IL310429A - Focusing device having an image plane extending parallel or congruent to a target plane - Google Patents
Focusing device having an image plane extending parallel or congruent to a target planeInfo
- Publication number
- IL310429A IL310429A IL310429A IL31042924A IL310429A IL 310429 A IL310429 A IL 310429A IL 310429 A IL310429 A IL 310429A IL 31042924 A IL31042924 A IL 31042924A IL 310429 A IL310429 A IL 310429A
- Authority
- IL
- Israel
- Prior art keywords
- focusing
- laser beam
- respect
- target material
- optical axis
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/16—Beam splitting or combining systems used as aids for focusing
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0095—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with ultraviolet radiation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/1006—Beam splitting or combining systems for splitting or combining different wavelengths
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/008—Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation
- H05G2/0082—Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation the energy-carrying beam being a laser beam
- H05G2/0086—Optical arrangements for conveying the laser beam to the plasma generation location
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/009—Auxiliary arrangements not involved in the plasma generation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/005—Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP21188167.7A EP4125165B1 (de) | 2021-07-28 | 2021-07-28 | Fokussiereinrichtung mit einer parallel oder deckungsgleich zu einer targetebene verlaufenden bildebene |
| PCT/EP2022/071088 WO2023006821A1 (de) | 2021-07-28 | 2022-07-27 | Fokussiereinrichtung mit einer parallel oder deckungsgleich zu einer targetebene verlaufenden bildebene |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IL310429A true IL310429A (en) | 2024-03-01 |
Family
ID=77103962
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IL310429A IL310429A (en) | 2021-07-28 | 2022-07-27 | Focusing device having an image plane extending parallel or congruent to a target plane |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20240168306A1 (https=) |
| EP (1) | EP4125165B1 (https=) |
| JP (1) | JP2024530617A (https=) |
| KR (1) | KR20240037266A (https=) |
| CN (1) | CN117769793A (https=) |
| IL (1) | IL310429A (https=) |
| TW (1) | TWI845996B (https=) |
| WO (1) | WO2023006821A1 (https=) |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5458243B2 (ja) * | 2007-10-25 | 2014-04-02 | 国立大学法人大阪大学 | Euv光の放射方法、および前記euv光を用いた感応基板の露光方法 |
| US9265136B2 (en) * | 2010-02-19 | 2016-02-16 | Gigaphoton Inc. | System and method for generating extreme ultraviolet light |
| JP5758662B2 (ja) * | 2011-03-23 | 2015-08-05 | 国立大学法人大阪大学 | 極端紫外光生成装置及び極端紫外光生成方法 |
| WO2013161760A1 (ja) * | 2012-04-27 | 2013-10-31 | ギガフォトン株式会社 | レーザシステム及び極端紫外光生成システム |
| WO2015036024A1 (de) | 2013-09-12 | 2015-03-19 | Trumpf Laser- Und Systemtechnik Gmbh | Strahlführungseinrichtung und euv-strahlungserzeugungsvorrichtung mit einer überlagerungseinrichtung |
| WO2015036025A1 (de) | 2013-09-12 | 2015-03-19 | Trumpf Laser- Und Systemtechnik Gmbh | Strahlführungseinrichtung und euv-strahlungserzeugungsvorrichtung mit einer überlagerungseinrichtung |
| US9360600B2 (en) * | 2013-11-20 | 2016-06-07 | Asml Netherlands B.V. | System and method for correcting the focus of a laser beam |
| JP6556250B2 (ja) * | 2015-11-06 | 2019-08-07 | ギガフォトン株式会社 | 極端紫外光生成装置 |
| WO2017137074A1 (de) * | 2016-02-10 | 2017-08-17 | Trumpf Lasersystems For Semiconductor Manufacturing Gmbh | Treiberlaseranordnung mit einem optischen isolator und euv-strahlungserzeugungsvorrichtung damit |
| CN111955058B (zh) * | 2018-04-03 | 2025-06-17 | Asml荷兰有限公司 | 光束的空间调制 |
-
2021
- 2021-07-28 EP EP21188167.7A patent/EP4125165B1/de active Active
-
2022
- 2022-07-27 TW TW111128178A patent/TWI845996B/zh active
- 2022-07-27 IL IL310429A patent/IL310429A/en unknown
- 2022-07-27 CN CN202280052584.XA patent/CN117769793A/zh active Pending
- 2022-07-27 KR KR1020247004446A patent/KR20240037266A/ko active Pending
- 2022-07-27 WO PCT/EP2022/071088 patent/WO2023006821A1/de not_active Ceased
- 2022-07-27 JP JP2024505253A patent/JP2024530617A/ja active Pending
-
2024
- 2024-01-24 US US18/420,916 patent/US20240168306A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| TWI845996B (zh) | 2024-06-21 |
| TW202321756A (zh) | 2023-06-01 |
| EP4125165A1 (de) | 2023-02-01 |
| KR20240037266A (ko) | 2024-03-21 |
| US20240168306A1 (en) | 2024-05-23 |
| JP2024530617A (ja) | 2024-08-23 |
| EP4125165B1 (de) | 2023-11-01 |
| CN117769793A (zh) | 2024-03-26 |
| WO2023006821A1 (de) | 2023-02-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6127090B2 (ja) | 走査装置 | |
| JP5525136B2 (ja) | シート光を発生するための光学装置 | |
| US9874545B2 (en) | Photoacoustic microscope | |
| JP4762593B2 (ja) | 外部レーザ導入装置 | |
| JP2017000832A (ja) | 眼科用機器 | |
| JP2009069692A (ja) | レーザー走査型顕微鏡 | |
| KR20240027641A (ko) | 마이크로리소그라픽 마스크의 특징을 구하기 위한 장치 및 방법 | |
| JP2009510535A (ja) | Fシータ対物レンズおよびfシータ対物レンズを備えたスキャナ装置 | |
| CN104483816B (zh) | 一种用于极紫外光刻的类临界照明系统 | |
| IL310429A (en) | Focusing device having an image plane extending parallel or congruent to a target plane | |
| TWI627509B (zh) | 用於投影曝光設備以產生合用的輸出光束的euv光源 | |
| US6888680B2 (en) | Optical arrangement for obtaining information from a sample or an observed object | |
| JP2022521567A5 (https=) | ||
| CN117728281A (zh) | 一种激光诱发充电控制装置、方法及带电粒子束检测系统 | |
| US11968767B2 (en) | EUV light source with a separation device | |
| CN112439992A (zh) | 一种焊接激光头同轴视觉镜组及焊接激光同轴系统 | |
| JP4723842B2 (ja) | 走査型光学顕微鏡 | |
| KR102677920B1 (ko) | 현미경 시스템 | |
| TWI582407B (zh) | 粒子三維定位與追蹤裝置及其方法 | |
| US20260046995A1 (en) | Euv light source having a combination device | |
| CN117309839A (zh) | 拉曼红外复合显微装置 | |
| CN118276294A (zh) | 一种单物镜光片荧光投影分辨率补偿成像系统 | |
| JPH06214185A (ja) | 光ビーム走査装置 |