JP2000341242A5 - - Google Patents

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Publication number
JP2000341242A5
JP2000341242A5 JP1999153430A JP15343099A JP2000341242A5 JP 2000341242 A5 JP2000341242 A5 JP 2000341242A5 JP 1999153430 A JP1999153430 A JP 1999153430A JP 15343099 A JP15343099 A JP 15343099A JP 2000341242 A5 JP2000341242 A5 JP 2000341242A5
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JP
Japan
Prior art keywords
output
impulse response
wraparound
outputs
amplitude
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JP1999153430A
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English (en)
Japanese (ja)
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JP3787041B2 (ja
JP2000341242A (ja
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Priority to JP15343099A priority Critical patent/JP3787041B2/ja
Priority claimed from JP15343099A external-priority patent/JP3787041B2/ja
Publication of JP2000341242A publication Critical patent/JP2000341242A/ja
Publication of JP2000341242A5 publication Critical patent/JP2000341242A5/ja
Application granted granted Critical
Publication of JP3787041B2 publication Critical patent/JP3787041B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP15343099A 1999-06-01 1999-06-01 回り込みキャンセラ Expired - Lifetime JP3787041B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15343099A JP3787041B2 (ja) 1999-06-01 1999-06-01 回り込みキャンセラ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15343099A JP3787041B2 (ja) 1999-06-01 1999-06-01 回り込みキャンセラ

Publications (3)

Publication Number Publication Date
JP2000341242A JP2000341242A (ja) 2000-12-08
JP2000341242A5 true JP2000341242A5 (https=) 2006-03-16
JP3787041B2 JP3787041B2 (ja) 2006-06-21

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ID=15562355

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15343099A Expired - Lifetime JP3787041B2 (ja) 1999-06-01 1999-06-01 回り込みキャンセラ

Country Status (1)

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JP (1) JP3787041B2 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4118484B2 (ja) 2000-03-06 2008-07-16 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP2001257350A (ja) 2000-03-08 2001-09-21 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法
JP4683688B2 (ja) 2000-03-16 2011-05-18 株式会社半導体エネルギー研究所 液晶表示装置の作製方法
JP4393662B2 (ja) 2000-03-17 2010-01-06 株式会社半導体エネルギー研究所 液晶表示装置の作製方法
US6900084B1 (en) 2000-05-09 2005-05-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device having a display device
US7071037B2 (en) 2001-03-06 2006-07-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP3713214B2 (ja) * 2001-03-28 2005-11-09 日本無線株式会社 伝送路特性測定器および回り込みキャンセラ
EP1521413A3 (en) 2003-10-01 2009-09-30 Panasonic Corporation Multicarrier reception with channel estimation and equalisation
JP4409395B2 (ja) 2004-07-13 2010-02-03 富士通株式会社 伝搬路推定方法及び推定装置
JP2006262039A (ja) 2005-03-17 2006-09-28 Fujitsu Ltd 伝搬路推定方法及び伝搬路推定装置
JP5068230B2 (ja) * 2008-08-22 2012-11-07 日本放送協会 Ｏｆｄｍデジタル信号等化装置、等化方法及び中継装置
JP5700691B2 (ja) * 2012-01-05 2015-04-15 日本電信電話株式会社 受信装置、及び受信方法

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