IL32247A - X-ray diffractometer - Google Patents

X-ray diffractometer

Info

Publication number
IL32247A
IL32247A IL32247A IL3224769A IL32247A IL 32247 A IL32247 A IL 32247A IL 32247 A IL32247 A IL 32247A IL 3224769 A IL3224769 A IL 3224769A IL 32247 A IL32247 A IL 32247A
Authority
IL
Israel
Prior art keywords
detector
axis
drum
crystal
ray
Prior art date
Application number
IL32247A
Other languages
English (en)
Other versions
IL32247A0 (en
Original Assignee
Yeda Res & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yeda Res & Dev filed Critical Yeda Res & Dev
Priority to IL32247A priority Critical patent/IL32247A/en
Publication of IL32247A0 publication Critical patent/IL32247A0/xx
Priority to GB2323570A priority patent/GB1307570A/en
Priority to DE19702023646 priority patent/DE2023646A1/de
Priority to CH740170A priority patent/CH519171A/de
Priority to NL7007274A priority patent/NL7007274A/xx
Priority to FR7018256A priority patent/FR2048551A5/fr
Priority to US00215486A priority patent/US3728541A/en
Publication of IL32247A publication Critical patent/IL32247A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
IL32247A 1969-05-20 1969-05-20 X-ray diffractometer IL32247A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer
GB2323570A GB1307570A (en) 1969-05-20 1970-05-13 X-ray diffractometer
DE19702023646 DE2023646A1 (cs) 1969-05-20 1970-05-14
CH740170A CH519171A (de) 1969-05-20 1970-05-19 Röntgendiffraktometer
NL7007274A NL7007274A (cs) 1969-05-20 1970-05-20
FR7018256A FR2048551A5 (cs) 1969-05-20 1970-05-20
US00215486A US3728541A (en) 1969-05-20 1972-01-05 X-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer

Publications (2)

Publication Number Publication Date
IL32247A0 IL32247A0 (en) 1969-07-30
IL32247A true IL32247A (en) 1972-08-30

Family

ID=11044944

Family Applications (1)

Application Number Title Priority Date Filing Date
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer

Country Status (7)

Country Link
US (1) US3728541A (cs)
CH (1) CH519171A (cs)
DE (1) DE2023646A1 (cs)
FR (1) FR2048551A5 (cs)
GB (1) GB1307570A (cs)
IL (1) IL32247A (cs)
NL (1) NL7007274A (cs)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5222553B2 (cs) * 1973-02-20 1977-06-17
US4016420A (en) * 1975-05-30 1977-04-05 Dekanat Prirodovedecke Fakulty University Karlovy Precession-type x-ray diffraction camera
DE2534790C2 (de) * 1975-08-04 1986-08-21 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Röntgengoniometer zum wahlweisen Durchführen von Buerger-Präzessionsaufnahmen und Drehkristallaufnahmen
DE8423909U1 (de) * 1984-08-11 1985-01-03 Kernforschungsanlage Jülich GmbH, 5170 Jülich Eulerwiege fuer tieftemperatur-diffraktometrie
US4723075A (en) * 1985-06-12 1988-02-02 The United States Of America As Represented By The Secretary Of The Air Force Translational mount for large optical elements
GB9919396D0 (en) * 1999-08-18 1999-10-20 Knight Richard A moving yoke
GB0415053D0 (en) * 2004-07-05 2004-08-04 Dage Prec Ind Ltd X-ray manipulator
FI20041538L (fi) * 2004-11-29 2006-05-30 Stresstech Oy Goniometri
IT1403478B1 (it) * 2010-12-28 2013-10-17 Fond Bruno Kessler Diffrattometro a raggi x del tipo portatile perfezionato
JP6685078B2 (ja) * 2013-03-15 2020-04-22 プロト マニュファクチャリング リミテッド Ｘ線回折装置およびｘ線回折装置駆動方法
EP3112815B1 (en) 2015-07-01 2021-01-27 Microtecnica S.r.l. Sensor mount

Also Published As

Publication number Publication date
US3728541A (en) 1973-04-17
DE2023646A1 (cs) 1970-11-26
NL7007274A (cs) 1970-11-24
FR2048551A5 (cs) 1971-03-19
GB1307570A (en) 1973-02-21
IL32247A0 (en) 1969-07-30
CH519171A (de) 1972-02-15

Similar Documents

Publication Publication Date Title
IL32247A (en) X-ray diffractometer
US4364122A (en) X-Ray diffraction method and apparatus
US3105901A (en) X-ray diffraction device with 360 rotatable specimen holder
US4199678A (en) Asymmetric texture sensitive X-ray powder diffractometer
US2805341A (en) Diffractometer
US3345613A (en) X-ray diffractometer control system
US2928945A (en) Diffractometers
US3649831A (en) Device for determining the crystallographic directions in single crystals by x-rays
JPS59153153A (ja) Ｘ線分析装置
US3073952A (en) X-ray diffraction apparatus
Ladell et al. Automatic single crystal diffractometry. I. The kinematic problem
US3816747A (en) Method and apparatus for measuring lattice parameter
US2829262A (en) X-ray apparatus
US3427451A (en) X-ray diffractometer having several detectors movable on a goniometer circle
JP2000258366A (ja) 微小部ｘ線回折装置
US3714426A (en) Method of x-ray analysis of crystal structure an x-ray goniometer for carrying out said method
Wooster An X-ray Goniometer for the Study of Preferred Orientation in Polycrystalline Aggregates
JP2567840B2 (ja) 結晶方位決定装置
Smirnov et al. A device for precise measurements of radiation energy from the (n, γ) reaction
JPH01214747A (ja) Ｘ線回折装置
JPS62223655A (ja) 格子定数測定装置
SU522458A1 (ru) Рентгеновский трехкристальный спектрометр
US3626185A (en) X-ray powder camera having a semicylindrical film holder and means to simultaneously rotate a specimen about two mutually perpendicular axes
JPH05296946A (ja) Ｘ線回折装置
Weissman et al. Part II-Description of X-Ray Double-Crystal Diffractometer Combining X-Ray Microscopy and Diffraction Analysis