FR2792730B1 - Procede de detection de defaut pour circuit electronique - Google Patents

Procede de detection de defaut pour circuit electronique

Info

Publication number
FR2792730B1
FR2792730B1 FR9904984A FR9904984A FR2792730B1 FR 2792730 B1 FR2792730 B1 FR 2792730B1 FR 9904984 A FR9904984 A FR 9904984A FR 9904984 A FR9904984 A FR 9904984A FR 2792730 B1 FR2792730 B1 FR 2792730B1
Authority
FR
France
Prior art keywords
electronic circuit
detection method
fault detection
output
state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR9904984A
Other languages
English (en)
Other versions
FR2792730A1 (fr
Inventor
Renaud Ayrignac
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR9904984A priority Critical patent/FR2792730B1/fr
Priority to US09/552,765 priority patent/US6681360B1/en
Publication of FR2792730A1 publication Critical patent/FR2792730A1/fr
Application granted granted Critical
Publication of FR2792730B1 publication Critical patent/FR2792730B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318502—Test of Combinational circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
FR9904984A 1999-04-20 1999-04-20 Procede de detection de defaut pour circuit electronique Expired - Lifetime FR2792730B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR9904984A FR2792730B1 (fr) 1999-04-20 1999-04-20 Procede de detection de defaut pour circuit electronique
US09/552,765 US6681360B1 (en) 1999-04-20 2000-04-19 Fault detection method for electronic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9904984A FR2792730B1 (fr) 1999-04-20 1999-04-20 Procede de detection de defaut pour circuit electronique

Publications (2)

Publication Number Publication Date
FR2792730A1 FR2792730A1 (fr) 2000-10-27
FR2792730B1 true FR2792730B1 (fr) 2001-06-08

Family

ID=9544651

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9904984A Expired - Lifetime FR2792730B1 (fr) 1999-04-20 1999-04-20 Procede de detection de defaut pour circuit electronique

Country Status (2)

Country Link
US (1) US6681360B1 (fr)
FR (1) FR2792730B1 (fr)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3108870C2 (de) * 1981-03-09 1983-05-05 Siemens AG, 1000 Berlin und 8000 München Verfahren zur Funktionsprüfung eines Multiplexers
JPH01132980A (ja) * 1987-11-17 1989-05-25 Mitsubishi Electric Corp テスト機能付電子回路装置
US5572535A (en) * 1994-07-05 1996-11-05 Motorola Inc. Method and data processing system for verifying the correct operation of a tri-state multiplexer in a circuit design
US5684808A (en) * 1995-09-19 1997-11-04 Unisys Corporation System and method for satisfying mutually exclusive gating requirements in automatic test pattern generation systems
US6032278A (en) * 1996-12-26 2000-02-29 Intel Corporation Method and apparatus for performing scan testing
US6185713B1 (en) * 1998-04-09 2001-02-06 Pmc-Sierra Ltd. Method and apparatus for improving stuck-at fault detection in large scale integrated circuit testing
US6163192A (en) * 1999-02-26 2000-12-19 Sun Microsystems, Inc. Negative pulse edge triggered flip-flop

Also Published As

Publication number Publication date
FR2792730A1 (fr) 2000-10-27
US6681360B1 (en) 2004-01-20

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