JPS4859887A - - Google Patents
Info
- Publication number
- JPS4859887A JPS4859887A JP46094308A JP9430871A JPS4859887A JP S4859887 A JPS4859887 A JP S4859887A JP 46094308 A JP46094308 A JP 46094308A JP 9430871 A JP9430871 A JP 9430871A JP S4859887 A JPS4859887 A JP S4859887A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9430871A JPS539109B2 (en) | 1971-11-24 | 1971-11-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9430871A JPS539109B2 (en) | 1971-11-24 | 1971-11-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4859887A true JPS4859887A (en) | 1973-08-22 |
| JPS539109B2 JPS539109B2 (en) | 1978-04-03 |
Family
ID=14106635
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9430871A Expired JPS539109B2 (en) | 1971-11-24 | 1971-11-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS539109B2 (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49110393A (en) * | 1973-02-20 | 1974-10-21 | ||
| JPS5028388A (en) * | 1973-07-13 | 1975-03-22 | ||
| JPS5137285A (en) * | 1974-09-25 | 1976-03-29 | Mitsubishi Heavy Ind Ltd | X senoryokusokuteihoho |
| JP2010523959A (en) * | 2007-04-03 | 2010-07-15 | ストレステック，オウ | Goniometer |
| JP2014106004A (en) * | 2012-11-22 | 2014-06-09 | Kowa Dennetsu Keiki:Kk | X-ray stress measurement device |
| JP2014182135A (en) * | 2013-03-15 | 2014-09-29 | Proto Manufacturing Ltd | X-ray diffraction apparatus and x-ray diffraction apparatus driving method |
| JP2018124244A (en) * | 2017-02-03 | 2018-08-09 | 国立大学法人東北大学 | Portable three-axial stress measurement device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2462374A (en) * | 1944-10-04 | 1949-02-22 | Philips Lab Inc | Stress analysis by x-ray diffraction |
-
1971
- 1971-11-24 JP JP9430871A patent/JPS539109B2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2462374A (en) * | 1944-10-04 | 1949-02-22 | Philips Lab Inc | Stress analysis by x-ray diffraction |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49110393A (en) * | 1973-02-20 | 1974-10-21 | ||
| JPS5222553B2 (en) * | 1973-02-20 | 1977-06-17 | ||
| JPS5028388A (en) * | 1973-07-13 | 1975-03-22 | ||
| JPS5137285A (en) * | 1974-09-25 | 1976-03-29 | Mitsubishi Heavy Ind Ltd | X senoryokusokuteihoho |
| JP2010523959A (en) * | 2007-04-03 | 2010-07-15 | ストレステック，オウ | Goniometer |
| JP2014106004A (en) * | 2012-11-22 | 2014-06-09 | Kowa Dennetsu Keiki:Kk | X-ray stress measurement device |
| JP2014182135A (en) * | 2013-03-15 | 2014-09-29 | Proto Manufacturing Ltd | X-ray diffraction apparatus and x-ray diffraction apparatus driving method |
| JP2018124244A (en) * | 2017-02-03 | 2018-08-09 | 国立大学法人東北大学 | Portable three-axial stress measurement device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS539109B2 (en) | 1978-04-03 |