IT1085965B - Filtro per fotorivelatori - Google Patents

Filtro per fotorivelatori

Info

Publication number
IT1085965B
IT1085965B IT26786/77A IT2678677A IT1085965B IT 1085965 B IT1085965 B IT 1085965B IT 26786/77 A IT26786/77 A IT 26786/77A IT 2678677 A IT2678677 A IT 2678677A IT 1085965 B IT1085965 B IT 1085965B
Authority
IT
Italy
Prior art keywords
detectors
filter
Prior art date
Application number
IT26786/77A
Other languages
English (en)
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of IT1085965B publication Critical patent/IT1085965B/it

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters
    • G02B5/285—Interference filters comprising deposited thin solid films
    • G02B5/288—Interference filters comprising deposited thin solid films comprising at least one thin film resonant cavity, e.g. in bandpass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0216—Coatings
    • H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H01L31/02165—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors using interference filters, e.g. multilayer dielectric filters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
  • Photovoltaic Devices (AREA)
  • Optical Filters (AREA)
IT26786/77A 1976-08-20 1977-08-19 Filtro per fotorivelatori IT1085965B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19762637616 DE2637616A1 (de) 1976-08-20 1976-08-20 Filter fuer fotodetektoren

Publications (1)

Publication Number Publication Date
IT1085965B true IT1085965B (it) 1985-05-28

Family

ID=5985967

Family Applications (1)

Application Number Title Priority Date Filing Date
IT26786/77A IT1085965B (it) 1976-08-20 1977-08-19 Filtro per fotorivelatori

Country Status (6)

Country Link
US (1) US4158133A (it)
JP (1) JPS5326147A (it)
DE (1) DE2637616A1 (it)
FR (1) FR2362412A1 (it)
GB (1) GB1591812A (it)
IT (1) IT1085965B (it)

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SU1125588A1 (ru) * 1982-01-27 1984-11-23 Киевское Научно-Производственное Объединение "Аналитприбор" Интерференционный отрезающий фильтр
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DE3302827A1 (de) * 1983-01-28 1984-08-02 Leybold-Heraeus GmbH, 5000 Köln Verfahren zum herstellen von optischen elementen mit interferenzschichten
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FR2559619B1 (fr) * 1984-02-10 1987-01-16 Thomson Csf Dispositif photosensible avec filtres integres pour la separation des couleurs et procede de fabrication
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EP0253002A1 (de) * 1986-07-12 1988-01-20 Günter Dr.-Ing. Pusch Vorrichtung zur Erkennung thermischer Kontraste
US4851664A (en) * 1988-06-27 1989-07-25 United States Of America As Represented By The Secretary Of The Navy Narrow band and wide angle hemispherical interference optical filter
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DE4004398A1 (de) * 1990-02-13 1991-08-14 Siemens Ag Wellenlaengenselektiver photodetektor
JPH04179278A (ja) * 1990-11-13 1992-06-25 Sumitomo Electric Ind Ltd 受光素子
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DE4234471C1 (de) * 1992-10-13 1994-01-20 Fraunhofer Ges Forschung Vorrichtung zur Absorption infraroter Strahlung
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DE4439533C2 (de) * 1994-06-02 1996-10-02 Rolf Dipl Phys Weidemann Vorrichtung und Verfahren zur farbmetrischen Erfassung von Farbkontrollfeldern bei der Farbkalibrierung der ausgegebenen Farben von elektronischen Bildverarbeitungssystemen
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US5477075A (en) * 1994-12-16 1995-12-19 Advanced Photonix, Inc. Solid state photodetector with light-responsive rear face
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US6005276A (en) * 1997-11-12 1999-12-21 Advanced Photonix, Inc. Solid state photodetector with light-responsive rear face
US6355939B1 (en) 1998-11-03 2002-03-12 Lockheed Martin Corporation Multi-band infrared photodetector
US6341040B1 (en) * 1999-06-08 2002-01-22 Jds Uniphase Corporation Multi-plate comb filter and applications therefor
US6727192B2 (en) * 2001-03-01 2004-04-27 Micron Technology, Inc. Methods of metal doping a chalcogenide material
US6550330B1 (en) 2001-03-14 2003-04-22 The United States Of America As Represented By The Secretary Of The Navy Differential amplification for micro-electro-mechanical ultra-sensitive accelerometer
US6581465B1 (en) 2001-03-14 2003-06-24 The United States Of America As Represented By The Secretary Of The Navy Micro-electro-mechanical systems ultra-sensitive accelerometer
US7095009B2 (en) * 2002-05-21 2006-08-22 3M Innovative Properties Company Photopic detector system and filter therefor
US7396493B2 (en) 2002-05-21 2008-07-08 3M Innovative Properties Company Multilayer optical film with melt zone to control delamination
US6991695B2 (en) * 2002-05-21 2006-01-31 3M Innovative Properties Company Method for subdividing multilayer optical film cleanly and rapidly
US6818962B2 (en) * 2002-10-25 2004-11-16 Omnivision International Holding Ltd Image sensor having integrated thin film infrared filter
US7148704B2 (en) * 2002-10-31 2006-12-12 Harald Philipp Charge transfer capacitive position sensor
US6897447B2 (en) * 2002-12-05 2005-05-24 Lockheed Martin Corporation Bias controlled multi-spectral infrared photodetector and imager
US7135698B2 (en) * 2002-12-05 2006-11-14 Lockheed Martin Corporation Multi-spectral infrared super-pixel photodetector and imager
DE10302165A1 (de) * 2003-01-22 2004-07-29 Robert Bosch Gmbh Infrarotquelle und Gassensor
WO2005001409A2 (en) * 2003-06-11 2005-01-06 Furry Brothers, Llc Infrared imaging of chemical leaks
DE10335189A1 (de) * 2003-07-30 2005-03-03 Daimlerchrysler Ag Vorrichtung zur Sichtverbesserung bei Kraftfahrzeugen
US7223960B2 (en) * 2003-12-03 2007-05-29 Micron Technology, Inc. Image sensor, an image sensor pixel, and methods of forming the same
WO2005069376A1 (ja) * 2004-01-15 2005-07-28 Matsushita Electric Industrial Co.,Ltd. 固体撮像装置、固体撮像装置の製造方法及びこれを用いたカメラ
US7521666B2 (en) * 2005-02-17 2009-04-21 Capella Microsystems Inc. Multi-cavity Fabry-Perot ambient light filter apparatus
US20070115415A1 (en) * 2005-11-21 2007-05-24 Arthur Piehl Light absorbers and methods
US20080180665A1 (en) * 2007-01-31 2008-07-31 Redman David J Measuring color spectra using color filter arrays
US20080266563A1 (en) * 2007-04-26 2008-10-30 Redman David J Measuring color using color filter arrays
DE102007032371A1 (de) * 2007-07-06 2009-01-15 Carl Zeiss Laser Optics Gmbh Verfahren zum Beschichten eines optischen Bauelements für eine Laseranordnung
JP5524844B2 (ja) * 2007-09-13 2014-06-18 デーム、ケーシー エネルギー受信パネル内の３次元的な光起電力モジュール
CN102057495B (zh) * 2008-06-04 2013-10-09 旭化成微电子株式会社 量子型红外线传感器以及使用该量子型红外线传感器的量子型红外线气体浓度仪
US20100163759A1 (en) * 2008-12-31 2010-07-01 Stmicroelectronics S.R.L. Radiation sensor with photodiodes being integrated on a semiconductor substrate and corresponding integration process
IT1392502B1 (it) * 2008-12-31 2012-03-09 St Microelectronics Srl Sensore comprendente almeno un fotodiodo a doppia giunzione verticale integrato su substrato semiconduttore e relativo processo di integrazione
DE102009012755A1 (de) * 2009-03-12 2010-09-16 Osram Opto Semiconductors Gmbh Strahlungsempfangendes Halbleiterbauelement und optoelektrisches Bauteil
US20110068423A1 (en) * 2009-09-18 2011-03-24 International Business Machines Corporation Photodetector with wavelength discrimination, and method for forming the same and design structure
WO2013164720A1 (en) 2012-04-30 2013-11-07 Koninklijke Philips N.V. Imaging detector with anti-aliasing filter in the readout electronics and/or photosensor
DE102013101001B4 (de) * 2013-01-31 2020-10-08 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronisches Halbleiterbauteil und Strahlungssensor
CN103698831B (zh) * 2013-11-29 2016-04-27 杭州麦乐克电子科技有限公司 通过带为7600-9900nm的红外测温滤光片
CN103713347B (zh) * 2013-11-29 2016-02-10 杭州麦乐克电子科技有限公司 通过带为7550-13900nm的红外测温滤光片
CN103713346B (zh) * 2013-11-29 2016-02-10 杭州麦乐克电子科技有限公司 中心波长2700nm的航空尾气气体检测滤光片
US10078142B2 (en) * 2014-03-26 2018-09-18 California Institute Of Technology Sensor integrated metal dielectric filters for solar-blind silicon ultraviolet detectors
WO2015148861A1 (en) * 2014-03-26 2015-10-01 California Institute Of Technology Subnanosecond scintillation detector
US20160035914A1 (en) * 2014-07-31 2016-02-04 Analog Devices, Inc. Filter coating design for optical sensors
JP6529743B2 (ja) * 2014-11-06 2019-06-12 株式会社豊田中央研究所 光電変換素子
JP2016167530A (ja) * 2015-03-10 2016-09-15 ソニー株式会社 固体撮像装置及びその製造方法、並びに電子機器
JP6504874B2 (ja) * 2015-03-27 2019-04-24 株式会社豊田中央研究所 光学フィルタおよび光学測定装置
GB2542802A (en) * 2015-09-30 2017-04-05 Cambridge Display Tech Ltd Organic-based fluorescence sensor with low background signal
JP2019200383A (ja) * 2018-05-18 2019-11-21 ソニーセミコンダクタソリューションズ株式会社 共振器構造体、撮像素子、および電子機器
CN110824599B (zh) 2018-08-14 2021-09-03 白金科技股份有限公司 一种红外带通滤波器
EP3640690B1 (en) * 2018-09-27 2023-06-21 Seiko Epson Corporation Optical device and electronic apparatus

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US3076861A (en) * 1959-06-30 1963-02-05 Space Technology Lab Inc Electromagnetic radiation converter
US3247392A (en) * 1961-05-17 1966-04-19 Optical Coating Laboratory Inc Optical coating and assembly used as a band pass interference filter reflecting in the ultraviolet and infrared
US3528726A (en) * 1969-07-10 1970-09-15 Perkin Elmer Corp Narrow band interference light filter
US3649359A (en) * 1969-10-27 1972-03-14 Optical Coating Laboratory Inc Multilayer filter with metal dielectric period
US3743847A (en) * 1971-06-01 1973-07-03 Motorola Inc Amorphous silicon film as a uv filter
US3929398A (en) * 1971-08-18 1975-12-30 Harry E Bates High speed optical wavelength detection system
US3781090A (en) * 1972-11-06 1973-12-25 Minolta Camera Kk Four layer anti-reflection coating
US3949463A (en) * 1973-02-13 1976-04-13 Communications Satellite Corporation (Comsat) Method of applying an anti-reflective coating to a solar cell
US3996461A (en) * 1975-03-31 1976-12-07 Texas Instruments Incorporated Silicon photosensor with optical thin film filter

Also Published As

Publication number Publication date
GB1591812A (en) 1981-06-24
DE2637616A1 (de) 1978-02-23
JPS5326147A (en) 1978-03-10
FR2362412B1 (it) 1982-09-10
FR2362412A1 (fr) 1978-03-17
US4158133A (en) 1979-06-12

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