IL32247A - X-ray diffractometer - Google Patents

X-ray diffractometer

Info

Publication number
IL32247A
IL32247A IL32247A IL3224769A IL32247A IL 32247 A IL32247 A IL 32247A IL 32247 A IL32247 A IL 32247A IL 3224769 A IL3224769 A IL 3224769A IL 32247 A IL32247 A IL 32247A
Authority
IL
Israel
Prior art keywords
detector
axis
drum
crystal
ray
Prior art date
Application number
IL32247A
Other languages
English (en)
Other versions
IL32247A0 (en
Original Assignee
Yeda Res & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yeda Res & Dev filed Critical Yeda Res & Dev
Priority to IL32247A priority Critical patent/IL32247A/en
Publication of IL32247A0 publication Critical patent/IL32247A0/xx
Priority to GB2323570A priority patent/GB1307570A/en
Priority to DE19702023646 priority patent/DE2023646A1/de
Priority to CH740170A priority patent/CH519171A/de
Priority to NL7007274A priority patent/NL7007274A/xx
Priority to FR7018256A priority patent/FR2048551A5/fr
Priority to US00215486A priority patent/US3728541A/en
Publication of IL32247A publication Critical patent/IL32247A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
IL32247A 1969-05-20 1969-05-20 X-ray diffractometer IL32247A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer
GB2323570A GB1307570A (en) 1969-05-20 1970-05-13 X-ray diffractometer
DE19702023646 DE2023646A1 (enrdf_load_stackoverflow) 1969-05-20 1970-05-14
CH740170A CH519171A (de) 1969-05-20 1970-05-19 Röntgendiffraktometer
NL7007274A NL7007274A (enrdf_load_stackoverflow) 1969-05-20 1970-05-20
FR7018256A FR2048551A5 (enrdf_load_stackoverflow) 1969-05-20 1970-05-20
US00215486A US3728541A (en) 1969-05-20 1972-01-05 X-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer

Publications (2)

Publication Number Publication Date
IL32247A0 IL32247A0 (en) 1969-07-30
IL32247A true IL32247A (en) 1972-08-30

Family

ID=11044944

Family Applications (1)

Application Number Title Priority Date Filing Date
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer

Country Status (7)

Country Link
US (1) US3728541A (enrdf_load_stackoverflow)
CH (1) CH519171A (enrdf_load_stackoverflow)
DE (1) DE2023646A1 (enrdf_load_stackoverflow)
FR (1) FR2048551A5 (enrdf_load_stackoverflow)
GB (1) GB1307570A (enrdf_load_stackoverflow)
IL (1) IL32247A (enrdf_load_stackoverflow)
NL (1) NL7007274A (enrdf_load_stackoverflow)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5222553B2 (enrdf_load_stackoverflow) * 1973-02-20 1977-06-17
US4016420A (en) * 1975-05-30 1977-04-05 Dekanat Prirodovedecke Fakulty University Karlovy Precession-type x-ray diffraction camera
DE2534790C2 (de) * 1975-08-04 1986-08-21 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Röntgengoniometer zum wahlweisen Durchführen von Buerger-Präzessionsaufnahmen und Drehkristallaufnahmen
DE8423909U1 (de) * 1984-08-11 1985-01-03 Kernforschungsanlage Jülich GmbH, 5170 Jülich Eulerwiege fuer tieftemperatur-diffraktometrie
US4723075A (en) * 1985-06-12 1988-02-02 The United States Of America As Represented By The Secretary Of The Air Force Translational mount for large optical elements
GB9919396D0 (en) * 1999-08-18 1999-10-20 Knight Richard A moving yoke
GB0415053D0 (en) * 2004-07-05 2004-08-04 Dage Prec Ind Ltd X-ray manipulator
FI20041538A7 (fi) * 2004-11-29 2006-05-30 Stresstech Oy Goniometri
IT1403478B1 (it) * 2010-12-28 2013-10-17 Fond Bruno Kessler Diffrattometro a raggi x del tipo portatile perfezionato
US9613728B2 (en) * 2013-03-15 2017-04-04 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
EP3112815B1 (en) * 2015-07-01 2021-01-27 Microtecnica S.r.l. Sensor mount

Also Published As

Publication number Publication date
FR2048551A5 (enrdf_load_stackoverflow) 1971-03-19
NL7007274A (enrdf_load_stackoverflow) 1970-11-24
DE2023646A1 (enrdf_load_stackoverflow) 1970-11-26
CH519171A (de) 1972-02-15
GB1307570A (en) 1973-02-21
US3728541A (en) 1973-04-17
IL32247A0 (en) 1969-07-30

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