ITTO991077A0 - Apparecchiatura di prova per il collaudo di backplane o schede circuit ali popolate. - Google Patents

Apparecchiatura di prova per il collaudo di backplane o schede circuit ali popolate.

Info

Publication number
ITTO991077A0
ITTO991077A0 IT99TO001077A ITTO991077A ITTO991077A0 IT TO991077 A0 ITTO991077 A0 IT TO991077A0 IT 99TO001077 A IT99TO001077 A IT 99TO001077A IT TO991077 A ITTO991077 A IT TO991077A IT TO991077 A0 ITTO991077 A0 IT TO991077A0
Authority
IT
Italy
Prior art keywords
backplanes
circuit boards
test equipment
populated
testing
Prior art date
Application number
IT99TO001077A
Other languages
English (en)
Inventor
Kevin M Wheel
John R Kiely
Original Assignee
Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Capital Formation Inc filed Critical Capital Formation Inc
Publication of ITTO991077A0 publication Critical patent/ITTO991077A0/it
Publication of ITTO991077A1 publication Critical patent/ITTO991077A1/it
Application granted granted Critical
Publication of IT1311302B1 publication Critical patent/IT1311302B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Emergency Protection Circuit Devices (AREA)
IT1999TO001077A 1998-12-08 1999-12-07 Apparecchiatura di prova per il collaudo di backplane o schedecircuitali popolate. IT1311302B1 (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/207,740 US6194908B1 (en) 1997-06-26 1998-12-08 Test fixture for testing backplanes or populated circuit boards

Publications (3)

Publication Number Publication Date
ITTO991077A0 true ITTO991077A0 (it) 1999-12-07
ITTO991077A1 ITTO991077A1 (it) 2001-06-07
IT1311302B1 IT1311302B1 (it) 2002-03-12

Family

ID=22771811

Family Applications (1)

Application Number Title Priority Date Filing Date
IT1999TO001077A IT1311302B1 (it) 1998-12-08 1999-12-07 Apparecchiatura di prova per il collaudo di backplane o schedecircuitali popolate.

Country Status (7)

Country Link
US (1) US6194908B1 (it)
JP (1) JP3124762B2 (it)
DE (1) DE19960112B4 (it)
FR (1) FR2786873B1 (it)
GB (1) GB2344704B (it)
IT (1) IT1311302B1 (it)
TW (1) TW522240B (it)

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US6628130B2 (en) * 2001-07-18 2003-09-30 Agilent Technologies, Inc. Wireless test fixture for printed circuit board test systems
US6828773B2 (en) * 2002-03-21 2004-12-07 Agilent Technologies, Inc. Adapter method and apparatus for interfacing a tester with a device under test
US6956379B2 (en) * 2002-07-09 2005-10-18 Hewlett-Packard Development Company, L.P. Testing device and method for testing backplanes and connectors on backplanes
KR100600482B1 (ko) * 2004-06-22 2006-07-13 삼성전자주식회사 반도체 패키지 측정용 프로브
US7145352B2 (en) * 2004-08-13 2006-12-05 Agilent Technologies, Inc. Apparatus, method, and kit for probing a pattern of points on a printed circuit board
US7616004B1 (en) * 2004-10-25 2009-11-10 The United States Of America As Represented By The Department Of The Navy Backplane tester and method of use
US7374293B2 (en) * 2005-03-25 2008-05-20 Vishay General Semiconductor Inc. Apparatus, system and method for testing electronic elements
US11378588B2 (en) * 2006-12-21 2022-07-05 Essai, Inc. Contactor with angled depressible probes in shifted bores
KR100975808B1 (ko) 2007-04-17 2010-08-13 니혼덴산리드가부시키가이샤 기판검사용 치구
US7492174B2 (en) * 2007-06-18 2009-02-17 James Hall Testing apparatus for surface mounted connectors
CN101697002B (zh) * 2009-10-16 2012-08-08 南京普宜施电子科技有限公司 一种低阻值印刷线路板测试装置
US8907694B2 (en) * 2009-12-17 2014-12-09 Xcerra Corporation Wiring board for testing loaded printed circuit board
US8648616B2 (en) * 2009-12-22 2014-02-11 Ltx-Credence Corporation Loaded printed circuit board test fixture and method for manufacturing the same
US8269507B2 (en) 2010-05-29 2012-09-18 James Hall Device for testing surface mounted connectors
US9110129B1 (en) * 2010-11-17 2015-08-18 Michael Ames Test fixture utilizing a docking station and interchangeable cassettes and method of use
CN102540004A (zh) * 2010-12-08 2012-07-04 鸿富锦精密工业（深圳）有限公司 测试装置
CN102802350A (zh) * 2011-05-27 2012-11-28 鸿富锦精密工业（深圳）有限公司 电路板组合及其辅助测试电路板
CN102565675B (zh) * 2011-12-31 2014-02-26 北京中微普业科技有限公司 一种宽管脚低阻抗大功率功放管测试夹具及校准方法
US9354267B1 (en) * 2012-07-18 2016-05-31 Neurotopia, Inc. Sensor probe assembly
US9618570B2 (en) 2014-06-06 2017-04-11 Advantest Corporation Multi-configurable testing module for automated testing of a device
US9618574B2 (en) 2014-06-06 2017-04-11 Advantest Corporation Controlling automated testing of devices
US9933454B2 (en) 2014-06-06 2018-04-03 Advantest Corporation Universal test floor system
US9638749B2 (en) 2014-06-06 2017-05-02 Advantest Corporation Supporting automated testing of devices in a test floor system
US9678148B2 (en) 2014-06-06 2017-06-13 Advantest Corporation Customizable tester having testing modules for automated testing of devices
JP6367124B2 (ja) * 2015-01-09 2018-08-01 マクセルシステムテック株式会社 半導体製造装置のテスト方法
US10539592B2 (en) 2016-10-18 2020-01-21 Texas Instruments Incorporated Systems and methods for depopulating pins from contactor test sockets for packaged semiconductor devices
CN107817440B (zh) * 2017-10-26 2020-06-12 东营南科电气有限责任公司 一种电路开关检测用耐点击测试设备
CN110865295A (zh) * 2019-10-30 2020-03-06 武汉光庭信息技术股份有限公司 一种板载ic管脚信号测试治具
US11818842B1 (en) * 2020-03-06 2023-11-14 Amazon Technologies, Inc. Configurable circuit board for abstracting third-party controls

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Publication number Priority date Publication date Assignee Title
JPS5839574A (ja) 1981-09-04 1983-03-08 Nissan Motor Co Ltd 自動車車体の移載装置
JPS60163374A (ja) 1984-02-03 1985-08-26 Asahi Chem Ind Co Ltd 積層電池
EP0215146B1 (de) 1985-09-16 1988-08-03 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH Vorrichtung zum elektronischen Prüfen von Leiterplatten oder dergleichen
JPS6371600A (ja) 1986-09-11 1988-03-31 Kubota Ltd 揚砂装置の制御方法
US5247246A (en) 1987-04-17 1993-09-21 Everett Charles Technologies, Inc. Testing of integrated circuit devices on loaded printed circuit boards
US5180976A (en) 1987-04-17 1993-01-19 Everett/Charles Contact Products, Inc. Integrated circuit carrier having built-in circuit verification
DE3902161A1 (de) * 1988-01-27 1989-08-10 Manfred Prokopp Kontaktiervorrichtung
US4904935A (en) * 1988-11-14 1990-02-27 Eaton Corporation Electrical circuit board text fixture having movable platens
JPH04110978A (ja) 1990-08-31 1992-04-13 Mita Ind Co Ltd 画像形成装置
US5389885A (en) 1992-01-27 1995-02-14 Everett Charles Technologies, Inc. Expandable diaphragm test modules and connectors
JPH05215773A (ja) 1992-02-04 1993-08-24 Nhk Spring Co Ltd 多点測定用導電性接触子ユニット
JPH05302938A (ja) 1992-04-24 1993-11-16 Ibiden Co Ltd プリント配線板の検査治具
JPH0680179A (ja) 1992-08-28 1994-03-22 Fujitsu Ltd 光モジュール・光ユニット収容装置
US5450017A (en) * 1993-12-03 1995-09-12 Everett Charles Technologies, Inc. Test fixture having translator for grid interface
US5493230A (en) 1994-02-25 1996-02-20 Everett Charles Technologies, Inc. Retention of test probes in translator fixtures
DE19507127A1 (de) * 1995-03-01 1996-09-12 Test Plus Electronic Gmbh Adaptersystem für Baugruppen-Platinen, zu verwenden in einer Prüfeinrichtung
US5729146A (en) * 1995-09-21 1998-03-17 Everett Charles Technologies, Inc. Quick stacking translator fixture
IT1282689B1 (it) 1996-02-26 1998-03-31 Circuit Line Spa Dispositivo di conversione della griglia di punti di test di una macchina per il test elettrico di circuiti stampati non montati
GB2311175A (en) * 1996-03-15 1997-09-17 Everett Charles Tech PCB / test circuitry connection interface with short circuiting means
US5883520A (en) * 1996-06-14 1999-03-16 Star Technology Group, Inc. Retention of test probes in translator fixtures
US5818248A (en) * 1996-07-29 1998-10-06 Delaware Capital Formation, Inc Loaded board test fixture with integral translator fixture for testing closely spaced test sites
US5773988A (en) * 1996-10-29 1998-06-30 Hewlett-Packard Company Standard- and limited-access hybrid test fixture
US5945836A (en) 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
US6005405A (en) * 1997-06-30 1999-12-21 Hewlett Packard Company Probe plate assembly for high-node-count circuit board test fixtures

Also Published As

Publication number Publication date
FR2786873B1 (fr) 2002-01-18
GB2344704B (en) 2002-11-13
JP3124762B2 (ja) 2001-01-15
GB9925748D0 (en) 1999-12-29
IT1311302B1 (it) 2002-03-12
DE19960112A1 (de) 2000-06-29
FR2786873A1 (fr) 2000-06-09
ITTO991077A1 (it) 2001-06-07
GB2344704A (en) 2000-06-14
TW522240B (en) 2003-03-01
JP2000171514A (ja) 2000-06-23
US6194908B1 (en) 2001-02-27
DE19960112B4 (de) 2005-05-25

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