HK1049043A1 - 掃描磁性探測器及其探針 - Google Patents

掃描磁性探測器及其探針

Info

Publication number
HK1049043A1
HK1049043A1 HK03101183.2A HK03101183A HK1049043A1 HK 1049043 A1 HK1049043 A1 HK 1049043A1 HK 03101183 A HK03101183 A HK 03101183A HK 1049043 A1 HK1049043 A1 HK 1049043A1
Authority
HK
Hong Kong
Prior art keywords
probe
same
magnetism detector
scanning
scanning magnetism
Prior art date
Application number
HK03101183.2A
Other languages
English (en)
Inventor
武笠幸一
澤村誠
末岡和久
廣田榮一
Original Assignee
北海道大學
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 北海道大學 filed Critical 北海道大學
Publication of HK1049043A1 publication Critical patent/HK1049043A1/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/50—MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
    • G01Q60/54—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/038—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices
    • G01R33/0385—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices in relation with magnetic force measurements
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/865—Magnetic force probe

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Magnetic Variables (AREA)
HK03101183.2A 2001-03-05 2003-02-18 掃描磁性探測器及其探針 HK1049043A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001059440A JP3472828B2 (ja) 2001-03-05 2001-03-05 走査型磁気検出装置、及び走査型磁気検出装置用深針

Publications (1)

Publication Number Publication Date
HK1049043A1 true HK1049043A1 (zh) 2003-04-25

Family

ID=18918999

Family Applications (1)

Application Number Title Priority Date Filing Date
HK03101183.2A HK1049043A1 (zh) 2001-03-05 2003-02-18 掃描磁性探測器及其探針

Country Status (6)

Country Link
US (1) US6750450B2 (zh)
EP (1) EP1239294A2 (zh)
JP (1) JP3472828B2 (zh)
KR (1) KR100456369B1 (zh)
CN (1) CN1376906A (zh)
HK (1) HK1049043A1 (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3472828B2 (ja) 2001-03-05 2003-12-02 北海道大学長 走査型磁気検出装置、及び走査型磁気検出装置用深針
US7183779B2 (en) * 2004-12-28 2007-02-27 Spectrum Technologies, Inc. Soil probe device and method of making same
CN101075015B (zh) * 2006-05-19 2010-08-25 清华大学 极化电子发射源及自旋极化扫描隧道显微镜
CN104528632B (zh) * 2014-12-24 2016-02-17 哈尔滨工业大学 利用三棱锥微探针轨迹运动加工微结构的装置及方法
CN105182544B (zh) * 2015-08-25 2017-05-10 南开大学 单轴对称微螺旋锥器件
GB2566548B (en) * 2017-09-19 2022-04-13 Elcometer Ltd Surface profile measuring instrument and method

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2760508B2 (ja) * 1988-06-23 1998-06-04 工業技術院長 走査型トンネル顕微鏡
EP0355241A1 (en) * 1988-08-18 1990-02-28 International Business Machines Corporation Spin-polarized scanning tunneling microscope
JP3384582B2 (ja) * 1993-04-02 2003-03-10 株式会社サーモボニック 走査トンネル顕微鏡
NL9301617A (nl) * 1993-09-17 1995-04-18 Stichting Katholieke Univ Meetinrichting voor het meten van de intensiteit en/of polarisatie van elektromagnetische straling, voor het bepalen van fysische eigenschappen van een preparaat en voor het lezen van informatie vanaf een opslagmedium.
JP3571756B2 (ja) * 1994-06-08 2004-09-29 株式会社東芝 スピン偏極ｓｔｍ装置
JP3618841B2 (ja) 1995-07-31 2005-02-09 富士通株式会社 磁場測定方法および磁場測定装置
JP3662362B2 (ja) * 1996-09-26 2005-06-22 富士通株式会社 スピン偏極電子線源、その作成方法及び測定装置
JP3698872B2 (ja) * 1997-10-01 2005-09-21 富士通株式会社 スピン偏極走査型トンネル顕微鏡及びその探針、及び磁化情報評価方法
JP3223155B2 (ja) 1998-02-05 2001-10-29 科学技術振興事業団 薄膜スピンプローブ
JP3441051B2 (ja) * 1998-04-10 2003-08-25 日本電信電話株式会社 原子間力顕微鏡、トンネル顕微鏡又はスピン偏極トンネル顕微鏡に用いる探針及びカンチレバー並びにその作製法
JP2001264230A (ja) 2000-03-21 2001-09-26 Nippon Telegr & Teleph Corp <Ntt> 原子間力顕微鏡、トンネル顕微鏡に用いる探針
JP2002202238A (ja) * 2000-12-28 2002-07-19 Toshiba Corp スピン偏極走査型トンネル顕微鏡及び再生装置
JP3472828B2 (ja) 2001-03-05 2003-12-02 北海道大学長 走査型磁気検出装置、及び走査型磁気検出装置用深針

Also Published As

Publication number Publication date
US20020149362A1 (en) 2002-10-17
KR100456369B1 (ko) 2004-11-10
JP3472828B2 (ja) 2003-12-02
EP1239294A2 (en) 2002-09-11
US6750450B2 (en) 2004-06-15
JP2002257703A (ja) 2002-09-11
KR20020071464A (ko) 2002-09-12
CN1376906A (zh) 2002-10-30

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