HK1176743A1 - Semiconductor package for mems device and method of manufacturing the same - Google Patents
Semiconductor package for mems device and method of manufacturing the sameInfo
- Publication number
- HK1176743A1 HK1176743A1 HK13103697.5A HK13103697A HK1176743A1 HK 1176743 A1 HK1176743 A1 HK 1176743A1 HK 13103697 A HK13103697 A HK 13103697A HK 1176743 A1 HK1176743 A1 HK 1176743A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- manufacturing
- same
- semiconductor package
- mems device
- mems
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/0032—Packages or encapsulation
- B81B7/0061—Packages or encapsulation suitable for fluid transfer from the MEMS out of the package or vice versa, e.g. transfer of liquid, gas, sound
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0257—Microphones or microspeakers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2207/00—Microstructural systems or auxiliary parts thereof
- B81B2207/09—Packages
- B81B2207/091—Arrangements for connecting external electrical signals to mechanical structures inside the package
- B81B2207/094—Feed-through, via
- B81B2207/096—Feed-through, via through the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45139—Silver (Ag) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/053—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
- H01L23/057—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body the leads being parallel to the base
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/10—Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00011—Not relevant to the scope of the group, the symbol of which is combined with the symbol of this group
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/146—Mixed devices
- H01L2924/1461—MEMS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16151—Cap comprising an aperture, e.g. for pressure control, encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16152—Cap comprising a cavity for hosting the device, e.g. U-shaped cap
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16152—Cap comprising a cavity for hosting the device, e.g. U-shaped cap
- H01L2924/1617—Cavity coating
- H01L2924/16171—Material
- H01L2924/16172—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/162—Disposition
- H01L2924/16251—Connecting to an item not being a semiconductor or solid-state body, e.g. cap-to-substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/166—Material
- H01L2924/167—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/166—Material
- H01L2924/1679—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R2201/00—Details of transducers, loudspeakers or microphones covered by H04R1/00 but not provided for in any of its subgroups
- H04R2201/003—Mems transducers or their use
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Micromachines (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2010/070775 WO2011103720A1 (en) | 2010-02-26 | 2010-02-26 | Semiconductor package for mems device and method of manufacturing the same |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1176743A1 true HK1176743A1 (en) | 2013-08-02 |
Family
ID=44506126
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK13103697.5A HK1176743A1 (en) | 2010-02-26 | 2013-03-25 | Semiconductor package for mems device and method of manufacturing the same |
Country Status (5)
Country | Link |
---|---|
US (1) | US8809974B2 (xx) |
KR (1) | KR101443477B1 (xx) |
CN (1) | CN102859688B (xx) |
HK (1) | HK1176743A1 (xx) |
WO (1) | WO2011103720A1 (xx) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8577063B2 (en) | 2010-02-18 | 2013-11-05 | Analog Devices, Inc. | Packages and methods for packaging MEMS microphone devices |
US9420378B1 (en) * | 2010-07-12 | 2016-08-16 | Amkor Technology, Inc. | Top port MEMS microphone package and method |
US8447057B2 (en) | 2011-03-18 | 2013-05-21 | Analog Devices, Inc. | Packages and methods for packaging MEMS microphone devices |
US8625832B2 (en) | 2011-04-04 | 2014-01-07 | Invensense, Inc. | Packages and methods for packaging microphone devices |
ITTO20110980A1 (it) * | 2011-10-27 | 2013-04-28 | St Microelectronics Srl | Struttura incapsulante schermata e relativo metodo di fabbricazione |
JP5999302B2 (ja) * | 2012-02-09 | 2016-09-28 | セイコーエプソン株式会社 | 電子デバイスおよびその製造方法、並びに電子機器 |
JP5861497B2 (ja) * | 2012-02-29 | 2016-02-16 | オムロン株式会社 | センサ装置 |
US8779535B2 (en) | 2012-03-14 | 2014-07-15 | Analog Devices, Inc. | Packaged integrated device die between an external and internal housing |
US9162872B2 (en) * | 2012-09-10 | 2015-10-20 | Invensense, Inc. | Pre-molded MEMS device package having conductive column coupled to leadframe and cover |
US9156680B2 (en) | 2012-10-26 | 2015-10-13 | Analog Devices, Inc. | Packages and methods for packaging |
US9409765B1 (en) * | 2013-02-01 | 2016-08-09 | Maxim Integrated Products, Inc. | Method and apparatus for an isolating structure |
EP2790213A3 (en) * | 2013-04-11 | 2015-04-01 | Chun Ho Fan | Cavity package |
US9296607B2 (en) * | 2013-07-22 | 2016-03-29 | Invensense, Inc. | Apparatus and method for reduced strain on MEMS devices |
KR101538543B1 (ko) * | 2013-08-13 | 2015-07-22 | 앰코 테크놀로지 코리아 주식회사 | 반도체 디바이스 및 그 제조 방법 |
CN104425392A (zh) * | 2013-08-27 | 2015-03-18 | 优博创新科技有限公司 | 具有预模制的基板的空腔封装 |
US9257370B2 (en) | 2013-08-27 | 2016-02-09 | Ubotic Company Limited | Cavity package with pre-molded cavity leadframe |
WO2015031711A1 (en) * | 2013-08-29 | 2015-03-05 | Robert Bosch Gmbh | Molded lead frame package with embedded die |
US8912641B1 (en) * | 2013-09-09 | 2014-12-16 | Harris Corporation | Low profile electronic package and associated methods |
US10659889B2 (en) * | 2013-11-08 | 2020-05-19 | Infineon Technologies Ag | Microphone package and method for generating a microphone signal |
KR20150058780A (ko) * | 2013-11-21 | 2015-05-29 | 삼성전기주식회사 | 마이크로폰 패키지 및 그 실장 구조 |
US10138115B2 (en) | 2014-08-06 | 2018-11-27 | Infineon Technologies Ag | Low profile transducer module |
TWI539831B (zh) * | 2014-12-05 | 2016-06-21 | 財團法人工業技術研究院 | 微機電麥克風封裝 |
US9443785B2 (en) * | 2014-12-19 | 2016-09-13 | Advanced Semiconductor Engineering, Inc. | Semiconductor package |
CN104811889B (zh) * | 2015-03-26 | 2021-08-10 | 华天科技(西安)有限公司 | 一种mems麦克风封装器件的组装方法 |
CN104766831B (zh) * | 2015-04-16 | 2018-03-23 | 歌尔股份有限公司 | 一种集成传感器的封装结构 |
CN104779213B (zh) * | 2015-04-16 | 2017-12-15 | 歌尔股份有限公司 | 集成传感器的封装结构和封装方法 |
KR101684526B1 (ko) | 2015-08-28 | 2016-12-08 | 현대자동차 주식회사 | 마이크로폰 및 그 제조 방법 |
KR101657650B1 (ko) * | 2015-08-31 | 2016-09-19 | 주식회사 비에스이센서스 | 맴스 마이크로폰 패키지 및 그 방법 |
JP2017067463A (ja) * | 2015-09-28 | 2017-04-06 | セイコーエプソン株式会社 | 圧力センサー、高度計、電子機器および移動体 |
CN106960824B (zh) | 2015-10-16 | 2020-08-28 | 日月光半导体制造股份有限公司 | 封盖结构和包含封盖结构的半导体装置封装 |
US10589989B2 (en) * | 2016-10-14 | 2020-03-17 | Semiconductor Components Industries, Llc | Absolute and differential pressure sensors and related methods |
EP3625554A1 (en) | 2017-05-15 | 2020-03-25 | Analog Devices Global Unlimited Company | Integrated ion sensing apparatus and methods |
US10178764B2 (en) * | 2017-06-05 | 2019-01-08 | Waymo Llc | PCB optical isolation by nonuniform catch pad stack |
CN107324274B (zh) * | 2017-07-13 | 2024-04-05 | 中国工程物理研究院电子工程研究所 | 用于sip三维集成的封装载体 |
US10458826B2 (en) * | 2017-08-25 | 2019-10-29 | Ubotic Company Limited | Mass flow sensor module and method of manufacture |
US10730743B2 (en) | 2017-11-06 | 2020-08-04 | Analog Devices Global Unlimited Company | Gas sensor packages |
WO2020016778A2 (en) | 2018-07-19 | 2020-01-23 | Cochlear Limited | Contaminant-proof microphone assembly |
US10728674B2 (en) * | 2018-08-27 | 2020-07-28 | Solid State System Co., Ltd. | Microphone package |
US11587839B2 (en) | 2019-06-27 | 2023-02-21 | Analog Devices, Inc. | Device with chemical reaction chamber |
CN110769357A (zh) * | 2019-10-30 | 2020-02-07 | 通用微(深圳)科技有限公司 | 一种采用引线框架塑料壳的麦克风封装结构 |
US20220384362A1 (en) * | 2021-05-31 | 2022-12-01 | Ubotic Company Limited | Faraday cage plastic cavity package with pre-molded cavity leadframe |
CN114040307A (zh) * | 2021-11-25 | 2022-02-11 | 荣成歌尔微电子有限公司 | Mems麦克风和电子设备 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5524423A (en) * | 1978-08-10 | 1980-02-21 | Nissan Motor Co Ltd | Semiconductor pressure sensor |
JPH09222372A (ja) * | 1996-02-19 | 1997-08-26 | Mitsubishi Electric Corp | 半導体式センサ |
JP2991172B2 (ja) | 1997-10-24 | 1999-12-20 | 日本電気株式会社 | 半導体装置 |
US6550337B1 (en) * | 2000-01-19 | 2003-04-22 | Measurement Specialties, Inc. | Isolation technique for pressure sensing structure |
KR20060127166A (ko) * | 2004-03-09 | 2006-12-11 | 마츠시타 덴끼 산교 가부시키가이샤 | 일렉트릿 컨덴서 마이크로폰 |
US7262498B2 (en) | 2004-10-19 | 2007-08-28 | Hewlett-Packard Development Company, L.P. | Assembly with a ring and bonding pads formed of a same material on a substrate |
KR100648398B1 (ko) | 2005-07-07 | 2006-11-24 | 주식회사 비에스이 | 실리콘 콘덴서 마이크로폰의 패키징 구조 및 그 제조방법 |
US7202552B2 (en) * | 2005-07-15 | 2007-04-10 | Silicon Matrix Pte. Ltd. | MEMS package using flexible substrates, and method thereof |
US7419853B2 (en) | 2005-08-11 | 2008-09-02 | Hymite A/S | Method of fabrication for chip scale package for a micro component |
US20070040231A1 (en) * | 2005-08-16 | 2007-02-22 | Harney Kieran P | Partially etched leadframe packages having different top and bottom topologies |
DE102005053765B4 (de) * | 2005-11-10 | 2016-04-14 | Epcos Ag | MEMS-Package und Verfahren zur Herstellung |
JP2007178133A (ja) * | 2005-12-27 | 2007-07-12 | Yamaha Corp | 圧力センサモジュール、その製造方法、及び、半導体装置 |
US7436054B2 (en) * | 2006-03-03 | 2008-10-14 | Silicon Matrix, Pte. Ltd. | MEMS microphone with a stacked PCB package and method of producing the same |
KR100722686B1 (ko) * | 2006-05-09 | 2007-05-30 | 주식회사 비에스이 | 부가적인 백 챔버를 갖고 기판에 음향홀이 형성된 실리콘콘덴서 마이크로폰 |
US7781852B1 (en) * | 2006-12-05 | 2010-08-24 | Amkor Technology, Inc. | Membrane die attach circuit element package and method therefor |
US7550828B2 (en) | 2007-01-03 | 2009-06-23 | Stats Chippac, Inc. | Leadframe package for MEMS microphone assembly |
TWI333264B (en) * | 2007-01-10 | 2010-11-11 | Advanced Semiconductor Eng | Packaging structure and method of mems microphone |
CN101296530B (zh) | 2007-04-29 | 2013-06-12 | 歌尔声学股份有限公司 | 硅电容传声器 |
US8767983B2 (en) | 2007-06-01 | 2014-07-01 | Infineon Technologies Ag | Module including a micro-electro-mechanical microphone |
JP2009164475A (ja) * | 2008-01-09 | 2009-07-23 | Yamaha Corp | マイクロフォンパッケージ、リードフレーム、モールド基板及びマイクロフォンパッケージの実装構造 |
US7843021B2 (en) * | 2008-02-28 | 2010-11-30 | Shandong Gettop Acoustic Co. Ltd. | Double-side mountable MEMS package |
CN101282594B (zh) | 2008-04-10 | 2013-06-05 | 苏州敏芯微电子技术有限公司 | 具有双面贴装电极的微机电传声器的封装结构 |
CN101394687A (zh) * | 2008-10-28 | 2009-03-25 | 歌尔声学股份有限公司 | 硅电容麦克风 |
CN101415138A (zh) * | 2008-11-14 | 2009-04-22 | 瑞声声学科技(深圳)有限公司 | Mems换能器封装结构 |
CN103097282B (zh) | 2010-04-30 | 2016-01-13 | 优博创新科技产权有限公司 | 被配置成用于电气连接到印刷电路板上的气腔封装体以及其提供方法 |
-
2010
- 2010-02-26 KR KR1020127025182A patent/KR101443477B1/ko not_active IP Right Cessation
- 2010-02-26 WO PCT/CN2010/070775 patent/WO2011103720A1/en active Application Filing
- 2010-02-26 CN CN201080066467.6A patent/CN102859688B/zh not_active Expired - Fee Related
- 2010-02-26 US US13/581,270 patent/US8809974B2/en not_active Expired - Fee Related
-
2013
- 2013-03-25 HK HK13103697.5A patent/HK1176743A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN102859688B (zh) | 2015-05-27 |
KR20130027475A (ko) | 2013-03-15 |
WO2011103720A1 (en) | 2011-09-01 |
CN102859688A (zh) | 2013-01-02 |
US8809974B2 (en) | 2014-08-19 |
US20120319256A1 (en) | 2012-12-20 |
KR101443477B1 (ko) | 2014-09-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
HK1176743A1 (en) | Semiconductor package for mems device and method of manufacturing the same | |
HK1213690A1 (zh) | 半導體器件及其製造方法 | |
TWI562379B (en) | Semiconductor device and method for manufacturing semiconductor device | |
TWI562285B (en) | Semiconductor device and method for manufacturing the same | |
TWI562364B (en) | Semiconductor device and manufacturing method thereof | |
HK1194861A1 (zh) | 半導體器件及其製造方法 | |
HK1198303A1 (en) | Semiconductor device and method of manufacturing the same | |
EP2589077A4 (en) | MICROELECTRONIC CASE AND METHOD FOR MANUFACTURING THE SAME | |
HK1203244A1 (en) | Method of manufacturing semiconductor device | |
HK1179751A1 (zh) | 微電子封裝結構及形成微電子封裝結構的方法 | |
EP2786404A4 (en) | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | |
SG11201504734VA (en) | Semiconductor device and method for manufacturing the same | |
EP2581937A4 (en) | SEMICONDUCTOR DEVICE SEALED WITH THE RESIN AND METHOD OF MANUFACTURING THE SAME | |
EP2622644A4 (en) | SEMICONDUCTOR COMPONENTS AND MANUFACTURING METHOD THEREFOR | |
EP2637212A4 (en) | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | |
EP2660869A4 (en) | Semiconductor device and method for manufacturing same | |
EP2631950A4 (en) | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | |
EP2634824A4 (en) | COMPOSITE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | |
EP2624286A4 (en) | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | |
EP2526565A4 (en) | SEMICONDUCTOR HOUSING AND CORRESPONDING METHOD | |
EP2657958A4 (en) | METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE | |
EP2549528A4 (en) | COMPOSITE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | |
GB201121915D0 (en) | Semiconductor device and manufacturing method thereof | |
EP2618380A4 (en) | SEMICONDUCTOR COMPONENT AND MANUFACTURING METHOD THEREFOR | |
TWI562248B (en) | Semiconductor sensor device and method of packaging same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20200223 |