HK1042743B - 散射靶固定機構及電子自旋分析器 - Google Patents

散射靶固定機構及電子自旋分析器

Info

Publication number
HK1042743B
HK1042743B HK02104085.6A HK02104085A HK1042743B HK 1042743 B HK1042743 B HK 1042743B HK 02104085 A HK02104085 A HK 02104085A HK 1042743 B HK1042743 B HK 1042743B
Authority
HK
Hong Kong
Prior art keywords
holding mechanism
electron spin
scattering target
spin analyzer
analyzer
Prior art date
Application number
HK02104085.6A
Other languages
English (en)
Other versions
HK1042743A1 (en
Inventor
武笠幸一
池田正幸
末岡和久
武藤征一
上遠野久夫
上田映介
Original Assignee
北海道大學
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 北海道大學 filed Critical 北海道大學
Publication of HK1042743A1 publication Critical patent/HK1042743A1/xx
Publication of HK1042743B publication Critical patent/HK1042743B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/295—Electron or ion diffraction tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
HK02104085.6A 2000-04-28 2002-05-31 散射靶固定機構及電子自旋分析器 HK1042743B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000130224A JP3383842B2 (ja) 2000-04-28 2000-04-28 散乱ターゲット保持機構及び電子スピン分析器

Publications (2)

Publication Number Publication Date
HK1042743A1 HK1042743A1 (en) 2002-08-23
HK1042743B true HK1042743B (zh) 2005-03-11

Family

ID=18639368

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02104085.6A HK1042743B (zh) 2000-04-28 2002-05-31 散射靶固定機構及電子自旋分析器

Country Status (6)

Country Link
US (1) US6674073B2 (zh)
EP (1) EP1150329A3 (zh)
JP (1) JP3383842B2 (zh)
KR (1) KR100414381B1 (zh)
CN (1) CN1159599C (zh)
HK (1) HK1042743B (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3757263B2 (ja) 2000-05-02 2006-03-22 国立大学法人 北海道大学 電子スピン分析器
JP5222712B2 (ja) * 2008-12-22 2013-06-26 株式会社日立製作所 電子スピン検出器並びにそれを用いたスピン偏極走査電子顕微鏡及びスピン分解光電子分光装置
US8434752B2 (en) 2011-08-05 2013-05-07 Goss International Americas, Inc. Apparatus for opening and transporting a product with a non-symmetrical fold
CN104345331B (zh) 2013-07-24 2017-04-19 中国科学院上海微系统与信息技术研究所 图像型电子自旋分析器
CN109470732B (zh) * 2017-09-07 2020-11-24 中国科学院上海微系统与信息技术研究所 一种电子光学系统
CN109470731B (zh) * 2017-09-07 2020-10-20 中国科学院上海微系统与信息技术研究所 一种图像型电子自旋分析器

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5578449A (en) * 1978-12-08 1980-06-13 Toshiba Corp Rotary anode x-ray tube
JPS6017846A (ja) 1983-07-08 1985-01-29 Hitachi Ltd 電子スピン偏極率検出器
JPS60177539A (ja) 1984-02-24 1985-09-11 Hitachi Ltd 走査型電子顕微鏡
JPS60105152A (ja) 1984-10-05 1985-06-10 Hitachi Ltd 走査型電子顕微鏡
US4760254A (en) * 1985-06-07 1988-07-26 Pierce Daniel T Apparatus and method for electron spin polarization detection
US4800581A (en) * 1986-10-27 1989-01-24 Kabushiki Kaisha Toshiba X-ray tube
US4802196A (en) * 1986-12-31 1989-01-31 General Electric Company X-ray tube target
JPH0786897B2 (ja) 1987-05-15 1995-09-20 シャープ株式会社 カ−ド状体の読取り装置
JP2561699B2 (ja) * 1988-04-28 1996-12-11 日本電子株式会社 電子顕微鏡用試料装置
US5442678A (en) * 1990-09-05 1995-08-15 Photoelectron Corporation X-ray source with improved beam steering
JPH04206427A (ja) 1990-11-30 1992-07-28 Hitachi Ltd スピン検出器
DE69229432T2 (de) * 1991-10-24 2000-02-17 Hitachi, Ltd. Probenhalter für Elektronenmikroskop
JPH0684490A (ja) * 1992-09-02 1994-03-25 Toshiba Corp 分析用ｘ線管
JP3302569B2 (ja) 1996-07-09 2002-07-15 科学技術振興事業団 電子スピン偏極度の計測方法及びその装置
JP3757263B2 (ja) 2000-05-02 2006-03-22 国立大学法人 北海道大学 電子スピン分析器

Also Published As

Publication number Publication date
KR100414381B1 (ko) 2004-01-07
US20020003212A1 (en) 2002-01-10
CN1336542A (zh) 2002-02-20
HK1042743A1 (en) 2002-08-23
JP3383842B2 (ja) 2003-03-10
KR20010100913A (ko) 2001-11-14
CN1159599C (zh) 2004-07-28
EP1150329A2 (en) 2001-10-31
US6674073B2 (en) 2004-01-06
JP2001311702A (ja) 2001-11-09
EP1150329A3 (en) 2006-06-28

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20080428