FR2048551A5 - - Google Patents

Info

Publication number
FR2048551A5
FR2048551A5 FR7018256A FR7018256A FR2048551A5 FR 2048551 A5 FR2048551 A5 FR 2048551A5 FR 7018256 A FR7018256 A FR 7018256A FR 7018256 A FR7018256 A FR 7018256A FR 2048551 A5 FR2048551 A5 FR 2048551A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7018256A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yeda Research and Development Co Ltd
Original Assignee
Yeda Research and Development Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yeda Research and Development Co Ltd filed Critical Yeda Research and Development Co Ltd
Application granted granted Critical
Publication of FR2048551A5 publication Critical patent/FR2048551A5/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
FR7018256A 1969-05-20 1970-05-20 Expired FR2048551A5 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer

Publications (1)

Publication Number Publication Date
FR2048551A5 true FR2048551A5 (en) 1971-03-19

Family

ID=11044944

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7018256A Expired FR2048551A5 (en) 1969-05-20 1970-05-20

Country Status (7)

Country Link
US (1) US3728541A (en)
CH (1) CH519171A (en)
DE (1) DE2023646A1 (en)
FR (1) FR2048551A5 (en)
GB (1) GB1307570A (en)
IL (1) IL32247A (en)
NL (1) NL7007274A (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5222553B2 (en) * 1973-02-20 1977-06-17
US4016420A (en) * 1975-05-30 1977-04-05 Dekanat Prirodovedecke Fakulty University Karlovy Precession-type x-ray diffraction camera
DE2534790C2 (en) * 1975-08-04 1986-08-21 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen X-ray goniometer for optionally performing Buerger precession recordings and rotary crystal recordings
DE8423909U1 (en) * 1984-08-11 1985-01-03 Kernforschungsanlage Jülich GmbH, 5170 Jülich EULERWIEGE FOR DEEP TEMPERATURE DIFFRAKTOMETRY
US4723075A (en) * 1985-06-12 1988-02-02 The United States Of America As Represented By The Secretary Of The Air Force Translational mount for large optical elements
GB9919396D0 (en) * 1999-08-18 1999-10-20 Knight Richard A moving yoke
GB0415053D0 (en) * 2004-07-05 2004-08-04 Dage Prec Ind Ltd X-ray manipulator
FI20041538A (en) * 2004-11-29 2006-05-30 Stresstech Oy goniometer
IT1403478B1 (en) * 2010-12-28 2013-10-17 Fond Bruno Kessler X-RAY DIFFRATTOMETER OF THE PERFECT PORTABLE TYPE
JP6685078B2 (en) * 2013-03-15 2020-04-22 プロト マニュファクチャリング リミテッド X-ray diffractometer and method for driving X-ray diffractometer
EP3112815B1 (en) * 2015-07-01 2021-01-27 Microtecnica S.r.l. Sensor mount

Also Published As

Publication number Publication date
US3728541A (en) 1973-04-17
CH519171A (en) 1972-02-15
NL7007274A (en) 1970-11-24
DE2023646A1 (en) 1970-11-26
IL32247A (en) 1972-08-30
GB1307570A (en) 1973-02-21
IL32247A0 (en) 1969-07-30

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Legal Events

Date Code Title Description
ST Notification of lapse