IT1111167B - Memoria semiconduttrice - Google Patents

Memoria semiconduttrice

Info

Publication number
IT1111167B
IT1111167B IT20837/78A IT2083778A IT1111167B IT 1111167 B IT1111167 B IT 1111167B IT 20837/78 A IT20837/78 A IT 20837/78A IT 2083778 A IT2083778 A IT 2083778A IT 1111167 B IT1111167 B IT 1111167B
Authority
IT
Italy
Prior art keywords
semiconductive memory
semiconductive
memory
Prior art date
Application number
IT20837/78A
Other languages
English (en)
Other versions
IT7820837A0 (it
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of IT7820837A0 publication Critical patent/IT7820837A0/it
Application granted granted Critical
Publication of IT1111167B publication Critical patent/IT1111167B/it

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/35—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices with charge storage in a depletion layer, e.g. charge coupled devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/04—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
    • G11C13/06—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam using magneto-optical elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/81—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation
    • H10D62/815—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW]
    • H10D62/8161—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/81—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation
    • H10D62/815—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW]
    • H10D62/8161—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices
    • H10D62/8162—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices having quantum effects only in the vertical direction, i.e. layered structures having quantum effects solely resulting from vertical potential variation
    • H10D62/8164—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices having quantum effects only in the vertical direction, i.e. layered structures having quantum effects solely resulting from vertical potential variation comprising only semiconductor materials 
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00—Diodes
    • H10D8/812—Charge-trapping diodes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/926—Elongated lead extending axially through another elongated lead

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Memories (AREA)
  • Shift Register Type Memory (AREA)
  • Non-Volatile Memory (AREA)
IT20837/78A 1977-06-09 1978-03-03 Memoria semiconduttrice IT1111167B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/805,068 US4103312A (en) 1977-06-09 1977-06-09 Semiconductor memory devices

Publications (2)

Publication Number Publication Date
IT7820837A0 IT7820837A0 (it) 1978-03-03
IT1111167B true IT1111167B (it) 1986-01-13

Family

ID=25190599

Family Applications (1)

Application Number Title Priority Date Filing Date
IT20837/78A IT1111167B (it) 1977-06-09 1978-03-03 Memoria semiconduttrice

Country Status (8)

Country Link
US (1) US4103312A (it)
JP (1) JPS544539A (it)
DE (1) DE2803795A1 (it)
FR (1) FR2394142A1 (it)
GB (1) GB1595878A (it)
IT (1) IT1111167B (it)
NL (1) NL7806183A (it)
SE (1) SE418917B (it)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE33671E (en) * 1978-04-24 1991-08-20 At&T Bell Laboratories Method of making high mobility multilayered heterojunction device employing modulated doping
US4194935A (en) * 1978-04-24 1980-03-25 Bell Telephone Laboratories, Incorporated Method of making high mobility multilayered heterojunction devices employing modulated doping
US4163237A (en) * 1978-04-24 1979-07-31 Bell Telephone Laboratories, Incorporated High mobility multilayered heterojunction devices employing modulated doping
US4205331A (en) * 1978-06-09 1980-05-27 The United States Of America As Represented By The Secretary Of The Army Infrared optical devices of layered structure
US4250515A (en) * 1978-06-09 1981-02-10 The United States Of America As Represented By The Secretary Of The Army Heterojunction superlattice with potential well depth greater than half the bandgap
US4198644A (en) * 1978-06-09 1980-04-15 The United States Of America As Represented By The Secretary Of The Army Tunnel diode
US4208667A (en) * 1978-06-09 1980-06-17 The United States Of America As Represented By The Secretary Of The Army Controlled absorption in heterojunction structures
US4163238A (en) * 1978-06-09 1979-07-31 The United States Of America As Represented By The Secretary Of The Army Infrared semiconductor device with superlattice region
US4203124A (en) * 1978-10-06 1980-05-13 Bell Telephone Laboratories, Incorporated Low noise multistage avalanche photodetector
US4257055A (en) * 1979-07-26 1981-03-17 University Of Illinois Foundation Negative resistance heterojunction devices
US4250516A (en) * 1979-08-06 1981-02-10 Bell Telephone Laboratories, Incorporated Multistage avalanche photodetector
US4348686A (en) * 1980-07-28 1982-09-07 The United States Of America As Represented By The Secretary Of The Army Microwave-infrared detector with semiconductor superlattice region
US4361814A (en) * 1980-09-29 1982-11-30 Rockwell International Corporation Distributed optical parametric amplifier
JPS5851568A (ja) * 1981-09-22 1983-03-26 Nec Corp 半導体装置
US4553317A (en) * 1981-11-09 1985-11-19 Canon Kabushiki Kaisha Method of obtaining an impact ionization coefficient rate by junction of different kinds of semiconductors
US4486765A (en) * 1981-12-07 1984-12-04 At&T Bell Laboratories Avalanche photodetector including means for separating electrons and holes
US4503447A (en) * 1982-07-16 1985-03-05 The United States Of America As Represented By The Secretary Of The Army Multi-dimensional quantum well device
US4719496A (en) * 1982-11-24 1988-01-12 Federico Capasso Repeated velocity overshoot semiconductor device
US4665504A (en) * 1982-11-26 1987-05-12 The British Petroleum Company Memory device containing electrically conducting substrate having deposited hereon a layer of amorphous or microcrystalline silicon-carbon alloy and a layer of amorphous or microcrystalline silicon-containing material
NL8301187A (nl) * 1983-04-05 1984-11-01 Philips Nv Halfgeleiderinrichting voor het opwekken van elektromagnetische straling.
JPS6028268A (ja) * 1983-07-26 1985-02-13 Agency Of Ind Science & Technol 半導体装置
US4575924A (en) * 1984-07-02 1986-03-18 Texas Instruments Incorporated Process for fabricating quantum-well devices utilizing etch and refill techniques
US4665412A (en) * 1985-06-19 1987-05-12 Ga Technologies Inc. Coupled heterostructure superlattice devices
US4672405A (en) * 1985-08-23 1987-06-09 Bell Communications Research, Inc. Multiple quantum well frequency multiplier circuit
US4783427A (en) * 1986-02-18 1988-11-08 Texas Instruments Incorporated Process for fabricating quantum-well devices
FR2595509B1 (fr) * 1986-03-07 1988-05-13 Thomson Csf Composant en materiau semiconducteur epitaxie sur un substrat a parametre de maille different et application a divers composants en semiconducteurs
JP2508637B2 (ja) * 1986-05-20 1996-06-19 日本電気株式会社 半導体素子
US5010517A (en) * 1987-11-18 1991-04-23 Hitachi, Ltd. Semiconductor optical apparatus
JP3020529B2 (ja) * 1989-12-29 2000-03-15 富士通株式会社 光駆動量子化装置
US5465249A (en) * 1991-11-26 1995-11-07 Cree Research, Inc. Nonvolatile random access memory device having transistor and capacitor made in silicon carbide substrate
GB9226382D0 (en) * 1992-12-18 1993-02-10 Hitachi Europ Ltd Memory device
US5677637A (en) * 1992-03-25 1997-10-14 Hitachi, Ltd. Logic device using single electron coulomb blockade techniques
JP4854975B2 (ja) * 1995-04-28 2012-01-18 富士通株式会社 光半導体記憶装置の書込み読出し方法
US8394683B2 (en) 2008-01-15 2013-03-12 Micron Technology, Inc. Methods of forming semiconductor constructions, and methods of forming NAND unit cells
US8053982B2 (en) * 2008-04-30 2011-11-08 Hewlett-Packard Development Company, L.P. Light-emitting diodes with carrier extraction electrodes
DE102011006782A1 (de) * 2011-04-05 2012-10-11 Technische Universität Berlin Speicherzelle

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3626257A (en) * 1969-04-01 1971-12-07 Ibm Semiconductor device with superlattice region
US3626328A (en) * 1969-04-01 1971-12-07 Ibm Semiconductor bulk oscillator
US3721583A (en) * 1970-12-08 1973-03-20 Ibm Vapor phase epitaxial deposition process for forming superlattice structure
DE2139436A1 (de) * 1971-08-06 1973-02-22 Licentia Gmbh Halbleiterlaser
DE2261527C2 (de) * 1972-12-15 1983-04-21 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Halbleiterkörper mit in einer vorgegebenen Richtung abwechselnd aufeinanderfolgenden n- und p-dotierten Zonen, Verfahren zu seiner Herstellung und Verwendungen des Halbleiterkörpers
US3893148A (en) * 1974-02-25 1975-07-01 Us Navy Layered superlattic switching and negative resistance devices
US3929527A (en) * 1974-06-11 1975-12-30 Us Army Molecular beam epitaxy of alternating metal-semiconductor films

Also Published As

Publication number Publication date
US4103312A (en) 1978-07-25
JPS544539A (en) 1979-01-13
JPS5723353B2 (it) 1982-05-18
DE2803795A1 (de) 1978-12-14
SE7802625L (sv) 1978-12-10
FR2394142B1 (it) 1983-10-07
IT7820837A0 (it) 1978-03-03
FR2394142A1 (fr) 1979-01-05
SE418917B (sv) 1981-06-29
NL7806183A (nl) 1978-12-12
GB1595878A (en) 1981-08-19

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