FR2685807B1 - Circuit de commutation haute tension. - Google Patents

Circuit de commutation haute tension.

Info

Publication number
FR2685807B1
FR2685807B1 FR9213607A FR9213607A FR2685807B1 FR 2685807 B1 FR2685807 B1 FR 2685807B1 FR 9213607 A FR9213607 A FR 9213607A FR 9213607 A FR9213607 A FR 9213607A FR 2685807 B1 FR2685807 B1 FR 2685807B1
Authority
FR
France
Prior art keywords
high voltage
switching circuit
voltage switching
circuit
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9213607A
Other languages
English (en)
French (fr)
Other versions
FR2685807A1 (fr
Inventor
Lee Woung-Moo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of FR2685807A1 publication Critical patent/FR2685807A1/fr
Application granted granted Critical
Publication of FR2685807B1 publication Critical patent/FR2685807B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
    • H01L27/0883—Combination of depletion and enhancement field effect transistors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/06—Modifications for ensuring a fully conducting state
    • H03K17/063—Modifications for ensuring a fully conducting state in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/10—Modifications for increasing the maximum permissible switched voltage
    • H03K17/102—Modifications for increasing the maximum permissible switched voltage in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors

Landscapes

  • Power Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
  • Read Only Memory (AREA)
  • Electronic Switches (AREA)
  • Dc-Dc Converters (AREA)
  • Non-Volatile Memory (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
FR9213607A 1991-12-28 1992-11-12 Circuit de commutation haute tension. Expired - Fee Related FR2685807B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019910024801A KR940008206B1 (ko) 1991-12-28 1991-12-28 고전압 스위치 회로

Publications (2)

Publication Number Publication Date
FR2685807A1 FR2685807A1 (fr) 1993-07-02
FR2685807B1 true FR2685807B1 (fr) 1995-11-03

Family

ID=19326362

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9213607A Expired - Fee Related FR2685807B1 (fr) 1991-12-28 1992-11-12 Circuit de commutation haute tension.

Country Status (7)

Country Link
JP (1) JP2677747B2 (zh)
KR (1) KR940008206B1 (zh)
DE (1) DE4242801C2 (zh)
FR (1) FR2685807B1 (zh)
GB (1) GB2262850B (zh)
IT (1) IT1256217B (zh)
TW (1) TW209926B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4128763B2 (ja) 2000-10-30 2008-07-30 株式会社東芝 電圧切り替え回路
KR100725993B1 (ko) * 2005-12-28 2007-06-08 삼성전자주식회사 누설 전류를 방지하는 로우 디코더 회로 및 이를 구비하는반도체 메모리 장치
JP4909647B2 (ja) 2006-06-02 2012-04-04 株式会社東芝 不揮発性半導体記憶装置
KR20150121288A (ko) * 2014-04-17 2015-10-29 에스케이하이닉스 주식회사 고전압 스위치 회로 및 이를 포함하는 비휘발성 메모리

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5541030B2 (zh) * 1972-02-09 1980-10-21
US4511811A (en) * 1982-02-08 1985-04-16 Seeq Technology, Inc. Charge pump for providing programming voltage to the word lines in a semiconductor memory array
JPS58151124A (ja) * 1982-03-04 1983-09-08 Ricoh Co Ltd レベル変換回路
US4672241A (en) * 1985-05-29 1987-06-09 Advanced Micro Devices, Inc. High voltage isolation circuit for CMOS networks
US4689495A (en) * 1985-06-17 1987-08-25 Advanced Micro Devices, Inc. CMOS high voltage switch
JPH0748310B2 (ja) * 1987-04-24 1995-05-24 株式会社東芝 半導体集積回路
US4888738A (en) * 1988-06-29 1989-12-19 Seeq Technology Current-regulated, voltage-regulated erase circuit for EEPROM memory
US5039882A (en) * 1988-10-15 1991-08-13 Sony Corporation Address decoder circuit for non-volatile memory

Also Published As

Publication number Publication date
JP2677747B2 (ja) 1997-11-17
DE4242801A1 (zh) 1993-07-01
GB2262850B (en) 1996-04-17
GB9226862D0 (en) 1993-02-17
DE4242801C2 (de) 2000-02-10
KR930014615A (ko) 1993-07-23
JPH05259473A (ja) 1993-10-08
TW209926B (zh) 1993-07-21
ITMI922927A1 (it) 1994-06-22
FR2685807A1 (fr) 1993-07-02
ITMI922927A0 (it) 1992-12-22
IT1256217B (it) 1995-11-29
KR940008206B1 (ko) 1994-09-08
GB2262850A (en) 1993-06-30

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Legal Events

Date Code Title Description
ER Errata listed in the french official journal (bopi)

Free format text: 26/93

ST Notification of lapse

Effective date: 20120731