GB1400467A - Specimen tilting device for an electron microscope - Google Patents

Specimen tilting device for an electron microscope

Info

Publication number
GB1400467A
GB1400467A GB2769272A GB2769272A GB1400467A GB 1400467 A GB1400467 A GB 1400467A GB 2769272 A GB2769272 A GB 2769272A GB 2769272 A GB2769272 A GB 2769272A GB 1400467 A GB1400467 A GB 1400467A
Authority
GB
United Kingdom
Prior art keywords
specimen
rods
axis
rotatable
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2769272A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Publication of GB1400467A publication Critical patent/GB1400467A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB2769272A 1971-06-19 1972-06-13 Specimen tilting device for an electron microscope Expired GB1400467A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5271571U JPS5126613Y2 (de) 1971-06-19 1971-06-19

Publications (1)

Publication Number Publication Date
GB1400467A true GB1400467A (en) 1975-07-16

Family

ID=27934548

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2769272A Expired GB1400467A (en) 1971-06-19 1972-06-13 Specimen tilting device for an electron microscope

Country Status (3)

Country Link
JP (1) JPS5126613Y2 (de)
DE (1) DE2229310C3 (de)
GB (1) GB1400467A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3038131A1 (de) * 2014-12-22 2016-06-29 FEI Company Verbesserter Probenhalter für Ladungsträgerteilchenmikroskop

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50107605U (de) * 1974-02-15 1975-09-03
JPS50117010U (de) * 1974-03-11 1975-09-23
JPS50155205U (de) * 1974-06-10 1975-12-23
JPS53132805U (de) * 1977-03-29 1978-10-21
JPS6032459Y2 (ja) * 1977-04-26 1985-09-27 ヤンマー農機株式会社 耕耘機の伝動ケ−ス
JPS5912899B2 (ja) * 1977-11-05 1984-03-26 松下電器産業株式会社 機器の歯車装置
DE19839871C2 (de) * 1998-09-02 2000-06-15 Dresden Ev Inst Festkoerper Manipulator zur Positionierung von Proben in Apparaturen und Kammern

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3038131A1 (de) * 2014-12-22 2016-06-29 FEI Company Verbesserter Probenhalter für Ladungsträgerteilchenmikroskop
US9741527B2 (en) 2014-12-22 2017-08-22 Fei Company Specimen holder for a charged particle microscope

Also Published As

Publication number Publication date
DE2229310A1 (de) 1973-06-14
DE2229310B2 (de) 1977-10-27
JPS4811764U (de) 1973-02-09
DE2229310C3 (de) 1978-06-29
JPS5126613Y2 (de) 1976-07-06

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Legal Events

Date Code Title Description
PS Patent sealed
PE20 Patent expired after termination of 20 years