IT1403478B1 - Diffrattometro a raggi x del tipo portatile perfezionato - Google Patents

Diffrattometro a raggi x del tipo portatile perfezionato

Info

Publication number
IT1403478B1
IT1403478B1 ITVI2010A000351A ITVI20100351A IT1403478B1 IT 1403478 B1 IT1403478 B1 IT 1403478B1 IT VI2010A000351 A ITVI2010A000351 A IT VI2010A000351A IT VI20100351 A ITVI20100351 A IT VI20100351A IT 1403478 B1 IT1403478 B1 IT 1403478B1
Authority
IT
Italy
Prior art keywords
diffrattometer
ray
portable type
perfect portable
perfect
Prior art date
Application number
ITVI2010A000351A
Other languages
English (en)
Inventor
Corrado Deflorian
Gianpaolo Marconi
Original Assignee
Fond Bruno Kessler
Tnx Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fond Bruno Kessler, Tnx Srl filed Critical Fond Bruno Kessler
Priority to ITVI2010A000351A priority Critical patent/IT1403478B1/it
Priority to EP11195865.8A priority patent/EP2472252B1/en
Publication of ITVI20100351A1 publication Critical patent/ITVI20100351A1/it
Application granted granted Critical
Publication of IT1403478B1 publication Critical patent/IT1403478B1/it

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016Goniometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/301Accessories, mechanical or electrical features portable apparatus
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/33Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3303Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object fixed; source and detector move
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/607Specific applications or type of materials strain
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/629Specific applications or type of materials welds, bonds, sealing compounds
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/631Specific applications or type of materials large structures, walls

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
ITVI2010A000351A 2010-12-28 2010-12-28 Diffrattometro a raggi x del tipo portatile perfezionato IT1403478B1 (it)

Priority Applications (2)

Application Number Priority Date Filing Date Title
ITVI2010A000351A IT1403478B1 (it) 2010-12-28 2010-12-28 Diffrattometro a raggi x del tipo portatile perfezionato
EP11195865.8A EP2472252B1 (en) 2010-12-28 2011-12-28 Portable x-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITVI2010A000351A IT1403478B1 (it) 2010-12-28 2010-12-28 Diffrattometro a raggi x del tipo portatile perfezionato

Publications (2)

Publication Number Publication Date
ITVI20100351A1 ITVI20100351A1 (it) 2012-06-29
IT1403478B1 true IT1403478B1 (it) 2013-10-17

Family

ID=43737559

Family Applications (1)

Application Number Title Priority Date Filing Date
ITVI2010A000351A IT1403478B1 (it) 2010-12-28 2010-12-28 Diffrattometro a raggi x del tipo portatile perfezionato

Country Status (2)

Country Link
EP (1) EP2472252B1 (it)
IT (1) IT1403478B1 (it)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9613728B2 (en) * 2013-03-15 2017-04-04 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
JP5954642B1 (ja) * 2015-03-20 2016-07-20 パルステック工業株式会社 X線回折測定装置および3軸残留応力測定の必要性判定方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL32247A (en) * 1969-05-20 1972-08-30 Yeda Res & Dev X-ray diffractometer
DE2534790C2 (de) * 1975-08-04 1986-08-21 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Röntgengoniometer zum wahlweisen Durchführen von Buerger-Präzessionsaufnahmen und Drehkristallaufnahmen
DE2633114C2 (de) * 1976-07-23 1978-08-03 Allianz-Zentrum Fuer Technik Gmbh, 8000 Muenchen Spannungsmeßgoniometer für die Bauteilprüfung
JP3245475B2 (ja) * 1993-02-19 2002-01-15 理学電機株式会社 Exafs測定装置
DE102008020108B3 (de) * 2008-04-22 2010-01-14 Bruker Axs Gmbh Röntgendiffraktometer zum mechanisch korrelierten Verfahren von Quelle, Detektor und Probenposition

Also Published As

Publication number Publication date
EP2472252B1 (en) 2013-11-20
ITVI20100351A1 (it) 2012-06-29
EP2472252A1 (en) 2012-07-04

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