HRP20100286B1 - Detektor svjetla ili radijacije i metoda za njegovu proizvodnju - Google Patents

Detektor svjetla ili radijacije i metoda za njegovu proizvodnju

Info

Publication number
HRP20100286B1
HRP20100286B1 HRP20100286AA HRP20100286A HRP20100286B1 HR P20100286 B1 HRP20100286 B1 HR P20100286B1 HR P20100286A A HRP20100286A A HR P20100286AA HR P20100286 A HRP20100286 A HR P20100286A HR P20100286 B1 HRP20100286 B1 HR P20100286B1
Authority
HR
Croatia
Prior art keywords
light
radiation detector
manufacturing
same
molding structure
Prior art date
Application number
HRP20100286AA
Other languages
English (en)
Inventor
Toshinori Yoshimuta
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Publication of HRP20100286A2 publication Critical patent/HRP20100286A2/hr
Publication of HRP20100286B1 publication Critical patent/HRP20100286B1/hr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14618—Containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14665—Imagers using a photoconductor layer
    • H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/10—Methods of surface bonding and/or assembly therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

U detektoru svjetla ili radijacije iz ovog izuma, konstrukcija kalupa, prvi dio i drugi dio su napravljeni tako da konstrukcija kalupa za zaštitu sloja za pretvaranje i elektrode za primjenu voltaže imaju otpornost višu od prvog dijela sastavljenog od planarnog vodljivog bafera koji je liminiran na upadnu površinu (svjetla ili radijacije) konstrukcije kalupa, a da prvi dio spomenut ranije ima otpornost višu od drugog dijela sastavljenog od planarnog vodljivog dijela koji je laminiran na upadnu površinu stranice prvog dijela. Posljedično, pojava buke od statičkog elektriciteta može se suzbiti.
HRP20100286AA 2007-10-23 2010-05-21 Detektor svjetla ili radijacije i metoda za njegovu proizvodnju HRP20100286B1 (hr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/070609 WO2009054042A1 (ja) 2007-10-23 2007-10-23 光または放射線検出器およびそれを製造する方法

Publications (2)

Publication Number Publication Date
HRP20100286A2 HRP20100286A2 (hr) 2010-09-30
HRP20100286B1 true HRP20100286B1 (hr) 2013-03-31

Family

ID=40579152

Family Applications (1)

Application Number Title Priority Date Filing Date
HRP20100286AA HRP20100286B1 (hr) 2007-10-23 2010-05-21 Detektor svjetla ili radijacije i metoda za njegovu proizvodnju

Country Status (7)

Country Link
US (1) US8357909B2 (hr)
EP (1) EP2209021B1 (hr)
JP (1) JP4569712B2 (hr)
CN (1) CN101688919B (hr)
AT (1) ATE537467T1 (hr)
HR (1) HRP20100286B1 (hr)
WO (1) WO2009054042A1 (hr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010070759A1 (ja) * 2008-12-18 2010-06-24 株式会社島津製作所 光マトリックスデバイスの製造方法
JP5694892B2 (ja) * 2011-10-19 2015-04-01 富士フイルム株式会社 放射線画像撮影装置
JP6377101B2 (ja) * 2016-07-07 2018-08-22 キヤノン株式会社 放射線検出装置及び放射線検出システム
US10481280B2 (en) 2016-07-07 2019-11-19 Canon Kabushiki Kaisha Radiation detecting apparatus, radiation detecting system, and manufacturing method for radiation detecting apparatus
JP7292868B2 (ja) * 2018-12-18 2023-06-19 キヤノン株式会社 検出器

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6885005B2 (en) * 2001-10-22 2005-04-26 Shimadzu Corporation Radiation detector
JP2005268271A (ja) * 2004-03-16 2005-09-29 Shimadzu Corp 光または放射線用二次元検出器
JP2007139604A (ja) * 2005-11-18 2007-06-07 Konica Minolta Medical & Graphic Inc 放射線用シンチレータプレート

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3737343B2 (ja) * 1999-09-08 2006-01-18 シャープ株式会社 二次元画像検出器
US6681992B2 (en) * 2000-08-03 2004-01-27 Tomomi Iihama Image reading apparatus
JP3678162B2 (ja) * 2001-04-12 2005-08-03 株式会社島津製作所 放射線検出装置
JP4280024B2 (ja) * 2001-04-23 2009-06-17 株式会社東芝 Ｘ線平面検出器
JP4211435B2 (ja) * 2002-08-30 2009-01-21 株式会社島津製作所 放射線検出器
JP3861829B2 (ja) 2003-03-05 2006-12-27 ブラザー工業株式会社 記録媒体カセット
US20050184244A1 (en) * 2004-02-25 2005-08-25 Shimadzu Corporation Radiation detector and light or radiation detector
JP2005241334A (ja) 2004-02-25 2005-09-08 Shimadzu Corp 放射線検出装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6885005B2 (en) * 2001-10-22 2005-04-26 Shimadzu Corporation Radiation detector
JP2005268271A (ja) * 2004-03-16 2005-09-29 Shimadzu Corp 光または放射線用二次元検出器
JP2007139604A (ja) * 2005-11-18 2007-06-07 Konica Minolta Medical & Graphic Inc 放射線用シンチレータプレート

Also Published As

Publication number Publication date
JP4569712B2 (ja) 2010-10-27
WO2009054042A1 (ja) 2009-04-30
HRP20100286A2 (hr) 2010-09-30
CN101688919A (zh) 2010-03-31
US20100243893A1 (en) 2010-09-30
CN101688919B (zh) 2012-10-17
US8357909B2 (en) 2013-01-22
EP2209021B1 (en) 2011-12-14
ATE537467T1 (de) 2011-12-15
EP2209021A1 (en) 2010-07-21
JPWO2009054042A1 (ja) 2011-03-03
EP2209021A4 (en) 2011-02-16

Similar Documents

Publication Publication Date Title
HRP20100286B1 (hr) Detektor svjetla ili radijacije i metoda za njegovu proizvodnju
EA201290855A1 (ru) Оконное стекло с электрическим соединительным элементом
EA201390096A1 (ru) Стекло с электрическим присоединительным элементом
MX2010009789A (es) Articulo reflectante.
EA201170580A1 (ru) Стеклопакет, включающий по меньшей мере одно противоотражательное покрытие, и использование противоотражательного покрытия в стеклопакете
EP3540776A3 (en) Semiconductor device, method of manufacturing semiconductor device, and electronic apparatus
EA201491638A1 (ru) Стекло, снабженное покрытием, отражающим тепловое излучение
WO2007018934A3 (en) Compositionally-graded photovoltaic device and fabrication method, and related articles
WO2009069551A1 (ja) 光電変換素子用電極基板
WO2011066035A3 (en) Silicon-on-insulator (soi) structure configured for reduced harmonics, design structure and method
TW200639441A (en) PDP filter and manufacturing method thereof
IT1399315B1 (it) Procedimento per disporre su una qualsiasi superficie verniciabile, dei circuiti conduttori e/o generatori di cariche elettriche e circuiti realizzati con tale procedimento.
WO2012115392A3 (ko) 양면 구조를 가지는 태양전지 및 이의 제조방법
EP2312642A4 (en) TRANSPARENT CONDUCTIVE FILM SUBSTRATE AND SOLAR CELL USING THE SUBSTRATE
WO2011149850A3 (en) Photovoltaic device and method of making same
KR101305839B1 (ko) 플렉서블 태양광 발전장치 및 이의 제조방법
WO2011151338A3 (fr) Composant photovoltaïque pour application sous flux solaire concentré
WO2008120498A1 (ja) 光電変換装置及びその製造方法
TW200743179A (en) Semiconductor structure
BR112014017495A2 (pt) método para formar uma célula fotovoltaica e célula fotovoltaica
WO2008148524A3 (en) Solar module with an electrical connector element
ATE499398T1 (de) Regioreguläre polyselenophene
EP2437313A3 (en) Photovoltaic devices
FR2961953B1 (fr) Cellule comprenant un matériau photovoltaïque a base de cadmium
TW200707766A (en) Thin film structure and manufacturing method therefor

Legal Events

Date Code Title Description
A1OB Publication of a patent application
AIPI Request for the grant of a patent on the basis of a substantive examination of a patent application
B1PR Patent granted
ODRP Renewal fee for the maintenance of a patent

Payment date: 20150904

Year of fee payment: 9

PBON Lapse due to non-payment of renewal fee

Effective date: 20161023