FR2692048B1 - Montage d'essai. - Google Patents
Montage d'essai.Info
- Publication number
- FR2692048B1 FR2692048B1 FR9306778A FR9306778A FR2692048B1 FR 2692048 B1 FR2692048 B1 FR 2692048B1 FR 9306778 A FR9306778 A FR 9306778A FR 9306778 A FR9306778 A FR 9306778A FR 2692048 B1 FR2692048 B1 FR 2692048B1
- Authority
- FR
- France
- Prior art keywords
- test assembly
- test
- assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US89647992A | 1992-06-09 | 1992-06-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2692048A1 FR2692048A1 (fr) | 1993-12-10 |
FR2692048B1 true FR2692048B1 (fr) | 1996-09-06 |
Family
ID=25406287
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9306778A Expired - Fee Related FR2692048B1 (fr) | 1992-06-09 | 1993-06-07 | Montage d'essai. |
Country Status (5)
Country | Link |
---|---|
US (3) | US5300881A (fr) |
JP (1) | JP2781511B2 (fr) |
DE (1) | DE4319230C2 (fr) |
FR (1) | FR2692048B1 (fr) |
GB (1) | GB2267786B (fr) |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5550482A (en) * | 1993-07-20 | 1996-08-27 | Tokyo Electron Kabushiki Kaisha | Probe device |
US5442299A (en) * | 1994-01-06 | 1995-08-15 | International Business Machines Corporation | Printed circuit board test fixture and method |
US5430385A (en) * | 1994-08-15 | 1995-07-04 | H+W Test Products, Inc. | Test fixture for printed circuit boards having a dual seal system |
US5823737A (en) * | 1995-10-31 | 1998-10-20 | Lucent Technologies | Probemat handler |
US6283464B1 (en) | 1996-05-24 | 2001-09-04 | International Business Machines Corporation | Adjustable tooling pin for a card test fixture |
US5892366A (en) | 1996-05-24 | 1999-04-06 | International Business Machines Corporation | Adjustable tooling pin for a card test fixture |
KR0161821B1 (ko) * | 1996-06-20 | 1999-03-30 | 김광호 | 시리얼 프린터에서 양방향 인자 위치 자동 조절 장치 및 방법 |
KR100189084B1 (ko) * | 1996-10-16 | 1999-06-01 | 윤종용 | 수직 조정을 위한 패턴 인자 방법 |
DE19703982B4 (de) * | 1997-02-03 | 2004-06-09 | Atg Test Systems Gmbh & Co.Kg | Verfahren zum Prüfen von Leiterplatten |
US6043667A (en) * | 1997-04-17 | 2000-03-28 | International Business Machines Corporation | Substrate tester location clamping, sensing, and contacting method and apparatus |
US6025729A (en) * | 1997-09-11 | 2000-02-15 | Delaware Capital Formation, Inc. | Floating spring probe wireless test fixture |
US6066957A (en) * | 1997-09-11 | 2000-05-23 | Delaware Capital Formation, Inc. | Floating spring probe wireless test fixture |
US6054869A (en) * | 1998-03-19 | 2000-04-25 | H+W Test Products, Inc. | Bi-level test fixture for testing printed circuit boards |
US7119342B2 (en) * | 1999-02-09 | 2006-10-10 | Syagen Technology | Interfaces for a photoionization mass spectrometer |
US7109476B2 (en) | 1999-02-09 | 2006-09-19 | Syagen Technology | Multiple ion sources involving atmospheric pressure photoionization |
US6407541B1 (en) * | 1999-07-30 | 2002-06-18 | Credence Systems Corporation | Docking mechanism for semiconductor tester |
JP2001127499A (ja) * | 1999-10-26 | 2001-05-11 | Matsushita Electric Ind Co Ltd | 検査方法および検査装置 |
US6262571B1 (en) | 1999-11-17 | 2001-07-17 | Agilent Technologies, Inc. | Adjustable electrical connector for test fixture nest |
US6384617B1 (en) | 1999-11-17 | 2002-05-07 | Agilent Technologies, Inc. | Signal transfer device for probe test fixture |
US6336276B1 (en) | 2000-01-18 | 2002-01-08 | Agilent Technologies, Inc. | Customizable nest for positioning a device under test |
US6509753B2 (en) | 2000-02-23 | 2003-01-21 | Agilent Technologies, Inc. | Customizable nest that requires no machining or tools |
US6377038B1 (en) | 2000-02-23 | 2002-04-23 | Agilent Technologies, Inc. | RF isolation test device having a box within a box configuration for RF sheilding reference to related applications |
US6469495B1 (en) | 2000-02-23 | 2002-10-22 | Agilent Technologies, Inc. | RF isolation test device accommodating multiple nest plates for testing different devices and providing variable testing options |
US6563297B1 (en) | 2000-02-23 | 2003-05-13 | Agilent Technologies, Inc. | RF isolation test device having ease of accessibility |
US6492823B1 (en) | 2000-02-23 | 2002-12-10 | Agilent Technologies, Inc. | Customizable nest providing for adjustable audio isolation for testing wireless devices |
US6752391B1 (en) | 2000-02-23 | 2004-06-22 | Agilent Technologies, Inc. | Customizable nest with the option of conversion to a permanent nest |
US6737642B2 (en) | 2002-03-18 | 2004-05-18 | Syagen Technology | High dynamic range analog-to-digital converter |
US7442342B2 (en) * | 2002-06-26 | 2008-10-28 | Ge Healthcare Bio-Sciences Ab | Biochip holder and method of collecting fluid |
WO2004008158A2 (fr) | 2002-07-17 | 2004-01-22 | Delta Design, Inc. | Mecanisme plongeant exempt d'empreinte pour test de semi-conducteurs |
US6940297B2 (en) * | 2003-05-27 | 2005-09-06 | James Hall | Top plate release mechanism |
CN101291182A (zh) * | 2007-04-16 | 2008-10-22 | 鸿富锦精密工业(深圳)有限公司 | 屏蔽箱体 |
CN101296604A (zh) * | 2007-04-24 | 2008-10-29 | 鸿富锦精密工业(深圳)有限公司 | 屏蔽箱体 |
US8810460B2 (en) | 2009-11-05 | 2014-08-19 | Atc Logistics & Electronics, Inc. | Multidimensional RF test fixture and method for securing a wireless device for RF testing |
US8931770B1 (en) | 2011-03-31 | 2015-01-13 | Spirent Communications, Inc. | Adjustable electronic device holder |
US9285419B2 (en) | 2011-06-30 | 2016-03-15 | Apple Inc. | Test probe alignment structures for radio-frequency test systems |
CN103134650B (zh) * | 2011-11-29 | 2016-01-27 | 青岛橡胶谷知识产权有限公司 | 测试治具 |
TWI499751B (zh) * | 2012-06-07 | 2015-09-11 | Giga Byte Tech Co Ltd | 可調式過爐治具 |
US10371718B2 (en) | 2016-11-14 | 2019-08-06 | International Business Machines Corporation | Method for identification of proper probe placement on printed circuit board |
CN109590994B (zh) * | 2019-01-09 | 2023-08-22 | 安徽明天氢能科技股份有限公司 | 一种用于阴阳极板上线的机械手 |
DE102019002266A1 (de) * | 2019-03-28 | 2020-10-01 | Yamaichi Electronics Deutschland Gmbh | Testvorrichtung zum Testen elektrischer Bauteile, Verwendung der Testvorrichtung zum Testen eines elektrischen Bauteils und Verfahren zum Testen elektrischer Bauteile mittels der Testvorrichtung |
CN110262094B (zh) * | 2019-06-20 | 2021-10-12 | 东莞理工学院 | 一种用于检测遥控器液晶显示屏的显示功能的夹具 |
KR102171682B1 (ko) * | 2019-08-07 | 2020-10-30 | 주식회사 디엠엔티 | 디스플레이 패널 검사용 프로브 블록의 탈착장치 |
KR102189260B1 (ko) * | 2019-09-09 | 2020-12-18 | 주식회사 디앤에스시스템 | 패널 테스트용 프로브 블록 |
CN111521932B (zh) * | 2020-05-22 | 2023-04-28 | 上海工程技术大学 | 一种旋转开关测试夹具 |
CN112345915B (zh) * | 2020-09-30 | 2022-03-22 | 无锡凌通精密工业有限公司 | 一种pcb线路板阳极测试夹具 |
US11835076B1 (en) * | 2023-02-03 | 2023-12-05 | The Boeing Company | Axial locking mechanisms and methods for supporting a workpiece |
Family Cites Families (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3899972A (en) * | 1973-08-27 | 1975-08-19 | William H Albright | Registration-adjusting printing plate saddle |
US3936743A (en) * | 1974-03-05 | 1976-02-03 | Electroglas, Inc. | High speed precision chuck assembly |
GB1530350A (en) * | 1976-10-23 | 1978-10-25 | Marconi Instruments Ltd | Electrical test jigs |
JPS54119667U (fr) * | 1978-02-10 | 1979-08-22 | ||
US4209745A (en) * | 1978-06-12 | 1980-06-24 | Everett/Charles, Inc. | Interchangeable test head for loaded test member |
US4322682A (en) * | 1979-05-21 | 1982-03-30 | Everett/Charles Inc. | Vacuum actuated test head having programming plate |
DE3040340A1 (de) * | 1980-10-25 | 1982-05-27 | Standard Elektrik Lorenz Ag, 7000 Stuttgart | Pruefaufnahme fuer plattenfoermige baugruppen |
DE3301687C2 (de) * | 1983-01-20 | 1986-06-12 | Helmut 7800 Freiburg Lang-Dahlke | Andruckvorrichtung für Nadeladapter eines Leiterplattenprüfgerätes |
US4538104A (en) * | 1983-04-11 | 1985-08-27 | Test Point 1, Inc. | In-circuit test apparatus for printed circuit board |
IT1194298B (it) * | 1983-07-04 | 1988-09-14 | Honeywell Inf Systems Italia | Elemento porta-sonde per attrezzatura di collaudo di piastre a circuito stampato |
DE3340178C1 (de) * | 1983-11-07 | 1985-05-15 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH | Vorrichtung zum Andruecken von in einem Leiterplattenpruefgeraet zu testenden Leiterplatten und Verfahren zur Justierung der dazugehoerigen Lichtmarkenprojektoren |
US4573009A (en) * | 1983-12-07 | 1986-02-25 | Zehntel, Inc. | Printed circuit board test fixture with flexion means for providing registration between the test probes and the circuit board |
US4694245A (en) * | 1984-09-07 | 1987-09-15 | Precision Drilling, Inc. | Vacuum-actuated top access test probe fixture |
JPS62121376A (ja) * | 1985-11-21 | 1987-06-02 | Hitachi Electronics Eng Co Ltd | テストヘツド |
AT391762B (de) * | 1985-11-26 | 1990-11-26 | Alcatel Austria Ag | Vorrichtung zum pruefen von leiterplatten |
US4701700A (en) * | 1985-12-02 | 1987-10-20 | Jenkins Jack E | Captivated, pre-loaded spring means for vacuum displaced circuit board testing |
US4667155A (en) * | 1986-01-07 | 1987-05-19 | Virginia Panel Corporation | Modular molded vacuum test fixture |
US4818933A (en) * | 1986-10-08 | 1989-04-04 | Hewlett-Packard Company | Board fixturing system |
US4758780A (en) * | 1986-12-08 | 1988-07-19 | Ncr Corporation | Circuit board test apparatus and method |
US4812754A (en) * | 1987-01-07 | 1989-03-14 | Tracy Theodore A | Circuit board interfacing apparatus |
GB8700754D0 (en) * | 1987-01-14 | 1987-02-18 | Int Computers Ltd | Test apparatus for printed circuit boards |
US4929893A (en) * | 1987-10-06 | 1990-05-29 | Canon Kabushiki Kaisha | Wafer prober |
WO1990006518A1 (fr) * | 1988-11-28 | 1990-06-14 | Cimm, Inc. | Appareil d'essai sans fil |
US5055779A (en) * | 1989-06-19 | 1991-10-08 | Hewlett-Packard Company | Integrated board testing system |
ATE156958T1 (de) * | 1990-05-25 | 1997-08-15 | Everett Charles Contact Prod | Ausrichtsystem und -verfahren für eine prüfhalterung |
KR920022574A (ko) * | 1991-05-03 | 1992-12-19 | 김광호 | 반도체 장치의 칩 수명테스트 장치 |
JPH04355384A (ja) * | 1991-05-31 | 1992-12-09 | Suzuki Motor Corp | テスタ用基板位置決め装置 |
US5150041A (en) * | 1991-06-21 | 1992-09-22 | Compaq Computer Corporation | Optically alignable printed circuit board test fixture apparatus and associated methods |
US5396186A (en) * | 1993-08-09 | 1995-03-07 | Landers Plastics Inc. | Vacuum actuated multiple level printed circuit board test fixture |
-
1993
- 1993-06-07 FR FR9306778A patent/FR2692048B1/fr not_active Expired - Fee Related
- 1993-06-08 GB GB9311799A patent/GB2267786B/en not_active Expired - Fee Related
- 1993-06-09 DE DE4319230A patent/DE4319230C2/de not_active Expired - Fee Related
- 1993-06-10 JP JP5138212A patent/JP2781511B2/ja not_active Expired - Fee Related
- 1993-06-30 US US08/084,755 patent/US5300881A/en not_active Expired - Lifetime
-
1994
- 1994-04-05 US US08/224,006 patent/US5422575A/en not_active Expired - Lifetime
-
1995
- 1995-06-05 US US08/462,229 patent/US5557211A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH06281701A (ja) | 1994-10-07 |
FR2692048A1 (fr) | 1993-12-10 |
GB2267786A (en) | 1993-12-15 |
US5422575A (en) | 1995-06-06 |
US5557211A (en) | 1996-09-17 |
US5300881A (en) | 1994-04-05 |
GB9311799D0 (en) | 1993-07-28 |
DE4319230A1 (de) | 1993-12-16 |
GB2267786B (en) | 1996-08-21 |
DE4319230C2 (de) | 1998-07-30 |
JP2781511B2 (ja) | 1998-07-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20090228 |