JP1529605S - - Google Patents
Info
- Publication number
- JP1529605S JP1529605S JPD2014-27890F JP2014027890F JP1529605S JP 1529605 S JP1529605 S JP 1529605S JP 2014027890 F JP2014027890 F JP 2014027890F JP 1529605 S JP1529605 S JP 1529605S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2014-27890F JP1529605S (es) | 2014-12-15 | 2014-12-15 | |
TW104303164F TWD173713S (zh) | 2014-12-15 | 2015-06-11 | 積體電路插座用探針引腳 |
US29/530,260 USD776551S1 (en) | 2014-12-15 | 2015-06-15 | Probe pin |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2014-27890F JP1529605S (es) | 2014-12-15 | 2014-12-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP1529605S true JP1529605S (es) | 2015-07-27 |
Family
ID=53764632
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JPD2014-27890F Active JP1529605S (es) | 2014-12-15 | 2014-12-15 |
Country Status (3)
Country | Link |
---|---|
US (1) | USD776551S1 (es) |
JP (1) | JP1529605S (es) |
TW (1) | TWD173713S (es) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP1592871S (es) * | 2017-02-10 | 2017-12-11 | ||
USD869305S1 (en) * | 2017-02-10 | 2019-12-10 | Kabushiki Kaisha Nihon Micronics | Probe pin |
JP1623280S (es) * | 2018-02-02 | 2019-01-28 | ||
JP1623279S (es) * | 2018-02-02 | 2019-01-28 | ||
JP1622968S (es) * | 2018-02-02 | 2019-01-28 | ||
JP1622970S (es) * | 2018-02-02 | 2019-01-28 | ||
JP1622969S (es) * | 2018-02-02 | 2019-01-28 | ||
JP1626667S (es) * | 2018-02-02 | 2019-03-18 | ||
TWD197822S (zh) * | 2018-02-02 | 2019-06-01 | 日商日本麥克隆尼股份有限公司 | 電性接觸子之部分 |
JP1626668S (es) * | 2018-02-02 | 2019-03-18 | ||
JP1624757S (es) * | 2018-05-16 | 2019-02-18 | ||
USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
TWD226028S (zh) * | 2022-04-29 | 2023-06-21 | 南韓商普因特工程有限公司 | 半導體檢測針 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
WO2011036800A1 (ja) * | 2009-09-28 | 2011-03-31 | 株式会社日本マイクロニクス | 接触子及び電気的接続装置 |
KR101058146B1 (ko) * | 2009-11-11 | 2011-08-24 | 하이콘 주식회사 | 스프링 콘택트 및 스프링 콘택트 내장 소켓 |
TWD138876S1 (zh) * | 2010-01-27 | 2011-02-01 | 日本麥克隆尼股份有限公司 | 電接觸元件 |
TWM390564U (en) * | 2010-03-18 | 2010-10-11 | Hon Hai Prec Ind Co Ltd | Electrical contact |
JP4998838B2 (ja) * | 2010-04-09 | 2012-08-15 | 山一電機株式会社 | プローブピン及びそれを備えるicソケット |
JP5352525B2 (ja) | 2010-04-28 | 2013-11-27 | 日本航空電子工業株式会社 | プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具 |
USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
JP5699899B2 (ja) * | 2011-10-14 | 2015-04-15 | オムロン株式会社 | 接触子 |
JP5708430B2 (ja) * | 2011-10-14 | 2015-04-30 | オムロン株式会社 | 接触子 |
USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
-
2014
- 2014-12-15 JP JPD2014-27890F patent/JP1529605S/ja active Active
-
2015
- 2015-06-11 TW TW104303164F patent/TWD173713S/zh unknown
- 2015-06-15 US US29/530,260 patent/USD776551S1/en active Active
Also Published As
Publication number | Publication date |
---|---|
USD776551S1 (en) | 2017-01-17 |
TWD173713S (zh) | 2016-02-11 |