HK76292A - Integrated semiconductor memory - Google Patents

Integrated semiconductor memory

Info

Publication number
HK76292A
HK76292A HK762/92A HK76292A HK76292A HK 76292 A HK76292 A HK 76292A HK 762/92 A HK762/92 A HK 762/92A HK 76292 A HK76292 A HK 76292A HK 76292 A HK76292 A HK 76292A
Authority
HK
Hong Kong
Prior art keywords
data
separators
memory
nxm
response
Prior art date
Application number
HK762/92A
Other languages
English (en)
Inventor
Kurt Dr Prof Hoffmann
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of HK76292A publication Critical patent/HK76292A/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Non-Volatile Memory (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
HK762/92A 1984-12-28 1992-10-01 Integrated semiconductor memory HK76292A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3447761 1984-12-28

Publications (1)

Publication Number Publication Date
HK76292A true HK76292A (en) 1992-10-09

Family

ID=6254081

Family Applications (1)

Application Number Title Priority Date Filing Date
HK762/92A HK76292A (en) 1984-12-28 1992-10-01 Integrated semiconductor memory

Country Status (6)

Country Link
US (1) US4742489A (xx)
EP (1) EP0186051B1 (xx)
JP (1) JPS61158100A (xx)
AT (1) ATE65339T1 (xx)
DE (1) DE3583493D1 (xx)
HK (1) HK76292A (xx)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4868823B1 (en) * 1984-08-31 1999-07-06 Texas Instruments Inc High speed concurrent testing of dynamic read/write memory array
EP0193210A3 (en) * 1985-02-28 1988-12-14 Nec Corporation Semiconductor memory device with a built-in test circuit
JPS62170094A (ja) * 1986-01-21 1987-07-27 Mitsubishi Electric Corp 半導体記憶回路
DE3634352A1 (de) * 1986-10-08 1988-04-21 Siemens Ag Verfahren und anordnung zum testen von mega-bit-speicherbausteinen mit beliebigen testmustern im multi-bit-testmodus
JPS63244400A (ja) * 1987-03-16 1988-10-11 シーメンス・アクチエンゲゼルシヤフト メモリセルの検査回路装置および方法
US4980850A (en) * 1987-05-14 1990-12-25 Digital Equipment Corporation Automatic sizing memory system with multiplexed configuration signals at memory modules
US4782486A (en) * 1987-05-14 1988-11-01 Digital Equipment Corporation Self-testing memory
ATE125386T1 (de) * 1989-05-31 1995-08-15 Siemens Ag Verfahren und vorrichtung zum internen paralleltest von halbleiterspeichern.
DE59101394D1 (de) * 1990-05-10 1994-05-19 Siemens Ag Integrierter halbleiterspeicher mit paralleltestmöglichkeit und redundanzverfahren.
US5103430A (en) * 1990-11-01 1992-04-07 The Bob Fournet Company Mud pulse pressure signal generator
EP0505603B1 (de) * 1991-03-28 1995-06-21 Siemens Aktiengesellschaft Verfahren zum Testen eines Datenspeichers und zugehörigen Schutzspeichers und Anordnung zur Durchführung des Verfahrens
DE19607724A1 (de) * 1996-02-29 1997-09-04 Siemens Ag Schaltungsanordnung für einen programmierbaren nichtflüchtigen Speicher

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56153596A (en) * 1980-04-30 1981-11-27 Nec Corp Mass storage device
JPS573298A (en) * 1980-06-06 1982-01-08 Nec Corp Memory integrated circuit
JPS57105897A (en) * 1980-12-23 1982-07-01 Fujitsu Ltd Semiconductor storage device
JPS57179997A (en) * 1981-04-25 1982-11-05 Toshiba Corp Semiconductor memory
JPS57203298A (en) * 1981-06-09 1982-12-13 Matsushita Electric Ind Co Ltd Semiconductor storage device
US4541090A (en) * 1981-06-09 1985-09-10 Matsushita Electric Industrial Co., Ltd. Semiconductor memory device
JPS57208696A (en) * 1981-06-16 1982-12-21 Fujitsu Ltd Diagnosing system of storage device
JPS59119597A (ja) * 1982-12-27 1984-07-10 Fujitsu Ltd 半導体記憶装置
DE3576755D1 (de) * 1984-12-28 1990-04-26 Siemens Ag Integrierter halbleiterspeicher.
EP0214508B1 (de) * 1985-09-11 1991-09-25 Siemens Aktiengesellschaft Integrierter Halbleiterspeicher

Also Published As

Publication number Publication date
US4742489A (en) 1988-05-03
EP0186051A2 (de) 1986-07-02
DE3583493D1 (de) 1991-08-22
EP0186051B1 (de) 1991-07-17
JPS61158100A (ja) 1986-07-17
EP0186051A3 (en) 1988-07-06
ATE65339T1 (de) 1991-08-15

Similar Documents

Publication Publication Date Title
EP0213037A3 (en) Semiconductor memory device having test pattern generating circuit
HK1005492A1 (en) Data transfers method for a semiconductor memory and semiconductor memory to perform such a method
HK76292A (en) Integrated semiconductor memory
KR900004345B1 (en) Semiconductor memory device
HK23192A (en) Integrated semiconductor memory
EP0401521A2 (en) Semiconductor memory device
KR900015156A (ko) 다이나믹 ram의 판독 회로
IE810170L (en) Switching digital data
KR850003045A (ko) 라인 절환 회로 및 그를 사용한 반도체 메모리
WO1988001079A3 (en) Signal processing
EP0381404A3 (en) Non-volatile memory
KR840005888A (ko) 반도체 기억장치(半導體記憶置裝)
ATE67892T1 (de) Integrierter halbleiterspeicher.
TW332355B (en) Semiconductor device having a latch circuit for latching externally input data
EP0123896A3 (en) Character and video mode control circuit
GB2088166A (en) Logic interface circuit
TW238387B (en) Decoding circuit for semiconductor memory device and its process
KR890002768A (ko) 하나 이상의 입력 비동기 레지스터
KR950004856B1 (en) Data transmitiing circuit
EP0400724B1 (en) Integrated memory comprising a sense amplifier
KR920005150A (ko) 씨모오스디램의 센스 앰프 구성방법
MY102018A (en) A memory device
EP0190942A3 (en) Signal processing apparatus
JPS6439699A (en) Semiconductor memory device
JPS5798172A (en) Memory access controlling circuit