JPS49110393A - - Google Patents

Info

Publication number
JPS49110393A
JPS49110393A JP48019797A JP1979773A JPS49110393A JP S49110393 A JPS49110393 A JP S49110393A JP 48019797 A JP48019797 A JP 48019797A JP 1979773 A JP1979773 A JP 1979773A JP S49110393 A JPS49110393 A JP S49110393A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48019797A
Other languages
Japanese (ja)
Other versions
JPS5222553B2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP48019797A priority Critical patent/JPS5222553B2/ja
Priority to US383611A priority patent/US3868506A/en
Priority to GB3692273A priority patent/GB1390710A/en
Priority to DE19732340028 priority patent/DE2340028A1/en
Publication of JPS49110393A publication Critical patent/JPS49110393A/ja
Publication of JPS5222553B2 publication Critical patent/JPS5222553B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP48019797A 1973-02-20 1973-02-20 Expired JPS5222553B2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP48019797A JPS5222553B2 (en) 1973-02-20 1973-02-20
US383611A US3868506A (en) 1973-02-20 1973-07-30 X-ray diffraction instrument
GB3692273A GB1390710A (en) 1973-02-20 1973-08-03 X-ray diffraction instrument
DE19732340028 DE2340028A1 (en) 1973-02-20 1973-08-08 FACILITY FOR ROENTINE STRUCTURE EXAMINATION

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP48019797A JPS5222553B2 (en) 1973-02-20 1973-02-20

Publications (2)

Publication Number Publication Date
JPS49110393A true JPS49110393A (en) 1974-10-21
JPS5222553B2 JPS5222553B2 (en) 1977-06-17

Family

ID=12009325

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48019797A Expired JPS5222553B2 (en) 1973-02-20 1973-02-20

Country Status (4)

Country Link
US (1) US3868506A (en)
JP (1) JPS5222553B2 (en)
DE (1) DE2340028A1 (en)
GB (1) GB1390710A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61500181A (en) * 1983-09-22 1986-01-30 オウトクンプ、オイ X-ray diffraction method and measuring device for measuring stress
JP2006520902A (en) * 2003-03-17 2006-09-14 プロト マニュファクチャリング リミテッド X-ray diffraction system and method
JP2014106004A (en) * 2012-11-22 2014-06-09 Kowa Dennetsu Keiki:Kk X-ray stress measurement device
JP2014182135A (en) * 2013-03-15 2014-09-29 Proto Manufacturing Ltd X-ray diffraction apparatus and x-ray diffraction apparatus driving method
JP2016090357A (en) * 2014-11-04 2016-05-23 パルステック工業株式会社 X-ray diffraction measurement apparatus
JP2018124244A (en) * 2017-02-03 2018-08-09 国立大学法人東北大学 Portable three-axial stress measurement device

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4074132A (en) * 1976-08-24 1978-02-14 North American Philips Corporation Automatic single crystal diffractometer
US4209706A (en) * 1976-11-26 1980-06-24 Varian Associates, Inc. Fluoroscopic apparatus mounting fixture
DE2750781A1 (en) * 1976-11-26 1978-06-01 Varian Associates DEVICE FOR EXAMINATION OF THE INSIDE OF THE BODY, IN PARTICULAR FLUOROSCOPIC X-RAY SYSTEM
JPS5744841A (en) * 1980-09-01 1982-03-13 Hitachi Ltd Method and apparatus for x-ray diffraction
US4495636A (en) * 1981-01-02 1985-01-22 Research Corporation Multichannel radiography employing scattered radiation
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US4525854A (en) * 1983-03-22 1985-06-25 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
GB2169480B (en) * 1985-01-03 1988-12-07 Erno Raumfahrttechnik Gmbh A method of non-destructive testing of structural members
US4987585A (en) * 1989-04-04 1991-01-22 General Electric Company X-ray positioner for multi-axis profiling
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
JP2904891B2 (en) * 1990-08-31 1999-06-14 日新製鋼株式会社 Online alloying degree measuring device for galvanized steel sheet
GB9223592D0 (en) * 1992-11-11 1992-12-23 Fisons Plc X-ray analysis apparatus
USRE39396E1 (en) * 1996-02-12 2006-11-14 American Science And Engineering, Inc. Mobile x-ray inspection system for large objects
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
US5966423A (en) * 1997-03-28 1999-10-12 Philips Electronics North America Corporation Arc diffractometer
US6721393B1 (en) * 1999-03-31 2004-04-13 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
US6693281B2 (en) * 2001-05-02 2004-02-17 Massachusetts Institute Of Technology Fast neutron resonance radiography for elemental mapping
US6697453B1 (en) * 2002-02-08 2004-02-24 Metscan Technologies, Llc Portable X-ray diffractometer
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
US7505556B2 (en) * 2002-11-06 2009-03-17 American Science And Engineering, Inc. X-ray backscatter detection imaging modules
US7099434B2 (en) 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US7551715B2 (en) * 2005-10-24 2009-06-23 American Science And Engineering, Inc. X-ray inspection based on scatter detection
US20090257555A1 (en) * 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
WO2005010512A1 (en) * 2003-07-22 2005-02-03 X-Ray Optical Systems, Inc. Method and system for x-ray diffraction measurements using an aligned source and detector rotating around a sample surface
CN1864062B (en) * 2003-08-04 2011-11-02 X射线光学系统公司 In-situ x-ray diffraction system using sources and detectors at fixed angular positions
US20060245548A1 (en) * 2005-04-22 2006-11-02 Joseph Callerame X-ray backscatter inspection with coincident optical beam
US7593510B2 (en) * 2007-10-23 2009-09-22 American Science And Engineering, Inc. X-ray imaging with continuously variable zoom and lateral relative displacement of the source
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
CN102483383A (en) * 2009-07-29 2012-05-30 美国科技工程公司 Top-down X-ray inspection trailer
WO2011149566A2 (en) 2010-02-12 2011-12-01 American Science And Engineering, Inc. Disruptor guidance system and methods based on scatter imaging
JP6394513B2 (en) * 2015-06-18 2018-09-26 新東工業株式会社 Residual stress measuring device and residual stress measuring method
DE102016222644A1 (en) 2016-03-14 2017-09-28 Sms Group Gmbh Process for rolling and / or heat treating a metallic product
US11058892B2 (en) 2017-05-05 2021-07-13 Zap Surgical Systems, Inc. Revolving radiation collimator
CN108401421B (en) 2017-09-06 2022-12-20 睿谱外科系统股份有限公司 Self-shielding integrated control radiosurgery system
US11684446B2 (en) 2019-02-27 2023-06-27 Zap Surgical Systems, Inc. Device for radiosurgical treatment of uterine fibroids

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4859887A (en) * 1971-11-24 1973-08-22

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2462374A (en) * 1944-10-04 1949-02-22 Philips Lab Inc Stress analysis by x-ray diffraction
US3322948A (en) * 1964-12-21 1967-05-30 Owens Illinois Inc X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable
JPS4919239B1 (en) * 1969-03-07 1974-05-16
IL32247A (en) * 1969-05-20 1972-08-30 Yeda Res & Dev X-ray diffractometer
US3634686A (en) * 1969-06-17 1972-01-11 Rigaku Denki Co Ltd X-ray stress-measuring apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4859887A (en) * 1971-11-24 1973-08-22

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61500181A (en) * 1983-09-22 1986-01-30 オウトクンプ、オイ X-ray diffraction method and measuring device for measuring stress
JP2006520902A (en) * 2003-03-17 2006-09-14 プロト マニュファクチャリング リミテッド X-ray diffraction system and method
JP2014106004A (en) * 2012-11-22 2014-06-09 Kowa Dennetsu Keiki:Kk X-ray stress measurement device
JP2014182135A (en) * 2013-03-15 2014-09-29 Proto Manufacturing Ltd X-ray diffraction apparatus and x-ray diffraction apparatus driving method
JP2016090357A (en) * 2014-11-04 2016-05-23 パルステック工業株式会社 X-ray diffraction measurement apparatus
JP2018124244A (en) * 2017-02-03 2018-08-09 国立大学法人東北大学 Portable three-axial stress measurement device

Also Published As

Publication number Publication date
JPS5222553B2 (en) 1977-06-17
DE2340028A1 (en) 1974-09-05
US3868506A (en) 1975-02-25
GB1390710A (en) 1975-04-16

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