JP2000182550A - 電子銃および電子銃を用いる照明装置または電子ビーム露光装置 - Google Patents

電子銃および電子銃を用いる照明装置または電子ビーム露光装置

Info

Publication number
JP2000182550A
JP2000182550A JP10361040A JP36104098A JP2000182550A JP 2000182550 A JP2000182550 A JP 2000182550A JP 10361040 A JP10361040 A JP 10361040A JP 36104098 A JP36104098 A JP 36104098A JP 2000182550 A JP2000182550 A JP 2000182550A
Authority
JP
Japan
Prior art keywords
electron
electrode
electron gun
acceleration
crossover
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP10361040A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000182550A5 (enExample
Inventor
Masahiko Okunuki
昌彦 奥貫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP10361040A priority Critical patent/JP2000182550A/ja
Priority to US09/461,835 priority patent/US6670620B1/en
Publication of JP2000182550A publication Critical patent/JP2000182550A/ja
Publication of JP2000182550A5 publication Critical patent/JP2000182550A5/ja
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/06—Electron sources; Electron guns
    • H01J37/063—Geometrical arrangement of electrodes for beam-forming
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
    • H01J3/02—Electron guns
    • H01J3/029—Schematic arrangements for beam forming

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
  • Electron Sources, Ion Sources (AREA)
JP10361040A 1998-12-18 1998-12-18 電子銃および電子銃を用いる照明装置または電子ビーム露光装置 Abandoned JP2000182550A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP10361040A JP2000182550A (ja) 1998-12-18 1998-12-18 電子銃および電子銃を用いる照明装置または電子ビーム露光装置
US09/461,835 US6670620B1 (en) 1998-12-18 1999-12-16 Electron gun, illumination apparatus using the electron gun, and electron beam exposure apparatus using the illumination apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10361040A JP2000182550A (ja) 1998-12-18 1998-12-18 電子銃および電子銃を用いる照明装置または電子ビーム露光装置

Publications (2)

Publication Number Publication Date
JP2000182550A true JP2000182550A (ja) 2000-06-30
JP2000182550A5 JP2000182550A5 (enExample) 2006-04-27

Family

ID=18471943

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10361040A Abandoned JP2000182550A (ja) 1998-12-18 1998-12-18 電子銃および電子銃を用いる照明装置または電子ビーム露光装置

Country Status (2)

Country Link
US (1) US6670620B1 (enExample)
JP (1) JP2000182550A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1199739A3 (en) * 2000-10-20 2007-03-28 eLith LLC A device and method for suppressing space charge induced abberations in charged-particle projection lithography systems
JP2015204450A (ja) * 2014-04-16 2015-11-16 株式会社ニューフレアテクノロジー 電子ビーム描画装置、及び電子ビームの収束半角調整方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4113032B2 (ja) * 2003-04-21 2008-07-02 キヤノン株式会社 電子銃及び電子ビーム露光装置
US7110500B2 (en) * 2003-09-12 2006-09-19 Leek Paul H Multiple energy x-ray source and inspection apparatus employing same
WO2009085240A2 (en) * 2007-12-21 2009-07-09 Cornell Research Foundation, Inc. Self-powered lithography method and apparatus using radioactive thin films
US8581526B1 (en) * 2010-08-28 2013-11-12 Jefferson Science Associates, Llc Unbalanced field RF electron gun

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2599591B2 (ja) 1987-04-28 1997-04-09 キヤノン株式会社 電子放出素子特性測定装置
DE3851083T2 (de) 1987-04-28 1995-01-12 Canon Kk Musteraufzeichnungsgerät mit Mehrfach-Elektronenstrahl.
DE3850996T2 (de) 1987-04-28 1994-12-15 Canon Kk Musteraufzeichnungsgerät mit Mehrfach-Elektronenstrahl.
US4896945A (en) 1987-12-14 1990-01-30 Nippon Telegraph And Telephone Corporation Liquid crystal cell array and method for driving the same
US5633507A (en) * 1995-09-19 1997-05-27 International Business Machines Corporation Electron beam lithography system with low brightness
JP3369379B2 (ja) 1995-11-16 2003-01-20 日本電信電話株式会社 荷電粒子照射装置
JPH10106926A (ja) * 1996-10-01 1998-04-24 Nikon Corp 荷電粒子線リソグラフィ装置、荷電粒子線リソグラフィ装置の評価方法およびパターン形成方法
JP3728031B2 (ja) 1996-10-25 2005-12-21 キヤノン株式会社 電子ビーム露光装置及び電子ビーム露光用マスク
US6232040B1 (en) * 1999-05-06 2001-05-15 Agere Systems, Inc. Method of electron beam exposure utilizing emitter with conductive mesh grid

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1199739A3 (en) * 2000-10-20 2007-03-28 eLith LLC A device and method for suppressing space charge induced abberations in charged-particle projection lithography systems
JP2015204450A (ja) * 2014-04-16 2015-11-16 株式会社ニューフレアテクノロジー 電子ビーム描画装置、及び電子ビームの収束半角調整方法
US9336980B2 (en) 2014-04-16 2016-05-10 Nuflare Technology, Inc. Electron beam writing apparatus, and method for adjusting convergence half angle of electron beam

Also Published As

Publication number Publication date
US6670620B1 (en) 2003-12-30

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