JP2000046646A - 光電変換装置及びその駆動方法及びx線撮像装置 - Google Patents
光電変換装置及びその駆動方法及びx線撮像装置Info
- Publication number
- JP2000046646A JP2000046646A JP10217783A JP21778398A JP2000046646A JP 2000046646 A JP2000046646 A JP 2000046646A JP 10217783 A JP10217783 A JP 10217783A JP 21778398 A JP21778398 A JP 21778398A JP 2000046646 A JP2000046646 A JP 2000046646A
- Authority
- JP
- Japan
- Prior art keywords
- photoelectric conversion
- conversion element
- conversion device
- film transistor
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/191—Photoconductor image sensors
- H10F39/195—X-ray, gamma-ray or corpuscular radiation imagers
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Measurement Of Radiation (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10217783A JP2000046646A (ja) | 1998-07-31 | 1998-07-31 | 光電変換装置及びその駆動方法及びx線撮像装置 |
| DE69942188T DE69942188D1 (de) | 1998-07-31 | 1999-07-29 | Photoelektrische Umwandlungsvorrichtung, Ansteurungsverfahren davon, und Informations-Verarbeitungsgerät zur Anwendung desselben |
| EP99306031A EP0977268B1 (en) | 1998-07-31 | 1999-07-29 | Photoelectric conversion apparatus, driving method thereof and information processing apparatus using the same |
| US09/363,821 US6512217B1 (en) | 1998-07-31 | 1999-07-30 | Photoelectric conversion apparatus, method for driving photoelectric conversion apparatus, and information processing apparatus having photoelectric conversion apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10217783A JP2000046646A (ja) | 1998-07-31 | 1998-07-31 | 光電変換装置及びその駆動方法及びx線撮像装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2000046646A true JP2000046646A (ja) | 2000-02-18 |
| JP2000046646A5 JP2000046646A5 (enExample) | 2005-10-27 |
Family
ID=16709669
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10217783A Pending JP2000046646A (ja) | 1998-07-31 | 1998-07-31 | 光電変換装置及びその駆動方法及びx線撮像装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6512217B1 (enExample) |
| EP (1) | EP0977268B1 (enExample) |
| JP (1) | JP2000046646A (enExample) |
| DE (1) | DE69942188D1 (enExample) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002101343A (ja) * | 2000-09-22 | 2002-04-05 | Toshiba Medical System Co Ltd | X線平面検出器及びx線診断システム |
| JP2006145214A (ja) * | 2004-11-16 | 2006-06-08 | Nissan Motor Co Ltd | 赤外線検出装置 |
| JP2009265074A (ja) * | 2008-03-31 | 2009-11-12 | Epson Imaging Devices Corp | 光検出装置、電気光学装置及び電子機器並びに光劣化補正方法 |
| WO2010032497A1 (ja) * | 2008-09-19 | 2010-03-25 | コニカミノルタエムジー株式会社 | 欠陥画素判定方法、欠陥画素判定プログラム、放射線画像検出器及び欠陥画素判定システム |
| WO2011111590A1 (ja) * | 2010-03-09 | 2011-09-15 | 株式会社島津製作所 | 二次元アレイx線検出器の検査方法 |
| JP2011214905A (ja) * | 2010-03-31 | 2011-10-27 | Fujifilm Corp | 放射線画像検出装置 |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001251557A (ja) * | 1999-12-27 | 2001-09-14 | Canon Inc | エリアセンサ、該エリアセンサを有する画像入力装置および該エリアセンサの駆動方法 |
| US7031026B2 (en) * | 2001-05-21 | 2006-04-18 | International Business Machines Corporation | Defect and maintenance detection for image capture device |
| US6818899B2 (en) * | 2001-06-07 | 2004-11-16 | Canon Kabushiki Kaisha | Radiographic image pickup apparatus and method of driving the apparatus |
| US6730900B2 (en) * | 2002-02-05 | 2004-05-04 | E-Phocus, Inc. | Camera with MOS or CMOS sensor array |
| JP4147094B2 (ja) * | 2002-11-22 | 2008-09-10 | キヤノン株式会社 | 放射線撮像装置及び放射線撮像システム |
| FR2852099B1 (fr) * | 2003-03-04 | 2005-05-20 | Actaris Sas | Dispositif optoelectronique pour module de detection optique d'un compteur |
| JP4360121B2 (ja) | 2003-05-23 | 2009-11-11 | ソニー株式会社 | 画素回路、表示装置、および画素回路の駆動方法 |
| DE102004015876A1 (de) * | 2004-03-31 | 2005-10-27 | Siemens Ag | Verfahren zum Auslesen eines Flächendetektors |
| US8067813B2 (en) * | 2004-07-01 | 2011-11-29 | Varian Medical Systems Technologies, Inc. | Integrated MIS photosensitive device using continuous films |
| US7208810B2 (en) * | 2004-07-01 | 2007-04-24 | Varian Medical Technologies, Inc. | Integrated MIS photosensitive device using continuous films |
| JP4349232B2 (ja) * | 2004-07-30 | 2009-10-21 | ソニー株式会社 | 半導体モジュール及びmos型固体撮像装置 |
| JP5013754B2 (ja) * | 2005-06-13 | 2012-08-29 | キヤノン株式会社 | 電磁波検出装置、放射線検出装置、放射線検出システム及びレーザ加工方法 |
| JP2007088616A (ja) * | 2005-09-20 | 2007-04-05 | Seiko Epson Corp | 画像読み取り装置及びその原稿ホルダ |
| JP5257271B2 (ja) * | 2009-06-26 | 2013-08-07 | ソニー株式会社 | 光電変換装置および光電変換装置の駆動方法、並びに放射線撮像装置および放射線撮像装置の駆動方法 |
| CN108110015B (zh) * | 2016-11-25 | 2020-05-08 | 奕瑞影像科技(太仓)有限公司 | X射线图像传感器、平板探测器及其图像采集校正方法 |
| US11131782B2 (en) * | 2018-11-12 | 2021-09-28 | Stmicroelectronics (Crolles 2) Sas | Ionizing radiation detector |
| JP7271209B2 (ja) * | 2019-02-06 | 2023-05-11 | キヤノン株式会社 | 放射線撮像装置、放射線撮像システムおよび放射線撮像装置の制御方法 |
| CN111337125B (zh) | 2020-03-20 | 2021-11-16 | 京东方科技集团股份有限公司 | 一种光强检测电路、光强检测方法和装置 |
| JP2024017481A (ja) * | 2022-07-28 | 2024-02-08 | キヤノンメディカルシステムズ株式会社 | X線ct装置、データ収集システム、データ収集方法、及びプログラム |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4376888A (en) * | 1978-04-20 | 1983-03-15 | Canon Kabushiki Kaisha | Photoelectric conversion type information processing device |
| EP0232083B1 (en) * | 1986-01-24 | 1995-04-19 | Canon Kabushiki Kaisha | Photoelectric conversion device |
| US5665968A (en) * | 1992-05-27 | 1997-09-09 | Kla Instruments Corporation | Inspecting optical masks with electron beam microscopy |
| JPH0767152B2 (ja) * | 1993-03-25 | 1995-07-19 | 日本電気株式会社 | イメージセンサとその駆動方法 |
| JP3014895B2 (ja) | 1993-06-02 | 2000-02-28 | 株式会社日立製作所 | ビデオカメラ |
| DE19527148C1 (de) * | 1995-07-25 | 1997-01-09 | Siemens Ag | Verfahren zum Betrieb eines digitalen Bildsystems einer Röntgendiagnostikeinrichtung |
| US6002433A (en) * | 1995-08-29 | 1999-12-14 | Sanyo Electric Co., Ltd. | Defective pixel detecting circuit of a solid state image pick-up device capable of detecting defective pixels with low power consumption and high precision, and image pick-up device having such detecting circuit |
| US5854655A (en) | 1995-08-29 | 1998-12-29 | Sanyo Electric Co., Ltd. | Defective pixel detecting circuit of a solid state image pick-up device capable of detecting defective pixels with low power consumption and high precision, and image pick-up device having such detecting circuit |
| US5912465A (en) | 1995-09-05 | 1999-06-15 | Canon Kabushiki Kaisha | Photoelectric converter |
| JP3416432B2 (ja) * | 1996-12-24 | 2003-06-16 | キヤノン株式会社 | 光電変換装置及びその駆動方法 |
-
1998
- 1998-07-31 JP JP10217783A patent/JP2000046646A/ja active Pending
-
1999
- 1999-07-29 DE DE69942188T patent/DE69942188D1/de not_active Expired - Lifetime
- 1999-07-29 EP EP99306031A patent/EP0977268B1/en not_active Expired - Lifetime
- 1999-07-30 US US09/363,821 patent/US6512217B1/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002101343A (ja) * | 2000-09-22 | 2002-04-05 | Toshiba Medical System Co Ltd | X線平面検出器及びx線診断システム |
| JP2006145214A (ja) * | 2004-11-16 | 2006-06-08 | Nissan Motor Co Ltd | 赤外線検出装置 |
| JP2009265074A (ja) * | 2008-03-31 | 2009-11-12 | Epson Imaging Devices Corp | 光検出装置、電気光学装置及び電子機器並びに光劣化補正方法 |
| WO2010032497A1 (ja) * | 2008-09-19 | 2010-03-25 | コニカミノルタエムジー株式会社 | 欠陥画素判定方法、欠陥画素判定プログラム、放射線画像検出器及び欠陥画素判定システム |
| WO2011111590A1 (ja) * | 2010-03-09 | 2011-09-15 | 株式会社島津製作所 | 二次元アレイx線検出器の検査方法 |
| US8415636B2 (en) | 2010-03-09 | 2013-04-09 | Shimadzu Corporation | Method for inspecting two-dimensional array X-ray detector |
| JP5348314B2 (ja) * | 2010-03-09 | 2013-11-20 | 株式会社島津製作所 | 二次元アレイx線検出器の検査方法 |
| JP2011214905A (ja) * | 2010-03-31 | 2011-10-27 | Fujifilm Corp | 放射線画像検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0977268B1 (en) | 2010-03-31 |
| EP0977268A2 (en) | 2000-02-02 |
| DE69942188D1 (de) | 2010-05-12 |
| US6512217B1 (en) | 2003-01-28 |
| EP0977268A3 (en) | 2005-06-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
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