JPS5222553B2 - - Google Patents

Info

Publication number
JPS5222553B2
JPS5222553B2 JP48019797A JP1979773A JPS5222553B2 JP S5222553 B2 JPS5222553 B2 JP S5222553B2 JP 48019797 A JP48019797 A JP 48019797A JP 1979773 A JP1979773 A JP 1979773A JP S5222553 B2 JPS5222553 B2 JP S5222553B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP48019797A
Other languages
Japanese (ja)
Other versions
JPS49110393A (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP48019797A priority Critical patent/JPS5222553B2/ja
Priority to US383611A priority patent/US3868506A/en
Priority to GB3692273A priority patent/GB1390710A/en
Priority to DE19732340028 priority patent/DE2340028A1/de
Publication of JPS49110393A publication Critical patent/JPS49110393A/ja
Publication of JPS5222553B2 publication Critical patent/JPS5222553B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP48019797A 1973-02-20 1973-02-20 Expired JPS5222553B2 (enrdf_load_stackoverflow)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP48019797A JPS5222553B2 (enrdf_load_stackoverflow) 1973-02-20 1973-02-20
US383611A US3868506A (en) 1973-02-20 1973-07-30 X-ray diffraction instrument
GB3692273A GB1390710A (en) 1973-02-20 1973-08-03 X-ray diffraction instrument
DE19732340028 DE2340028A1 (de) 1973-02-20 1973-08-08 Einrichtung zur roentgenstrukturuntersuchung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP48019797A JPS5222553B2 (enrdf_load_stackoverflow) 1973-02-20 1973-02-20

Publications (2)

Publication Number Publication Date
JPS49110393A JPS49110393A (enrdf_load_stackoverflow) 1974-10-21
JPS5222553B2 true JPS5222553B2 (enrdf_load_stackoverflow) 1977-06-17

Family

ID=12009325

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48019797A Expired JPS5222553B2 (enrdf_load_stackoverflow) 1973-02-20 1973-02-20

Country Status (4)

Country Link
US (1) US3868506A (enrdf_load_stackoverflow)
JP (1) JPS5222553B2 (enrdf_load_stackoverflow)
DE (1) DE2340028A1 (enrdf_load_stackoverflow)
GB (1) GB1390710A (enrdf_load_stackoverflow)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4074132A (en) * 1976-08-24 1978-02-14 North American Philips Corporation Automatic single crystal diffractometer
US4209706A (en) * 1976-11-26 1980-06-24 Varian Associates, Inc. Fluoroscopic apparatus mounting fixture
DE2750781A1 (de) * 1976-11-26 1978-06-01 Varian Associates Vorrichtung zur untersuchung des koerperinneren, insbesondere fluoroskopisches roentgensystem
JPS5744841A (en) * 1980-09-01 1982-03-13 Hitachi Ltd Method and apparatus for x-ray diffraction
US4495636A (en) * 1981-01-02 1985-01-22 Research Corporation Multichannel radiography employing scattered radiation
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US4525854A (en) * 1983-03-22 1985-06-25 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
FI67956C (fi) * 1983-09-22 1985-06-10 Mexpert Oy Pao roentgendiffraktion sig grundande foerfarande och anordning foer maetning av spaenningar
GB2169480B (en) * 1985-01-03 1988-12-07 Erno Raumfahrttechnik Gmbh A method of non-destructive testing of structural members
US4987585A (en) * 1989-04-04 1991-01-22 General Electric Company X-ray positioner for multi-axis profiling
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
JP2904891B2 (ja) * 1990-08-31 1999-06-14 日新製鋼株式会社 合金化亜鉛めつき鋼板のオンライン合金化度測定装置
GB9223592D0 (en) * 1992-11-11 1992-12-23 Fisons Plc X-ray analysis apparatus
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
USRE39396E1 (en) * 1996-02-12 2006-11-14 American Science And Engineering, Inc. Mobile x-ray inspection system for large objects
US5966423A (en) * 1997-03-28 1999-10-12 Philips Electronics North America Corporation Arc diffractometer
US6721393B1 (en) * 1999-03-31 2004-04-13 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
US6693281B2 (en) * 2001-05-02 2004-02-17 Massachusetts Institute Of Technology Fast neutron resonance radiography for elemental mapping
US6697453B1 (en) * 2002-02-08 2004-02-24 Metscan Technologies, Llc Portable X-ray diffractometer
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
US7551715B2 (en) * 2005-10-24 2009-06-23 American Science And Engineering, Inc. X-ray inspection based on scatter detection
US20090257555A1 (en) * 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
US7505556B2 (en) * 2002-11-06 2009-03-17 American Science And Engineering, Inc. X-ray backscatter detection imaging modules
US7099434B2 (en) * 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US6925146B2 (en) * 2003-03-17 2005-08-02 Proto Manufacturing Ltd. X-ray diffraction system
WO2005010512A1 (en) * 2003-07-22 2005-02-03 X-Ray Optical Systems, Inc. Method and system for x-ray diffraction measurements using an aligned source and detector rotating around a sample surface
EP1660874B1 (en) * 2003-08-04 2014-05-07 X-Ray Optical Systems, Inc. In-situ x-ray diffraction system using sources and detectors at fixed angular positions
US20060245548A1 (en) * 2005-04-22 2006-11-02 Joseph Callerame X-ray backscatter inspection with coincident optical beam
US7593510B2 (en) * 2007-10-23 2009-09-22 American Science And Engineering, Inc. X-ray imaging with continuously variable zoom and lateral relative displacement of the source
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
BR112012002166B1 (pt) * 2009-07-29 2019-07-30 American Science And Engineering, Inc. Sistema de inspeção para inspecionar um objeto
WO2011149566A2 (en) 2010-02-12 2011-12-01 American Science And Engineering, Inc. Disruptor guidance system and methods based on scatter imaging
JP2014106004A (ja) * 2012-11-22 2014-06-09 Kowa Dennetsu Keiki:Kk Ｘ線応力測定装置
US9613728B2 (en) 2013-03-15 2017-04-04 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
JP5984024B2 (ja) * 2014-11-04 2016-09-06 パルステック工業株式会社 Ｘ線回折測定装置
JP6394513B2 (ja) * 2015-06-18 2018-09-26 新東工業株式会社 残留応力測定装置及び残留応力測定方法
DE102016222644A1 (de) 2016-03-14 2017-09-28 Sms Group Gmbh Verfahren zum Walzen und/oder zur Wärmebehandlung eines metallischen Produkts
JP6842084B2 (ja) * 2017-02-03 2021-03-17 国立大学法人東北大学 携帯型３軸応力測定装置
US11058892B2 (en) 2017-05-05 2021-07-13 Zap Surgical Systems, Inc. Revolving radiation collimator
CN108401421B (zh) 2017-09-06 2022-12-20 睿谱外科系统股份有限公司 自屏蔽的集成控制放射外科系统
US11684446B2 (en) 2019-02-27 2023-06-27 Zap Surgical Systems, Inc. Device for radiosurgical treatment of uterine fibroids
WO2022165438A1 (en) 2021-02-01 2022-08-04 Zap Surgical Systems, Inc. Inverse planning device and methods for radiation treatment

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2462374A (en) * 1944-10-04 1949-02-22 Philips Lab Inc Stress analysis by x-ray diffraction
US3322948A (en) * 1964-12-21 1967-05-30 Owens Illinois Inc X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable
JPS4919239B1 (enrdf_load_stackoverflow) * 1969-03-07 1974-05-16
IL32247A (en) * 1969-05-20 1972-08-30 Yeda Res & Dev X-ray diffractometer
US3634686A (en) * 1969-06-17 1972-01-11 Rigaku Denki Co Ltd X-ray stress-measuring apparatus
JPS539109B2 (enrdf_load_stackoverflow) * 1971-11-24 1978-04-03

Also Published As

Publication number Publication date
US3868506A (en) 1975-02-25
JPS49110393A (enrdf_load_stackoverflow) 1974-10-21
GB1390710A (en) 1975-04-16
DE2340028A1 (de) 1974-09-05

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