IL32247A0 - An improved x-ray diffractometer - Google Patents

An improved x-ray diffractometer

Info

Publication number
IL32247A0
IL32247A0 IL32247A IL3224769A IL32247A0 IL 32247 A0 IL32247 A0 IL 32247A0 IL 32247 A IL32247 A IL 32247A IL 3224769 A IL3224769 A IL 3224769A IL 32247 A0 IL32247 A0 IL 32247A0
Authority
IL
Israel
Prior art keywords
improved
ray diffractometer
diffractometer
ray
Prior art date
Application number
IL32247A
Other versions
IL32247A (en
Original Assignee
Yeda Res & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yeda Res & Dev filed Critical Yeda Res & Dev
Priority to IL32247A priority Critical patent/IL32247A/en
Publication of IL32247A0 publication Critical patent/IL32247A0/en
Priority to GB2323570A priority patent/GB1307570A/en
Priority to DE19702023646 priority patent/DE2023646A1/de
Priority to CH740170A priority patent/CH519171A/en
Priority to NL7007274A priority patent/NL7007274A/xx
Priority to FR7018256A priority patent/FR2048551A5/fr
Priority to US00215486A priority patent/US3728541A/en
Publication of IL32247A publication Critical patent/IL32247A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
IL32247A 1969-05-20 1969-05-20 X-ray diffractometer IL32247A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer
GB2323570A GB1307570A (en) 1969-05-20 1970-05-13 X-ray diffractometer
DE19702023646 DE2023646A1 (en) 1969-05-20 1970-05-14
CH740170A CH519171A (en) 1969-05-20 1970-05-19 X-ray diffractometer
NL7007274A NL7007274A (en) 1969-05-20 1970-05-20
FR7018256A FR2048551A5 (en) 1969-05-20 1970-05-20
US00215486A US3728541A (en) 1969-05-20 1972-01-05 X-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer

Publications (2)

Publication Number Publication Date
IL32247A0 true IL32247A0 (en) 1969-07-30
IL32247A IL32247A (en) 1972-08-30

Family

ID=11044944

Family Applications (1)

Application Number Title Priority Date Filing Date
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer

Country Status (7)

Country Link
US (1) US3728541A (en)
CH (1) CH519171A (en)
DE (1) DE2023646A1 (en)
FR (1) FR2048551A5 (en)
GB (1) GB1307570A (en)
IL (1) IL32247A (en)
NL (1) NL7007274A (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5222553B2 (en) * 1973-02-20 1977-06-17
US4016420A (en) * 1975-05-30 1977-04-05 Dekanat Prirodovedecke Fakulty University Karlovy Precession-type x-ray diffraction camera
DE2534790C2 (en) * 1975-08-04 1986-08-21 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen X-ray goniometer for optionally performing Buerger precession recordings and rotary crystal recordings
DE8423909U1 (en) * 1984-08-11 1985-01-03 Kernforschungsanlage Jülich GmbH, 5170 Jülich EULERWIEGE FOR DEEP TEMPERATURE DIFFRAKTOMETRY
US4723075A (en) * 1985-06-12 1988-02-02 The United States Of America As Represented By The Secretary Of The Air Force Translational mount for large optical elements
GB9919396D0 (en) * 1999-08-18 1999-10-20 Knight Richard A moving yoke
GB0415053D0 (en) * 2004-07-05 2004-08-04 Dage Prec Ind Ltd X-ray manipulator
FI20041538A (en) * 2004-11-29 2006-05-30 Stresstech Oy goniometer
IT1403478B1 (en) * 2010-12-28 2013-10-17 Fond Bruno Kessler X-RAY DIFFRATTOMETER OF THE PERFECT PORTABLE TYPE
JP6685078B2 (en) * 2013-03-15 2020-04-22 プロト マニュファクチャリング リミテッド X-ray diffractometer and method for driving X-ray diffractometer
EP3112815B1 (en) 2015-07-01 2021-01-27 Microtecnica S.r.l. Sensor mount

Also Published As

Publication number Publication date
GB1307570A (en) 1973-02-21
NL7007274A (en) 1970-11-24
IL32247A (en) 1972-08-30
US3728541A (en) 1973-04-17
DE2023646A1 (en) 1970-11-26
FR2048551A5 (en) 1971-03-19
CH519171A (en) 1972-02-15

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