GB9817395D0 - Polysillicon etching method and etching apparatus - Google Patents

Polysillicon etching method and etching apparatus

Info

Publication number
GB9817395D0
GB9817395D0 GBGB9817395.8A GB9817395A GB9817395D0 GB 9817395 D0 GB9817395 D0 GB 9817395D0 GB 9817395 A GB9817395 A GB 9817395A GB 9817395 D0 GB9817395 D0 GB 9817395D0
Authority
GB
United Kingdom
Prior art keywords
etching
polysillicon
etching method
etching apparatus
polysillicon etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB9817395.8A
Other versions
GB2332302A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of GB9817395D0 publication Critical patent/GB9817395D0/en
Publication of GB2332302A publication Critical patent/GB2332302A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321After treatment
    • H01L21/3213Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
    • H01L21/32133Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
    • H01L21/32135Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only
    • H01L21/32136Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas
    • H01L21/32137Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas of silicon-containing layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065Plasma etching; Reactive-ion etching

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Plasma & Fusion (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Drying Of Semiconductors (AREA)
  • Weting (AREA)
GB9817395A 1997-12-05 1998-08-10 Etching polysilicon films Withdrawn GB2332302A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019970066289A KR100271763B1 (en) 1997-12-05 1997-12-05 Apparatus and method for etching polysilicon layer

Publications (2)

Publication Number Publication Date
GB9817395D0 true GB9817395D0 (en) 1998-10-07
GB2332302A GB2332302A (en) 1999-06-16

Family

ID=19526550

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9817395A Withdrawn GB2332302A (en) 1997-12-05 1998-08-10 Etching polysilicon films

Country Status (5)

Country Link
JP (1) JPH11176817A (en)
KR (1) KR100271763B1 (en)
CN (1) CN1218986A (en)
DE (1) DE19840437A1 (en)
GB (1) GB2332302A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4689841B2 (en) * 1999-03-04 2011-05-25 サーフィス テクノロジー システムズ ピーエルシー Chlorine trifluoride gas generator
DE10214620B4 (en) * 2002-04-03 2010-02-04 Robert Bosch Gmbh Process for the plasmaless gas phase etching of a silicon wafer and device for its implementation
DE10229037A1 (en) * 2002-06-28 2004-01-29 Robert Bosch Gmbh Device and method for producing chlorine trifluoride and plant for etching semiconductor substrates with this device
DE102016200506B4 (en) 2016-01-17 2024-05-02 Robert Bosch Gmbh Etching device and etching process

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3511727A (en) * 1967-05-08 1970-05-12 Motorola Inc Vapor phase etching and polishing of semiconductors
JPS62250642A (en) * 1986-04-24 1987-10-31 Victor Co Of Japan Ltd Reactive ion etching method
US4731158A (en) * 1986-09-12 1988-03-15 International Business Machines Corporation High rate laser etching technique
JPH0793291B2 (en) * 1986-12-19 1995-10-09 アプライド マテリアルズインコーポレーテッド Bromine and iodine etching method for silicon and silicide

Also Published As

Publication number Publication date
KR19990047772A (en) 1999-07-05
KR100271763B1 (en) 2001-02-01
JPH11176817A (en) 1999-07-02
GB2332302A (en) 1999-06-16
CN1218986A (en) 1999-06-09
DE19840437A1 (en) 1999-06-17

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)