JP2000502188A - 操向可能のx線光学系 - Google Patents
操向可能のx線光学系Info
- Publication number
- JP2000502188A JP2000502188A JP09522869A JP52286997A JP2000502188A JP 2000502188 A JP2000502188 A JP 2000502188A JP 09522869 A JP09522869 A JP 09522869A JP 52286997 A JP52286997 A JP 52286997A JP 2000502188 A JP2000502188 A JP 2000502188A
- Authority
- JP
- Japan
- Prior art keywords
- optical system
- bragg
- incidence
- angle
- bragg structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 58
- 230000005855 radiation Effects 0.000 claims abstract description 27
- 239000013078 crystal Substances 0.000 description 11
- 238000000034 method Methods 0.000 description 5
- 238000010408 sweeping Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000002310 reflectometry Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003278 mimic effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
- G21K1/062—Devices having a multilayer structure
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/061—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements characterised by a multilayer structure
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/068—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements specially adapted for particle beams
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1. 放射線源から操向可能の単色X線あるいは中性子ビームを発生させる光学 系において、 前記放射線源からコリメートされたビームを発生させる手段と、 前記放射線源からある距離に配置され、側方格子間隔勾配を有するブラッグの 法則に従って前記コリメートされたビームを反射させるブラッグ構造と、 前記コリメートされたビームに相対的に前記ブラッグ構造を運動させて前記コ リメートされたビームと前記ブラッグ構造との間の入射角を変化させると同時に 前記コリメートされたビームと前記ブラッグ構造との間の入射領域を変化させて 前記入射領域で格子間隔を、常にブラッグの法則を満足する態様で入射角に関連 させる手段と、 を有し、前記ブラッグ構造は、前記入射領域の長さが、運動の方向における勾配 付けされたブラッグ構造の長さより小さい大きさのオーダとなるように構成され 、よって前記コリメートされたビームは、制御下で反射され、前記単色X線ビー ムは、前記光学系により前記入射角を変化させることにより操向可能である光学 系。 2. 請求項1に記載の光学系において、前記ブラッグ構造は、側方に勾配付け された多層平面反射鏡を有し、前記格子間隔は、前記反射鏡の第1端から前記反 射鏡の対向端へ向かって変化するようになっている光学系。 3. 請求項2に記載の光学系において、前記運動させる手段が、前記反射鏡を 同時に回転および併進させ、前記コリメートされたビームと前記反射鏡との間の 入射角と入射領域とを同時に変化させ、前記入射領域において前記反射鏡の格子 間隔は、ブラッグの法則を満足する態様で前記入射角に関連し、よって前記コリ メートされたビームは、制御下で反射され、前記単色X線ビームは、前記光学系 により前記入射角を変化させることにより操向可能である光学系。 4. 請求項1に記載の光学系において、前記ブラッグ構造は、軸を有する側方 に勾配付けされた多層円板を有し、前記ブラッグ構造は、各部分に分割され、各 部分は、周方向部分放物円筒形表面を有し、前記格子間隔は、各部分の周りで周 方向に変化するようになっている光学系。 5. 請求項4に記載の光学システムにおいて、前記運動させる手段は、前記円 板をその軸周りに回転し、前記周方向部分放物円筒形部分により前記コリメート されたビームと前記円板との間の前記入射角と前記入射領域を同時に変化させ、 前記入射領域で前記円板の前記格子間隔は、ブラッグの法則を満足する態様で前 記入射角に関連し、前記コリメートされたビームは、制御下で反射され、これに より前記単色X線ビームは、前記光学系が前記入射角を変化させることにより操 向可能となっている光学システム。 6. 請求項5に記載の光学系において、前記部分の表面は、径方向傾斜され、 該傾斜は、各部分内で一定であり、しかして各隣接部分毎に時計回りに周方向に 増加し、各隣接部分が、前の部分に隣接する試料の部分を掃引し、もって前記光 学系をX線ラスタライザとして作用させるようになっている光学系。 7. 請求項1に記載の光学系において、前記放射線源と入射点との前記距離は 、前記ブラッグ構造が運動したときに一定に維持するようになっている光学系。 8. 請求項1に記載の光学系において、前記放射線源と入射点との距離は、前 記ブラッグ構造が運動したときに変化するようになっいる光学系。 9. 請求項1に記載の光学系において、前記ブラッグ構造は、反射ビームのバ ンドパスを広げる深度勾配を有するようになっている光学系。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/574,249 | 1995-12-18 | ||
US08/574,249 US5757882A (en) | 1995-12-18 | 1995-12-18 | Steerable x-ray optical system |
PCT/US1996/019565 WO1997022976A1 (en) | 1995-12-18 | 1996-12-12 | Steerable x-ray optical system |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2000502188A true JP2000502188A (ja) | 2000-02-22 |
JP3733142B2 JP3733142B2 (ja) | 2006-01-11 |
Family
ID=24295305
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52286997A Expired - Fee Related JP3733142B2 (ja) | 1995-12-18 | 1996-12-12 | 操向可能のx線光学系 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5757882A (ja) |
EP (1) | EP0868729B1 (ja) |
JP (1) | JP3733142B2 (ja) |
DE (1) | DE69604699T2 (ja) |
WO (1) | WO1997022976A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004077477A (ja) * | 2002-08-09 | 2004-03-11 | Siemens Ag | 単色x線発生装置および方法 |
JP2007011403A (ja) * | 1999-11-29 | 2007-01-18 | X-Ray Optical Systems Inc | 徐々に変化する原子面を有する二重に湾曲した光学素子 |
WO2015186369A1 (ja) * | 2014-06-05 | 2015-12-10 | 株式会社リガク | X線回折装置 |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3734366B2 (ja) | 1998-03-20 | 2006-01-11 | 株式会社リガク | X線分析装置 |
AU2368900A (en) | 1998-12-18 | 2000-07-03 | Symyx Technologies, Inc. | Apparatus and method for characterizing libraries of different materials using x-ray scattering |
JP3048569B1 (ja) | 1999-03-08 | 2000-06-05 | 理化学研究所 | 中性子ビ―ム制御装置及び中性子エネルギ―測定装置 |
US6389100B1 (en) | 1999-04-09 | 2002-05-14 | Osmic, Inc. | X-ray lens system |
EP1200879B1 (de) | 1999-07-30 | 2007-06-20 | Carl Zeiss SMT AG | Steuerung der Beleuchtungsverteilung in der Austrittspupille eines EUV-Beleuchtungssystems |
US6421417B1 (en) | 1999-08-02 | 2002-07-16 | Osmic, Inc. | Multilayer optics with adjustable working wavelength |
US6389099B1 (en) * | 2000-11-13 | 2002-05-14 | Rad Source Technologies Inc. | Irradiation system and method using X-ray and gamma-ray reflector |
US6870896B2 (en) | 2000-12-28 | 2005-03-22 | Osmic, Inc. | Dark-field phase contrast imaging |
US6804324B2 (en) * | 2001-03-01 | 2004-10-12 | Osmo, Inc. | X-ray phase contrast imaging using a fabry-perot interferometer concept |
US6510200B1 (en) | 2001-06-29 | 2003-01-21 | Osmic, Inc. | Multi-layer structure with variable bandpass for monochromatization and spectroscopy |
US6678082B2 (en) | 2001-09-12 | 2004-01-13 | Harris Corporation | Electro-optical component including a fluorinated poly(phenylene ether ketone) protective coating and related methods |
US6643353B2 (en) | 2002-01-10 | 2003-11-04 | Osmic, Inc. | Protective layer for multilayers exposed to x-rays |
US7651270B2 (en) * | 2007-08-31 | 2010-01-26 | Rigaku Innovative Technologies, Inc. | Automated x-ray optic alignment with four-sector sensor |
US7848483B2 (en) * | 2008-03-07 | 2010-12-07 | Rigaku Innovative Technologies | Magnesium silicide-based multilayer x-ray fluorescence analyzers |
CN101599307B (zh) * | 2009-03-12 | 2012-02-29 | 中国原子能科学研究院 | 中子单色器屏蔽装置 |
DE102010022851B4 (de) * | 2010-06-07 | 2014-11-13 | Siemens Aktiengesellschaft | Röntgenstrahlungsvorrichtung zur Erzeugung von quasimonochromatischer Röntgenstrahlung und Radiographie-Röntgenaufnahmesystem |
DE102014219601B4 (de) | 2014-08-13 | 2023-06-29 | Bruker Nano Gmbh | Verfahren zum Scannen einer Probe mittels einer Röntgenoptik und eine Apparatur zum Scannen einer Probe |
JP6545353B2 (ja) * | 2015-07-14 | 2019-07-17 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 変調されたx線放射による撮像 |
JP6533006B2 (ja) * | 2015-07-14 | 2019-06-19 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 強化されたx線放射を用いた撮像 |
DE102017208736A1 (de) | 2017-05-23 | 2018-11-29 | Robert Bosch Gmbh | LIDAR-Vorrichtung mit erhöhter Abtastfrequenz und Verfahren zum Abtasten eines Abtastbereiches |
US11333621B2 (en) * | 2017-07-11 | 2022-05-17 | Kla-Tencor Corporation | Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction |
DE102019128198B3 (de) | 2019-10-18 | 2021-02-25 | Laser Imaging Systems Gmbh | Vorrichtung zur Mustereinbringung mittels Strahlung an einem aufgewickelten Endlossubstrat |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4525853A (en) * | 1983-10-17 | 1985-06-25 | Energy Conversion Devices, Inc. | Point source X-ray focusing device |
US4698833A (en) * | 1985-05-14 | 1987-10-06 | Energy Conversion Devices, Inc. | Subassembly, method and system for monochromatizing X-rays |
US4675889A (en) * | 1985-07-08 | 1987-06-23 | Ovonic Synthetic Materials Company, Inc. | Multiple wavelength X-ray dispersive devices and method of making the devices |
US4958363A (en) * | 1986-08-15 | 1990-09-18 | Nelson Robert S | Apparatus for narrow bandwidth and multiple energy x-ray imaging |
JPH04169898A (ja) * | 1990-11-02 | 1992-06-17 | Seiko Instr Inc | X線多層膜鏡構造体 |
JPH0534500A (ja) * | 1991-08-02 | 1993-02-09 | Olympus Optical Co Ltd | X線多層膜反射鏡 |
GB2266040B (en) * | 1992-04-09 | 1996-03-13 | Rigaku Ind Corp | X-ray analysis apparatus |
US5384817A (en) * | 1993-07-12 | 1995-01-24 | Ovonic Synthetic Materials Company | X-ray optical element and method for its manufacture |
US5646976A (en) * | 1994-08-01 | 1997-07-08 | Osmic, Inc. | Optical element of multilayered thin film for X-rays and neutrons |
-
1995
- 1995-12-18 US US08/574,249 patent/US5757882A/en not_active Expired - Fee Related
-
1996
- 1996-12-12 EP EP96943654A patent/EP0868729B1/en not_active Expired - Lifetime
- 1996-12-12 DE DE69604699T patent/DE69604699T2/de not_active Expired - Lifetime
- 1996-12-12 WO PCT/US1996/019565 patent/WO1997022976A1/en active IP Right Grant
- 1996-12-12 JP JP52286997A patent/JP3733142B2/ja not_active Expired - Fee Related
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007011403A (ja) * | 1999-11-29 | 2007-01-18 | X-Ray Optical Systems Inc | 徐々に変化する原子面を有する二重に湾曲した光学素子 |
JP2004077477A (ja) * | 2002-08-09 | 2004-03-11 | Siemens Ag | 単色x線発生装置および方法 |
JP4584554B2 (ja) * | 2002-08-09 | 2010-11-24 | シーメンス アクチエンゲゼルシヤフト | 単色x線を用いて被検体のx線画像を作成する装置および方法 |
WO2015186369A1 (ja) * | 2014-06-05 | 2015-12-10 | 株式会社リガク | X線回折装置 |
JP2015230238A (ja) * | 2014-06-05 | 2015-12-21 | 株式会社リガク | X線回折装置 |
KR20170016374A (ko) * | 2014-06-05 | 2017-02-13 | 가부시키가이샤 리가쿠 | X선 회절장치 |
EP3147654A4 (en) * | 2014-06-05 | 2017-12-20 | Rigaku Corporation | X-ray diffractometer |
US10436723B2 (en) | 2014-06-05 | 2019-10-08 | Rigaku Corporation | X-ray diffractometer with multilayer reflection-type monochromator |
KR102179112B1 (ko) * | 2014-06-05 | 2020-11-16 | 가부시키가이샤 리가쿠 | X선 회절장치 |
Also Published As
Publication number | Publication date |
---|---|
US5757882A (en) | 1998-05-26 |
JP3733142B2 (ja) | 2006-01-11 |
DE69604699T2 (de) | 2000-03-02 |
EP0868729A1 (en) | 1998-10-07 |
DE69604699D1 (de) | 1999-11-18 |
EP0868729B1 (en) | 1999-10-13 |
WO1997022976A1 (en) | 1997-06-26 |
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