GB1237662A - Method for manufacturing semiconductor device with passivation film - Google Patents
Method for manufacturing semiconductor device with passivation filmInfo
- Publication number
- GB1237662A GB1237662A GB22634/69A GB2263469A GB1237662A GB 1237662 A GB1237662 A GB 1237662A GB 22634/69 A GB22634/69 A GB 22634/69A GB 2263469 A GB2263469 A GB 2263469A GB 1237662 A GB1237662 A GB 1237662A
- Authority
- GB
- United Kingdom
- Prior art keywords
- layer
- silicon oxide
- phosphorus
- forming
- oxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
-
- H10P14/6309—
-
- H10P14/6322—
-
- H10P14/6518—
-
- H10P14/662—
-
- H10P14/6334—
-
- H10P14/69215—
-
- H10P14/6923—
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/043—Dual dielectric
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/118—Oxide films
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3046668 | 1968-05-07 | ||
| JP3046568 | 1968-05-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1237662A true GB1237662A (en) | 1971-06-30 |
Family
ID=26368817
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB22634/69A Expired GB1237662A (en) | 1968-05-07 | 1969-05-02 | Method for manufacturing semiconductor device with passivation film |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3615941A (esLanguage) |
| DE (1) | DE1923035A1 (esLanguage) |
| FR (1) | FR2011823B1 (esLanguage) |
| GB (1) | GB1237662A (esLanguage) |
| NL (1) | NL6906890A (esLanguage) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2040180B2 (de) * | 1970-01-22 | 1977-08-25 | Intel Corp, Mountain View, Calif. (V.St.A.) | Verfahren zur verhinderung von mechanischen bruechen einer duennen, die oberflaeche eines halbleiterkoerpers ueberdeckende isolierschichten ueberziehenden elektrisch leitenden schicht |
| JPS5317860B1 (esLanguage) * | 1971-01-22 | 1978-06-12 | ||
| US3755015A (en) * | 1971-12-10 | 1973-08-28 | Gen Electric | Anti-reflection coating for semiconductor diode array targets |
| JPS5160454A (ja) * | 1974-11-22 | 1976-05-26 | Hitachi Ltd | Tasohogomakunokeiseiho |
| JPS5922381B2 (ja) * | 1975-12-03 | 1984-05-26 | 株式会社東芝 | ハンドウタイソシノ セイゾウホウホウ |
| DE2658304C2 (de) * | 1975-12-24 | 1984-12-20 | Tokyo Shibaura Electric Co., Ltd., Kawasaki, Kanagawa | Halbleitervorrichtung |
| USRE32351E (en) * | 1978-06-19 | 1987-02-17 | Rca Corporation | Method of manufacturing a passivating composite comprising a silicon nitride (SI1 3N4) layer and a phosphosilicate glass (PSG) layer for a semiconductor device layer |
| US4668973A (en) * | 1978-06-19 | 1987-05-26 | Rca Corporation | Semiconductor device passivated with phosphosilicate glass over silicon nitride |
| EP0560617A3 (en) * | 1992-03-13 | 1993-11-24 | Kawasaki Steel Co | Method of manufacturing insulating film on semiconductor device and apparatus for carrying out the same |
| US5470801A (en) * | 1993-06-28 | 1995-11-28 | Lsi Logic Corporation | Low dielectric constant insulation layer for integrated circuit structure and method of making same |
| CN113113324B (zh) * | 2021-04-07 | 2024-02-06 | 捷捷半导体有限公司 | 一种钝化层制作方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1449089A (fr) * | 1964-07-09 | 1966-08-12 | Rca Corp | Dispositifs semi-conducteurs |
| CH456570A (de) * | 1965-11-18 | 1968-07-31 | Geigy Ag J R | Verfahren zur Herstellung von neuen substituierten Harnstoffderivaten |
| GB1172491A (en) * | 1967-03-29 | 1969-12-03 | Hitachi Ltd | A method of manufacturing a semiconductor device |
-
1969
- 1969-04-30 US US820433A patent/US3615941A/en not_active Expired - Lifetime
- 1969-05-02 GB GB22634/69A patent/GB1237662A/en not_active Expired
- 1969-05-05 FR FR696914305A patent/FR2011823B1/fr not_active Expired
- 1969-05-06 DE DE19691923035 patent/DE1923035A1/de active Pending
- 1969-05-06 NL NL6906890A patent/NL6906890A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| NL6906890A (esLanguage) | 1969-11-11 |
| DE1923035A1 (de) | 1969-11-13 |
| US3615941A (en) | 1971-10-26 |
| FR2011823A1 (esLanguage) | 1970-03-13 |
| FR2011823B1 (esLanguage) | 1974-02-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed [section 19, patents act 1949] | ||
| PCNP | Patent ceased through non-payment of renewal fee |