US4074132A
(en)
*
|
1976-08-24 |
1978-02-14 |
North American Philips Corporation |
Automatic single crystal diffractometer
|
DE2750781A1
(en)
*
|
1976-11-26 |
1978-06-01 |
Varian Associates |
DEVICE FOR EXAMINATION OF THE INSIDE OF THE BODY, IN PARTICULAR FLUOROSCOPIC X-RAY SYSTEM
|
US4209706A
(en)
*
|
1976-11-26 |
1980-06-24 |
Varian Associates, Inc. |
Fluoroscopic apparatus mounting fixture
|
JPS5744841A
(en)
*
|
1980-09-01 |
1982-03-13 |
Hitachi Ltd |
Method and apparatus for x-ray diffraction
|
US4495636A
(en)
*
|
1981-01-02 |
1985-01-22 |
Research Corporation |
Multichannel radiography employing scattered radiation
|
US4561062A
(en)
*
|
1983-02-18 |
1985-12-24 |
Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources |
Stress measurement by X-ray diffractometry
|
US4525854A
(en)
*
|
1983-03-22 |
1985-06-25 |
Troxler Electronic Laboratories, Inc. |
Radiation scatter apparatus and method
|
FI67956C
(en)
*
|
1983-09-22 |
1985-06-10 |
Mexpert Oy |
ROO GENDER FACTORY WITHOUT FUNCTIONAL ORGANIZATION FOR MAINTENANCE OF SPA
|
GB2169480B
(en)
*
|
1985-01-03 |
1988-12-07 |
Erno Raumfahrttechnik Gmbh |
A method of non-destructive testing of structural members
|
US4987585A
(en)
*
|
1989-04-04 |
1991-01-22 |
General Electric Company |
X-ray positioner for multi-axis profiling
|
US5148458A
(en)
*
|
1990-01-18 |
1992-09-15 |
Clayton Ruud |
Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
|
JP2904891B2
(en)
*
|
1990-08-31 |
1999-06-14 |
日新製鋼株式会社 |
Online alloying degree measuring device for galvanized steel sheet
|
GB9223592D0
(en)
*
|
1992-11-11 |
1992-12-23 |
Fisons Plc |
X-ray analysis apparatus
|
US5764683B1
(en)
|
1996-02-12 |
2000-11-21 |
American Science & Eng Inc |
Mobile x-ray inspection system for large objects
|
USRE39396E1
(en)
*
|
1996-02-12 |
2006-11-14 |
American Science And Engineering, Inc. |
Mobile x-ray inspection system for large objects
|
US5966423A
(en)
*
|
1997-03-28 |
1999-10-12 |
Philips Electronics North America Corporation |
Arc diffractometer
|
US6721393B1
(en)
*
|
1999-03-31 |
2004-04-13 |
Proto Manufacturing Ltd. |
X-ray diffraction apparatus and method
|
US6693281B2
(en)
*
|
2001-05-02 |
2004-02-17 |
Massachusetts Institute Of Technology |
Fast neutron resonance radiography for elemental mapping
|
US6697453B1
(en)
*
|
2002-02-08 |
2004-02-24 |
Metscan Technologies, Llc |
Portable X-ray diffractometer
|
US20040256565A1
(en)
*
|
2002-11-06 |
2004-12-23 |
William Adams |
X-ray backscatter mobile inspection van
|
US7099434B2
(en)
|
2002-11-06 |
2006-08-29 |
American Science And Engineering, Inc. |
X-ray backscatter mobile inspection van
|
US20090257555A1
(en)
*
|
2002-11-06 |
2009-10-15 |
American Science And Engineering, Inc. |
X-Ray Inspection Trailer
|
US7505556B2
(en)
*
|
2002-11-06 |
2009-03-17 |
American Science And Engineering, Inc. |
X-ray backscatter detection imaging modules
|
US6925146B2
(en)
*
|
2003-03-17 |
2005-08-02 |
Proto Manufacturing Ltd. |
X-ray diffraction system
|
US7711088B2
(en)
*
|
2003-07-22 |
2010-05-04 |
X-Ray Optical Systems, Inc. |
Method and system for X-ray diffraction measurements using an aligned source and detector rotating around a sample surface
|
WO2005031329A1
(en)
*
|
2003-08-04 |
2005-04-07 |
X-Ray Optical Systems, Inc. |
In-situ x-ray diffraction system using sources and detectors at fixed angular positions
|
US20060245548A1
(en)
*
|
2005-04-22 |
2006-11-02 |
Joseph Callerame |
X-ray backscatter inspection with coincident optical beam
|
EP1949139A2
(en)
*
|
2005-10-24 |
2008-07-30 |
American Science & Engineering, Inc. |
X-ray inspection based on scatter detection
|
US7593510B2
(en)
*
|
2007-10-23 |
2009-09-22 |
American Science And Engineering, Inc. |
X-ray imaging with continuously variable zoom and lateral relative displacement of the source
|
PL2459991T3
(en)
*
|
2009-07-29 |
2020-01-31 |
American Science & Engineering, Inc. |
Top-down x-ray inspection trailer
|
US8824632B2
(en)
|
2009-07-29 |
2014-09-02 |
American Science And Engineering, Inc. |
Backscatter X-ray inspection van with top-down imaging
|
US8532823B2
(en)
|
2010-02-12 |
2013-09-10 |
American Science And Engineering, Inc. |
Disruptor guidance system and methods based on scatter imaging
|
JP2014106004A
(en)
*
|
2012-11-22 |
2014-06-09 |
Kowa Dennetsu Keiki:Kk |
X-ray stress measurement device
|
US9613728B2
(en)
|
2013-03-15 |
2017-04-04 |
Proto Manufacturing Ltd. |
X-ray diffraction apparatus and method
|
JP5984024B2
(en)
*
|
2014-11-04 |
2016-09-06 |
パルステック工業株式会社 |
X-ray diffractometer
|
JP6394513B2
(en)
*
|
2015-06-18 |
2018-09-26 |
新東工業株式会社 |
Residual stress measuring device and residual stress measuring method
|
DE102016222644A1
(en)
|
2016-03-14 |
2017-09-28 |
Sms Group Gmbh |
Process for rolling and / or heat treating a metallic product
|
JP6842084B2
(en)
*
|
2017-02-03 |
2021-03-17 |
国立大学法人東北大学 |
Portable 3-axis stress measuring device
|
US11058892B2
(en)
|
2017-05-05 |
2021-07-13 |
Zap Surgical Systems, Inc. |
Revolving radiation collimator
|
CN108401421B
(en)
|
2017-09-06 |
2022-12-20 |
睿谱外科系统股份有限公司 |
Self-shielding integrated control radiosurgery system
|
US11684446B2
(en)
|
2019-02-27 |
2023-06-27 |
Zap Surgical Systems, Inc. |
Device for radiosurgical treatment of uterine fibroids
|