FR3120947B1 - Caractérisation électrique de circuit d’adressage matriciel - Google Patents

Caractérisation électrique de circuit d’adressage matriciel Download PDF

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Publication number
FR3120947B1
FR3120947B1 FR2102571A FR2102571A FR3120947B1 FR 3120947 B1 FR3120947 B1 FR 3120947B1 FR 2102571 A FR2102571 A FR 2102571A FR 2102571 A FR2102571 A FR 2102571A FR 3120947 B1 FR3120947 B1 FR 3120947B1
Authority
FR
France
Prior art keywords
blocks
addressing circuit
matrix addressing
electrical characterization
addressing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR2102571A
Other languages
English (en)
Other versions
FR3120947A1 (fr
Inventor
Aurélien Suhm
Rhun Gwenaël Le
Nicolas Devanciard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR2102571A priority Critical patent/FR3120947B1/fr
Priority to EP22154701.1A priority patent/EP4060399A1/fr
Priority to US17/693,688 priority patent/US20220299562A1/en
Priority to CN202210254861.7A priority patent/CN115144715A/zh
Publication of FR3120947A1 publication Critical patent/FR3120947A1/fr
Application granted granted Critical
Publication of FR3120947B1 publication Critical patent/FR3120947B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/133394—Piezoelectric elements associated with the cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2202/00—Materials and properties
    • G02F2202/42—Materials having a particular dielectric constant

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

Structure (10) pour le test d’un circuit électronique (50) d’adressage d’une matrice de cellules comprenant :- une pluralité de blocs (151,…,15m) à base d’au moins un premier matériau (14), piézo-électrique et/ou diélectrique dont les propriétés diélectriques sont modulables en fonction de l’intensité d’un champ électrique qui lui est appliqué,- au moins une région de séparation entre lesdits blocs (15), la structure (10) comprenant en outre :- une électrode (18) commune connectée à une première extrémité (15A) desdits blocs (151,…,15m) à base dudit premier matériau (14), une deuxième extrémité desdits blocs (151,…,15m) à base dudit premier matériau (14) étant agencée par rapport à une face (10B) de la structure (10) appelée « face de contact », de sorte que lorsque la face (10B) de contact est disposée sur le circuit d’adressage, la deuxième extrémité (15B) desdits blocs (151,…,15m) est connectée à au moins un plot conducteur du circuit d’adressage Figure pour l’abrégé : figure 2.
FR2102571A 2021-03-16 2021-03-16 Caractérisation électrique de circuit d’adressage matriciel Active FR3120947B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR2102571A FR3120947B1 (fr) 2021-03-16 2021-03-16 Caractérisation électrique de circuit d’adressage matriciel
EP22154701.1A EP4060399A1 (fr) 2021-03-16 2022-02-02 Caractérisation électrique de circuit d'adressage matriciel
US17/693,688 US20220299562A1 (en) 2021-03-16 2022-03-14 Electric characterisation of a matrix addressing circuit
CN202210254861.7A CN115144715A (zh) 2021-03-16 2022-03-15 矩阵寻址电路的电气表征

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2102571 2021-03-16
FR2102571A FR3120947B1 (fr) 2021-03-16 2021-03-16 Caractérisation électrique de circuit d’adressage matriciel

Publications (2)

Publication Number Publication Date
FR3120947A1 FR3120947A1 (fr) 2022-09-23
FR3120947B1 true FR3120947B1 (fr) 2023-05-12

Family

ID=76807704

Family Applications (1)

Application Number Title Priority Date Filing Date
FR2102571A Active FR3120947B1 (fr) 2021-03-16 2021-03-16 Caractérisation électrique de circuit d’adressage matriciel

Country Status (4)

Country Link
US (1) US20220299562A1 (fr)
EP (1) EP4060399A1 (fr)
CN (1) CN115144715A (fr)
FR (1) FR3120947B1 (fr)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2653099B2 (ja) * 1988-05-17 1997-09-10 セイコーエプソン株式会社 アクティブマトリクスパネル，投写型表示装置及びビューファインダー
US5546013A (en) 1993-03-05 1996-08-13 International Business Machines Corporation Array tester for determining contact quality and line integrity in a TFT/LCD
US7173609B2 (en) * 2000-06-08 2007-02-06 Matsushita Electric Industrial Co., Ltd. Image display apparatus and image display method
US7843621B2 (en) * 2002-06-10 2010-11-30 E Ink Corporation Components and testing methods for use in the production of electro-optic displays
US20080158648A1 (en) * 2006-12-29 2008-07-03 Cummings William J Peripheral switches for MEMS display test
KR20170012661A (ko) * 2015-07-21 2017-02-03 비앤비산업 주식회사 X-밴드 핀을 이용한 반도체 소자 및 디스플레이 패널 품질 검사용 마이크로 테스트 컨택터 및 그 제조 방법
US10198984B2 (en) 2017-03-31 2019-02-05 Facebook Technologise, LLC Display panel calibration using detector array measurement
US10580352B2 (en) 2018-07-03 2020-03-03 Facebook Technologies, Llc Testing of micro light emitting diodes (LEDs) using probe pads

Also Published As

Publication number Publication date
CN115144715A (zh) 2022-10-04
FR3120947A1 (fr) 2022-09-23
US20220299562A1 (en) 2022-09-22
EP4060399A1 (fr) 2022-09-21

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