IL127063A0 - Method of compressing and expanding data pattern and data pattern compressing and expanding apparatus - Google Patents

Method of compressing and expanding data pattern and data pattern compressing and expanding apparatus

Info

Publication number
IL127063A0
IL127063A0 IL12706398A IL12706398A IL127063A0 IL 127063 A0 IL127063 A0 IL 127063A0 IL 12706398 A IL12706398 A IL 12706398A IL 12706398 A IL12706398 A IL 12706398A IL 127063 A0 IL127063 A0 IL 127063A0
Authority
IL
Israel
Prior art keywords
compressing
data pattern
expanding
expanding apparatus
pattern
Prior art date
Application number
IL12706398A
Other languages
English (en)
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of IL127063A0 publication Critical patent/IL127063A0/xx

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • H03M7/30—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318335—Test pattern compression or decompression
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T9/00—Image coding
    • G06T9/005—Statistical coding, e.g. Huffman, run length coding
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • H03M7/30—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction
    • H03M7/3084—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction using adaptive string matching, e.g. the Lempel-Ziv method
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • H03M7/30—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction
    • H03M7/3084—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction using adaptive string matching, e.g. the Lempel-Ziv method
    • H03M7/3088—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction using adaptive string matching, e.g. the Lempel-Ziv method employing the use of a dictionary, e.g. LZ78
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • H03M7/30—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction
    • H03M7/40—Conversion to or from variable length codes, e.g. Shannon-Fano code, Huffman code, Morse code
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • H03M7/30—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction
    • H03M7/46—Conversion to or from run-length codes, i.e. by representing the number of consecutive digits, or groups of digits, of the same kind by a code word and a digit indicative of that kind

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Multimedia (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)
  • Tests Of Electronic Circuits (AREA)
IL12706398A 1997-03-24 1998-03-24 Method of compressing and expanding data pattern and data pattern compressing and expanding apparatus IL127063A0 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP7029397 1997-03-24
JP9022597 1997-03-24
PCT/JP1998/001273 WO1998043359A1 (fr) 1997-03-24 1998-03-24 Procede et dispositif de compression et de decompression de configuration binaire

Publications (1)

Publication Number Publication Date
IL127063A0 true IL127063A0 (en) 1999-09-22

Family

ID=26411459

Family Applications (1)

Application Number Title Priority Date Filing Date
IL12706398A IL127063A0 (en) 1997-03-24 1998-03-24 Method of compressing and expanding data pattern and data pattern compressing and expanding apparatus

Country Status (6)

Country Link
EP (1) EP0909037A4 (ja)
JP (1) JP3377217B2 (ja)
KR (1) KR100341211B1 (ja)
IL (1) IL127063A0 (ja)
TW (1) TW358165B (ja)
WO (1) WO1998043359A1 (ja)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000040750A (ko) * 1998-12-19 2000-07-05 오노 히로시게 반도체 테스트 시스템용 패턴 데이타 압축 및 압축 해제
US7064688B2 (en) * 2001-07-09 2006-06-20 Good Technology, Inc. System and method for compressing data on a bandwidth-limited network
US20030009595A1 (en) * 2001-07-09 2003-01-09 Roger Collins System and method for compressing data using field-based code word generation
US7962622B2 (en) 2001-08-07 2011-06-14 Motorola Mobility, Inc. System and method for providing provisioning and upgrade services for a wireless device
US7243163B1 (en) 2001-08-07 2007-07-10 Good Technology, Inc. System and method for full wireless synchronization of a data processing apparatus with a messaging system
US7743119B2 (en) 2001-08-07 2010-06-22 Motorola, Inc. System and method for mapping identification codes
US7155483B1 (en) 2001-08-07 2006-12-26 Good Technology, Inc. Apparatus and method for conserving bandwidth by batch processing data transactions
US7039106B2 (en) 2002-03-25 2006-05-02 Intel Corporation Processing digital data prior to compression
US9813514B2 (en) 2002-06-12 2017-11-07 Good Technology Holdings Limited Information repository system including a wireless device and related method
US8516034B1 (en) 2002-07-08 2013-08-20 Good Technology Software, Inc System and method for modifying application behavior based on network bandwidth
JP4133172B2 (ja) 2002-09-27 2008-08-13 シャープ株式会社 論理回路テスト装置
DE602004013744D1 (de) 2003-03-14 2008-06-26 Advantest Corp Testvorrichtung, programm für eine testvorrichtung und verfahren zur steuerung einer testvorrichtung
US7404109B2 (en) * 2003-06-12 2008-07-22 Verigy (Singapore) Pte. Ltd. Systems and methods for adaptively compressing test data
JP4719068B2 (ja) * 2005-04-21 2011-07-06 パナソニック株式会社 集積回路検査装置
US7516381B2 (en) 2005-04-21 2009-04-07 Panasonic Corporation Integrated circuit test system
US7620392B1 (en) 2006-02-27 2009-11-17 Good Technology, Inc. Method and system for distributing and updating software in wireless devices
EP1978527B1 (en) * 2007-02-16 2010-10-13 Advantest Corporation Tester
JP5029172B2 (ja) * 2007-07-02 2012-09-19 横河電機株式会社 半導体試験装置
JP2012141860A (ja) * 2011-01-05 2012-07-26 Shuji Itai ソーターソーター（別名：ア・ソータロー）
CN105530013B (zh) * 2015-12-03 2018-08-31 四川中光防雷科技股份有限公司 一种波形数据压缩方法与系统
JP7493001B2 (ja) 2022-09-13 2024-05-30 株式会社日立製作所 圧縮伸長装置、ストレージシステム、および圧縮伸長方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3787669A (en) * 1972-06-30 1974-01-22 Ibm Test pattern generator
JPS613569A (ja) * 1984-06-18 1986-01-09 Nippon Denki Kanji Syst Kk ランレングス符号化方法
JPS61107818A (ja) * 1984-10-30 1986-05-26 Nec Corp エントロピ−符号化方式とその装置
JPH0789618B2 (ja) * 1985-10-07 1995-09-27 キヤノン株式会社 画像符号化方法
JPH0789621B2 (ja) * 1985-10-25 1995-09-27 キヤノン株式会社 符号化装置
JPH0789619B2 (ja) * 1985-10-25 1995-09-27 キヤノン株式会社 符号化装置
JPH07105730B2 (ja) * 1985-11-19 1995-11-13 キヤノン株式会社 符号化装置
JPH0193217A (ja) * 1987-10-02 1989-04-12 Matsushita Electric Ind Co Ltd データ圧縮伸長装置
JPH0234038A (ja) * 1988-07-23 1990-02-05 Hitachi Ltd データ圧縮装置
US5467087A (en) * 1992-12-18 1995-11-14 Apple Computer, Inc. High speed lossless data compression system
CA2127192C (en) * 1993-07-01 1999-09-07 Alan Brent Hussey Shaping ate bursts, particularly in gallium arsenide
US5535311A (en) * 1994-07-28 1996-07-09 Hewlett-Packard Company Method and apparatus for image-type determination to enable choice of an optimum data compression procedure

Also Published As

Publication number Publication date
KR100341211B1 (ko) 2002-08-22
JP3377217B2 (ja) 2003-02-17
EP0909037A1 (en) 1999-04-14
TW358165B (en) 1999-05-11
WO1998043359A1 (fr) 1998-10-01
KR20000010935A (ko) 2000-02-25
EP0909037A4 (en) 2000-11-22

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