに配置されたウエハ1を搬送面11から
浮上させるために必要な噴出量で、搬送面11から噴出
される。このとき、ウエハ1の凸面1Aが搬送路10の
搬送面11と向かい合うように配置されているので、搬
送面11から噴出される浮上用気体は、凸面1Aに当た
ってウエハ1を浮上させた後、凸面1Aに沿うように上
昇する。
The wafer 1 placed in this manner has a convex surface 1A.
, And the top of the convex surface 1 </ b> A comes closest to the transfer surface 11. And
As for the gas for floating from the transfer surface 11, the convex surface 1 </ b> A
The wafer 1 disposed opposite to the above is ejected from the transfer surface 11 with an ejection amount necessary for floating the wafer 1 from the transfer surface 11. At this time, since the convex surface 1A of the wafer 1 is disposed so as to face the transfer surface 11 of the transfer path 10, the floating gas ejected from the transfer surface 11 hits the convex surface 1A to float the wafer 1, and then the convex surface It rises along 1A.

【0019】一方、搬送路10の搬送面11に対して、
図1の状態とは逆にウエハ1を配置すると、ウエハ1
は、搬送面11に対して図2に示すようになる。このよ
うに配置されると、搬送面11から噴出された浮上用気
体は、ウエハ1の凹面1Bに入り込み、流れ方向91に
示すように、ウエハ1の凹面1Bに沿って移動する。こ
の結果、流れ方向91に沿って移動する気体が、搬送面
11から噴出される浮上用気体の流れを乱してしまう。
また、ウエハ1の反りが完全に対称でないので、ウエハ
1のバランスが乱れ、ウエハ1の姿勢が傾く。この状態
で、ウエハ1の浮上状態を維持するために、気体の噴出
量を増大すると、ウエハ1の周辺部分1Cや、凸面1A
および凹面1Bの周囲の面部分つまり周辺部分1Cを囲
む面部分が、浮上用気体の噴出や流れ方向91からの気
体によって、波打つような状態になる。
On the other hand, with respect to the transport surface 11 of the transport path 10,
When the wafer 1 is placed in a state opposite to the state shown in FIG.
Is as shown in FIG. With this arrangement, the floating gas ejected from the transfer surface 11 enters the concave surface 1B of the wafer 1 and moves along the concave surface 1B of the wafer 1 as shown in the flow direction 91. As a result, the gas moving along the flow direction 91 disturbs the flow of the floating gas ejected from the transport surface 11.
Further, since the warpage of the wafer 1 is not completely symmetric, the balance of the wafer 1 is disturbed, and the posture of the wafer 1 is inclined. In this state, in order to maintain the floating state of the wafer 1, if the amount of gas ejected is increased, the peripheral portion 1C of the wafer 1 and the convex surface 1A
The surface portion surrounding the concave surface 1B, that is, the surface portion surrounding the peripheral portion 1C, is brought into a wavy state by the ejection of the floating gas or the gas from the flow direction 91.

【0020】このように、ウエハ1の傾斜、ウエハ1の
周辺部分1Cの波打ち状態、また、弱まった浮上力によ
って、図3に示すように、周辺部分1Cの一部が搬送面
11と接触し、ウエハ1が搬送面11上で停止してしま
う。特に、図4に示すように、ウエハ2の断面形状が非
対称の弓形である場合、ウエハ2が搬送面11から浮上
することが困難になる。この発明の発明者は、ウエハ
1,2に対するこのような考察に基づいて、図1に示す
ようなウエハ1の搬送方法を見出した。
As described above, due to the inclination of the wafer 1, the waving state of the peripheral portion 1 C of the wafer 1, and the weak floating force, a part of the peripheral portion 1 C comes into contact with the transfer surface 11 as shown in FIG. Then, the wafer 1 stops on the transfer surface 11. In particular, as shown in FIG. 4, when the cross-sectional shape of the wafer 2 is an asymmetric bow, it becomes difficult for the wafer 2 to float from the transfer surface 11. The inventor of the present invention has found a method of transporting the wafer 1 as shown in FIG.

【0021】この実施の形態によれば、図1の状態で搬
送されているウエハ1が傾いた場合でも、図5に示すよ
うに、搬送面11からウエハ1を浮上させることができ
る。しかも、この場合に、搬送面11から直角方向に最
も離れたウエハ1の周辺部分1Cでは、浮上力が小さく
なるので、この周辺部分1Cが搬送面11に向かって回
転するように動く。この結果、ウエハ1が矢印92で示
される方向に姿勢を自動的に修正する。つまり、姿勢を
直す自動修正作用がウエハ1に働く。これによって、ウ
エハ1は、最終的に図1の姿勢で搬送される。また、ウ
エハが図4に示すように湾曲している場合でも、ウエハ
2に自動修正作用が働き、図6に示すように、バランス
した状態で搬送される。
According to this embodiment, even if the wafer 1 being transferred in the state of FIG. 1 is tilted, the wafer 1 can be floated from the transfer surface 11 as shown in FIG. In addition, in this case, the levitation force is reduced at the peripheral portion 1C of the wafer 1 farthest in the direction perpendicular to the transfer surface 11, so that the peripheral portion 1C moves so as to rotate toward the transfer surface 11. As a result, the posture of the wafer 1 is automatically corrected in the direction indicated by the arrow 92. That is, an automatic correction action for correcting the posture acts on the wafer 1. Thereby, the wafer 1 is finally transferred in the posture of FIG. In addition, even when the wafer is curved as shown in FIG. 4, the wafer 2 is automatically corrected and transferred in a balanced state as shown in FIG.

【0022】このようにして、この実施の形態によれ
ば、ウエハ1,2が湾曲しても、ウエハ1,2の凸面1
A,2Aが搬送路10の搬送面11と向かい合うよう
に、ウエハ1を配置するので、湾曲したウエハ1,2が
搬送面11と接触することを防いで、ウエハ1,2を搬
送することができる。
As described above, according to this embodiment, even if the wafers 1 and 2 are curved, the convex surfaces 1
Since the wafer 1 is arranged so that A and 2A face the transfer surface 11 of the transfer path 10, the wafers 1 and 2 can be transferred while preventing the curved wafers 1 and 2 from contacting the transfer surface 11. it can.

【0023】また、この実施の形態によれば、次のよう
なウエハを非接触で搬送することができる。つまり、図
7に示すウエハ3では、一方の面が凸状であり、かつ、
この一方の面である凸面3Aがほぼ対称であり、他方の
面3Bが凹凸状に起伏している。そして、凸面3Aが搬
送路10の搬送面11と向かい合うように、ウエハ3を
配置し、ウエハ3を浮上させるために十分な量の浮上用
気体を搬送面11から噴出する。
According to this embodiment, the following wafer can be transferred in a non-contact manner. That is, in the wafer 3 shown in FIG. 7, one surface is convex, and
The convex surface 3A, which is one surface, is substantially symmetric, and the other surface 3B is unevenly undulated. Then, the wafer 3 is arranged so that the convex surface 3A faces the transfer surface 11 of the transfer path 10, and a sufficient amount of levitation gas is ejected from the transfer surface 11 to cause the wafer 3 to float.

【0024】図8に示すウエハ4では、一方の面が凸状
であり、かつ、この一方の面である凸面4Aが非対称で
あり、他方の面4Bが凹凸状に起伏している。そして、
凸面4Aが搬送路10の搬送面11と向かい合うよう
に、ウエハ4を配置し、ウエハ4を浮上させるために十
分な量の浮上用気体を搬送面11から噴出する。
In the wafer 4 shown in FIG. 8, one surface is convex, the convex surface 4A, which is one surface, is asymmetric, and the other surface 4B is uneven. And
The wafer 4 is arranged so that the convex surface 4A faces the transfer surface 11 of the transfer path 10, and a sufficient amount of levitation gas is ejected from the transfer surface 11 to float the wafer 4.

【0025】図9,10に示すウエハ5,6では、両面
に起伏が発生し、かつ、一方の面には、起伏の大きさに
比べて大きな凸面部分5A,6Aがある。そして、凸面
部分5A,6Aが搬送路10の搬送面11と向かい合う
ように、ウエハ5,6を配置し、ウエハ5,6を浮上さ
せるために十分な量の浮上用気体を搬送面11から噴出
する。
In the wafers 5 and 6 shown in FIGS. 9 and 10, undulations occur on both surfaces, and one surface has convex portions 5A and 6A larger than the undulations. Then, the wafers 5 and 6 are arranged so that the convex portions 5A and 6A face the transfer surface 11 of the transfer path 10, and a sufficient amount of levitation gas is ejected from the transfer surface 11 to float the wafers 5 and 6. I do.

【0026】このように変形したウエハ3〜6でも、搬
送路10の搬送面11と非接触で搬送することができ
る。
The thus deformed wafers 3 to 6 can be transferred without contact with the transfer surface 11 of the transfer path 10.

【0027】また、湾曲や変形をしたウエハ1〜6を非
接触で搬送するための装置等が要らないので、湾曲や変
形をしたウエハ1〜6を浮上搬送するために、搬送路1
0や搬送面11の交換等を不要にすることができる。し
かも、浮上用気体の噴出量を調節するだけで、ウエハ1
〜6の湾曲状態や変形状態に応じて、ウエハ1〜6を確
実に浮上させることができる。
Since a device for transporting the curved or deformed wafers 1 to 6 in a non-contact manner is not required, the transport path 1 is used for floatingly transporting the curved or deformed wafers 1 to 6.
It is possible to eliminate the need for exchanging 0 or the transfer surface 11. In addition, only by adjusting the ejection amount of the floating gas, the wafer 1
The wafers 1 to 6 can be reliably levitated in accordance with the curved state or the deformed state of the wafers 1 to 6.

【0028】なお、この実施の形態では、板状体として
ウエハ1〜6を用いたが、この発明は、ガラス板などの
ような板状体にも同様に適用することができる。
In this embodiment, the wafers 1 to 6 are used as the plate-like members, but the present invention can be similarly applied to a plate-like member such as a glass plate.

【0029】また、この実施の形態では、気体の噴出に
よって、板状体の浮上搬送を行ったが、この発明は、静
電気や超音波などによる浮上搬送に対しても適用可能で
ある。
Further, in this embodiment, the plate-like body is levitated and conveyed by jetting gas. However, the present invention is also applicable to levitating and conveyed by static electricity or ultrasonic waves.

【0030】[0030]

【発明の効果】以上、説明したように、請求項1に記載
された発明によれば、板状体の凸面が搬送面と向かい合
うように板状体を配置し、また、請求項2に記載された
発明によれば、起伏する面の中で大きな凸面部分が搬送
面と向かい合うように板状体を配置する。この結果、板
状体の浮上搬送に際して、板状体が搬送面と接触するこ
とを防ぐことができる。また、これらの発明によれば、
板状体の搬送に際して、搬送面に対する板状体の配置を
統一するだけでよいので、面が湾曲したり、また、起伏
が面に発生した板状体と、搬送面との接触を防ぐための
特別な装置等の使用を不要にすることができる。
As described above, according to the first aspect of the present invention, the plate is disposed so that the convex surface of the plate faces the conveying surface. According to the invention, the plate-like body is arranged such that the large convex portion of the undulating surface faces the conveying surface. As a result, it is possible to prevent the plate-shaped member from coming into contact with the transfer surface during the floating transfer of the plate-shaped member. According to these inventions,
When transporting a plate-shaped object, it is only necessary to unify the arrangement of the plate-shaped object with respect to the transport surface, so that the surface is curved, or in order to prevent contact between the plate-shaped object with undulation generated on the surface and the transport surface The use of a special device or the like can be eliminated.

【0031】請求項3に記載された発明によれば、浮上
および搬送に必要な気体の噴出量を変えるだけで、板状
体の湾曲状態に応じた浮上搬送をすることができる。
According to the third aspect of the present invention, it is possible to carry out the levitation and conveyance in accordance with the curved state of the plate by simply changing the amount of gas required for the levitation and the conveyance.

【図面の簡単な説明】[Brief description of the drawings]

【図1】発明の実施の形態による浮上搬送方法を説明す
るための説明図である。
FIG. 1 is an explanatory diagram for explaining a levitation transport method according to an embodiment of the present invention.

【図2】図1とは逆に配置されたウエハの浮上の様子を
説明するための説明図である。
FIG. 2 is an explanatory diagram for explaining how a wafer placed opposite to FIG. 1 floats;

【図3】図2のウエハが停止する様子を説明するための
説明図である。
FIG. 3 is an explanatory diagram for explaining how the wafer of FIG. 2 stops.

【図4】非対称に湾曲したウエハ停止する様子を説明す
るための説明図である。
FIG. 4 is an explanatory diagram for explaining how to stop a wafer that is asymmetrically curved.

【図5】図1のウエハが傾斜した場合の浮上搬送方法を
説明するための説明図である。
FIG. 5 is an explanatory diagram for explaining a floating transfer method when the wafer of FIG. 1 is inclined.

【図6】図4のウエハが浮上する様子を説明するための
説明図である。
FIG. 6 is an explanatory diagram for explaining how the wafer of FIG. 4 floats.

【図7】別のウエハが浮上する様子を説明するための説
明図である。
FIG. 7 is an explanatory diagram for explaining how another wafer floats.

【図8】別のウエハが浮上する様子を説明するための説
明図である。
FIG. 8 is an explanatory diagram for explaining how another wafer floats.

【図9】別のウエハが浮上する様子を説明するための説
明図である。
FIG. 9 is an explanatory diagram for explaining how another wafer floats.

【図10】別のウエハが浮上する様子を説明するための
説明図である。
FIG. 10 is an explanatory diagram for explaining how another wafer floats.

【図11】ウエハを搬送するためのシステムを示す構成
図である。
FIG. 11 is a configuration diagram showing a system for transferring a wafer.

【図12】気体噴出の様子を説明するための説明図であ
る。
FIG. 12 is an explanatory diagram for explaining a state of gas ejection.

【符号の説明】[Explanation of symbols]

1〜6,201 ウエハ 1A〜4A 凸面 1B 凹面 1C 周辺部分 3B,4B 他方の面 5A,6A 凸面部分 10,111〜113 搬送路 11,111A〜113A 搬送面 91 流れ方向 92 矢印 101,102 処理装置 211 搬送方向 212,213 噴出方向 1-6, 201 Wafer 1A-4A Convex surface 1B Concave surface 1C Peripheral portion 3B, 4B The other surface 5A, 6A Convex surface portion 10, 111-113 Transport path 11, 111A-113A Transport surface 91 Flow direction 92 Arrow 101, 102 Processing device 211 Transport direction 212, 213 Ejection direction

───────────────────────────────────────────────────── フロントページの続き (72)発明者 辻村 正之 埼玉県大里郡川本町田中568 株式会社ワ コム電創内 (72)発明者 深川 満 埼玉県大里郡川本町田中568 株式会社ワ コム電創内 (72)発明者 稲光 政司 埼玉県大里郡川本町田中568 株式会社ワ コム電創内 (72)発明者 畠中 貴裕 埼玉県大里郡川本町田中568 株式会社ワ コム電創内 (72)発明者 都田 昌之 山形県米沢市東2丁目7の139 (72)発明者 楠原 昌樹 東京都中央区日本橋室町4丁目2番16号 株式会社渡邊商行内 Fターム(参考) 5F031 CA02 CA05 GA62  ──────────────────────────────────────────────────続 き Continuing from the front page (72) Inventor Masayuki Tsujimura 568, Tanaka, Kawamotomachi, Osato-gun, Saitama Prefecture Wacom Denso Co., Ltd. 72) Inventor Masashi Inami 568, Tanaka, Kawamoto-machi, Osato-gun, Saitama Prefecture Wacom Denso Co., Ltd. (72) Inventor Takahiro Hatanaka 568, Tanaka, Kawamoto-machi, Osato-gun, Saitama Prefecture Wacom Denso Co., Ltd. 2-7-139 Higashi, Yonezawa-shi (72) Inventor Masaki Kusuhara 4-2-1, Nihonbashi Muromachi, Chuo-ku, Tokyo F-term (reference) 5F031 CA02 CA05 GA62

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 少なくとも一部分が凸状に湾曲している
凸面を持つ板状体の前記凸面が搬送面と向かい合うよう
に、前記板状体を前記搬送面に対して配置し、 前記板状体を前記搬送面から浮上させて、前記搬送面に
沿って移動させることを特徴とする浮上搬送方法。
1. A plate-like body having a convex surface at least a part of which is convexly curved, wherein said plate-like body is disposed with respect to said transport surface such that said convex surface faces a transport surface; And floating along the transport surface by floating the device from the transport surface.
【請求項2】 前記板状体の代わりに、起伏を持つ面の
中で前記起伏に比べて大きな凸面部分を含む板状体を、
この板状体の前記凸面部分が搬送面と向かい合うよう
に、前記搬送面に対して配置することを特徴とする請求
項1に記載の浮上搬送方法。
2. Instead of the plate-like body, a plate-like body including a convex portion larger than the undulation on a surface having undulations,
The levitation transport method according to claim 1, wherein the plate-like body is disposed on the transport surface such that the convex portion faces the transport surface.
【請求項3】 前記搬送面から気体を噴出して、前記板
状体の浮上と搬送とをすることを特徴とする請求項1ま
たは2に記載の浮上搬送方法。
3. The levitation transport method according to claim 1, wherein a gas is ejected from the transport surface to float and transport the plate-like body.
JP24344099A 1999-08-30 1999-08-30 Levitation conveying method Pending JP2001063822A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24344099A JP2001063822A (en) 1999-08-30 1999-08-30 Levitation conveying method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24344099A JP2001063822A (en) 1999-08-30 1999-08-30 Levitation conveying method

Publications (1)

Publication Number Publication Date
JP2001063822A true JP2001063822A (en) 2001-03-13

Family

ID=17103918

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2001063822A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009072650A (en) * 2007-09-19 2009-04-09 Tokyo Ohka Kogyo Co Ltd Floating transfer coater
JP2011025286A (en) * 2009-07-27 2011-02-10 Hitachi High-Technologies Corp Laser beam machining method, laser beam machining device, and solar panel manufacturing method

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JPH06286831A (en) * 1992-08-26 1994-10-11 Nippon Furnace Kogyo Kaisha Ltd Plate material supporting method by fluid and device therefor
JPH08290813A (en) * 1995-04-21 1996-11-05 Ishikawajima Harima Heavy Ind Co Ltd Belt conveyor
JPH10157851A (en) * 1996-12-02 1998-06-16 Ckd Corp Object-to-be-conveyed conveying method in floatation type conveying device and floatation type conveying device
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JPS5079085A (en) * 1973-11-16 1975-06-27
JPS5137484A (en) * 1974-09-27 1976-03-29 Hitachi Ltd USUITAJOBUTSUNOKITAIYUSOSOCHI
JPS5137848A (en) * 1974-09-28 1976-03-30 Kobe Steel Ltd YOSETSUTOOCHINONARAIHOHO OYOBI SOCHI
JPS63123645A (en) * 1986-11-12 1988-05-27 Nec Corp Manufacture of semi-conductor device
JPS63153837A (en) * 1986-12-18 1988-06-27 Nippon Mining Co Ltd Semiconductor processing method
JPS63225026A (en) * 1987-03-16 1988-09-20 Hitachi Ltd Holding device
JPS6440496A (en) * 1987-08-05 1989-02-10 Toyo Jozo Kk Novel macrolide antibiotic substance mycinamicins and production thereof
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JPH11224869A (en) * 1998-02-05 1999-08-17 Mitsui Chem Inc Peeling method for adhesive film for surface protection at manufacturing of semiconductor wafer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009072650A (en) * 2007-09-19 2009-04-09 Tokyo Ohka Kogyo Co Ltd Floating transfer coater
JP2011025286A (en) * 2009-07-27 2011-02-10 Hitachi High-Technologies Corp Laser beam machining method, laser beam machining device, and solar panel manufacturing method

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